Works matching DE "VOLTA effect"
Results: 32
On the Volta potential measured by SKPFM - fundamental and practical aspects with relevance to corrosion science.
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- Corrosion Engineering, Science & Technology, 2019, v. 54, n. 3, p. 185, doi. 10.1080/1478422X.2019.1583436
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Work function dynamics in activated thermionic cathode.
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- Technical Physics Letters, 2010, v. 36, n. 7, p. 679, doi. 10.1134/S106378501007028X
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Substantiation and guaranteeing of technological parameters of triboelectrical method of monitoring of cables with polymer insulation.
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- Electrical Engineering & Electromechanics, 2014, n. 6, p. 56, doi. 10.20998/2074-272x.2014.6.10
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Study of optimization of the barrel cam in a paper-cup-forming machine.
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- Journal of Mechanical Science & Technology, 2012, v. 26, n. 9, p. 2679, doi. 10.1007/s12206-012-0718-7
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Influence of Barrier Width on Spin-Polarisation Measured by Point Contact Andreev Reflection.
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- Journal of Superconductivity & Novel Magnetism, 2011, v. 24, n. 1/2, p. 939, doi. 10.1007/s10948-010-0888-4
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The infiniteness of the number of eigenvalues in the gap in the essential spectrum for the three-particle Schrödinger operator on a lattice.
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- Theoretical & Mathematical Physics, 2009, v. 159, n. 2, p. 667, doi. 10.1007/s11232-009-0054-y
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Seeing Down to the Bottom: Nondestructive Inspection of All-Polymer Solar Cells by Kelvin Probe Force Microscopy.
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- Advanced Materials Interfaces, 2016, v. 3, n. 18, p. n/a, doi. 10.1002/admi.201600446
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Jumps of the Contact-Potential Difference in a Magnetic Field and the Electron Energy Spectrum of Superlattices.
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- Doklady Physics, 2004, v. 49, n. 7, p. 409, doi. 10.1134/1.1784853
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Work function dependence on the thickness and substrate of carbon contamination layers by Kelvin probe force microscopy.
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- Philosophical Magazine Letters, 2003, v. 83, n. 7, p. 441, doi. 10.1080/0950083031000137857
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Measurement of potential distribution function on object surface by using an electron microscope in the mirror operation mode.
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- Journal of Microscopy, 2010, v. 238, n. 1, p. 90, doi. 10.1111/j.1365-2818.2009.03340.x
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Scanning Kelvin probe study of photolabile silane surface modification of indium tin oxide.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 9, p. 1347, doi. 10.1002/sia.5288
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Development of An Automatic Approaching System for Electrochemical Nanofabrication Using Visual and Force-Displacement Sensing.
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- Sensors (14248220), 2012, v. 12, n. 7, p. 8465, doi. 10.3390/s120708465
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Electron work function of LaNiT ( T = Al, Cu, Fe; x = 0, 1) intermetallics.
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- Technical Physics, 2012, v. 57, n. 9, p. 1266, doi. 10.1134/S1063784212090149
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PATH INTEGRAL DERIVATION OF THE GROUND STATE ENERGY OF THE INTERACTING PARTICLES IN A HARMONIC TRAP.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2003, v. 17, n. 31/32, p. 5983, doi. 10.1142/S0217979203023215
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Combination of scoring functions improves discrimination in proteinprotein docking.
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- Proteins, 2003, v. 53, n. 4, p. 840, doi. 10.1002/prot.10473
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Nanoscale Characterization of Active Doping Concentration in Boron‐Doped Individual Si Nanocrystals (Phys. Status Solidi A 23∕2018).
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- Physica Status Solidi. A: Applications & Materials Science, 2018, v. 215, n. 23, p. N.PAG, doi. 10.1002/pssa.201870052
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Suitability of Various Materials for Probes in Scanning Kelvin Probe Measurements.
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- Physica Status Solidi. A: Applications & Materials Science, 2018, v. 215, n. 15, p. 1, doi. 10.1002/pssa.201700952
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Investigation of barrier height distributions over the gate area of Al-SiO<sub>2</sub>-Si structures.
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- Journal of Telecommunications & Information Technology, 2007, v. 2007, n. 3, p. 49, doi. 10.26636/jtit.2007.3.829
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Bullied no more: when and how DNA shoves proteins around.
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- Quarterly Reviews of Biophysics, 2012, v. 45, n. 3, p. 257, doi. 10.1017/S0033583512000054
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A COMPARISON OF DIFFERENT SOLUTION ALGORITHMS FOR THE NUMERICAL ANALYSIS OF VEHICLE-BRIDGE INTERACTION.
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- International Journal of Structural Stability & Dynamics, 2014, v. 14, n. 2, p. -1, doi. 10.1142/S021945541350065X
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Studies in the Electrical Double Layer at Metal/Polymer Interfaces by Scanning Capacitive Probe.
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- Protection of Metals, 2003, v. 39, n. 1, p. 55, doi. 10.1023/A:1021995208966
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On the Role of Tunneling in Metal–Semiconductor Nanocontacts.
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- Journal of Experimental & Theoretical Physics, 2004, v. 99, n. 1, p. 211, doi. 10.1134/1.1787094
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β-sheet Topology Prediction with High Precision and Recall for β and Mixed α/β Proteins.
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- PLoS ONE, 2012, v. 7, n. 3, p. 1, doi. 10.1371/journal.pone.0032461
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Investigation of surface potential in the V-defect region of MBE CdHgTe film.
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- Semiconductors, 2015, v. 49, n. 3, p. 309, doi. 10.1134/S106378261503015X
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Semiconductor surface potential relaxation in the MIS structure in the presence of convective currents in insulator and through its boundaries.
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- Semiconductors, 2011, v. 45, n. 2, p. 188, doi. 10.1134/S1063782611020072
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Irreversible structure transitions in Gd monolayers on Mo(112).
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- European Physical Journal B: Condensed Matter, 2009, v. 71, n. 1, p. 47, doi. 10.1140/epjb/e2009-00285-1
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ON THE MOTION OF PLANAR BARS SYSTEMS WITH CLEARANCES IN JOINTS.
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- Fiability & Durability / Fiabilitate si Durabilitate, 2009, n. 1, p. 79
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Surface potentials on Pd/GaAs contacts studied using scanning probe microscopy.
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- Applied Physics A: Materials Science & Processing, 1998, v. 66, n. 7, p. S1059, doi. 10.1007/s003390051297
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The Peculiarities of Contact Potential Difference and Energy Characteristics of Metal Boundaries.
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- Nanosistemi, Nanomateriali, Nanotehnologii, 2017, v. 15, n. 4, p. 703, doi. 10.15407/nnn.15.04.0703
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EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative.
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- Scientific Reports, 2013, p. 1, doi. 10.1038/srep03352
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General Route to ZnO Nanorod Arrays on Conducting Substrates via Galvanic-cell-based approach.
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- Scientific Reports, 2013, p. 1, doi. 10.1038/srep02434
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- Article
Early Detection of New Microcracks on Aluminum and Aluminum Alloys Caused by a Fatigue.
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- Electrical Engineering in Japan, 1985, v. 105, n. 1, p. 1, doi. 10.1002/eej.4391050101
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- Article