Works matching DE "THIN-film circuits"
1
- Solid State Technology, 1999, v. 42, n. 6, p. 111
- Article
2
- Solid State Technology, 1998, v. 41, n. 6, p. 40
- Article
3
- Advanced Functional Materials, 2017, v. 27, n. 11, p. n/a, doi. 10.1002/adfm.201604921
- Lee, Suhui;
- Shin, Jiyeong;
- Jang, Jin
- Article
4
- Advanced Functional Materials, 2017, v. 27, n. 11, p. n/a, doi. 10.1002/adfm.201605058
- Un, Hio‐Ieng;
- Zheng, Yu‐Qing;
- Shi, Ke;
- Wang, Jie‐Yu;
- Pei, Jian
- Article
5
- Advanced Functional Materials, 2017, v. 27, n. 11, p. n/a, doi. 10.1002/adfm.201606005
- Choi, Minwoo;
- Jang, Bongkyun;
- Lee, Wonho;
- Lee, Seonwoo;
- Kim, Tae Woong;
- Lee, Hak‐Joo;
- Kim, Jae‐Hyun;
- Ahn, Jong‐Hyun
- Article
6
- Advanced Functional Materials, 2016, v. 26, n. 8, p. 1253, doi. 10.1002/adfm.201503338
- Zhang, Xiaoliang;
- Hägglund, Carl;
- Johansson, Erik M. J.
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7
- Advanced Functional Materials, 2016, v. 26, n. 3, p. 321, doi. 10.1002/adfm.201503489
- Chueh, Chu‐Chen;
- Crump, Michael;
- Jen, Alex K.‐Y.
- Article
8
- Advanced Functional Materials, 2014, v. 24, n. 19, p. 2907, doi. 10.1002/adfm.201302855
- Xu, Huan;
- Zhou, Ye‐Cheng;
- Zhou, Xing‐Yu;
- Liu, Ke;
- Cao, Lu‐Ya;
- Ai, Yong;
- Fan, Zhi‐Ping;
- Zhang, Hao‐Li
- Article
9
- Advanced Functional Materials, 2014, v. 24, n. 12, p. 1657, doi. 10.1002/adfm.201303024
- Fujisaki, Yoshihide;
- Koga, Hirotaka;
- Nakajima, Yoshiki;
- Nakata, Mitsuru;
- Tsuji, Hiroshi;
- Yamamoto, Toshihiro;
- Kurita, Taiichiro;
- Nogi, Masaya;
- Shimidzu, Naoki
- Article
10
- Integrated Ferroelectrics, 2006, v. 78, n. 1, p. 19, doi. 10.1080/10584580600656882
- Hong Yang;
- Lin Yinyin;
- Tang Tingao;
- Chen Bomy
- Article
11
- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 3, p. 151, doi. 10.1142/S012915640400282X
- Gorev, Nikolai B.;
- Kodzhespirova, Inna F.;
- Privalov, Evgeny N.;
- Khuchua, Nina;
- Khvedelidze, Levan;
- Shur, Michael S.
- Article
12
- Insight: Non-Destructive Testing & Condition Monitoring, 2010, v. 52, n. 4, p. 184, doi. 10.1784/insi.2010.52.4.184
- Kirk, K. J.;
- Elgoyhen, J.;
- Hood, J. P.;
- Hutson, D.;
- Dwyer-Joyce, R. S.;
- Zhang, J.;
- Drinkwater, B. W.
- Article
13
- Annales de l'Institut Henri Poincaré C, 2016, v. 33, n. 5, p. 1301, doi. 10.1016/j.anihpc.2015.05.001
- Article
14
- Microwave & Optical Technology Letters, 1996, v. 13, n. 6, p. 339, doi. 10.1002/(SICI)1098-2760(19961220)13:6<339::AID-MOP9>3.0.CO;2-M
- Lakhtakla, Akhlesh;
- Venugopal, Vijayakumar C.
- Article
15
- IUP Journal of Science & Technology, 2011, v. 7, n. 2, p. 7
- Singh, Kulwant;
- Varghese, Soney;
- Uvais, V. N.;
- Sharma, Prachi;
- Kumar, Ashish
- Article
16
- Photovoltaics International, 2010, n. 10, p. 98
- Article
17
- Photovoltaics International, 2009, n. 5, p. 131
- Article
18
- Photovoltaics International, 2009, n. 5, p. 100
- Article
19
- Photovoltaics International, 2009, n. 5, p. 99
- Article
20
- Photovoltaics International, 2009, n. 4, p. 102
- Article
21
- Photovoltaics International, 2009, n. 4, p. 93
- Article
22
- Journal of the Society for Information Display, 2014, v. 22, n. 6, p. 281, doi. 10.1002/jsid.239
- Guo, Xiaojun;
- Wang, Yanwei;
- Chen, Li
- Article
23
- International Journal of Advanced Manufacturing Technology, 2006, v. 30, n. 1/2, p. 87, doi. 10.1007/s00170-005-0044-7
- Wang, Gou-Jen;
- Hsu, Wen-Haw
- Article
24
- European Physical Journal - Applied Physics, 2015, v. 70, n. 1, p. 10101-p1, doi. 10.1051/epjap/2015150032
- Article
25
- Measurement Techniques, 2013, v. 56, n. 3, p. 304, doi. 10.1007/s11018-013-0200-7
- Article
26
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1520, doi. 10.1002/j.2168-0159.2012.tb06102.x
- Maindron, Tony;
- Doyeux, Henri;
- Kanaan, Hani;
- Simon, Jean-Yves;
- Viasnoff, Emile
- Article
27
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04295
- Sporea, R. A.;
- Trainor, M. J.;
- Young, N. D.;
- Shannon, J. M.;
- Silva, S. R. P.
