Works matching IS 00135194 AND DT 2013 AND VI 49 AND IP 1
1
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 79, doi. 10.1049/el.2012.3918
- Mizuno, Y.;
- Hayashi, N.;
- Nakamura, K.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 77, doi. 10.1049/el.2012.3896
- Tennant, A.;
- Hurley, W.;
- Dias, T.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 63, doi. 10.1049/el.2012.3782
- Article
4
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 83, doi. 10.1049/el.2012.3944
- Frison, B.;
- Sarmani, A. R.;
- Chen, L. R.;
- Gu, X.;
- Saad, M.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 81, doi. 10.1049/el.2012.3922
- Nada, M.;
- Muramoto, Y.;
- Yokoyama, H.;
- Ishibashi, T.;
- Matsuzaki, H.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 2, doi. 10.1049/el.2012.4241
- Toumazou, Chris;
- Dyball, Helen;
- White, Ian
- Article
10
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 87, doi. 10.1049/el.2012.3984
- Sigg, A.;
- Heck, S.;
- Bräckle, A.;
- Berroth, M.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 85, doi. 10.1049/el.2012.3950
- Article
12
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 35, doi. 10.1049/el.2012.3427
- Valkonen, R.;
- Ilvonen, J.;
- Icheln, C.;
- Vainikainen, P.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 61, doi. 10.1049/el.2012.3774
- Article
14
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 31, doi. 10.1049/el.2012.3376
- Article
15
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 75, doi. 10.1049/el.2012.3891
- Zhu, F.;
- Hong, W.;
- Chen, J. X.;
- Wu, K.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 73, doi. 10.1049/el.2012.3861
- Murray, T. S.;
- Pouliquen, P. O.;
- Andreou, A. G.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 71, doi. 10.1049/el.2012.3843
- Article
18
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 69, doi. 10.1049/el.2012.3839
- Ma, X.;
- Huo, J.;
- Yang, X.;
- Ren, G.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 65, doi. 10.1049/el.2012.3812
- Chen, N.;
- Xiao, H. D.;
- Zhu, J.;
- Lin, J. J.;
- Wang, Y.;
- Yuan, W. H.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 67, doi. 10.1049/el.2012.3827
- Zhang, Y.;
- Chen, C.-H.;
- Temes, G. C.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 29, doi. 10.1049/el.2012.3366
- Raman, J.;
- Rombouts, P.;
- Weyten, L.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 37, doi. 10.1049/el.2012.3450
- Ranta, S.;
- Tavast, M.;
- Leinonen, T.;
- Van Lieu, N.`;
- Fetzer, G.;
- Guina, M.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 27, doi. 10.1049/el.2012.3358
- Article
24
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 59, doi. 10.1049/el.2012.3749
- Shim, S.;
- Lee, H. Y.;
- Choi, J.-H.;
- Yu, H.-K.;
- Hong, S.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 57, doi. 10.1049/el.2012.3728
- Kayastha, M. S.;
- Sapkota, D. P.;
- Takahashi, M.;
- Wakita, K.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 55, doi. 10.1049/el.2012.3722
- Zargaran-Yazd, A.;
- Keikhosravy, K.;
- Rashtian, H.;
- Mirabbasi, S.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 53, doi. 10.1049/el.2012.3712
- Article
28
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 51, doi. 10.1049/el.2012.3690
- Wang, J.;
- Ye, L.;
- Chen, L.;
- Liu, J.;
- Liao, H.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 49, doi. 10.1049/el.2012.3684
- Dadashi, F.;
- Millet, G. P.;
- Aminian, K.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 47, doi. 10.1049/el.2012.3655
- Chen, C.-H.;
- Jung, Y.;
- Ceballos, J. L.;
- Temes, G. C.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 45, doi. 10.1049/el.2012.3607
- Crepaldi, M.;
- Kinget, P. R.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 43, doi. 10.1049/el.2012.3554
- Chen, G. Y.;
- Brambilla, G.;
- Newson, T. P.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 41, doi. 10.1049/el.2012.3520
- Jeongsim Kim;
- Bara Kim;
- Jangha Kang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 39, doi. 10.1049/el.2012.3509
- Kašalynas, I.;
- Mekys, A.;
- Minkevičius, L.;
- Račiukaitis, G.;
- Seliuta, D.;
- Tamošiūnas, V.;
- Valušis, G.;
- Venckevičius, R.;
- Voisiat, B.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 221, doi. 10.1049/el.2012.3153
- Dong, Zhihua;
- Tan, Shuxin;
- Cai, Yong;
- Chen, Hongwei;
- Liu, Shenghou;
- Xu, Jicheng;
- Xue, Lu;
- Yu, Guohao;
- Wang, Yue;
- Zhao, Desheng;
- Hou, Keyu;
- Chen, Kevin J.;
- Zhang, Baoshun
- Article
36
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 33, doi. 10.1049/el.2012.3414
- Chungsoo Lim;
- Sang Won Nam;
- Joon-Hyuk Chang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 25, doi. 10.1049/el.2012.3326
- Park, H. J.;
- Go, S. C.;
- Lee, H. J.;
- Cho, S. Y.;
- Lee, K. D.;
- Ahn, H. W.;
- Lee, J.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 11, doi. 10.1049/el.2012.3054
- Dai-Qiang Chen;
- Li-Zhi Cheng
- Article
39
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 23, doi. 10.1049/el.2012.3262
- Haijia Wu;
- Xiongwei Zhang;
- Jianjun Huang and;
- Weiwei Chen
- Article
40
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 228, doi. 10.1049/el.2012.4032
- He, Z.Q.;
- Liu, Q.H.;
- Jin, L.N.;
- Ouyang, S.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 21, doi. 10.1049/el.2012.3191
- Rodrigues, C. R.;
- Muller, C.;
- Neto, D. J. Monteiro
- Article
42
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 13, doi. 10.1049/el.2012.3072
- Goodman, J.;
- Bertoncini, C.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 19, doi. 10.1049/el.2012.3182
- Zhang, W.;
- Wu, S.;
- Wang, J.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 17, doi. 10.1049/el.2012.3167
- Yang, S.-H.;
- Jeong, E.-M.;
- Kim, D.-R.;
- Kim, H.-S.;
- Son, Y.-H.;
- Han, S.-K.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 15, doi. 10.1049/el.2012.3101
- Bandiera, F.;
- Besson, O.;
- Ricci, G.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 9, doi. 10.1049/el.2012.3030
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 5, doi. 10.1049/el.2012.2475
- Moon-Kyu Cho;
- Donghyun Baek;
- Jeong-Geun Kim
- Article
48
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 201, doi. 10.1049/el.2012.3293
- Article
49
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 217, doi. 10.1049/el.2012.4180
- Endoh, A.;
- Watanabe, I.;
- Mimura, T.;
- Matsui, T.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 1, p. 7, doi. 10.1049/el.2012.2971
- Yu, X.;
- Xu, J.;
- Luo, Z.;
- Chen, X.
- Article