Works matching DE "THERMAL shock"
1
- Journal of Failure Analysis & Prevention, 2025, v. 25, n. 2, p. 813, doi. 10.1007/s11668-025-02144-4
- Jalar, Azman;
- Lim, Ee May;
- Abu Bakar, Maria;
- Ismail, Adlil Aizat;
- Che Ani, Fakhrozi;
- Tan, Choo Par
- Article
2
- Fluid Dynamics & Materials Processing, 2025, v. 21, n. 4, p. 851, doi. 10.32604/fdmp.2024.056729
- Liu, Zhuang;
- Fan, Tingen;
- Lu, Qianli;
- Guo, Jianchun;
- Yang, Renfeng;
- Wang, Haifeng
- Article
3
- SABRAO Journal of Breeding & Genetics, 2025, v. 57, n. 2, p. 599, doi. 10.54910/sabrao2025.57.2.18
- FAZAA, M. A.;
- ESMAIL, A. M.;
- RASHED, M. A.;
- BADR, A. M.;
- IBRAHIM, K. I. M.;
- MOHAMED, A. Z. A.;
- AL ABOUD, N. M.;
- MANSOUR, E.
- Article
4
- Acta Mechanica, 2025, v. 236, n. 5, p. 2943, doi. 10.1007/s00707-025-04299-5
- Wang, Dechen;
- Li, Chenlin;
- Zheng, Liangcheng
- Article
5
- Biological Chemistry, 2025, v. 406, n. 1/2, p. 29, doi. 10.1515/hsz-2024-0140
- Miwa, Tsukumi;
- Taguchi, Hideki
- Article
6
- Surface Engineering, 2025, v. 41, n. 2, p. 176, doi. 10.1177/02670844251315284
- P. V., Sachin Raj;
- S. P., Kumaresh Babu;
- P. V., Adarsh Vijayan;
- S., Manivannan
- Article
7
- Surface Engineering, 2023, v. 39, n. 6, p. 738, doi. 10.1080/02670844.2023.2257856
- Kochmańska, Agnieszka;
- Kochmański, Paweł
- Article
8
- Surface Engineering, 2022, v. 38, n. 10-12, p. 977, doi. 10.1080/02670844.2023.2180856
- Márquez-Cortés, R.;
- Martínez-Trinidad, J.;
- García-León, R. A.
- Article
9
- Surface Engineering, 2022, v. 38, n. 1, p. 44, doi. 10.1080/02670844.2022.2026665
- Dai, Weibing;
- Zhang, Xiulu;
- Li, Changyou;
- Yao, Guo
- Article
10
- Surface Engineering, 2021, v. 37, n. 9, p. 1194, doi. 10.1080/02670844.2021.1959287
- Miri, T.;
- Seifzadeh, D.;
- Rajabalizadeh, Z.
- Article
11
- Surface Engineering, 2021, v. 37, n. 8, p. 991, doi. 10.1080/02670844.2020.1840692
- Taghi-Ramezani, Saeid;
- Valefi, Zia;
- Mirjani, Masud;
- Ghasemi, Reza
- Article
12
- Surface Engineering, 2021, v. 37, n. 5, p. 572, doi. 10.1080/02670844.2020.1812478
- Gao, Minghao;
- Xu, Na;
- Zhang, Jia;
- Luan, Shengjia;
- Chang, Hui;
- Hou, Wanliang;
- Chang, Xinchun
- Article
13
- Surface Engineering, 2020, v. 36, n. 10, p. 1113, doi. 10.1080/02670844.2020.1766866
- Li, Min;
- Wei, Kun Xia;
- Wei, Wei;
- Du, Qing Bo;
- Zhao, Xiao Bing;
- Hu, Jing
- Article
14
- Surface Engineering, 2019, v. 35, n. 8, p. 710, doi. 10.1080/02670844.2019.1573343
- Men, Xiangdong;
- Tao, Fenghe;
- Gan, Lin;
- Zhao, Fang
- Article
15
- Surface Engineering, 2019, v. 35, n. 7, p. 627, doi. 10.1080/02670844.2018.1557996
- Wang, Ping;
- Gong, Ze Yu;
- Hu, Jie;
- Pu, Jun;
- Cao, Wen Jie
- Article
16
- Surface Engineering, 2017, v. 33, n. 3, p. 237, doi. 10.1080/02670844.2016.1216053
- Zhang, M.-Y.;
- Li, K.-Z.;
- Shi, X.-H.;
- Liu, N.-K.
