P-23: Simulation Calibration Procedure of Leakage Current in TFTs.Published in:SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 1201, doi. 10.1002/sdtp.10059By:Tak, Nam‐Kyun;Kim, Jin‐Young;Han, Ji‐Ung;Choi, In‐Chol;Lee, Won‐Seok;Hwang, Man‐GyuPublication type:Article