Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 13
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1609
- F. Li;
- W.Q. Che;
- L.M. Gu;
- Q. Xue
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1192
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1504
- Ferreiro, T. I.;
- Lamour, T. P.;
- Sun, J.;
- Reid, D. T.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1481
- An-An Liu;
- Yuting Su;
- Zan Gao;
- Tong Hao;
- Zhao-Xuan Yang;
- Zhe Zhang
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 778, doi. 10.1049/el.2013.1907
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1396
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1583
- J. Wang;
- L. Wang;
- C. Li;
- Romeira, B.;
- Wasige, E.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1553
- J. Liang;
- S. Nishida;
- M. Morimoto;
- N. Shigekawa
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1447
- Balzer, J. C.;
- Schlauch, T.;
- Klehr, A.;
- Erbert, G.;
- Tränkle, G.;
- Hofmann, M. R.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1493
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1126
- G. Kim;
- T. Kim;
- D. -H. Lim;
- C. Yim
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1059
- Jany, C.;
- Siligaris, A.;
- Zarudniev, M.;
- Ferrari, P.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1453
- F. Wan;
- Pommerenke, D.;
- Shumiya, H.;
- K. Araki
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0735
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1397
- Moh, T. S. Y.;
- Nie, M.;
- Pandraud, G.;
- de Smet, L. C. P. M.;
- Sudhölter, E. J. R.;
- Huang, Q. -A.;
- Sarro, P. M.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1350
- S. H. A. Woo;
- J. W. Lee;
- I. -Y. Park;
- B. S. Song
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1307
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1302
- S. Zou;
- P. Xu;
- Hamilton, M. C.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1278
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1229
- Y. P. Wang;
- X. Q. Huang;
- M. Wang
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1195
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.1075
- Ripamonti, G.;
- Caponio, F.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0995
- Qingchun Lu;
- Xiangzhong Fang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0773
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0754
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0609
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0583
- N. Schlepple;
- M. Nishigaki;
- H. Uemura;
- H. Furuyama;
- Y. Sugizaki;
- H. Shibata;
- Y. Koike
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0916
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0540
- H. D. Kang;
- J. Ha;
- E. Koh;
- J. G. Yook
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0505
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0495
- Cihangir, A.;
- Sonnerat, F.;
- Ferrero, F.;
- Pilard, R.;
- Gianesello, F.;
- Gloria, D.;
- Brachat, P.;
- Jacquemod, G.;
- Luxey, C.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0449
- Jing Li;
- Qi Zhang;
- Quanzhong Li;
- Liping Luo;
- Jiayin Qin
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0447
- Perrier, A. L.;
- Grenier, D.;
- Ravel, N.;
- Litaudon, P.;
- Beuf, O.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0310
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0254
- F. Hamaoka;
- T. Seki;
- T. Matsuda;
- A. Naka
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0226
- B. L. Cho;
- S. G. Sun;
- B. G. Lim
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0078
- C. J. Kim;
- S. W. Heo;
- H. K. Lee
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0183
- Y. Zhan;
- X. M. Zhang;
- M. Y. Ding
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2013.0071
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2012.4413
- Amarloo, H.;
- Neshat, M.;
- Safavi-Naeini, S.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2012.4342
- Peng Zhang;
- Changyin Liu;
- Lanxiang Jiang
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2012.4170
- Enikeeva, F.;
- Morche, D.;
- Oguz, A.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 13, p. 1, doi. 10.1049/el.2012.3390
- Hyeong-Gun Joo;
- Dong-Joon Shin
- Article