Works matching DE "STMICROELECTRONICS NV"
1
- Solid State Technology, 2001, v. 44, n. 10, p. 20
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2
- Solid State Technology, 2001, v. 44, n. 6, p. 56
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3
- Solid State Technology, 2001, v. 44, n. 3, p. 46
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4
- Solid State Technology, 2001, v. 44, n. 2, p. 54
- Article
5
- Solid State Technology, 2001, v. 44, n. 1, p. 48
- Article
6
- Solid State Technology, 2000, v. 43, n. 12, p. 18
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7
- Solid State Technology, 2000, v. 43, n. 7, p. 56
- Article
8
- Solid State Technology, 1999, v. 42, n. 11, p. 32
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9
- Solid State Technology, 1999, v. 42, n. 4, p. 18
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10
- Solid State Technology, 1998, v. 41, n. 12, p. 32
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11
- Solid State Technology, 1998, v. 41, n. 8, p. 42
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12
- Solid State Technology, 1998, v. 41, n. 5, p. 48
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13
- Solid State Technology, 1998, v. 41, n. 1, p. 36
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15
- California Management Review, 2013, v. 55, n. 4, p. 143, doi. 10.1525/cmr.2013.55.4.143
- Cesaroni, Fabrizio;
- Piccaluga, Andrea
- Article
16
- California Management Review, 2013, v. 55, n. 4, p. 143, doi. 10.1525/cmr.2013.55.4.143
- Cesaroni, Fabrizio;
- Piccaluga, Andrea
- Article
17
- Production Planning & Control, 2011, v. 22, n. 1, p. 91, doi. 10.1080/09537287.2010.490023
- Boucher, Xavier;
- Chapron, Julie;
- Burlat, Patrick;
- Lebrun, Pierre
- Article
18
- Production Planning & Control, 1999, v. 10, n. 1, p. 97, doi. 10.1080/095372899233479
- Cigolini, R.;
- Comi, A.;
- Micheletti, A.;
- A., M. Perona;
- Portioli
- Article
20
- EE: Evaluation Engineering, 2017, v. 56, n. 3, p. 10
- Article
22
- EE: Evaluation Engineering, 2013, v. 52, n. 2, p. 26
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23
- New York Law School Law Review, 2008, v. 53, n. 2, p. 351
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24
- International Journal of Micrographics & Optical Technology, 2007, v. 25, n. 5, p. 8
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25
- Nature, 1989, v. 338, n. 6213, p. 285, doi. 10.1038/338285b0
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26
- Integrated Ferroelectrics, 2007, v. 93, n. 1, p. 13, doi. 10.1080/10584580701755310
- Article
27
- EMedia Magazine, 2001, v. 14, n. 5, p. 14
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28
- Gazi Üniversitesi Fen Bilimleri Dergisi Part C: Tasarım ve Teknoloji, 2021, v. 9, n. 3, p. 373, doi. 10.29109/gujsc.915163
- İŞNAS, Gökhan;
- ŞENYER, Nurettin
- Article
29
- Chemistry & Industry, 2004, n. 14, p. 7
- Article
30
- Satellite Navigation, 2024, v. 5, n. 1, p. 1, doi. 10.1186/s43020-024-00134-9
- Liu, Ying;
- Liu, Wanke;
- Zhang, Xiaohong;
- Liang, Yantao;
- Tao, Xianlu;
- Ma, Liye
- Article
31
- Journal of Low Power Electronics & Applications, 2023, v. 13, n. 2, p. 35, doi. 10.3390/jlpea13020035
- Della Sala, Riccardo;
- Spinogatti, Valerio;
- Bocciarelli, Cristian;
- Centurelli, Francesco;
- Trifiletti, Alessandro
- Article
32
- Journal of Low Power Electronics & Applications, 2023, v. 13, n. 1, p. 17, doi. 10.3390/jlpea13010017
