Works matching DE "TRANSDUCERS -- Design %26 construction"
1
- Solid State Technology, 1998, v. 41, n. 10, p. 123
- Hoffman, Jim;
- Wagner, Dave
- Article
3
- Insight: Non-Destructive Testing & Condition Monitoring, 2007, v. 49, n. 1, p. 41, doi. 10.1784/insi.2007.49.1.41
- Zenghua, Liu;
- Bin, Wu;
- Cunfu, He;
- Xiuyan, Wang;
- Shiming, Yang
- Article
4
- Measurement Techniques, 2016, v. 58, n. 12, p. 1312, doi. 10.1007/s11018-016-0891-7
- Yanushkin, V.;
- Kolyada, Yu.;
- Krushnyak, N.
- Article
5
- Measurement Techniques, 2014, v. 57, n. 6, p. 643, doi. 10.1007/s11018-014-0512-2
- Yanushkin, V.;
- Kolyada, Yu.;
- Krushnyak, N.
- Article
6
- Measurement Techniques, 2008, v. 51, n. 11, p. 1191, doi. 10.1007/s11018-009-9185-7
- Article
7
- Analele Universitatii 'Eftimie Murgu', 2010, v. 17, n. 1, p. 104
- Article
8
- Frontiers in Neuroscience, 2018, p. N.PAG, doi. 10.3389/fnins.2018.00540
- Schaeffer, Marie-Caroline;
- Aksenova, Tetiana
- Article
9
- Acta Physica Polonica: A, 2017, v. 131, n. 4, p. 910, doi. 10.12693/APhysPolA.131.910
- KURIMSKÝ, J.;
- RAJŇÁKA;, M.;
- CIMBALA, R.;
- DOLNÍK, B.;
- TÓTHOVÁ, J.;
- PAULOVIČOVÁ, K.;
- TIMKO, M.;
- KOPČANSKÝ, P.;
- KOLCUNOVÁ, I.;
- PETRÁ, J.Â;
- DMURA, J.;
- BALOGH, J.
- Article
10
- Advanced Materials & Processes, 2008, v. 166, n. 1, p. 20
- Article
11
- Sensors (14248220), 2016, v. 16, n. 8, p. 1248, doi. 10.3390/s16081248
- Article
12
- International Power Generation, 1998, v. 21, n. 7, p. 45
- Article
13
- Applied Sciences (2076-3417), 2016, v. 6, n. 11, p. 341, doi. 10.3390/app6110341
- Qingzhao Kong;
- Robert, Rachel Howser;
- Silva, Pedro;
- Mo, Y. L.
- Article
14
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 2, p. 86, doi. 10.1134/S1061830915020047
- Goldshtein, A.;
- Vavilova, G.;
- Belyankov, V.
- Article
15
- Journal of Analytical Chemistry, 2012, v. 67, n. 11, p. 930, doi. 10.1134/S106193481211007X
- Kuchmenko, T.;
- Umarkhanov, R.;
- Kochetova, Zh.;
- Bel'skikh, N.
- Article
16
- Instruments & Experimental Techniques, 2016, v. 59, n. 2, p. 273, doi. 10.1134/S0020441216010115
- Article
17
- Electronics & Electrical Engineering, 2016, v. 22, n. 5, p. 69, doi. 10.5755/j01.eie.22.5.7123
- Sapeliauskas, Evaldas;
- Barauskas, Dovydas;
- Vanagas, Gailius;
- Pelenis, Donatas;
- Virzonis, Darius
- Article