Works matching DE "VSM (Company)"

The Impact of Classifier Configuration and Classifier Combination on Bug Localization.

Published in:

IEEE Transactions on Software Engineering, 2013, v. 39, n. 10, p. 1427, doi. 10.1109/TSE.2013.27

By:

• Thomas, Stephen W.;
• Nagappan, Meiyappan;
• Blostein, Dorothea;
• Hassan, Ahmed E.

Publication type:

Article