Works matching DE "THIN films in electrical insulation"

Results: 30

Microstructure, dielectric and photoluminescence properties of Tm-doped Ba0.8Sr0.2TiO3 thin films fabricated by sol–gel method.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1184, doi. 10.1007/s10854-007-9523-y

By:

Jun Wang;
Tianjin Zhang;
Neng Wan;
Junhuai Xiang

Publication type:

Article

Dependency of oxygen partial pressure on the characteristics of ZnO films grown by radio frequency magnetron sputtering.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 744, doi. 10.1007/s10854-007-9401-7

By:

Ahn, C. H.;
Kim, Y. Y.;
Kang, S. W.;
Kong, B. H.;
Mohanta, S. K.;
Cho, H. K.;
Kim, J. H.;
Lee, H. S.

Publication type:

Article

Depth profiles and concentration percentages of SiO2 and SiO x induced by ion bombardment of a silicon (100) target.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 898, doi. 10.1007/s10854-008-9658-5

By:

Chin Shuang Lee;
Chia Chan Chen;
Chin Shun Hsu;
Shyong Lee;
Ron-Kai Hsu

Publication type:

Article

Temperature dependence of ZnO thin films grown on Si substrate.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 749, doi. 10.1007/s10854-007-9402-6

By:

Kim, Y. Y.;
Ahn, C. H.;
Kang, S. W.;
Kong, B. H.;
Mohanta, S. K.;
Cho, H. K.;
Lee, J. Y.;
Kim, H. S.

Publication type:

Article

Pulsed laser deposited ZnO films and their humidity sensing behavior.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 788, doi. 10.1007/s10854-007-9414-2

By:

Dixit, Shobhna;
Srivastava, Anchal;
Shukla, R. K.;
Srivastava, Atul

Publication type:

Article

Nitrogen doping of SiC thin films deposited by RF magnetron sputtering.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 835, doi. 10.1007/s10854-007-9487-y

By:

Fraga, Mariana Amorim;
Massi, Marcos;
Oliveira, Ivo C.;
Maciel, Homero S.;
dos Santos Filho, Sebastião G.;
Mansano, Ronaldo D.

Publication type:

Article

THIN FILMS OF UNDOPED LEAD TITANATE: MORPHOLOGY AND ELECTRICAL PROPERTIES.

Published in:

Integrated Ferroelectrics, 2008, v. 98, n. 1, p. 3, doi. 10.1080/10584580802096671

By:

Dippel, Ann-Christin;
Schneller, Theodor;
Waser, Rainer

Publication type:

Article

STRUCTURE AND FERROELECTRIC PROPERTIES OF PZT THIN FILM DEPOSITED ON LaNiO3 BOTTOM ELECTRODES.

Published in:

Integrated Ferroelectrics, 2008, v. 98, n. 1, p. 69, doi. 10.1080/10584580802092274

By:

Chengtao Yang;
Shuren Zhang;
Hongwei Zhang;
Jinsong Liu

Publication type:

Article

MICROSTRUCTURE AND DIELECTRIC PROPERTIES OF ND-DOPED BISMUTH TITANATE.

Published in:

Integrated Ferroelectrics, 2008, v. 98, n. 1, p. 97, doi. 10.1080/10584580802092464

By:

Yongyuan Zang;
Xie, Dan;
Yehui Xiao;
Yong Ruan;
Tianling Ren;
Litian Liu

Publication type:

Article

TE Magnetostatic Surface Waves in Symmetric Dielectric Negative Permittivity Material Waveguide.

Published in:

Advances in Condensed Matter Physics, 2009, p. 1, doi. 10.1155/2009/867638

By:

Ass'ad, A. I.;
Ashour, H. S.

Publication type:

Article

Thin-film disorientation measurement using the single-crystal Nonius Kappa CCD diffractometer.

Published in:

Journal of Applied Crystallography, 2006, v. 39, n. 6, p. 919, doi. 10.1107/S0021889806037058

By:

Aubert, Emmanuel;
Wenger, Emmanuel;
Link, Mathias;
Assouar, Badreddine;
Didierjean, Claude;
Lecomte, Claude

Publication type:

Article

Transmission electron microscopy study of epitaxial La 0.8 MnO 3 thin films on SrTiO 3.

Published in:

Philosophical Magazine, 2006, v. 86, n. 27, p. 4341, doi. 10.1080/14786430600696363

By:

Chen, J.;
Zhu, J.

Publication type:

Article

Immobilization of nanobeads on a surface to control the size, shape, and distribution of pores in electrochemically generated sol-gel films.

Published in:

Journal of Solid State Electrochemistry, 2015, v. 19, n. 7, p. 2087, doi. 10.1007/s10008-014-2709-3

By:

Ciabocco, Michela;
Berrettoni, Mario;
Zamponi, Silvia;
Cox, James

Publication type:

Article

Dielectric and thermal characteristics of gel grown single crystals of ytterbium tartrate trihydrate.

Published in:

Journal of Materials Science, 2007, v. 42, n. 22, p. 9324, doi. 10.1007/s10853-007-1907-0

By:

Want, Basharat;
Ahmad, Farooq;
Kotru, P. N.