- Paolino, Carmine;
- Antolini, Alessio;
- Zavalloni, Francesco;
- Lico, Andrea;
- Franchi Scarselli, Eleonora;
- Mangia, Mauro;
- Marchioni, Alex;
- Pareschi, Fabio;
- Setti, Gianluca;
- Rovatti, Riccardo;
- Luigi Torres, Mattia;
- Carissimi, Marcella;
- Pasotti, Marco
- Article
33
- Journal of Low Power Electronics & Applications, 2021, v. 11, n. 2, p. 19, doi. 10.3390/jlpea11020019
- Centurelli, Francesco;
- Della Sala, Riccardo;
- Monsurrò, Pietro;
- Scotti, Giuseppe;
- Trifiletti, Alessandro
- Article
34
- Journal of Mathematics in Industry, 2022, v. 12, n. 1, p. 1, doi. 10.1186/s13362-022-00127-w
- Bannenberg, Marcus W. F. M.;
- Ciccazzo, Angelo;
- Günther, Michael
- Article
35
- Sensors (14248220), 2025, v. 25, n. 13, p. 4218, doi. 10.3390/s25134218
- Amato, Umberto;
- Antoniadis, Anestis;
- De Feis, Italia;
- Doinychko, Anastasiia;
- Gijbels, Irène;
- La Magna, Antonino;
- Pagano, Daniele;
- Piccinini, Francesco;
- Selvan Suviseshamuthu, Easter;
- Severgnini, Carlo;
- Torres, Andres;
- Vasquez, Patrizia
- Article
36
- Sensors (14248220), 2023, v. 23, n. 20, p. 8440, doi. 10.3390/s23208440
- Bonilla, Vicky;
- Campoverde, Brandon;
- Yoo, Sang Guun
- Article
37
- Sensors (14248220), 2023, v. 23, n. 7, p. 3422, doi. 10.3390/s23073422
- Kledrowetz, Vilem;
- Prokop, Roman;
- Fujcik, Lukas;
- Haze, Jiri
- Article
38
- Sensors (14248220), 2021, v. 21, n. 16, p. 5627, doi. 10.3390/s21165627
- Principato, Fabio;
- Allegra, Giuseppe;
- Cappello, Corrado;
- Crepel, Olivier;
- Nicosia, Nicola;
- D′Arrigo, Salvatore;
- Cantarella, Vincenzo;
- Di Mauro, Alessandro;
- Abbene, Leonardo;
- Mirabello, Marcello;
- Pintacuda, Francesco
- Article
39
- Sensors (14248220), 2021, v. 21, n. 5, p. 1840, doi. 10.3390/s21051840
- Ferlito, Umberto;
- Grasso, Alfio Dario;
- Vaiana, Michele;
- Bruno, Giuseppe;
- Mohd-Yasin, Faisal
- Article
40
- Electronic Device Failure Analysis, 2010, v. 12, n. 1, p. 47, doi. 10.31399/asm.edfa.2010-1.p047
- Article
41
- Entropy, 2023, v. 25, n. 12, p. 1656, doi. 10.3390/e25121656
- Li, Jian;
- Liang, Bo;
- Zhang, Xiefu;
- Yu, Zhixin
- Article
42
- Research in Engineering Design, 2021, v. 32, n. 3, p. 309, doi. 10.1007/s00163-021-00360-1
- Cabanes, Benjamin;
- Hubac, Stéphane;
- Le Masson, Pascal;
- Weil, Benoit
- Article
43
- Research in Engineering Design, 2017, v. 28, n. 4, p. 457, doi. 10.1007/s00163-016-0245-0
- Kokshagina, Olga;
- Masson, Pascal;
- Weil, Benoit
- Article
44
- IT Professional, 2007, v. 9, n. 5, p. 8
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45
- Journal of Integrated Circuits & Systems, 2022, v. 17, n. 1, p. 1, doi. 10.29292/jics.v17i1.589
- Ferreira, Pietro M.;
- Avignon-Meseldzija, Emilie;
- Bénabès, Philippe;
- Trélin, Francis
- Article
46
- Journal of Integrated Circuits & Systems, 2021, v. 16, n. 2, p. 1, doi. 10.29292/jics.v16i2.490
- Silva, R. S.;
- Rodovalho, L. H.;
- Marquesy, J. L. B.;
- Rodriguesy, C. R.
- Article
47
- Electronics Systems & Software, 2005, v. 3, n. 6, p. 7
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48
- Electronics Systems & Software, 2005, v. 3, n. 6, p. 4
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49
- 2013
- Hannah Jun;
- Wonseok Woo;
- Hyoung-goo Kang
- Case Study
50
- Creativity & Innovation Management, 2016, v. 25, n. 2, p. 270, doi. 10.1111/caim.12121
- Kokshagina, Olga;
- Le Masson, Pascal;
- Weil, Benoit;
- Cogez, Patrick
- Article