Works matching Defense Advanced Research Projects Agency (DARPA)
1
- Angewandte Chemie, 2003, v. 115, n. 46, p. 5884, doi. 10.1002/ange.200352352
- Hongbin Yu;
- Yi Luo;
- Kristen Beverly;
- J. Fraser Stoddart;
- Hsian-Rong Tseng;
- James R. Heath
- Article
2
- Angewandte Chemie, 2005, v. 117, n. 20, p. 3110, doi. 10.1002/ange.200500041
- Yi Liu;
- Paul A. Bonvallet;
- Scott A. Vignon;
- Saeed I. Khan;
- J. Fraser Stoddart
- Article
3
- Advanced Materials, 2007, v. 19, n. 1, p. 67, doi. 10.1002/adma.200601162
- P. X. Gao;
- J. Song;
- J. Liu;
- Z. L. Wang
- Article
4
- Advanced Materials, 2004, v. 16, n. 7, p. 592, doi. 10.1002/adma.200305641
- L. L. Brott;
- S. M. Rozenzhak;
- R. R. Naik;
- S. R. Davidson;
- R. E. Perrin
- Article
5
- Angewandte Chemie, 2003, v. 115, n. 13, p. 1529, doi. 10.1002/ange.200250453
- Hsian-Rong Tseng;
- Scott A. Vignon;
- J. Fraser Stoddart
- Article
6
- Advanced Functional Materials, 2006, v. 16, n. 13, p. 1685, doi. 10.1002/adfm.200500666
- B. Xie;
- R. L. Parkhill;
- W. L. Warren;
- J. E. Smay
- Article
7
- Advanced Functional Materials, 2006, v. 16, n. 8, p. 1001, doi. 10.1002/adfm.200500429
- Y. Yang;
- J. Ouyang;
- L. Ma;
- R. J.-H. Tseng;
- C.-W. Chu
- Article
8
- Angewandte Chemie International Edition, 2005, v. 44, n. 20, p. 3050, doi. 10.1002/anie.200500041
- Yi Liu;
- Paul A. Bonvallet;
- Scott A. Vignon;
- Saeed I. Khan;
- J. Fraser Stoddart
- Article
9
- Angewandte Chemie International Edition, 2003, v. 42, n. 46, p. 5706, doi. 10.1002/anie.200352352
- Hongbin Yu;
- Yi Luo;
- Kristen Beverly;
- J. Fraser Stoddart;
- Hsian-Rong Tseng;
- James R. Heath
- Article
10
- Angewandte Chemie International Edition, 2003, v. 42, n. 13, p. 1491, doi. 10.1002/anie.200250453
- Hsian-Rong Tseng;
- Scott A. Vignon;
- J. Fraser Stoddart
- Article
11
- Industrial & Corporate Change, 2018, v. 27, n. 5, p. 897, doi. 10.1093/icc/dty026
- Article
12
- Survival (0039-6338), 2025, v. 67, n. 2, p. 115, doi. 10.1080/00396338.2025.2481775
- Article
13
- Architectural Design, 2019, v. 89, n. 1, p. 84, doi. 10.1002/ad.2394
- Article
14
- Architectural Design, 2015, v. 85, n. 4, p. 26, doi. 10.1002/ad.1921
- Article
15
- Telecommunication Engineering, 2021, v. 61, n. 3, p. 384, doi. 10.3969/j.issn.1001-893x.2021.03.020
- Article
16
- Telecommunication Engineering, 2020, v. 60, n. 10, p. 1253, doi. 10.3969/j.issn.1001-893x.2020.10.019
- Article
17
- Peace Review, 2014, v. 26, n. 1, p. 94, doi. 10.1080/10402659.2013.846675
- Article
18
- Journal of Cybersecurity (2579-0072), 2024, v. 6, p. 41, doi. 10.32604/jcs.2024.049658
- Yu, Jian;
- Yu, Gaofeng;
- Xiao, Xiangmei;
- Lin, Zhixing
- Article
19
- International Journal of Business Analytics & Intelligence (IJBAI), 2016, v. 4, n. 1, p. 5, doi. 10.21863/ijbai/2016.4.1.017
- Article
20
- Electronics (2079-9292), 2019, v. 8, n. 11, p. 1343, doi. 10.3390/electronics8111343
- P. de Figueiredo, Felipe A.;
- Stojadinovic, Dragoslav;
- Maddala, Prasanthi;
- Mennes, Ruben;
- Jabandžić, Irfan;
- Jiao, Xianjun;
- Moerman, Ingrid
- Article
21
- Science & Public Policy (SPP), 2017, v. 44, n. 5, p. 707, doi. 10.1093/scipol/scx007
- Article
22
- Geoscience Letters, 2022, v. 9, n. 1, p. 1, doi. 10.1186/s40562-022-00242-x
- Article
23
- Design Issues, 2015, v. 31, n. 3, p. 66, doi. 10.1162/DESI_a_00339
- Kennedy, Emily;
- Fecheyr-Lippens, Daphne;
- Bor-Kai Hsiung;
- Niewiarowski, Peter H.;
- Kolodziej, Matthew
- Article
24
- Bulletin of the Atomic Scientists, 2014, v. 70, n. 1, p. 63, doi. 10.1177/0096340213516742
- Article
25
- Bulletin of the Atomic Scientists, 2003, v. 59, n. 4, p. 6
- Article
26
- International Journal of High Speed Electronics & Systems, 2003, v. 13, n. 1, p. 221, doi. 10.1142/S0129156403001582
- Fritz, Karl E.;
- Randall, Barbara A.;
- Fokken, Gregg J.;
- Degerstrom, Michael J.;
- Lorsung, Michael J.;
- Prairie, Jason F.;
- Amundsen, Eric L.H.;
- Schreiber, Shaun M.;
- Gilbert, Barry K.;
- Greenberg, David R.;
- Joseph, Alvin
- Article
27
- 2016
- Zamisch, Monica;
- Hepburn, Matthew J.;
- Ling, Geoffrey S. F.