Publication type:

Article

Structure and properties of zirconium oxide thin films prepared by filtered cathodic vacuum arc.

Published in:

Applied Physics A: Materials Science & Processing, 2005, v. 81, n. 2, p. 405, doi. 10.1007/s00339-004-2602-5

By:

Yu, G. Q.;
Tay, B. K.;
Zhao, Z. W.

Publication type:

Article

Femtosecond dynamics of dielectric films in the pre-ablation regime.

Published in:

Applied Physics A: Materials Science & Processing, 2005, v. 81, n. 2, p. 317, doi. 10.1007/s00339-005-3216-2

By:

Mero, M.;
Sabbah, A. J.;
Zeller, J.;
Rudolph, W.

Publication type:

Article

X-ray reflectometry of nanocomposite metal-dielectric films.

Published in:

Inorganic Materials, 2009, v. 45, n. 14, p. 1640, doi. 10.1134/S0020168509140258

By:

Petrakov, A. P.;
Kotov, L. N.;
Kalinin, Yu. E.;
Sitnikov, A. V.

Publication type:

Article

Cantor Dielectric Filters in Rectangular Waveguides.

Published in:

Electromagnetics, 2009, v. 29, n. 8, p. 575, doi. 10.1080/02726340903287315

By:

Chiadini, F.;
Fiumara, V.;
Gallina, I.;
Johnson, S.T.;
Scaglione, A.

Publication type:

Article

Electric Field–Induced Ordering of the Worm-Like Micelles: Application to the Low-Dielectric-Constant Materials.

Published in:

2006

By:

Sonin, Andrei A.;
Mu-Gyeom Kim;
Kwang-Hee Lee;
Joo-Young Kim;
Hyun-Dam Jeong;
Mahn-Won Kim

Publication type:

Case Study

Control of the spectral dependence of the output signal of a reflection interferometer with a noninverted instrumental function.

Published in:

Optics & Spectroscopy, 2008, v. 104, n. 1, p. 121, doi. 10.1134/S0030400X08010177

By:

Terent’ev, V. S.;
Troshin, B. I.

Publication type:

Article

3D Local Manipulation of the Metal–Insulator Transition Behavior in VO2 Thin Film by Defect‐Induced Lattice Engineering.

Published in:

Advanced Materials Interfaces, 2018, v. 5, n. 8, p. 1, doi. 10.1002/admi.201701268

By:

Jia, Qi;
Grenzer, Jörg;
He, Huabing;
Anwand, Wolfgang;
Ji, Yanda;
Yuan, Ye;
Huang, Kai;
You, Tiangui;
Yu, Wenjie;
Ren, Wei;
Chen, Xinzhong;
Liu, Mengkun;
Facsko, Stefan;
Wang, Xi;
Ou, Xin

Publication type:

Article

Relation between measured currents and charges in an inhomogeneous sample with anisotropic permittivity during its diagnostics.

Published in:

Journal of Communications Technology & Electronics, 2012, v. 57, n. 11, p. 1216, doi. 10.1134/S1064226912080141

By:

Dmitriev, S.

Publication type:

Article

Measurement of Dielectric Constant of Thin Film Materials at Microwave Frequencies.

Published in:

Journal of Electromagnetic Waves & Applications, 2009, v. 23, n. 5/6, p. 809, doi. 10.1163/156939309788019831

By:

Jin, H.;
Dong, S. R.;
Wang, D. M.

Publication type:

Article

Mitigating the dead-layer effect in nanocapacitors using graded dielectric films.

Published in:

International Journal of Smart & Nano Materials, 2012, v. 3, n. 1, p. 23, doi. 10.1080/19475411.2011.637992

By:

Li, Qin;
Patel, Chaitanya;
Ardebili, Haleh

Publication type:

Article

Ultralow-k nanoporous organosilicate dielectric films imprinted with dendritic spheres.

Published in:

Nature Materials, 2005, v. 4, n. 2, p. 147, doi. 10.1038/nmat1291

By:

Byeongdu Lee;
Young-Hee Park;
Yong-Taek Hwang;
Weontae Oh;
Jinhwan Yoon;
Moonhor Ree

Publication type:

Article

Method of increasing the electric strength of a dielectric film.

Published in:

Russian Physics Journal, 2007, v. 50, n. 10, p. 1066, doi. 10.1007/s11182-007-0155-8

By:

Vorob'ev, G. A.;
Ivanova, E. V.;
Mukhachev, V. A.

Publication type:

Article

Low Dielectric Loss and Good Dielectric Thermal Stability of x Nd( Zn1/2 Ti1/2) O3-(1− x) Ba0.6 Sr0.4 TiO3 Thin Films Fabricated by Sol-Gel Method.

Published in:

Journal of the American Ceramic Society, 2013, v. 96, n. 3, p. 820, doi. 10.1111/jace.12112

By:

Sun, Xiaohua;
Yang, Ying;
Zhang, Qiaoling;
Hou, Shuang;
Huang, Caihua;
Hu, Zongzhi;
Zou, Jun;
Li, Meiya;
Peng, Tianyou;
Zhao, Xing ‐ zhong;
Kim, H. ‐ E.