- Article
17
- Surface Engineering, 2015, v. 31, n. 5, p. 335, doi. 10.1179/1743294414Y.0000000428
- Hu, M. H.;
- Li, K. Z.;
- Li, H. J.;
- Wang, B.;
- Ma, H. L.
- Article
18
- Surface Engineering, 2015, v. 31, n. 1, p. 64, doi. 10.1179/1743294414Y.0000000397
- Pourbafrani, M.;
- Razavi, R. Shoja;
- Bakhshi, S. R.;
- Loghman-Estarki, M. R.;
- Jamali, H.
- Article
19
- Surface Engineering, 2014, v. 30, n. 8, p. 579, doi. 10.1179/1743294414Y.0000000289
- Lu, G. X.;
- Hao, L. J.;
- Cheng, Z. X.;
- Ye, F. X.
- Article
20
- Surface Engineering, 2014, v. 30, n. 3, p. 195, doi. 10.1179/1743294413Y.0000000236
- Deng, J.;
- Li, S.;
- Xing, Y.;
- Li, Y.
- Article
21
- Surface Engineering, 2013, v. 29, n. 2, p. 134, doi. 10.1179/1743294412Y.0000000063
- Article
22
- Journal of Materials Science: Materials in Electronics, 2023, v. 34, n. 8, p. 1, doi. 10.1007/s10854-023-10123-4
- Wang, Jianqiang;
- Duan, Fangcheng;
- Wang, Jintao;
- Zhang, Weiwei;
- Zhang, Luobin;
- Li, Mingyu;
- Hang, Chunjin;
- Chen, Hongtao;
- Liu, Jiahao
- Article
23
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 26, p. 20508, doi. 10.1007/s10854-022-08865-8
- Liang, Yu;
- Zhu, Gaojia;
- Lu, Guo-Quan;
- Mei, Yun-Hui
- Article
24
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 22, p. 17493, doi. 10.1007/s10854-022-08605-y
- Son, Kirak;
- Oh, Aesun;
- Park, Eunyoung;
- Bae, Hyun-Cheol
- Article
25
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 9, p. 7099, doi. 10.1007/s10854-022-07892-9
- Zhang, Peng;
- Xue, Songbai;
- Qian, Cheng;
- Wang, Jianhao;
- Liu, Lu;
- Wu, Jie
- Article
26
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 7, p. 3687, doi. 10.1007/s10854-021-07562-2
- Rajendran, Sri Harini;
- Jung, Do Hyun;
- Jung, Jae Pil
- Article
27
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 15, p. 20384, doi. 10.1007/s10854-021-06549-3
- Liu, Yang;
- Chen, Chuantong;
- Kim, Dongjin;
- Zhang, Zheng;
- Long, Xu;
- Suganuma, Katsuaki
- Article
28
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 13, p. 17143, doi. 10.1007/s10854-021-06159-z
- Zhou, Guoyun;
- Zhang, Xiumei;
- Hong, Yan;
- Wang, Yuefeng;
- Wang, Chong;
- He, Wei;
- Wang, Shouxu;
- Chen, Yuanming;
- Chen, Shijin;
- Han, Zhiwei;
- Xu, Huan
- Article
29
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 11, p. 14703, doi. 10.1007/s10854-021-06026-x
- Liu, Jiahao;
- Liu, Hao;
- Yu, Fuwen;
- Wang, Xinjie;
- Wang, Jianqiang;
- Hang, Chunjin;
- Chen, Hongtao;
- Li, Mingyu
- Article
30
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 6, p. 6890, doi. 10.1007/s10854-021-05395-7
- Tian, Ruyu;
- Tian, Yanhong;
- Huang, Yilong;
- Yang, Dongsheng;
- Chen, Cheng;
- Sun, Huhao
- Article
31
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 9, p. 6835, doi. 10.1007/s10854-020-03243-8
- Jeong, Haksan;
- Jung, Kwang-Ho;
- Lee, Choong-Jae;
- Min, Kyung Deuk;
- Myung, Woo-Ram;
- Jung, Seung-Boo
- Article
32
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 7, p. 5731, doi. 10.1007/s10854-020-03141-z
- Wang, Jianhao;
- Xue, Songbai;
- Wang, Jianxin;
- Zhang, Peng;
- Tao, Yu;
- Wang, Ziyi
- Article
33
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 4, p. 3715, doi. 10.1007/s10854-020-02930-w
- Kim, Dongjin;
- Chen, Chuantong;
- Lee, Seung-Joon;
- Nagao, Shijo;
