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Experimental determination of reference intensity ratio essential for accurate thickness measurement of HfO<sub>2</sub> ultrathin films by XPS.
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- Surface & Interface Analysis: SIA, 2024, v. 56, n. 6, p. 337, doi. 10.1002/sia.7293
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- Article
Synthesis of Wrinkled MoS 2 Thin Films Using a Two-Step Method Consisting of Magnetron Sputtering and Sulfurization in a Confined Space.
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- Sustainability (2071-1050), 2024, v. 16, n. 9, p. 3819, doi. 10.3390/su16093819
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- Article
Effect of Annealing on Stress, Microstructure, and Interfaces of NiV/B 4 C Multilayers.
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- Coatings (2079-6412), 2024, v. 14, n. 4, p. 513, doi. 10.3390/coatings14040513
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- Article
Distributed Temperature Sensing through Network Analysis Frequency-Domain Reflectometry.
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- Sensors (14248220), 2024, v. 24, n. 7, p. 2378, doi. 10.3390/s24072378
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- Article
Enhancement of the hydrophobicity and oleophobicity of a polyurethane coating using a fluorine‐free polyfarnesene‐based polyol.
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- Journal of Applied Polymer Science, 2024, v. 141, n. 9, p. 1, doi. 10.1002/app.55010
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- Article
Synthesis of WS 2 Ultrathin Films by Magnetron Sputtering Followed by Sulfurization in a Confined Space.
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- Surfaces (2571-9637), 2024, v. 7, n. 1, p. 108, doi. 10.3390/surfaces7010008
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- Article
Semitransparent Organic Photovoltaic Devices: Interface/Bulk Properties and Stability Issues.
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- Nanomaterials (2079-4991), 2024, v. 14, n. 3, p. 269, doi. 10.3390/nano14030269
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- Article
Gap-Free Tuning of Second and Third Harmonic Generation in Mechanochemically Synthesized Nanocrystalline LiNb 1− x Ta x O 3 (0 ≤ x ≤ 1) Studied with Nonlinear Diffuse Femtosecond-Pulse Reflectometry.
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- Nanomaterials (2079-4991), 2024, v. 14, n. 3, p. 317, doi. 10.3390/nano14030317
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Closing the loop: autonomous experiments enabled by machine-learning-based online data analysis in synchrotron beamline environments.
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- Journal of Synchrotron Radiation, 2023, v. 30, n. 6, p. 1064, doi. 10.1107/S160057752300749X
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- Article
Surface Degradation of Thin-Layer Al/MgF 2 Mirrors under Exposure to Powerful VUV Radiation.
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- Nanomaterials (2079-4991), 2023, v. 13, n. 21, p. 2819, doi. 10.3390/nano13212819
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- Article
Influence of the RF magnetron sputtering power on the optical and electrical properties of AZO films.
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- Physical Sciences & Technology, 2023, v. 10, n. 3/4, p. 28, doi. 10.26577/phst.2023.v10.i2.03
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- Article
Pt and Pd Nanoparticle Crystallization in the Sol-Gel-Derived Thin SiO 2 Films.
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- Physchem, 2023, v. 3, n. 2, p. 259, doi. 10.3390/physchem3020018
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- Article
Protection of Cu from Oxidation by Ta Capping Layer.
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- Coatings (2079-6412), 2023, v. 13, n. 5, p. 926, doi. 10.3390/coatings13050926
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- Article
Atomic Layer Deposition of Chlorine Containing Titanium–Zinc Oxide Nanofilms Using the Supercycle Approach.
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- Coatings (2079-6412), 2023, v. 13, n. 5, p. 960, doi. 10.3390/coatings13050960
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- Article
Invited: Investigation of Carbon/Copper Multilayer to Examine the Influence of Copper Coating on the Li-Storage Performance of Carbon.
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- Energies (19961073), 2023, v. 16, n. 6, p. 2740, doi. 10.3390/en16062740
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Features of the Composition and Photoluminescent Properties of Porous Silicon Depending on Its Porosity Index.
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- Coatings (2079-6412), 2023, v. 13, n. 2, p. 385, doi. 10.3390/coatings13020385
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- Article
X-ray Reflectometry of Thin Films Formed during Phase Separation of Organic Solutions of Aliphatic Polyethers in Water.