- journal article
28
- Kentucky English Bulletin, 2012, v. 62, n. 1, p. 30
- Article
29
- Technology, Instruction, Cognition & Learning, 2018, v. 11, n. 1, p. 51
- Article
30
- 2018
- Del Valle, Sara Y.;
- McMahon, Benjamin H.;
- Asher, Jason;
- Hatchett, Richard;
- Lega, Joceline C.;
- Brown, Heidi E.;
- Leany, Mark E.;
- Pantazis, Yannis;
- Roberts, David J.;
- Moore, Sean;
- Peterson, A Townsend;
- Escobar, Luis E.;
- Qiao, Huijie;
- Hengartner, Nicholas W.;
- Mukundan, Harshini
- journal article
31
- Nature, 2008, v. 453, n. 7197, p. 834, doi. 10.1038/453834a
- Article
34
- Nature, 2008, v. 451, n. 7177, p. 390, doi. 10.1038/451390a
- Article
35
- Nature, 2007, v. 445, n. 7129, p. 690, doi. 10.1038/445690a
- Article
36
- Nature, 2006, v. 444, n. 7122, p. 993, doi. 10.1038/444993a
- Article
37
- Nature, 2005, v. 438, n. 7065, p. 129, doi. 10.1038/438129a
- Article
38
- Nature, 2004, v. 428, n. 6978, p. 14, doi. 10.1038/428014a
- Article
39
- Noise & Vibration Worldwide, 2010, v. 41, n. 3, p. 4
- Article
40
- Electronics Letters (Wiley-Blackwell), 2021, v. 57, n. 4, p. 158, doi. 10.1049/ell2.12018
- Ali, Roshaan;
- Belostotski, Leonid;
- Messier, Geoffrey G.;
- Madanayake, Arjuna;
- Sutinjo, Adrian T.
- Article
41
- Journal of Technology Studies, 2015, v. 41, n. 1, p. 20, doi. 10.21061/jots.v41i1.a.3
- Tate, Jitendra S.;
- Espinoza, Sergio;
- Habbit, Davontae;
- Hanks, Craig;
- Trybula, Walt;
- Fazarro, Dominick
- Article
42
- Issues in Information Systems, 2016, v. 17, n. 4, p. 36
- Ehney, Ryan;
- Shorter, Jack D.
- Article
43
- CoatingsTech, 2013, v. 10, n. 8, p. 12
- Article
44
- EE: Evaluation Engineering, 2013, v. 52, n. 6, p. 6
- Article
45
- EE: Evaluation Engineering, 2012, v. 51, n. 9, p. 16
- Article
46
- Photogrammetric Engineering & Remote Sensing, 2013, v. 79, n. 7, p. 606
- Article
47
- Photogrammetric Engineering & Remote Sensing, 2008, v. 74, n. 1, p. 17
- Article
48
- Photogrammetric Engineering & Remote Sensing, 2007, v. 73, n. 10, p. 1111
- Article
49
- ITEA Journal of Test & Evaluation, 2015, v. 36, n. 3, p. 193
- Article
50
- ITEA Journal of Test & Evaluation, 2014, v. 35, n. 1, p. 58
- Downs, Anthony;
- Fronczek, Lisa;
- Morse, Emile;
- Weiss, Brian;
- Bashor, Ian;
- Schlenoff, Craig
- Article