Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 12
1
- 2013
- Garcia, C. R.;
- Tsang, H. H.;
- Barton, J. H.;
- Rumpf, R. C.
- Interview
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0985
- Ying Li;
- Zhitang Song;
- Bo Liu;
- Guanping Wu;
- Songlin Feng
- Article
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 730, doi. 10.1049/el.2013.1742
- Ren, R.;
- Y. X. Guo;
- J. Wang;
- R. H. Zhu
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 728, doi. 10.1049/el.2013.1741
- Article
6
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.1407
- Al-Khateeb, L.;
- Safia, O. Abu
- Article
7
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2012.4373
- Al-fuhaidi, B. A.;
- Hassan, H. E. A.;
- Salah, M. M.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.1010
- Kamal, N.;
- Al-Sarawi, S. F.;
- Abbott, D.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0998
- R. Ren;
- Y. X. Guo;
- J. Wang;
- R. H. Zhu
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.1528
- Garcia, C. R.;
- Rumpf, R. C.;
- Tsang, H. H.;
- Barton, J. H.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.1520
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.1198
- Y. H. Sun;
- G. J. Wen;
- H. Y. Jin;
- P. Wang;
- Y. J. Huang
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.1052
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.1096
- S. Tao;
- Rodriguez, S.;
- Rusu, A.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2012.4408
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 832, doi. 10.1049/el.2013.0505
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 830, doi. 10.1049/el.2013.1553
- Liang, J.;
- Nishida, S.;
- Morimoto, M.;
- Shigekawa, N.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0764
- Daigle, J. N.;
- Femminella, M.;
- Reali, G.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0789
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0580
- Y. F. Bai;
- X. H. Wang;
- C. J. Gao;
- Q. L. Huang;
- X. W. Shi
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0442
- Cheen-Hau Tan;
- JunHui Hou;
- Lap-Pui Chau
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 829, doi. 10.1049/el.2013.1302
- Zou, S.;
- Xu, P.;
- Hamilton, M.C.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0314
- C. W. Tang;
- P. G. Lan;
- C. T. Tseng
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0240
- J. J. Xie;
- Y. Z. Yin;
- Y. Chen
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0233
- T. Li;
- Sun, S.;
- Sattar, T. P.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0134
- T. Hu;
- Hudson, D. D.;
- Jackson, S. D.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0132
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2013.0125
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2012.4506
- J. Y. Zuo;
- Y. N. Jia;
- Y. Z. Zhang;
- W. Lian
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 827, doi. 10.1049/el.2013.1396
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2012.4126
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2012.4064
- Long-Fei Wang;
- Jing-Quan Liu;
- Bin Yang;
- Hong-Ying Zhu;
- Chun-Sheng Yang
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2012.3574
- Xiaodong Xie;
- Wei Li;
- Jianjun Li;
- Gang Wang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 848, doi. 10.1049/el.2013.0449
- Li, Jing;
- Zhang, Qi;
- Li, Quanzhong;
- Luo, Liping;
- Qin, Jiayin
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 846, doi. 10.1049/el.2013.0226
- Cho, B.L.;
- Sun, S.G.;
- Lim, B.G.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 845, doi. 10.1049/el.2013.0916
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 843, doi. 10.1049/el.2013.1278
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 841, doi. 10.1049/el.2013.1493
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 840, doi. 10.1049/el.2013.1229
- Wang, Y.P.;
- Huang, X.Q.;
- Wang, M.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 838, doi. 10.1049/el.2013.1447
- Balzer, J.C.;
- Schlauch, T.;
- Klehr, A.;
- Erbert, G.;
- Tränkle, G.;
- Hofmann, M.R.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 836, doi. 10.1049/el.2012.4413
- Amarloo, H.;
- Neshat, M.;
- Safavi‐Naeini, S.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 835, doi. 10.1049/el.2013.0583
- Schlepple, N.;
- Nishigaki, M.;
- Uemura, H.;
- Furuyama, H.;
- Sugizaki, Y.;
- Shibata, H.;
- Koike, Y.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 833, doi. 10.1049/el.2013.1504
- Ferreiro, T.I.;
- Lamour, T.P.;
- Sun, J.;
- Reid, D.T.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 826, doi. 10.1049/el.2013.0254
- Hamaoka, F.;
- Seki, T.;
- Matsuda, T.;
- Naka, A.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 824, doi. 10.1049/el.2012.4170
- Enikeeva, F.;
- Morche, D.;
- Oguz, A.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 823, doi. 10.1049/el.2013.0071
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 821, doi. 10.1049/el.2013.0540
- Kang, H.D.;
- Ha, J.;
- Koh, E.;
- Yook, J.G.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 820, doi. 10.1049/el.2013.0609
- Choi, J.;
- Kim, J.;
- Jung, C.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 818, doi. 10.1049/el.2013.1609
- Li, F.;
- Che, W.Q.;
- Gu, L.M.;
- Xue, Q.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 816, doi. 10.1049/el.2013.1583
- Wang, J.;
- Wang, L.;
- Li, C.;
- Romeira, B.;
- Wasige, E.
- Article