Works matching DE "VAPOR phase epitaxial growth"
1
- Biotechnic & Histochemistry, 2014, v. 89, n. 7, p. 518, doi. 10.3109/10520295.2014.904927
- Auer, H;
- Mobley, JA;
- Ayers, LW;
- Bowen, J;
- Chuaqui, RF;
- Johnson, LA;
- Livolsi, VA;
- Lubensky, IA;
- McGarvey, D;
- Monovich, LC;
- Moskaluk, CA;
- Rumpel, CA;
- Sexton, KC;
- Washington, MK;
- Wiles, KR;
- Grizzle, WE;
- Ramirez, NC
- Article
2
- Macromolecular Rapid Communications, 2014, v. 35, n. 23, p. 2000, doi. 10.1002/marc.201400436
- Haller, Patrick D.;
- Gupta, Malancha
- Article
3
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 8, p. 6008, doi. 10.1007/s10854-016-6276-5
- Cui, Shuang;
- Zhang, Yuantao;
- Huang, Zhen;
- Deng, Gaoqiang;
- Li, Baozhu;
- Chang, Yuchun;
- Zhao, Degang
- Article
4
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4380, doi. 10.1007/s10854-015-2939-x
- Article
5
- Inorganic Materials, 2017, v. 53, n. 4, p. 369, doi. 10.1134/S0020168517040124
- Maksimov, A.;
- Eistrikh-Geller, V.;
- Marmalyuk, A.;
- Ladugin, M.;
- Bagaev, T.;
- Gorlachuk, P.;
- Yarotskaya, I.
- Article
6
- Inorganic Materials, 2014, v. 50, n. 2, p. 205, doi. 10.1134/S0020168514020149
- Article
7
- Advanced Electronic Materials, 2016, v. 2, n. 11, p. 1, doi. 10.1002/aelm.201600298
- Li, Bo;
- Huang, Le;
- Zhong, Mianzeng;
- Li, Yan;
- Wang, Yan;
- Li, Jingbo;
- Wei, Zhongming
- Article
8
- Modares Mechanical Engineering, 2015, v. 15, n. 3, p. 303
- Rabiee, Ataollah;
- Atf, Alireza
- Article
9
- Applied Nanoscience, 2018, v. 8, n. 5, p. 1043, doi. 10.1007/s13204-018-0724-x
- Lee, Dongjin;
- Jeon, H. C.;
- Kang, T. W.;
- Kumar, Sunil
- Article
10
- Physica Status Solidi - Rapid Research Letters, 2018, v. 12, n. 8, p. 1, doi. 10.1002/pssr.201800124
- Barry, Ousmane I.;
- Lekhal, Kaddour;
- Bae, Si‐Young;
- Lee, Ho‐Jun;
- Pristovsek, Markus;
- Honda, Yoshio;
- Amano, Hiroshi
- Article
11
- Physica Status Solidi - Rapid Research Letters, 2018, v. 12, n. 8, p. 1, doi. 10.1002/pssr.201800124
- Barry, Ousmane I.;
- Lekhal, Kaddour;
- Bae, Si‐Young;
- Lee, Ho‐Jun;
- Pristovsek, Markus;
- Honda, Yoshio;
- Amano, Hiroshi
- Article
12
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 3, p. 269, doi. 10.1002/pssr.201308331
- Ghalamestani, Sepideh Gorji;
- Ek, Martin;
- Dick, Kimberly A.
- Article
13
- Physica Status Solidi - Rapid Research Letters, 2013, v. 7, n. 6, p. 443, doi. 10.1002/pssr.201307116
- Kúdela, Róbert;
- Šoltýs, Ján;
- Vincze, Andrej;
- Novák, Jozef
- Article
14
- Optica Applicata, 2016, v. 46, n. 2, p. 241, doi. 10.5277/oa160208
- BADURA, MIKOŁAJ;
- BIELAK, KATARZYNA;
- ŚCIANA, BEATA;
- RADZIEWICZ, DAMIAN;
- PUCICKI, DAMIAN;
- DAWIDOWSKI, WOJCIECH;
- ŻELAZNA, KAROLINA;
- KUDRAWIEC, ROBERT;
- TŁACZAŁA, MAREK
- Article
15
- Optica Applicata, 2016, v. 46, n. 2, p. 255, doi. 10.5277/oa160210
- PUCICKI, DAMIAN;
- BIELAK, KATARZYNA;
- DAWIDOWSKI, WOJCIECH;
- ŚCIANA, BEATA;
- TŁACZAŁA, MAREK
- Article
16
- Optica Applicata, 2013, v. 43, n. 1, p. 73, doi. 10.5277/oa130110
- KORBUTOWICZ, RYSZARD;
- WNĘK, JAN;
- PANACHIDA, PAWEL;
- SERAFIŃCZUK, JAROSŁAW;
- SRNANEK, RUDOLF
- Article
17
- Semiconductors, 2018, v. 52, n. 12, p. 1590, doi. 10.1134/S1063782618120163
- Maremyanin, K. V.;
- Ikonnikov, A. V.;
- Bovkun, L. S.;
- Rumyantsev, V. V.;
- Chizhevskii, E. G.;
- Zasavitskii, I. I.;
- Gavrilenko, V. I.
