Works matching DE "TRANSISTORS testing"


Results: 17
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    Stability and band offsets between Si and LaAlO.

    Published in:
    European Physical Journal B: Condensed Matter, 2017, v. 90, n. 9, p. 1, doi. 10.1140/epjb/e2017-80168-6
    By:
    • Wang, Jianli;
    • Pu, Long;
    • Han, Yujia;
    • Wu, Shuyin;
    • Tang, Gang;
    • Guo, Sandong;
    • Stampfl, Catherine
    Publication type:
    Article
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    AlN/GaN heterostructures for normally-off transistors.

    Published in:
    Semiconductors, 2017, v. 51, n. 3, p. 379, doi. 10.1134/S1063782617030277
    By:
    • Zhuravlev, K.;
    • Malin, T.;
    • Mansurov, V.;
    • Tereshenko, O.;
    • Abgaryan, K.;
    • Reviznikov, D.;
    • Zemlyakov, V.;
    • Egorkin, V.;
    • Parnes, Ya.;
    • Tikhomirov, V.;
    • Prosvirin, I.
    Publication type:
    Article
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