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- Crystallography Reports, 2023, v. 68, n. 1, p. 104, doi. 10.1134/S1063774523010029
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- Article
Application of Grazing-Incidence X-ray Methods to Study Terrace-Stepped SiC Surface for Graphene Growth.
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- Materials (1996-1944), 2022, v. 15, n. 21, p. 7669, doi. 10.3390/ma15217669
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- Article
Structural and Magnetic Specificities of Fe-B Thin Films Obtained by Thermionic Vacuum Arc and Magnetron Sputtering.
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- Coatings (2079-6412), 2022, v. 12, n. 10, p. 1592, doi. 10.3390/coatings12101592
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- Article
Poly(vinylidene fluoride‐co‐trifluoroethylene) Thin Films after Dip‐ and Spin‐Coating.
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- Macromolecular Materials & Engineering, 2022, v. 307, n. 10, p. 1, doi. 10.1002/mame.202200296
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Complementary Insights from Neutron and Resonant X‐Ray Reflectometry for the Study of Perovskite Transition Metal Oxide Heterostructures.
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- Physica Status Solidi (B), 2022, v. 259, n. 5, p. 1, doi. 10.1002/pssb.202100253
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- Article
Reference‐Free Combined X‐Ray Reflectometry−Grazing Incidence X‐Ray Fluorescence at the French Synchrotron SOLEIL.
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- Physica Status Solidi. A: Applications & Materials Science, 2022, v. 219, n. 9, p. 1, doi. 10.1002/pssa.202100423
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- Article
Review on the thickness measurement of ultrathin oxide films by mutual calibration method.
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- Surface & Interface Analysis: SIA, 2022, v. 54, n. 4, p. 405, doi. 10.1002/sia.7040
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- Article
Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation.
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- Coatings (2079-6412), 2022, v. 12, n. 2, p. 290, doi. 10.3390/coatings12020290
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- Article
Defect Passivation and Carrier Reduction Mechanisms in Hydrogen-Doped In-Ga-Zn-O (IGZO:H) Films upon Low-Temperature Annealing for Flexible Device Applications.
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- Materials (1996-1944), 2022, v. 15, n. 1, p. 334, doi. 10.3390/ma15010334
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- Article
Effect of Periodic Modulation of Tungsten Oxide Magnetron Deposition Angle upon the Obtained Layer Structure according to X-Ray Reflectometry Measurements.
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- Glass Physics & Chemistry, 2021, v. 47, n. 1, p. S63, doi. 10.1134/S1087659621070075
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- Article
Surface Topography of Si/TiO 2 Stacked Layers on Silicon Substrate Deposited by KrF Excimer Laser Ablation.
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- Coatings (2079-6412), 2021, v. 11, n. 11, p. 1350, doi. 10.3390/coatings11111350
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Determination of the Parameters of Films Formed on the Liquid Subphase According to Reflectometry Data.
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- Crystallography Reports, 2021, v. 66, n. 6, p. 1082, doi. 10.1134/S1063774521060031
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- Article
Plasma Enhanced Atomic Layer Deposition of Tantalum (V) Oxide.
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- Coatings (2079-6412), 2021, v. 11, n. 10, p. 1206, doi. 10.3390/coatings11101206
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- Article
High-Precision Characterization of Super-Multiperiod AlGaAs/GaAs Superlattices Using X-Ray Reflectometry on a Synchrotron Source.
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- Technical Physics Letters, 2021, v. 47, n. 10, p. 757, doi. 10.1134/S1063785021080071
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- Article
The Effect of the Deposition Method on the Structural and Optical Properties of ZnS Thin Films.
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- Coatings (2079-6412), 2021, v. 11, n. 9, p. 1064, doi. 10.3390/coatings11091064
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- Article
Synthesis and Characterization of Cu 2 ZnSnS 4 Thin Films Obtained by Combined Magnetron Sputtering and Pulsed Laser Deposition.
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- Nanomaterials (2079-4991), 2021, v. 11, n. 9, p. 2403, doi. 10.3390/nano11092403
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Methodological Approaches to Research of Multilayer Thin-Film Systems and Interfaces in Composite Materials.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 618, doi. 10.1134/S106377452104012X
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- Article
Mutually Beneficial Combination of Molecular Dynamics Computer Simulations and Scattering Experiments.
