Works matching DE "WAVEGUIDES"
1
- Laser & Photonics Reviews, 2025, v. 19, n. 12, p. 1, doi. 10.1002/lpor.202401627
- Wang, Hongwei;
- Sun, Lu;
- Li, Jingchi;
- Wang, Zhen;
- Pu, Zijian;
- He, Yu;
- Zhang, Yong;
- Hu, Xiao;
- Yuan, Luqi;
- Dong, Jianwen;
- Hu, Guangwei;
- Su, Yikai
- Article
2
- European Physical Journal D (EPJ D), 2025, v. 79, n. 5, p. 1, doi. 10.1140/epjd/s10053-025-00998-9
- Liu, Fuhai;
- Li, Yanling;
- Tao, Yong;
- Zheng, Mingfeng;
- Mao, Mingke;
- Zhang, Changchang;
- Gu, Manna;
- Zhang, Peng
- Article
3
- Plasmonics, 2025, v. 20, n. 6, p. 3563, doi. 10.1007/s11468-024-02564-2
- Yang, Ya;
- Zhang, Youjia;
- Hu, Shuangxiao;
- Yang, Nan;
- Teng, Da
- Article
4
- Plasmonics, 2025, v. 20, n. 6, p. 4257, doi. 10.1007/s11468-024-02562-4
- Article
5
- Plasmonics, 2025, v. 20, n. 6, p. 3281, doi. 10.1007/s11468-024-02542-8
- Article
6
- Plasmonics, 2025, v. 20, n. 6, p. 3455, doi. 10.1007/s11468-024-02541-9
- Haddadan, Fatemeh;
- Soroosh, Mohammad;
- Basem, Ali;
- Kenjrawy, Hassan A.
- Article
7
- Quantum Information Processing, 2025, v. 24, n. 5, p. 1, doi. 10.1007/s11128-025-04775-w
- Zhou, Yi-Jia;
- Zhang, Bai-Yun;
- Liu, Shuai;
- He, Ze-Long;
- Li, Ya-dong;
- Dang, Sui-Hu;
- Ran, Du
- Article
8
- Photonics, 2025, v. 12, n. 5, p. 491, doi. 10.3390/photonics12050491
- Liu, Fumin;
- Zhang, Xue;
- Wang, Tianyue;
- Huang, Guanghao
- Article
9
- Photonics, 2025, v. 12, n. 5, p. 476, doi. 10.3390/photonics12050476
- Li, Zhen;
- Fu, Xin;
- Yang, Lin
- Article
10
- Nanophotonics (21928606), 2025, v. 14, n. 10, p. 1665, doi. 10.1515/nanoph-2024-0755
- Binkowski, Felix;
- Betz, Fridtjof;
- Hammerschmidt, Martin;
- Zschiedrich, Lin;
- Burger, Sven
- Article
11
- Nanophotonics (21928606), 2025, v. 14, n. 10, p. 1509, doi. 10.1515/nanoph-2024-0732
- Ren, Linhao;
- Wang, Wenyu;
- Xu, Kang;
- Zhu, Liying;
- Wang, Jun;
- Shi, Lei;
- Zhang, Xinliang
- Article
12
- Chemistry - A European Journal, 2023, v. 29, n. 72, p. 1, doi. 10.1002/chem.202302524
- Tardío, Carlos;
- Donoso, Beatriz;
- Fernández, Pablo;
- Torres‐Moya, Iván
- Article
13
- Chemistry - A European Journal, 2020, v. 26, n. 52, p. 11979, doi. 10.1002/chem.202002641
- Naim, Khalid;
- Singh, Manjeet;
- Sharma, Sachin;
- Nair, Rajesh V.;
- Venugopalan, Paloth;
- Chandra Sahoo, Subash;
- Neelakandan, Prakash P.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 18, p. 16983, doi. 10.1007/s10854-019-02087-1
- Prajzler, Václav;
- Neruda, Miloš;
- Květoň, Milan
- Article
15
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 18, p. 16843, doi. 10.1007/s10854-019-01406-w
- Santos, Molíria V.;
- Santos, Sabrina N. C.;