- Article
18
- Semiconductors, 2018, v. 52, n. 12, p. 1525, doi. 10.1134/S1063782618120096
- Gorshkov, A. P.;
- Volkova, N. S.;
- Pavlov, D. A.;
- Usov, Yu. V.;
- Istomin, L. A.;
- Levichev, S. B.
- Article
19
- Semiconductors, 2018, v. 52, n. 11, p. 1412, doi. 10.1134/S106378261811026X
- Yunin, P. A.;
- Drozdov, Yu. N.;
- Khrykin, O. I.;
- Grigoryev, V. A.
- Article
20
- Semiconductors, 2018, v. 52, n. 8, p. 1012, doi. 10.1134/S1063782618080195
- Seredin, P. V.;
- Goloshchapov, D. L.;
- Zolotukhin, D. S.;
- Lenshin, A. S.;
- Lukin, A. N.;
- Khudyakov, Yu. Yu.;
- Arsentyev, I. N.;
- Zhabotinsky, A. V.;
- Nikolaev, D. N.;
- Pikhtin, N. A.
- Article
21
- Semiconductors, 2017, v. 51, n. 13, p. 1692, doi. 10.1134/S1063782617130127
- Sokolov, E. M.;
- Fedotov, S. D.;
- Statsenko, V. N.;
- Timoshenkov, S. P.;
- Emelyanov, A. V.
- Article
22
- Semiconductors, 2016, v. 50, n. 13, p. 1697, doi. 10.1134/S1063782616130108
- Article
23
- Semiconductors, 2016, v. 50, n. 11, p. 1439, doi. 10.1134/S1063782616110075
- Daniltsev, V.;
- Demidov, E.;
- Drozdov, M.;
- Drozdov, Yu.;
- Kraev, S.;
- Surovegina, E.;
- Shashkin, V.;
- Yunin, P.
- Article
24
- Semiconductors, 2016, v. 50, n. 4, p. 541, doi. 10.1134/S1063782616040217
- Sharofidinov, Sh.;
- Nikolaev, V.;
- Smirnov, A.;
- Chikiryaka, A.;
- Nikitina, I.;
- Odnoblyudov, M.;
- Bugrov, V.;
- Romanov, A.
- Article
25
- Semiconductors, 2015, v. 49, n. 10, p. 1341, doi. 10.1134/S1063782615100127
- Lebedev, A.;
- Belov, S.;
- Mynbaeva, M.;
- Strel'chuk, A.;
- Bogdanova, E.;
- Makarov, Yu.;
- Usikov, A.;
- Kurin, S.;
- Barash, I.;
- Roenkov, A.;
- Kozlovski, V.
- Article
26
- Semiconductors, 2014, v. 48, n. 11, p. 1432, doi. 10.1134/S1063782614110153
- Makhniy, V.;
- German, I.;
- Parfenyuk, O.
- Article
27
- Semiconductors, 2014, v. 48, n. 5, p. 649, doi. 10.1134/S1063782614050042
- Article
28
- Semiconductors, 2014, v. 48, n. 2, p. 245, doi. 10.1134/S1063782614020262
- Solomonov, A.;
- Tarasov, S.;
- Men'kovich, E.;
- Lamkin, I.;
- Kurin, S.;
- Antipov, A.;
- Barash, I.;
- Roenkov, A.;
- Helava, H.;
- Makarov, Yu.
- Article
29
- Energy Sources Part A: Recovery, Utilization & Environmental Effects, 2016, v. 38, n. 12, p. 1706, doi. 10.1080/15567036.2014.975298
- Ahmadi, M. A.;
- Soleimani, R.;
- Bahadori, A.
- Article
30
- Journal of Electronic Materials, 2019, v. 48, n. 1, p. 454, doi. 10.1007/s11664-018-6728-1
- Iso, Kenji;
- Gokudan, Yuya;
- Shiraishi, Masumi;
- Nishikado, Minae;
- Murakami, Hisashi;
- Koukitu, Akinori
- Article
31
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4277, doi. 10.1007/s11664-018-6190-0
- Concepción, O.;
- Escobosa, A.;
- de Melo, O.
- Article
32
- Journal of Electronic Materials, 2018, v. 47, n. 2, p. 910, doi. 10.1007/s11664-017-5937-3
- Marx, M.;
- Grundmann, A.;
- Lin, Y.-R.;
- Andrzejewski, D.;
- Kümmell, T.;
- Bacher, G.;
- Heuken, M.;
- Kalisch, H.;
- Vescan, A.
- Article
33
- Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1612, doi. 10.1007/s11664-016-5204-z
- Barchuk, M.;
- Lukin, G.;
- Zimmermann, F.;
- Röder, C.;
- Motylenko, M.;
- Pätzold, O.;
- Heitmann, J.;
- Kortus, J.;
- Rafaja, D.
