Works matching DE "TIME-of-flight spectrometry"


Results: 170
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    Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy.

    Published in:
    Microscopy & Microanalysis, 2025, v. 31, n. 1, p. 1, doi. 10.1093/mam/ozae105
    By:
    • Morgado, Felipe F.;
    • Stephenson, Leigh T;
    • Bhatt, Shalini;
    • Freysoldt, Christoph;
    • Neumeier, Steffen;
    • Katnagallu, Shyam;
    • Subramanyam, Aparna P A;
    • Pietka, Isabel;
    • Hammerschmidt, Thomas;
    • Vurpillot, François;
    • Gault, Baptiste
    Publication type:
    Article
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    Dynamics of femtosecond laser-produced plasma ions.

    Published in:
    Applied Physics A: Materials Science & Processing, 2014, v. 117, n. 1, p. 111, doi. 10.1007/s00339-014-8239-0
    By:
    • Ni, Xiaochang;
    • Anoop, K.;
    • Wang, X.;
    • Paparo, D.;
    • Amoruso, S.;
    • Bruzzese, R.
    Publication type:
    Article
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