- Martins, Renato J.;
- Almeida, Juliana M. P.;
- Paula, Kelly T.;
- Almeida, Gustavo F. B.;
- Ribeiro, Sidney J. L.;
- Mendonça, Cleber R.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 14, p. 11886, doi. 10.1007/s10854-018-9289-4
- Feng, Tuanhui;
- Han, Hongpei;
- Wang, Limin;
- Yang, Fei;
- Zhang, Feiyun
- Article
17
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 7, p. 5878, doi. 10.1007/s10854-018-8560-z
- Prajzler, Václav;
- Neruda, Miloš;
- Nekvindová, Pavla
- Article
18
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4777, doi. 10.1007/s10854-016-4358-z
- Article
19
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 844, doi. 10.1007/s10854-009-0005-2
- Wen-Ching Shih;
- Ming-Han Chiang
- Article
20
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 445, doi. 10.1007/s10854-009-9936-x
- Young Chae Yoo;
- Kim, Lee-Hyun;
- Il Ki Han
- Article
21
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 2, p. 192, doi. 10.1007/s10854-009-9892-5
- Murali, K. P.;
- Rajesh, S.;
- Jacob, K. Stanly;
- Prakash, Om;
- Kulkarni, A. R.;
- Ratheesh, R.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 695, doi. 10.1007/s10854-008-9787-x
- Fuke, Madhavi V.;
- Vijayan, Anu;
- Kanitkar, Prajakta;
- Kulkarni, Milind;
- Kale, B. B.;
- Aiyer, R. C.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 48, doi. 10.1007/s10854-007-9434-y
- Walters, W. David;
- Knights, Andy P.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 290, doi. 10.1007/s10854-008-9584-6
- Vlcek, Miroslav;
- Schroeter, Siegmund;
- Brueckner, Sven;
- Fehling, Sandra;
- Fiserova, Alena
- Article
25
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 456, doi. 10.1007/s10854-008-9669-2
- Jessop, P. E.;
- Rowe, L. K.;
- McFaul, S. M.;
- Knights, A. P.;
- Tarr, N. G.;
- Tam, A.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 195, doi. 10.1007/s10854-007-9536-6
- Kong, D. L. H.;
- Travis, A. R. L.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 371, doi. 10.1007/s10854-007-9239-z
- Salavcova, Linda;
- Ondracek, Frantisek;
- Spirkova, Jarmila;
- Mika, Martin
- Article
28
- Journal of Biological Physics, 2003, v. 29, n. 2/3, p. 287, doi. 10.1023/A:1024417531233
- Torosyan, G.;
- Nerkararyan, K.;
- Avetisyan, Y.;
- Beigang, R.
- Article
29
- Geotechnical & Geological Engineering, 2024, v. 42, n. 1, p. 307, doi. 10.1007/s10706-023-02573-8
- Wang, Wei;
- Song, Liangjun;
- You, Quanwei;
- Zheng, Xudong
- Article
30
- Experimental Astronomy, 2018, v. 46, n. 3, p. 433, doi. 10.1007/s10686-018-9589-y
- Labadie, Lucas;
- Minardi, Stefano;
- Martín, Guillermo;
- Thomson, Robert R.
