Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 21
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1351, doi. 10.1049/el.2013.2485
- N. Matsuo;
- T. Kobayashi;
- A. Heya
- Article
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1306, doi. 10.1049/el.2013.3213
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1315, doi. 10.1049/el.2013.2418
- Guo Liu;
- Liang Xu;
- Zhensen Wu
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1330, doi. 10.1049/el.2013.2203
- Byung-Hun Oh;
- Jung-Hyun Kim;
- Kwang-Seok Hong
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1350, doi. 10.1049/el.2013.2538
- Y. Sano;
- M. Kobayashi;
- T. Yoshino
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1308, doi. 10.1049/el.2013.3210
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1358, doi. 10.1049/el.2013.2768
- Minhwan Choi;
- Hoojin Lee;
- Haewoon Nam
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1356, doi. 10.1049/el.2013.2707
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1, doi. 10.1049/el.2013.2670
- Yong Chen;
- Pui-In Mak;
- Li Zhang;
- He Qian;
- Yan Wang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1317, doi. 10.1049/el.2013.2577
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1353, doi. 10.1049/el.2013.2479
- Haifeng Zhou;
- Kam Man Shum;
- Cheung, Ray C. C.;
- Chi-Hou Chan
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1321, doi. 10.1049/el.2013.2547
- Gunn, L. J.;
- Allison, A.;
- Abbott, D.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1313, doi. 10.1049/el.2013.2165
- Cakir, O.;
- Kaya, I.;
- Yazgan, A.;
- Cakir, Ö.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1348, doi. 10.1049/el.2013.2526
- Jinhui Yuan;
- Guiyao Zhou;
- Hongzhan Liu;
- Changming Xia;
- Xinzhu Sang;
- Qiang Wu;
- Chongxiu Yu;
- Kuiru Wang;
- Binbin Yan;
- Ying Han;
- Farrell, G.;
- Hou, Lantian
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1333, doi. 10.1049/el.2013.2239
- Basanta-Val, P.;
- Valls, M. García
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1318, doi. 10.1049/el.2013.2459
- Kun Mao;
- Ming Qiao;
- Zhaoji Li;
- Bo Zhang
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1326, doi. 10.1049/el.2013.2457
- Badri, V.;
- Tavazoei, M. S.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1312, doi. 10.1049/el.2013.2417
- Yi Zhao;
- Xiang-yu Cao;
- Jun Gao;
- Wen-qiang Li
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1323, doi. 10.1049/el.2013.2092
- L. Zou;
- Pathrose, J.;
- K. T. C. Chai;
- M. Je;
- Y. P. Xu
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1320, doi. 10.1049/el.2013.2116
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1355, doi. 10.1049/el.2013.2331
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1343, doi. 10.1049/el.2013.2321
- Karimi, Gh.;
- Khamin-Hamedani, F.;
- Siahkamari, H.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1338, doi. 10.1049/el.2013.2299
- Azcona, C.;
- Calvo, B.;
- Medrano, N.;
- Celma, S.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1345, doi. 10.1049/el.2013.2281
- Weickhmann, C.;
- Nathrath, N.;
- Gehring, R.;
- Gaebler, A.;
- Jost, M.;
- Jakoby, R.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1331, doi. 10.1049/el.2013.2112
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1406, doi. 10.1049/el.2013.2304
- Nakkala, P.;
- Martin, A.;
- Campovecchio, M.;
- Laurent, S.;
- Bouysse, P.;
- Bergeault, E.;
- Quéré, R.;
- Jardel, O.;
- Piotrowicz, S.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1335, doi. 10.1049/el.2013.2095
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1328, doi. 10.1049/el.2013.1753
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1325, doi. 10.1049/el.2013.2011
- J. H. Kim;
- J.-H. Chang;
- S. W. Nam
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1347, doi. 10.1049/el.2013.1839
- Hasanah, L.;
- Noor, F. A.;
- Jung, C. U.;
- Khairurrijal, K.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1342, doi. 10.1049/el.2013.1777
- Zhuohui He;
- Wu Ye;
- Suili FengQ
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1360, doi. 10.1049/el.2013.1731
- S. W. Chen;
- C. K. Seow;
- S. Y. Tan
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1337, doi. 10.1049/el.2012.2907
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1410, doi. 10.1049/el.2013.3387
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1409, doi. 10.1049/el.2013.2759
- Padilla, P.;
- Padilla, J.L.;
- Valenzuela‐Valdés, J.F.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1407, doi. 10.1049/el.2013.2220
- Li, Yanfei;
- Qiao, Ming;
- Jiang, Yongheng;
- Zhou, Xin;
- Xu, Wan;
- Zhang, Bo
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1311, doi. 10.1049/el.2013.1513
- J.-S. Shin;
- I. Song;
- Y. Ai;
- S. Hwang;
- J.-S. Rieh
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1404, doi. 10.1049/el.2013.1537
- Liu, Hongchen;
- Wang, Guoli;
- Yu, Hailong
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1402, doi. 10.1049/el.2013.2772
- Hwang, Yah‐Shyan;
- Shen, Jian‐Hong;
- Chen, Jiann‐Jong
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1376, doi. 10.1049/el.2013.2326
- Sadr, A.;
- Zolfaghari‐Nejad, M.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1401, doi. 10.1049/el.2013.2979
- Okayama, H.;
- Shimura, D.;
- Onawa, Y.;
- Takahashi, H.;
- Seki, M.;
- Koshino, K.;
- Yokoyama, N.;
- Oshtsuka, M.;
- Tsuchizawa, T.;
- Nishi, H.;
- Yamada, K.;
- Yaegashi, H.;
- Horikawa, T.;
- Sasaki, H.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1393, doi. 10.1049/el.2013.2151
- Kim, K.S.;
- Kim, C.Y.;
- Kim, D.O.;
- Park, J.G.;
- Koo, B.H.;
- Lee, C.H.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1399, doi. 10.1049/el.2013.1931
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1398, doi. 10.1049/el.2013.2407
- Xia, Bu Gang;
- Zhang, De Hai;
- Meng, Jin;
- Huang, Jian;
- Yao, Chang Fei;
- Zhang, Jin Sheng
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1396, doi. 10.1049/el.2013.2409
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1371, doi. 10.1049/el.2013.2105
- Seager, R.D.;
- Chauraya, A.;
- Zhang, S.;
- Whittow, W.;
- Vardaxoglou, Y.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1394, doi. 10.1049/el.2013.2975
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 21, p. 1391, doi. 10.1049/el.2013.2506
- Zhou, Q.;
- Chen, W.;
- Zhou, C.;
- Zhang, B.;
- Chen, K.J.
- Article