Works matching DE "SURFACE mount technology"
1
- Journal of the Operational Research Society, 2000, v. 51, n. 10, p. 1205, doi. 10.2307/253933
- Article
2
- Journal of the Operational Research Society, 1998, v. 49, n. 10, p. 1051, doi. 10.2307/3010529
- Article
3
- Advanced Functional Materials, 2013, v. 23, n. 30, p. 3790, doi. 10.1002/adfm.201202996
- Liu, Bo;
- Tu, Min;
- Zacher, Denise;
- Fischer, Roland A.
- Article
4
- Journal of Jilin University (Science Edition) / Jilin Daxue Xuebao (Lixue Ban), 2022, v. 60, n. 4, p. 977, doi. 10.13413/j.cnki.jdxblxb.202141
- Article
5
- Sensors & Materials, 2019, v. 31, n. 5, Part 1, p. 1375, doi. 10.18494/SAM.2019.2258
- Hyungseup Kim;
- Byeoncheol Lee;
- Jaesung Kim;
- Kwonsang Han;
- Hyoungho Ko;
- Dong Kyue Kim;
- Byong-Deok Choi;
- Ji-Hoon Kim
- Article
6
- Mathematics (2227-7390), 2022, v. 10, n. 13, p. 2305, doi. 10.3390/math10132305
- Chang, Yung-Chia;
- Chang, Kuei-Hu;
- Zheng, Ching-Ping
- Article
7
- Electronics (2079-9292), 2025, v. 14, n. 7, p. 1273, doi. 10.3390/electronics14071273
- Muñoz, Jose Vicente;
- Nieto-Nieto, Luis M.;
- Pulido-Lopez, Luis;
- Aguilar-Peña, Juan D.;
- Gonzalez-Rodriguez, Angel Gaspar
- Article
8
- Electronics (2079-9292), 2024, v. 13, n. 6, p. 1090, doi. 10.3390/electronics13061090
- Huang, Chien-Yi;
- Tsai, Pei-Xuan
- Article
9
- Electronics (2079-9292), 2023, v. 12, n. 19, p. 4116, doi. 10.3390/electronics12194116
- Górecki, Krzysztof;
- Posobkiewicz, Krzysztof
- Article
10
- Electronics (2079-9292), 2020, v. 9, n. 5, p. 786, doi. 10.3390/electronics9050786
- Rossi, Massimiliano;
- Liberati, Riccardo Maria;
- Frasca, Marco;
- Richardson, John
- Article
11
- Technical Transactions / Czasopismo Techniczne, 2016, v. 3-E, p. 185, doi. 10.4467/2353737XCT.16.276.6075
- KORKOSZ, MARIUSZ;
- PODSKARBI, GRZEGORZ
- Article
12
- Journal of Turbulence, 2016, v. 17, n. 8, p. 727, doi. 10.1080/14685248.2016.1174779
- Nyantekyi-Kwakye, Baafour;
- Tachie, Mark Francis;
- Clark, Shawn Paul
- Article
13
- Welding International, 2011, v. 25, n. 11, p. 844, doi. 10.1080/09507116.2011.590654
- Ikeda, Toru;
- Kanno, Toshifumi;
- Shishido, Nobuyuki;
- Miyazaki, Noriyuki;
- Tanaka, Hiroyuki;
- Hatao, Takuya
- Article
14
- Journal of Electronic Materials, 2024, v. 53, n. 12, p. 8066, doi. 10.1007/s11664-024-11420-2
- Shih, Meng-Kai;
- Chen, Shi-Jie;
- Lin, I. Hung;
- Lou, Bai-Yao;
- Ni, Tom
- Article
15
- Journal of Electronic Materials, 2022, v. 51, n. 4, p. 1481, doi. 10.1007/s11664-022-09440-x
- Chavez-Urbiola, I. R.;
- Sánchez-Fraga, R.;
- Mejia, I.;
- Leon-Gil, J. A.;
- Ponce-Hernández, J.;
- Velarde-Díaz, L. D.;
- Alcantar-Peña, Jesús J.
- Article
16
- Complexity, 2021, p. 1, doi. 10.1155/2021/7906047
- Article
17
- Quality & Reliability Engineering International, 2007, v. 23, n. 4, p. 415, doi. 10.1002/qre.810
- Salmela, Olli;
- Andersson, Klas;
- Perttula, Altti;
- Särkkauml;, Jussi;
- Tammenmaa, Markku
- Article
18
- Quality & Reliability Engineering International, 2005, v. 21, n. 4, p. 345, doi. 10.1002/qre.667
- Article
19
- Quality & Reliability Engineering International, 1995, v. 11, n. 5, p. 325, doi. 10.1002/qre.4680110503
- Ling-Yau Chan;
- Law, Lawrence Wing-Tung
- Article
20
- Quality & Reliability Engineering International, 1992, v. 8, n. 5, p. 511
- Article
21
- Quality & Reliability Engineering International, 1991, v. 7, n. 6, p. 514
- Article
22
- Quality & Reliability Engineering International, 1991, v. 7, n. 4, p. 351
- Article
24
- Quality & Reliability Engineering International, 1988, v. 4, n. 4, p. 367
- Article
25
- Quality & Reliability Engineering International, 1988, v. 4, n. 3, p. 215, doi. 10.1002/qre.4680040304
- Article
26
- Quality & Reliability Engineering International, 1988, v. 4, n. 2, p. 171, doi. 10.1002/qre.4680040212
- Bandurek, G. R.;
- Disney, J.;
- Bendell, A.