- Article
28
- Nanomaterials (2079-4991), 2016, v. 6, n. 9, p. 154, doi. 10.3390/nano6090154
- Vidor, Fábio F.;
- Meyers, Thorsten;
- Hilleringmann, Ulrich
- Article
29
- 2013
- Salez, Thomas;
- McGraw, Joshua;
- Cormier, Sara;
- Bäumchen, Oliver;
- Dalnoki-Veress, Kari;
- Raphaël, Elie
- Erratum
30
- Nature, 2015, v. 520, n. 7549, p. 656, doi. 10.1038/nature14417
- Kang, Kibum;
- Xie, Saien;
- Huang, Lujie;
- Han, Yimo;
- Huang, Pinshane Y.;
- Mak, Kin Fai;
- Kim, Cheol-Joo;
- Muller, David;
- Park, Jiwoong
- Article
31
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 15, p. 1353, doi. 10.1049/el.2016.1148
- Peiyao Zhao;
- Zhaocheng Wang;
- Linglong Dai
- Article
32
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2047, doi. 10.1049/el.2015.3086
- Kim, J.;
- Jeong, S. M.;
- Jeong, J.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 24, p. 2032, doi. 10.1049/el.2015.1982
- Xiao-long Hu;
- Li Liu;
- Hong Wang
- Article
34
- Eye (0950-222X), 2004, v. 18, n. 2, p. 169, doi. 10.1038/sj.eye.6700595
- Costen, M. T. J.;
- Newsom, R. S. B.;
- Parkin, B.;
- Marsh, C. S.;
- Mehta, R. L.;
- Luff, A. J.;
- Canning, C. R.
- Article
35
- Analytical Letters, 2009, v. 42, n. 13, p. 2011, doi. 10.1080/00032710903082853
- Mardini Farias, Percio Augusto;
- Castro, ArnaldoAguiar;
- Rebello Wagener, Angelade Luca
- Article
36
- Applied Physics A: Materials Science & Processing, 2008, v. 91, n. 3, p. 429, doi. 10.1007/s00339-008-4418-1
- Das, S.;
- Ahmed, S. F.;
- Mitra, M. K.;
- Chattopadhyay, K. K.
- Article
37
- Ukrainian Journal of Physical Optics, 2010, v. 11, n. 4, p. 260, doi. 10.3116/16091833/11/4/260/2010
- Tkachenko, G. V.;
- Shulika, O. V.
- Article
38
- Industry & Innovation, 2013, v. 20, n. 1, p. 1, doi. 10.1080/13662716.2013.761375
- Lee, Jeongsik;
- Kim, Byung-Cheol
- Article
39
- Nature Photonics, 2008, v. 2, n. 5, p. 279, doi. 10.1038/nphoton.2008.67
- Article
40
- Nature Photonics, 2007, v. 1, n. 5, p. 267, doi. 10.1038/nphoton.2007.61
- Article
41
- South African Journal of Science, 1999, v. 95, n. 9, p. 415
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42
- Technical Physics Letters, 1997, v. 23, n. 6, p. 427, doi. 10.1134/1.1261701
- Elistratov, A. A.;
- Maksimov, I. L.
- Article
43
- Technical Physics Letters, 1997, v. 23, n. 6, p. 478, doi. 10.1134/1.1261816
- Matyunina, O. V.;
- Pogrebnyakov, A. V.
- Article
44
- BioScience, 1965, v. 15, n. 2, p. 118, doi. 10.2307/1293352
- Article
45
- Plasmonics, 2011, v. 6, n. 1, p. 29, doi. 10.1007/s11468-010-9165-4
- Tzu-Cheih Peng;
- Wen-Chi Lin;
- Chih-Wei Chen;
- Din Ping Tsai;
- Hai-Pang Chiang
- Article
46
- Journal of the IEST, 2009, v. 52, n. 1, p. 87, doi. 10.17764/jiet.52.1.r38467496m5674p3
- Article
47
- Nature, 2000, v. 403, n. 6769, p. 521, doi. 10.1038/35000530
- Crone, B.;
- Dodabalapur, A.;
- Lin, Y.-Y.;
- Filas, R.W.;
- Bao, Z.;
- LaDuca, A.;
- Sarpeshkar, R.;
- Katz, H.E.;
- Li, W.
- Article
48
- Optics & Spectroscopy, 2016, v. 121, n. 1, p. 140, doi. 10.1134/S0030400X16070237
- Iaseniuc, O.;
- Cojocaru, I.;
- Prisacar, A.;
- Nastas, A.;
- Iovu, M.
- Article
49
- Optics & Spectroscopy, 2008, v. 105, n. 1, p. 128, doi. 10.1134/S0030400X08070205
- Konoplev, Yu. N.;
- Mamaev, Yu. A.;
- Turkin, A. A.
- Article
50
- European Physical Journal B: Condensed Matter, 2006, v. 54, n. 2, p. 141, doi. 10.1140/epjb/e2006-00440-2
- Shigeta, I.;
- Tanaka, Y.;
- Ichikawa, F.;
- Asano, Y.
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