- Article
31
- Experimental Astronomy, 2016, v. 42, n. 3, p. 285, doi. 10.1007/s10686-016-9510-5
- Feger, Tobias;
- Ireland, Michael;
- Schwab, Christian;
- Bento, Joao;
- Bacigalupo, Carlos;
- Coutts, David
- Article
32
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2014, v. 14, n. 1, p. 695, doi. 10.1002/pamm.201410330
- Schaal, Christoph;
- Hanss, Michael
- Article
33
- Numerical Methods for Partial Differential Equations, 2014, v. 30, n. 2, p. 490, doi. 10.1002/num.21821
- Article
34
- Microwave & Optical Technology Letters, 1988, v. 1, n. 8, p. 305, doi. 10.1002/mop.4650010809
- Article
35
- Microwave & Optical Technology Letters, 1988, v. 1, n. 6, p. 208, doi. 10.1002/mop.4650010607
- Article
36
- Microwave & Optical Technology Letters, 1988, v. 1, n. 6, p. 194, doi. 10.1002/mop.4650010604
- Englert, Thad J.;
- Flohr, Mark C.
- Article
37
- Microwave & Optical Technology Letters, 1988, v. 1, n. 6, p. 189, doi. 10.1002/mop.4650010602
- Chang, K.;
- Pandey, R. K.;
- Skrehot, M. K.;
- Li, M.;
- Gilbert, G. R.
- Article
38
- Microwave & Optical Technology Letters, 1988, v. 1, n. 3, p. 93, doi. 10.1002/mop.4650010305
- Article
39
- Microwave & Optical Technology Letters, 1988, v. 1, n. 1, p. 26, doi. 10.1002/mop.4650010111
- Lo, V. T.;
- Oberhart, M. L.;
- Brenneman, J. S.;
- Aoyagi, P.;
- Moore, J.;
- Lee, R. Q. H.
- Article
40
- Microwave & Optical Technology Letters, 1988, v. 1, n. 1, p. 20, doi. 10.1002/mop.4650010109
- Lee, S.;
- Horton, T.;
- Figueroa, L.
- Article
41
- Microwave & Optical Technology Letters, 1988, v. 1, n. 1, p. 1, doi. 10.1002/mop.4650010102
- Article
42
- Computational Mechanics, 2025, v. 75, n. 1, p. 15, doi. 10.1007/s00466-024-02488-y
- Baler, Ufuk Tan;
- Okyar, Ali Fethi;
- Abali, Bilen Emek
- Article
43
- Applied Microbiology & Biotechnology, 2009, v. 83, n. 3, p. 397, doi. 10.1007/s00253-009-2014-8
- Müller, Werner;
- Wang, Xiaohong;
- Cui, Fu-Zhai;
- Jochum, Klaus;
- Tremel, Wolfgang;
- Bill, Joachim;
- Schröder, Heinz;
- Natalio, Filipe;
- Schloßmacher, Ute;
- Wiens, Matthias
- Article
44
- Strength of Materials, 2018, v. 50, n. 6, p. 852, doi. 10.1007/s11223-019-00031-6
- Hart, E. L.;
- Hudramovich, V. S.
- Article
45
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 8, p. 666, doi. 10.1134/S1061830922080058
- Glushkov, E. V.;
- Glushkova, N. V.;
- Ermolenko, O. A.
- Article
46
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 9, p. 762, doi. 10.1134/S1061830921090084
- Ranjbar Naserabadi, M. J.;
- Sina Sodagar
- Article
47
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 11, p. 817, doi. 10.1134/S106183091911010X
- Yingsi Wu;
- Liu, Fei;
- Wang, Xiaodong;
- Du, Wenliang
- Article
48
- Russian Journal of Nondestructive Testing, 2016, v. 52, n. 2, p. 78, doi. 10.1134/S1061830916020066
- Murav'eva, O.;
- Len'kov, S.;
- Murav'ev, V.;
- Myshkin, Yu.;
- Murashov, S.
- Article
49
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 2, p. 93, doi. 10.1134/S1061830913020058
- Article
50
- Measurement Techniques, 2022, v. 65, n. 6, p. 391, doi. 10.1007/s11018-022-02095-4
- Koudelny, A. V.;
- Malay, I. M.;
- Matveev, A. I.;
- Perepelkin, V. A.;
- Chirkov, I. P.
- Article