Works matching DE "ZENER diodes"
1
- Measurement Techniques, 2013, v. 56, n. 5, p. 570, doi. 10.1007/s11018-013-0246-6
- Katkov, A. S.;
- Chernyaev, P. A.
- Article
2
- Semiconductors, 2015, v. 49, n. 11, p. 1448, doi. 10.1134/S1063782615110147
- Malysheva, E.;
- Dorokhin, M.;
- Ved', M.;
- Kudrin, A.;
- Zdoroveishchev, A.
- Article
3
- Nuclear Physics & Atomic Energy, 2013, v. 14, n. 2, p. 158
- Konoreva, O. V.;
- Litovchenko, P. G.;
- Maliy, E. V.;
- Petrenko, I. V.;
- Pinkovska, M. B.;
- Tartachnyk, V. P.;
- Shlapatska, V. V.
- Article
4
- Metalurgia, 2008, v. 60, n. 12, p. 13
- Cziple, Florentina;
- Frunzăverde, Doina;
- Nedelcu, Dorian;
- Pădurean, loan
- Article
5
- Journal of Engineering Physics & Thermophysics, 2014, v. 87, n. 4, p. 997, doi. 10.1007/s10891-014-1097-y
- Dudar, N.;
- Borzdov, V.;
- Turtsevich, A.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1608, doi. 10.1049/el.2017.2913
- Ping Li;
- Junji Cheng;
- Xingbi Chen
- Article
7
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 4, p. 327, doi. 10.1049/el.2014.4311
- Zhu, F.;
- Ravelo, B.;
- Fouquet, F.;
- Kadi, M.
- Article
8
- Contributions to Mineralogy & Petrology, 2010, v. 160, n. 2, p. 219, doi. 10.1007/s00410-009-0474-6
- Brodhag, Sabine Helene;
- Herwegh, Marco
- Article
9
- Iraqi Journal of Science, 2020, v. 61, n. 5, p. 1032, doi. 10.24996/ijs.2020.61.5.12
- Jamal, Raied K.;
- Ali, Falah Hassen;
- Hameed, Mohammed M.;
- Aadim, Kadhim Abdulwahid
- Article
10
- Science Journal of University of Zakho, 2022, v. 10, n. 3, p. 119, doi. 10.25271/sjuoz.2022.10.3.874
- Ramadhan, Dilovan S.;
- Al-Khaffaf, Hasan S. M.
- Article
11
- Metrology, 2024, v. 4, n. 1, p. 98, doi. 10.3390/metrology4010007
- Bülau, André;
- Walter, Daniela;
- Zimmermann, André
- Article
12
- Technical Physics Letters, 2007, v. 33, n. 2, p. 180, doi. 10.1134/S1063785007020265
- Grekhov, I. V.;
- Rodin, P. B.
- Article
13
- Journal of the American Ceramic Society, 2011, v. 94, n. 10, p. 3227, doi. 10.1111/j.1551-2916.2011.04812.x
- Nahm, Choon-W.;
- Peiteado, M.
- Article
14
- Journal of the American Ceramic Society, 2010, v. 93, n. 8, p. 2274, doi. 10.1111/j.1551-2916.2010.03740.x
- Vaidhyanathan, Balasubramaniam;
- Annapoorani, Ketharam;
- Binner, Jon;
- Raghavendra, Ramesh
- Article
15
- Journal of Active & Passive Electronic Devices, 2009, v. 4, n. 3, p. 265
- Article
16
- Measurement & Control (0020-2940), 2014, v. 47, n. 2, p. 48, doi. 10.1177/0020294013516947
- Article
17
- JETP Letters, 2017, v. 105, n. 4, p. 255, doi. 10.1134/S0021364017040038
- Article
18
- Metallurgical & Materials Transactions. Part A, 2011, v. 42, n. 4, p. 1109, doi. 10.1007/s11661-010-0452-7
- Eivani, A.;
- Valipour, S.;
- Ahmed, H.;
- Zhou, J.;
- Duszczyk, J.
- Article
19
- ETRI Journal, 2013, v. 35, n. 4, p. 603, doi. 10.4218/etrij.13.1912.0030
- Jongil Won;
- Jin Gun Koo;
- Taepok Rhee;
- Hyung-Seog Oh;
- Jin Ho Lee
- Article
20
- JETP Letters, 2013, v. 96, n. 12, p. 803, doi. 10.1134/S0021364012240046
- Goran, A.;
- Strygin, I.;
- Bykov, A.
- Article
21
- International Journal of High Speed Electronics & Systems, 2007, v. 17, n. 2, p. 339, doi. 10.1142/S0129156407004540
- WOOLARD, DWIGHT;
- ZHANG, WEIDONG;
- BROWN, ELLIOTT;
- GELMONT, BORIS;
- TREW, ROBERT
- Article
22
- Canadian Journal of Physics, 2012, v. 90, n. 9, p. 849, doi. 10.1139/p2012-080
- Paranjape, B.V.;
- Paranjape, M.B.
- Article