Works matching DE "ZINC telluride"
1
- Chemistry - A European Journal, 2023, v. 29, n. 7, p. 1, doi. 10.1002/chem.202202364
- Uible, Madeleine C.;
- Kieser, Jerod M.;
- Bart, Suzanne C.
- Article
2
- Angewandte Chemie, 2014, v. 126, n. 23, p. 5962, doi. 10.1002/ange.201310461
- Jang, Ji ‐ Wook;
- Cho, Seungho;
- Magesh, Ganesan;
- Jang, Youn Jeong;
- Kim, Jae Young;
- Kim, Won Yong;
- Seo, Jeong Kon;
- Kim, Sungjee;
- Lee, Kun ‐ Hong;
- Lee, Jae Sung
- Article
3
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 19, p. 17747, doi. 10.1007/s10854-019-02125-y
- Kumar, Sunil;
- Jeon, H. C.;
- Kang, T. W.;
- Seth, Rajni;
- Panwar, Sanjay;
- Shinde, Surendra K.;
- Waghmode, D. P.;
- Saratale, Rijuta Ganesh;
- Choubey, Ravi Kant
- Article
4
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15371, doi. 10.1007/s10854-019-01913-w
- Gullu, H. H.;
- Bayraklı Sürücü, Ö.;
- Terlemezoglu, M.;
- Yildiz, D. E.;
- Parlak, M.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 24, p. 20623, doi. 10.1007/s10854-018-0200-0
- Ochoa-Estrella, F. J.;
- Vera-Marquina, A.;
- Mejia, I.;
- Leal-Cruz, A. L.;
- Pintor-Monroy, M. I.;
- Quevedo-López, M.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 10, p. 8610, doi. 10.1007/s10854-018-8875-9
- Donya, Hossam;
- Taha, T. A.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 9, p. 7629, doi. 10.1007/s10854-018-8755-3
- Ochoa-Estrella, F. J.;
- Vera-Marquina, A.;
- Mejia, I.;
- Leal-Cruz, A. L.;
- Quevedo-López, M.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 6, p. 4992, doi. 10.1007/s10854-017-8460-7
- Singh, Harinder;
- Duklan, Neha;
- Sharma, Jeewan;
- Singh, Tejbir;
- Thakur, Anup
- Article
9
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 16, p. 11823, doi. 10.1007/s10854-017-6990-7
- Chaure, Nandu;
- Chaure, Shweta;
- Pandey, R.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1720, doi. 10.1007/s10854-016-5718-4
- Chang, Yuan;
- Wu, Di;
- Xu, Tingting;
- Shi, Zhifeng;
- Tian, Yongtao;
- Li, Xinjian
- Article
11
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 6, p. 4062, doi. 10.1007/s10854-015-2945-z
- Cheng, Tao;
- Li, Dongmei;
- Li, Jie;
- Ren, Bing;
- Wang, Gang;
- Cheng, Jingwei
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1114, doi. 10.1007/s10854-007-9483-2
- Hossain, M. S.;
- Islam, R.;
- Shahjahan, M.;
- Khan, K. A.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 4, p. 427, doi. 10.1007/s10854-006-9044-0
- Wenwu Wang;
- Gengpei Xia;
- Jiagui Zheng;
- Lianghuan Feng;
- Ruiying Hao
- Article
14
- Inorganic Materials, 2011, v. 47, n. 9, p. 945, doi. 10.1134/S0020168511090159
- Makhniy, V.;
- Protopopov, E.;
- Skripnik, N.
- Article
15
- International Journal of Energy Research, 2022, v. 46, n. 9, p. 12963, doi. 10.1002/er.8074
- Ahmed, Moustafa;
- Bakry, Ahmed;
- Shaaban, Essam R.
