Works in Electronics Letters (Wiley-Blackwell), 2018, Vol 54, Issue 15
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 915, doi. 10.1049/el.2018.1400
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2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 943, doi. 10.1049/el.2018.1128
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4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 914, doi. 10.1049/el.2018.1402
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5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 918, doi. 10.1049/el.2018.1346
- Rui Xu;
- Jianying Li;
- Jie Liu;
- Shi Gang Zhou;
- Kun Wei
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6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 930, doi. 10.1049/el.2018.5175
- Centurelli, F.;
- Monsurrò, P.;
- Parisi, G.;
- Tommasino, P.;
- Trifiletti, A.
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7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 936, doi. 10.1049/el.2018.5021
- Ko, H.;
- Chae, J.-H.;
- Kim, S.
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8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 920, doi. 10.1049/el.2018.1237
- Islam, Sk. N.;
- Kumar, M.;
- Sen, G.;
- Das, S.
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9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 955, doi. 10.1049/el.2018.1162
- Jeong, G.;
- Kang, S.;
- Hong, S.
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10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 926, doi. 10.1049/el.2018.1187
- Liang Shen;
- Xiaotao Huang;
- Chongyi Fan;
- Yueli Li
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11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 938, doi. 10.1049/el.2018.1134
- Palaniappan, A. Ramaswami;
- Siek, L.
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12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 922, doi. 10.1049/el.2018.1332
- Maddio, S.;
- Pelosi, G.;
- Righini, M.;
- Selleri, S.;
- Vecchi, I.
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13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 949, doi. 10.1049/el.2018.1125
- Aihua Liu;
- Qiang Yang;
- Xin Zhang;
- Weibo Deng
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14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 959, doi. 10.1049/el.2018.1082
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15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 953, doi. 10.1049/el.2018.0727
- Jian Pan;
- Jun Tang;
- Li Wang;
- Yunlei Zhang
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16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 928, doi. 10.1049/el.2018.0708
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17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 939, doi. 10.1049/el.2018.0121
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18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 947, doi. 10.1049/el.2018.1097
- Cho, S.-J.;
- Li, X.;
- Guiney, I.;
- Floros, K.;
- Hemakumara, D.;
- Wallis, D. J.;
- Humphreys, C.;
- Thayne, I. G.
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19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 917, doi. 10.1049/el.2018.1096
- Midya, M.;
- Bhattacharjee, S.;
- Mitra, M.
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20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 951, doi. 10.1049/el.2018.1065
- Ye Wei;
- Yonggang Zhang;
- Chengcheng Wang
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21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 934, doi. 10.1049/el.2018.1042
- Arifeen, Tooba;
- Hassan, Abdus Sami;
- Moradian, Hossein;
- Jeong A. Lee
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22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 941, doi. 10.1049/el.2018.1011
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23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 932, doi. 10.1049/el.2018.0997
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24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 957, doi. 10.1049/el.2018.0893
- Yuan, H.;
- Maple, C.;
- Chen, C.;
- Watson, T.
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25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 945, doi. 10.1049/el.2018.0039
- Gow, P. C.;
- Jantzen, A.;
- Boyd, K.;
- Simakov, N.;
- Daniel, J.;
- Gray, A. C.;
- Gates, J. C.;
- Shardlow, P. C.;
- Smith, P. G. R.;
- Holmes, C.
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26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 924, doi. 10.1049/el.2018.0033
- Guangwu Qian;
- Lei Zhang;
- Qianjun Zhang
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27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 959, doi. 10.1049/el.2018.1082
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28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 957, doi. 10.1049/el.2018.0893
- Yuan, H.;
- Maple, C.;
- Chen, C.;
- Watson, T.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 955, doi. 10.1049/el.2018.1162
- Jeong, G.;
- Kang, S.;
- Hong, S.
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30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 943, doi. 10.1049/el.2018.1128
- Zhou, Mingzhu;
- Wang, Keping
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31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 951, doi. 10.1049/el.2018.1065
- Wei, Ye;
- Zhang, Yonggang;
- Wang, Chengcheng
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32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 949, doi. 10.1049/el.2018.1125
- Liu, Aihua;
- Yang, Qiang;
- Zhang, Xin;
- Deng, Weibo
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33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 947, doi. 10.1049/el.2018.1097
- Cho, S.‐J.;
- Li, X.;
- Guiney, I.;
- Floros, K.;
- Hemakumara, D.;
- Wallis, D.J.;
- Humphreys, C.;
- Thayne, I.G.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 945, doi. 10.1049/el.2018.0039
- Gow, P.C.;
- Jantzen, A.;
- Boyd, K.;
- Simakov, N.;
- Daniel, J.;
- Gray, A.C.;
- Gates, J.C.;
- Shardlow, P.C.;
- Smith, P.G.R.;
- Holmes, C.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 953, doi. 10.1049/el.2018.0727
- Pan, Jian;
- Tang, Jun;
- Wang, Li;
- Zhang, Yunlei
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36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 941, doi. 10.1049/el.2018.1011
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37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 936, doi. 10.1049/el.2018.5021
- Ko, H.;
- Chae, J.‐H.;
- Kim, S.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 938, doi. 10.1049/el.2018.1134
- Ramaswami Palaniappan, A.;
- Siek, L.
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39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 915, doi. 10.1049/el.2018.1400
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 926, doi. 10.1049/el.2018.1187
- Shen, Liang;
- Huang, Xiaotao;
- Fan, Chongyi;
- Li, Yueli
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41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 914, doi. 10.1049/el.2018.1401
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42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 939, doi. 10.1049/el.2018.0121
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 934, doi. 10.1049/el.2018.1042
- Arifeen, Tooba;
- Hassan, Abdus Sami;
- Moradian, Hossein;
- Lee, Jeong A.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 922, doi. 10.1049/el.2018.1332
- Maddio, S.;
- Pelosi, G.;
- Righini, M.;
- Selleri, S.;
- Vecchi, I.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 932, doi. 10.1049/el.2018.0997
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 930, doi. 10.1049/el.2018.5175
- Centurelli, F.;
- Monsurrò, P.;
- Parisi, G.;
- Tommasino, P.;
- Trifiletti, A.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 928, doi. 10.1049/el.2018.0708
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 907, doi. 10.1049/el.2018.0948
- Hussein, H.S.;
- Esmaiel, H.;
- Jiang, D.
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49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 918, doi. 10.1049/el.2018.1346
- Xu, Rui;
- Li, Jianying;
- Liu, Jie;
- Zhou, Shi Gang;
- Wei, Kun
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50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 15, p. 924, doi. 10.1049/el.2018.0033
- Qian, Guangwu;
- Zhang, Lei;
- Zhang, Qianjun
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