- Suganuma, Katsuaki
- Article
34
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 2, p. 1421, doi. 10.1007/s10854-019-02656-4
- Wang, Jianhao;
- Xue, Songbai;
- Zhang, Peng;
- Wang, Ziyi;
- Zhai, Peizhuo
- Article
35
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 17, p. 15889, doi. 10.1007/s10854-019-01935-4
- Seo, Wonil;
- Ko, Yong-Ho;
- Kim, Young-Ho;
- Yoo, Sehoon
- Article
36
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 6, p. 5526, doi. 10.1007/s10854-019-00846-8
- Yang, Fan;
- Hu, Bo;
- Peng, Ye;
- Hang, Chunjin;
- Chen, Hongtao;
- Lee, Changwoo;
- Wei, Jun;
- Li, Mingyu
- Article
37
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 3, p. 2342, doi. 10.1007/s10854-018-0507-x
- Chou, Tzu-Ting;
- Fleshman, Collin Jordon;
- Chen, Hao;
- Duh, Jenq-Gong
- Article
38
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 10, p. 8767, doi. 10.1007/s10854-018-8893-7
- Wang, Ziming;
- Zou, Jun;
- Zhang, Canyun;
- Shi, Mingming;
- Yang, Bobo;
- Li, Yang;
- Zhou, Heyu;
- Liu, Yiming;
- Li, Mengtian;
- Qian, Xinglu
- Article
39
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 10, p. 8584, doi. 10.1007/s10854-018-8872-z
- Sun, Huayu;
- Chan, Y. C.;
- Wu, Fengshun
- Article
40
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 11, p. 8116, doi. 10.1007/s10854-017-6518-1
- Sharma, Ashutosh;
- Kumar, Santosh;
- Jung, Do-Hyun;
- Jung, Jae
- Article
41
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9159, doi. 10.1007/s10854-016-4952-0
- Yim, Byung-Seung;
- Kim, Jong-Min
- Article
42
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9642, doi. 10.1007/s10854-016-5022-3
- Tan, Shihai;
- Han, Jing;
- Guo, Fu
- Article
43
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 12, p. 9470, doi. 10.1007/s10854-015-3406-4
- Article
44
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 7277, doi. 10.1007/s10854-015-3355-y
- Park, Semin;
- Nagao, Shijo;
- Sugahara, Tohru;
- Suganuma, Katsuaki
- Article
45
- International Journal of Advanced Manufacturing Technology, 2024, v. 130, n. 7/8, p. 3179, doi. 10.1007/s00170-023-12910-z
- Mustafa, Ghulam;
- Li, Binxun;
- Zhang, Song
- Article
46
- International Journal of Advanced Manufacturing Technology, 2023, v. 129, n. 11/12, p. 5047, doi. 10.1007/s00170-023-12578-5
- Sun, Jian;
- Li, Pengyang;
- Zhang, Shen;
- Chen, Yunshuai;
- Lu, Han;
- Chen, Guoqing;
- Shao, Ding
- Article
47
- International Journal of Advanced Manufacturing Technology, 2023, v. 128, n. 5/6, p. 2311, doi. 10.1007/s00170-023-12084-8
- Bédard, Frédéric;
- Loucif, Abdelhalim;
- Jahazi, Mohammad;
- Songmene, Victor
- Article
48
- International Journal of Advanced Manufacturing Technology, 2023, v. 128, n. 3/4, p. 1291, doi. 10.1007/s00170-023-11975-0
- Schorr, Logan;
- Johnson, Bradley;
- McFall, Jesse;
- Shepherd, David;
- Hadimani, Ravi L.
- Article
49
- International Journal of Advanced Manufacturing Technology, 2023, v. 125, n. 5/6, p. 2065, doi. 10.1007/s00170-023-10832-4
- Wang, Limei;
- Liu, Hanlian;
- Huang, Chuanzhen;
- Yuan, Yulan;
- Yao, Peng;
- Huang, Jun;
- Han, Quanquan
- Article
50
- International Journal of Advanced Manufacturing Technology, 2022, v. 122, n. 5/6, p. 2407, doi. 10.1007/s00170-022-10023-7
- Lu, Yanjun;
- Rao, Xiaoshuang;
- Du, Jiaxuan;
- Guan, Weifeng
- Article