Publication type:

Article

Crossover of Ba(Ti,Y)O3 Solid Solutions to Ba3Ti2YO8.5–BaTiO3 Composites and their Dielectric Properties.

Published in:

Journal of the American Ceramic Society, 2005, v. 88, n. 10, p. 2775, doi. 10.1111/j.1551-2916.2005.00501.x

By:

Jing Zhi;
Zhi Yu;
Chen Ang

Publication type:

Article

Processing Effects for Integrated PZT: Residual Stress, Thickness, and Dielectric Properties.

Published in:

Journal of the American Ceramic Society, 2005, v. 88, n. 10, p. 2839, doi. 10.1111/j.1551-2916.2005.00641.x

By:

Ong, Ryan J.;
Payne, David A.;
Sottos, Nancy R.

Publication type:

Article

Effects of Interfacial Dielectric Layers on the Electrical Performance of Top-Gate In-Ga-Zn-Oxide Thin-Film Transistors.

Published in:

ETRI Journal, 2009, v. 31, n. 6, p. 660, doi. 10.4218/etrij.09.1209.0049

By:

Woo-Seok Cheong;
Jeong-Min Lee;
Jong-Ho Lee;
Sang-Hee Ko Park;
Sung Min Yoon;
Chun-Won Byun;
Shinhyuk Yang;
Sung Mook Chung;
Kyoung Ik Cho;
Chi-Sun Hwang

Publication type:

Article

Works matching DE "THIN films in electrical insulation"

Microstructure, dielectric and photoluminescence properties of Tm-doped Ba<sub>0.8</sub>Sr<sub>0.2</sub>TiO<sub>3 </sub>thin films fabricated by sol–gel method.

Dependency of oxygen partial pressure on the characteristics of ZnO films grown by radio frequency magnetron sputtering.

Depth profiles and concentration percentages of SiO<sub>2</sub> and SiO<sub> x </sub> induced by ion bombardment of a silicon (100) target.

Temperature dependence of ZnO thin films grown on Si substrate.

Pulsed laser deposited ZnO films and their humidity sensing behavior.

Nitrogen doping of SiC thin films deposited by RF magnetron sputtering.

THIN FILMS OF UNDOPED LEAD TITANATE: MORPHOLOGY AND ELECTRICAL PROPERTIES.

STRUCTURE AND FERROELECTRIC PROPERTIES OF PZT THIN FILM DEPOSITED ON LaNiO3 BOTTOM ELECTRODES.

MICROSTRUCTURE AND DIELECTRIC PROPERTIES OF ND-DOPED BISMUTH TITANATE.

TE Magnetostatic Surface Waves in Symmetric Dielectric Negative Permittivity Material Waveguide.

Thin-film disorientation measurement using the single-crystal Nonius Kappa CCD diffractometer.

Transmission electron microscopy study of epitaxial La 0.8 MnO 3 thin films on SrTiO 3.

Immobilization of nanobeads on a surface to control the size, shape, and distribution of pores in electrochemically generated sol-gel films.

Dielectric and thermal characteristics of gel grown single crystals of ytterbium tartrate trihydrate.

Structure and properties of zirconium oxide thin films prepared by filtered cathodic vacuum arc.

Femtosecond dynamics of dielectric films in the pre-ablation regime.

X-ray reflectometry of nanocomposite metal-dielectric films.

Cantor Dielectric Filters in Rectangular Waveguides.

Electric Field–Induced Ordering of the Worm-Like Micelles: Application to the Low-Dielectric-Constant Materials.

Control of the spectral dependence of the output signal of a reflection interferometer with a noninverted instrumental function.

3D Local Manipulation of the Metal–Insulator Transition Behavior in VO<sub>2</sub> Thin Film by Defect‐Induced Lattice Engineering.

Relation between measured currents and charges in an inhomogeneous sample with anisotropic permittivity during its diagnostics.

Measurement of Dielectric Constant of Thin Film Materials at Microwave Frequencies.

Mitigating the dead-layer effect in nanocapacitors using graded dielectric films.

Ultralow-k nanoporous organosilicate dielectric films imprinted with dendritic spheres.

Method of increasing the electric strength of a dielectric film.

Low Dielectric Loss and Good Dielectric Thermal Stability of x Nd( Zn<sub>1/2</sub> Ti<sub>1/2</sub>) O<sub>3</sub>-(1− x) Ba<sub>0.6</sub> Sr<sub>0.4</sub> TiO<sub>3</sub> Thin Films Fabricated by Sol-Gel Method.

Crossover of Ba(Ti,Y)O<sub>3</sub> Solid Solutions to Ba<sub>3</sub>Ti<sub>2</sub>YO<sub>8.5</sub>–BaTiO<sub>3</sub> Composites and their Dielectric Properties.

Processing Effects for Integrated PZT: Residual Stress, Thickness, and Dielectric Properties.

Effects of Interfacial Dielectric Layers on the Electrical Performance of Top-Gate In-Ga-Zn-Oxide Thin-Film Transistors.