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- Membranes, 2021, v. 11, n. 7, p. 507, doi. 10.3390/membranes11070507
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- Article
Structure and Oligonucleotide Binding Efficiency of Differently Prepared Click Chemistry-Type DNA Microarray Slides Based on 3-Azidopropyltrimethoxysilane.
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- Materials (1996-1944), 2021, v. 14, n. 11, p. 2855, doi. 10.3390/ma14112855
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- Article
Towards a neutron and X-ray reflectometry environment for the study of solid–liquid interfaces under shear.
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- Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-89189-1
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- Article
Low-Angle X-Ray Spectroscopy and Reflectometry Techniques in Interdisciplinary Applications.
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- Acta Physica Polonica: A, 2021, v. 139, n. 3, p. 247, doi. 10.12693/APhysPolA.139.247
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- Article
Internal Structure and Temporal Stability of Hard X-ray Pd/B 4 C Multilayer Mirrors under Different Humidity Environments.
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- Coatings (2079-6412), 2021, v. 11, n. 3, p. 262, doi. 10.3390/coatings11030262
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- Article
Improving the soft X‐ray reflectivity of Cr/Ti multilayers by co‐deposition of B<sub>4</sub>C.
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- Journal of Synchrotron Radiation, 2020, v. 27, n. 6, p. 1614, doi. 10.1107/S1600577520011741
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- Article
Deep X-Ray Reflectometry of Supermultiperiod A<sub>3</sub>B<sub>5</sub> Structures with Quantum Wells Grown by Molecular-Beam Epitaxy.
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- Technical Physics, 2020, v. 65, n. 11, p. 1822, doi. 10.1134/S1063784220110134
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- Article
Assessment of Potential of the High-Voltage Anodic Plasma Source to Deposit Multilayer Structures Relevant to X-ray Mirror Applications.
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- Coatings (2079-6412), 2020, v. 10, n. 6, p. 531, doi. 10.3390/coatings10060531
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- Article
Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO<sub>2</sub> Nanolayers, Unmodified and Irradiated with Xe<sup>q+</sup> Ions.
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- Acta Physica Polonica: A, 2020, v. 137, n. 1, p. 28, doi. 10.12693/APhysPolA.137.38
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- Article
Matched X-Ray Reflectometry and Diffractometry of Super-Multiperiod Heterostructures Grown by Molecular Beam Epitaxy.
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- Semiconductors, 2019, v. 53, n. 14, p. 1910, doi. 10.1134/S1063782619140082
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- Article
Photoluminescence and Transmission Electron Microscopy Methods for Characterization of Super-Multiperiod A3B5 Quantum Well Structures.
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- Semiconductors, 2019, v. 53, n. 14, p. 1914, doi. 10.1134/S1063782619140094
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- Article
Reflectometry Reveals Accumulation of Surfactant Impurities at Bare Oil/Water Interfaces.
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- Molecules, 2019, v. 24, n. 22, p. 4113, doi. 10.3390/molecules24224113
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- Article
Probing Surface Morphology using X-ray Grating Interferometry.
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- Scientific Reports, 2019, v. 9, n. 1, p. N.PAG, doi. 10.1038/s41598-019-50486-5
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- Article
Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2019, v. 22, n. 4, p. 444, doi. 10.15407/spqeo22.04.444
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- Article
Comparison of Transmission Electron Microscopy and X-Ray Reflectometry Data in the Study of the Structure of Silicon-Carbon Nanocomposite Films.
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- Crystallography Reports, 2019, v. 64, n. 5, p. 793, doi. 10.1134/S1063774519050031
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- Article
X-Ray Reflectometry of the Adsorption Octadecanamide Film at the Toluene–Water Interface.
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- Journal of Experimental & Theoretical Physics, 2019, v. 129, n. 3, p. 368, doi. 10.1134/S1063776119090061
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- Article
Influence of contamination layer on thickness evaluation by X‐ray reflectometry.
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- XRS: X-ray Spectrometry, 2019, v. 48, n. 5, p. 345, doi. 10.1002/xrs.3006
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- Article