- Article
16
- Cogent Engineering, 2017, v. 4, n. 1, p. 1, doi. 10.1080/23311916.2017.1318459
- Safa Sultana, Rucksana;
- Bahar, Ali Newaz;
- Asaduzzaman, Md.;
- Ahmed, Kawsar
- Article
17
- Physics & Chemistry of Glasses: European Journal of Glass Science & Technology Part B, 2019, v. 60, n. 1, p. 15, doi. 10.13036/17533562.60.1.006
- Article
18
- Advances in Condensed Matter Physics, 2015, v. 2015, p. 1, doi. 10.1155/2015/587696
- Davami, Keivan;
- Shaygan, Mehrdad;
- Kheirabi, Nazli;
- Ghassemi, Hessam
- Article
19
- Modern Physics Letters B, 2018, v. 32, n. 28, p. N.PAG, doi. 10.1142/S0217984918503426
- Zhuang, Yukai;
- Dai, Lidong;
- Li, Heping;
- Hu, Haiying;
- Liu, Kaixiang;
- Yang, Linfei;
- Pu, Chang;
- Hong, Meiling
- Article
20
- Optica Applicata, 2013, v. 43, n. 1, p. 181, doi. 10.5277/oa130122
- ZIELONY, EUNIKA;
- PŁACZEK-POPKO, EWA;
- KAMYCZEK, PAULINA;
- HENRYKOWSKI, ARTUR;
- KARCZEWSKI, GRZEGORZ
- Article
21
- Chemistry - A European Journal, 2018, v. 24, n. 12, p. 2999, doi. 10.1002/chem.201705443
- Zheng, Jiaojiao;
- Xu, Meng;
- Liu, Jia;
- Cheng, Xiaoyan;
- Liu, Jiajia;
- Rong, Hongpan;
- Zhang, Jiatao
- Article
22
- Optical & Quantum Electronics, 2018, v. 50, n. 6, p. 1, doi. 10.1007/s11082-018-1530-0
- Bayad, Hamza;
- El Manouni, Ahmed;
- Marí, Bernabé;
- Khattak, Yousaf H.;
- Ullah, Shafi;
- Baig, Faisal
- Article
23
- Optics & Spectroscopy, 2018, v. 124, n. 5, p. 712, doi. 10.1134/S0030400X18050053
- Dadoenkova, Yu. S.;
- Zolotovskii, I. O.;
- Panyaev, I. S.;
- Sannikov, D. G.
- Article
24
- Indian Journal of Pure & Applied Physics, 2024, v. 62, n. 3, p. 189, doi. 10.56042/ijpap.v62i3.7003
- Pandey, Dheeraj Kumar;
- Anilesh;
- Yadav, P. S.
- Article
25
- Journal of Chemical Technology & Metallurgy, 2018, v. 53, n. 6, p. 1067
- Ganev, Svetlozar;
- Bachvarova-Nedelcheva, Albena;
- Iordanova, Reni;
- Ranguelov, Bogdan;
- Parvanov, Svetlin
- Article
26
- Applied Physics A: Materials Science & Processing, 2004, v. 79, n. 8, p. 2021, doi. 10.1007/s00339-003-2389-9
- Rakhshani, A.E.;
- Pradeep, B.
- Article
27
- Applied Physics A: Materials Science & Processing, 1996, v. 63, n. 1, p. 81, doi. 10.1007/BF01579749
- El-Nahass, M. M.;
- Khalifa, B. A.;
- El-Rahman, A. M. Abd;
- El-Ariny, R.
- Article
28
- Journal of New Materials for Electrochemical Systems, 2021, v. 24, n. 4, p. 225, doi. 10.14447/jnmes.v24i4.a01
- Abduljabbar, Laith M.;
- Hwidi, Mohammed H.;
- Alchalaby, Ahmed A.
- Article
29
- Semiconductors, 2020, v. 54, n. 9, p. 999, doi. 10.1134/S1063782620090201
- Khan, H. Naeem-ur-Rehman;
- Mehmood, M.;
- Ling, F. C. C.;
- Khan, A. Faheem;
- Ali, S. M.
- Article
30
- Semiconductors, 2019, v. 53, n. 4, p. 573, doi. 10.1134/S106378261904016X
- Kumar, B. Rajesh;
- Hymavathi, B.
- Article
31
- Semiconductors, 2007, v. 41, n. 6, p. 660, doi. 10.1134/S1063782607060085
- Vaksman, Yu.;
- Nitsuk, Yu.;
- Pavlov, V.;
- Purtov, Yu.;
- Nasibov, A.;
- Shapkin, P.
- Article
32
- Semiconductors, 2005, v. 39, n. 9, p. 993, doi. 10.1134/1.2042585
- Ushakov, V. V.;
- Klevkov, Yu. V.
- Article
33
- Semiconductors, 2004, v. 38, n. 1, p. 48, doi. 10.1134/1.1641132
- Rizakhanov, M.A.;
- Zobov, E.M.;
- Khamidov, M.M.
- Article
34
- Semiconductors, 2000, v. 34, n. 1, p. 11, doi. 10.1134/1.1187943
- Venger, E. F.;
- Sadof’ev, Yu. G.;
- Semenova, G. N.;
- Korsunskaya, N. E.;
- Klad’ko, V. P.;
- Semtsiv, M. P.;
- Borkovskaya, L. V.