- Article
34
- Journal of Electronic Materials, 2016, v. 45, n. 10, p. 4782, doi. 10.1007/s11664-016-4726-8
- Chen, Jianli;
- Cheng, Hongjuan;
- Zhang, Song;
- Lan, Feifei;
- Qi, Chengjun;
- Xu, Yongkuan;
- Wang, Zaien;
- Li, Jing;
- Lai, Zhanping
- Article
35
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2178, doi. 10.1007/s11664-015-4305-4
- Reshchikov, M.;
- Usikov, A.;
- Helava, H.;
- Makarov, Yu.;
- Puzyk, M.;
- Papchenko, B.
- Article
36
- Journal of Electronic Materials, 2015, v. 44, n. 5, p. 1263, doi. 10.1007/s11664-014-3474-x
- Wille, Ada;
- Yacoub, Hady;
- Debald, Arne;
- Kalisch, Holger;
- Vescan, Andrei
- Article
37
- Journal of Electronic Materials, 2015, v. 44, n. 5, p. 1281, doi. 10.1007/s11664-014-3540-4
- Reshchikov, M.A.;
- Usikov, A.;
- Helava, H.;
- Makarov, Yu.
- Article
38
- Journal of Electronic Materials, 2014, v. 43, n. 7, p. 2715, doi. 10.1007/s11664-014-3225-z
- Sui, Yanping;
- Wang, Bin;
- Zhao, Zhide;
- Xu, Wei;
- Li, Xiaoliang;
- Yu, Guanghui;
- Wang, Xinzhong
- Article
39
- Journal of Electronic Materials, 2014, v. 43, n. 3, p. 786, doi. 10.1007/s11664-013-2920-5
- Zhao, Z.;
- Wang, B.;
- Sui, Y.;
- Xu, W.;
- Li, X.;
- Yu, G.
- Article
40
- Journal of Electronic Materials, 2013, v. 42, n. 5, p. 820, doi. 10.1007/s11664-012-2373-2
- Richter, E.;
- Stoica, T.;
- Zeimer, U.;
- Netzel, C.;
- Weyers, M.;
- Tränkle, G.
- Article
41
- Advanced Functional Materials, 2014, v. 24, n. 24, p. 3827, doi. 10.1002/adfm.201304129
- Hildreth, Owen J.;
- Schmidt, Daniel R.
- Article
42
- Advanced Functional Materials, 2014, v. 24, n. 14, p. 2072, doi. 10.1002/adfm.201302940
- Duan, Jingjing;
- Chen, Sheng;
- Dai, Sheng;
- Qiao, Shi Zhang
- Article
43
- Technical Physics, 2014, v. 59, n. 7, p. 1101, doi. 10.1134/S1063784214070056
- Belyaev, A.;
- Rubets, V.;
- Antipov, V.;
- Bordei, N.
- Article
44
- Technical Physics, 2013, v. 58, n. 7, p. 1034, doi. 10.1134/S106378421307027X
- Vlasov, A.;
- Khvostikov, V.;
- Karlina, L.;
- Sorokina, S.;
- Potapovich, N.;
- Shvarts, M.;
- Timoshina, N.;
- Lantratov, V.;
- Mintairov, S.;
- Kalyuzhnyi, N.;
- Marukhina, E.;
- Andreev, V.
- Article
45
- Journal of Analytical Chemistry, 2018, v. 73, n. 2, p. 109, doi. 10.1134/S1061934818020090
- Platonov, I. A.;
- Rodinkov, O. V.;
- Gorbacheva, A. R.;
- Moskvin, L. N.;
- Kolesnichenko, I. N.
- Article
46
- Applied Physics A: Materials Science & Processing, 2015, v. 118, n. 4, p. 1297, doi. 10.1007/s00339-014-8834-0
- Gromov, Dmitry;
- Pavlova, Lydia;
- Savitsky, Andrey;
- Trifonov, Alexey
- Article
47
- Applied Physics A: Materials Science & Processing, 2014, v. 115, n. 1, p. 313, doi. 10.1007/s00339-013-7817-x
- Yılmaz, S.;
- McGlynn, E.;
- Bacaksız, E.;
- Bogan, J.
- Article
48
- International Journal of Pharmacy & Life Sciences, 2014, v. 5, n. 5, p. 3558
- Upadhyay, Hardik;
- Shah, Aarti A.;
- Shah, Abhishek;
- Sharma, Praveen;
- Darwhekar, Gajanan
- Article
49
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 15, p. 1316, doi. 10.1049/el.2016.1043
- Mehra, P.;
- Shiwani, S.;
- Hemrajani, N.;
- Gupta, R. P.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 14, p. 1, doi. 10.1049/el.2013.1659
- Y. Ogiso;
- M. Arai;
- T. Sato;
- Y. Shibata;
- M. Kohtoku
- Article