Works matching DE "TRANSISTORS testing"
1
- Journal of Materials Science, 2013, v. 48, n. 7, p. 2797, doi. 10.1007/s10853-012-6856-6
- Article
2
- Micro & Nano Letters (Wiley-Blackwell), 2019, v. 14, n. 3, p. 249, doi. 10.1049/mnl.2018.5448
- Kangmin Kim;
- Seulgi Park;
- Ohyun Kim
- Article
3
- Science & Technology of Advanced Materials, 2016, v. 17, n. 1, p. 166, doi. 10.1080/14686996.2016.1167571
- Khan, Muhammad Farooq;
- Nazir, Ghazanfar;
- lermolenko, Volodymyr M.;
- Eom, Jonghwa
- Article
4
- European Physical Journal B: Condensed Matter, 2017, v. 90, n. 9, p. 1, doi. 10.1140/epjb/e2017-80168-6
- Wang, Jianli;
- Pu, Long;
- Han, Yujia;
- Wu, Shuyin;
- Tang, Gang;
- Guo, Sandong;
- Stampfl, Catherine
- Article
5
- Physica Status Solidi. A: Applications & Materials Science, 2018, v. 215, n. 13, p. 1, doi. 10.1002/pssa.201700825
- Yoshida, Takahiro;
- Egawa, Takashi
- Article
6
- ETRI Journal, 2014, v. 36, n. 1, p. 89, doi. 10.4218/etrij.14.0113.0051
- Zarhoun, Ronak;
- Moaiyeri, Mohammad Hossein;
- Farahani, Samira Shirinabadi;
- Navi, Keivan
- Article
7
- Semiconductors, 2017, v. 51, n. 3, p. 379, doi. 10.1134/S1063782617030277
- Zhuravlev, K.;
- Malin, T.;
- Mansurov, V.;
- Tereshenko, O.;
- Abgaryan, K.;
- Reviznikov, D.;
- Zemlyakov, V.;
- Egorkin, V.;
- Parnes, Ya.;
- Tikhomirov, V.;
- Prosvirin, I.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 16013, doi. 10.1007/s10854-017-7500-7
- Kandpal, Kavindra;
- Gupta, Navneet
- Article
9
- 2012
- Kawaharamura, Toshiyuki;
- Wang, Dapeng;
- Furuta, Mamoru
- Other
10
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1283, doi. 10.1002/j.2168-0159.2012.tb06034.x
- Lin, Wen-Chiuan;
- Yu, Sheng-Kang;
- Lin, Shih-Chieh
- Article
11
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1354, doi. 10.1002/j.2168-0159.2012.tb06055.x
- Kim, Yong-Hoon;
- Yoo, Byungwook;
- Oh, Min Suk;
- Lim, Chang-Yoon;
- Han, Jeong-In;
- Heo, Jae-Sang;
- Park, Sung Kyu
- Article
12
- Journal of Circuits, Systems & Computers, 2018, v. 27, n. 9, p. -1, doi. 10.1142/S021812661850144X
- Article
13
- Journal of Nano- & Electronic Physics, 2017, v. 9, n. 6, p. 1, doi. 10.21272/jnep.9(6).06008
- Owlia, H.;
- Keshavarzi, P.;
- Nasrollahnejad, M. B.
- Article
14
- International Journal of Nanoelectronics & Materials, 2019, v. 12, n. 1, p. 105
- Parameshwara, S.;
- Renukappa, N. M.;
- Rajan, J. Sundara
- Article
15
- Materials (1996-1944), 2017, v. 10, n. 7, p. 742, doi. 10.3390/ma10070742
- Ching-Lin Fan;
- Ming-Chi Shang;
- Shea-Jue Wang;
- Mao-Yuan Hsia;
- Win-Der Lee;
- Bohr-Ran Huang
- Article
16
- Materials (1996-1944), 2017, v. 10, n. 7, p. 702, doi. 10.3390/ma10070702
- Noviyana, Imas;
- Lestari, Annisa Dwi;
- Putri, Maryane;
- Mi-Sook Won;
- Jong-Seong Bae;
- Young-Woo Heo;
- Hee Young Lee
- Article
17
- Chemistry - A European Journal, 2017, v. 23, n. 60, p. 15002, doi. 10.1002/chem.201702657
- Yamashita, Masataka;
- Kawano, Koki;
- Matsumoto, Akinobu;
- Aratani, Naoki;
- Hayashi, Hironobu;
- Suzuki, Mitsuharu;
- Zhang, Lei;
- Briseno, Alejandro L.;
- Yamada, Hiroko
- Article