- Article
27
- Quality & Reliability Engineering International, 1987, v. 3, n. 3, p. 203, doi. 10.1002/qre.4680030311
- Article
28
- Quality & Reliability Engineering International, 1986, v. 2, n. 4, p. 229, doi. 10.1002/qre.4680020404
- Article
29
- International Journal of Advanced Manufacturing Technology, 2015, v. 77, n. 5-8, p. 973, doi. 10.1007/s00170-014-6510-3
- García-Nájera, Abel;
- Brizuela, Carlos;
- Martínez-Pérez, Israel
- Article
30
- International Journal of Advanced Manufacturing Technology, 2008, v. 36, n. 9/10, p. 918, doi. 10.1007/s00170-006-0918-3
- Chyu, Chiuh-Cheng;
- Chang, Wei-Shung
- Article
31
- International Journal of Advanced Manufacturing Technology, 2008, v. 35, n. 11/12, p. 1136, doi. 10.1007/s00170-006-0795-9
- Li Fang;
- Yue Hong Yin;
- Chen, Zhao Neng
- Article
32
- International Journal of Advanced Manufacturing Technology, 2007, v. 35, n. 3/4, p. 293, doi. 10.1007/s00170-006-0730-0
- Crispin, A. J.;
- Rankov, V.
- Article
33
- International Journal of Advanced Manufacturing Technology, 2006, v. 29, n. 9-10, p. 980, doi. 10.1007/s00170-005-2584-2
- Çatay, Bülent;
- Vakharia, Asoo J.;
- Erengüç, S. Selçuk
- Article
34
- International Journal of Advanced Manufacturing Technology, 2006, v. 27, n. 5/6, p. 561, doi. 10.1007/s00170-004-2233-1
- Fidan, Ismail;
- Roush, Edward;
- Tumkor, Serdar;
- Kraft, Russell P.
- Article
35
- International Journal of Advanced Manufacturing Technology, 2005, v. 26, n. 5/6, p. 491, doi. 10.1007/s00170-003-1617-y
- Shih, Ching-Long;
- Ruo, Chi-Wei;
- Sheu, Hsin-Teng
- Article
36
- International Journal of Advanced Manufacturing Technology, 2005, v. 25, n. 1/2, p. 145, doi. 10.1007/s00170-003-1824-6
- Li, Ming-Hsien Caleb;
- Hong, Shih-Ming
- Article
37
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 17, p. 893, doi. 10.1049/el.2020.1318
- Ozaki, J.;
- Tanobe, H.;
- Ishikawa, M.
- Article
38
- Machines, 2021, v. 9, n. 2, p. 34, doi. 10.3390/machines9020034
- Zhang, Huiyan;
- Sun, Hao;
- Shi, Peng
- Article
39
- Coatings (2079-6412), 2024, v. 14, n. 3, p. 359, doi. 10.3390/coatings14030359
- Yoo, Young-Ran;
- Won, Seokyeon;
- Kim, Young-Sik
- Article
40
- Journal of Laser Micro / Nanoengineering, 2018, v. 13, n. 2, p. 63, doi. 10.2961/jlmn.2018.02.0003
- Charipar, Kristin M.;
- Charipar, Nicholas A.;
- Auyeung, Raymond C. Y.;
- Heungsoo Kim;
- Piqué, Alberto
- Article
41
- International Journal of Distributed Sensor Networks, 2019, v. 15, n. 2, p. 1, doi. 10.1177/1550147719832802
- Kim, Dongil;
- Koo, Jeongin;
- Kim, Hyein;
- Kang, Seokho;
- Lee, Sang Hyun;
- Kang, Jeong Tae
- Article
42
- International Journal of Electronic Business Management, 2009, v. 7, n. 4, p. 286
- Article
43
- EE: Evaluation Engineering, 2016, v. 55, n. 11, p. 20
- Article
44
- EE: Evaluation Engineering, 2008, v. 47, n. 9, p. 40
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 3, p. 2073, doi. 10.1007/s11664-017-6014-7
- Lin, Jian;
- Lei, Yongping;
- Fu, Hanguang;
- Guo, Fu
- Article
46
- Journal of Electronic Materials, 2009, v. 38, n. 12, p. 2628, doi. 10.1007/s11664-009-0923-z
- Snugovsky, Polina;
- Bagheri, Zohreh;
- Hamilton, Craig
- Article
47
- Journal of Electronic Materials, 2006, v. 35, n. 12, p. 2074, doi. 10.1007/s11664-006-0316-5
- Huann-Wu Chiang;
- Chang, Kennedy;
- Jun-Yuan Chen
- Article
48
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1032, doi. 10.1007/BF02692564
- Huann-Wu Chiang;
- Jun-Yuan Chen;
- Ming-Chuan Chen;
- Lee, Jeffrey C. B.;
- Shiau, Gary
- Article
49
- Journal of Electronic Materials, 2004, v. 33, n. 12, p. 1550, doi. 10.1007/s11664-004-0097-7
- Huann-Wu Chiang;
- Jun-Yuan Chen;
- Lee, Jeffrey C. B.;
- Li, S. M.
- Article
50
- Journal of the Operational Research Society, 2007, v. 58, n. 1, p. 115, doi. 10.1057/palgrave.jors.2602136
- Knuutila, T.;
- Pyöttiälä, S.;
- Nevalainen, O. S.
- Article