- Article
35
- Journal of Electronic Materials, 2020, v. 49, n. 8, p. 4474, doi. 10.1007/s11664-020-08034-9
- Maekawa, Naoki;
- Nakayama, Hirotake;
- Yamane, Nobuaki;
- Irie, Koji;
- Abe, Tomoki;
- Kasada, Hirofumi;
- Ichino, Kunio;
- Akaiwa, Kazuaki
- Article
36
- Journal of Electronic Materials, 2020, v. 49, n. 8, p. 4589, doi. 10.1007/s11664-020-07970-w
- Ichikawa, Yuki;
- Tanaka, Keita;
- Nakagawa, Kazuki;
- Fujii, Yuta;
- Yoshida, Kentaro;
- Nakamura, Kaiki;
- Miyazaki, Ryuichi;
- Abe, Tomoki;
- Kasada, Hirofumi;
- Ichino, Kunio;
- Akaiwa, Kazuaki
- Article
37
- Journal of Electronic Materials, 2020, v. 49, n. 8, p. 4537, doi. 10.1007/s11664-020-07955-9
- Jiang, Hua;
- Lu, Youming;
- Rong, Ximing;
- Han, Shun;
- Cao, Peijiang;
- Zeng, Yuxiang;
- Xu, Wangying;
- Fang, Ming;
- Liu, Wenjun;
- Zhu, Deliang
- Article
38
- Journal of Electronic Materials, 2020, v. 49, n. 7, p. 4134, doi. 10.1007/s11664-020-08084-z
- Hasani, Ebrahim;
- Babazadeh Habashi, Lida;
- Kamalian, Monir;
- Gholizadeh Arashti, Maryam
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4399, doi. 10.1007/s11664-018-6395-2
- Banthí-Barcenas, Juan Carlos;
- Sutara, Frantisek;
- Hernández-Calderón, Isaac
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 1620, doi. 10.1007/s11664-017-5979-6
- Rowtu, Srinu;
- Sangani, L.;
- Krishna, M.
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 5112, doi. 10.1007/s11664-017-5502-0
- Shimpi, Tushar;
- Drayton, Jennifer;
- Swanson, Drew;
- Sampath, Walajabad
- Article
42
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4742, doi. 10.1007/s11664-016-4700-5
- Nakasu, Taizo;
- Aiba, Takayuki;
- Yamashita, Sotaro;
- Hattori, Shota;
- Kizu, Takeru;
- Sun, Wei-Che;
- Taguri, Kosuke;
- Kazami, Fukino;
- Hashimoto, Yuki;
- Ozaki, Shun;
- Kobayashi, Masakazu;
- Asahi, Toshiaki
- Article
43
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3653, doi. 10.1007/s11664-014-3279-y
- Gao, Yixing;
- Zhang, Huaiwu;
- Jin, Lichuan;
- Su, Hua;
- Liu, Yingli;
- Jia, Lijun;
- Liao, Yulong;
- Li, Yuanxun
- Article
44
- Journal of Electronic Materials, 2014, v. 43, n. 4, p. 921, doi. 10.1007/s11664-014-3028-2
- Nakasu, Taizo;
- Kobayashi, Masakazu;
- Togo, Hiroyoshi;
- Asahi, Toshiaki
- Article
45
- Journal of Electronic Materials, 2014, v. 43, n. 4, p. 879, doi. 10.1007/s11664-013-2950-z
- Chen, Chihyu;
- Zheng, Jiazhen;
- Nguy, Kevin;
- Naab, Fabian;
- Phillips, Jamie
- Article
46
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3168, doi. 10.1007/s11664-013-2701-1
- Article
47
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3239, doi. 10.1007/s11664-013-2810-x
- Kodama, Richard;
- Seldrum, Thomas;
- Wang, Xiaojin;
- Park, J.;
- Colegrove, Eric;
- Zheng, Xin;
- Dhere, Ramesh;
- Sivananthan, Siva
- Article
48
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3090, doi. 10.1007/s11664-013-2650-8
- Chai, J.;
- Noriega, O.;
- Dedigama, A.;
- Kim, J.;
- Savage, A.;
- Doyle, K.;
- Smith, C.;
- Chau, N.;
- Pena, J.;
- Dinan, J.;
- Smith, D.;
- Myers, T.
- Article
49
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2917, doi. 10.1007/s11664-012-2032-7
- Chen, Yuanping;
- Simingalam, Sina;
- Brill, Gregory;
- Wijewarnasuriya, Priyalal;
- Dhar, Nibir;
- Kim, Jae;
- Smith, David
- Article
50
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2738, doi. 10.1007/s11664-012-2054-1
- Chai, J.;
- Lee, K.-K.;
- Doyle, K.;
- Dinan, J.H.;
- Myers, T.H.
- Article