Works matching DE "STATIC random access memory chips"
1
- International Journal of Electronics Letters, 2020, v. 8, n. 1, p. 38, doi. 10.1080/21681724.2018.1545924
- Hiblot, Gaspard;
- Liu, Yefan;
- Van der Plas, Geert
- Article
2
- Journal of Nanotechnology, 2017, p. 1, doi. 10.1155/2017/4575013
- Joshi, Shital;
- Alabawi, Umar
- Article
3
- International Journal of Simulation: Systems, Science & Technology, 2015, v. 16, n. 6, p. 13.1, doi. 10.5013/IJSSST.a.16.06.13
- Bhatnagar, Vipul;
- Kumar, Pradeep;
- Pandey, Sujata
- Article
4
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 637, doi. 10.1007/s10836-017-5685-6
- Martins, M.;
- Medeiros, G.;
- Copetti, T.;
- Vargas, F.;
- Bolzani Poehls, L.
- Article
5
- Journal of Electronic Testing, 2017, v. 33, n. 4, p. 449, doi. 10.1007/s10836-017-5659-8
- Niaraki Asli, Rahebeh;
- Taghipour, Shiva
- Article
6
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 189, doi. 10.1007/s10836-017-5649-x
- Article
7
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 749, doi. 10.1007/s10836-016-5622-0
- Ruan, Aiwu;
- Huang, Haiyang;
- Wang, Jingwu;
- Zhao, Yifan
- Article
8
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 137, doi. 10.1007/s10836-016-5573-5
- Li, Yuanqing;
- Li, Lixiang;
- Ma, Yuan;
- Chen, Li;
- Liu, Rui;
- Wang, Haibin;
- Wu, Qiong;
- Newton, Michael;
- Chen, Mo
- Article
9
- Journal of Electronic Testing, 2015, v. 31, n. 5/6, p. 561, doi. 10.1007/s10836-015-5549-x
- Li, Lixiang;
- Li, Yuanqing;
- Wang, Haibin;
- Liu, Rui;
- Wu, Qiong;
- Newton, Michael;
- Ma, Yuan;
- Chen, Li
- Article
10
- Journal of Electronic Testing, 2013, v. 29, n. 6, p. 741, doi. 10.1007/s10836-013-5424-6
- Article
11
- Journal of Electronic Testing, 2013, v. 29, n. 6, p. 779, doi. 10.1007/s10836-013-5418-4
- Bolchini, Cristiana;
- Miele, Antonio;
- Sandionigi, Chiara
- Article
12
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 457, doi. 10.1007/s10836-013-5393-9
- Thibeault, C.;
- Hariri, Y.;
- Hasan, S. R.;
- Hobeika, C.;
- Savaria, Y.;
- Audet, Y.;
- Tazi, F. Z.
- Article
13
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 341, doi. 10.1007/s10836-013-5387-7
- Alderighi, M.;
- Casini, F.;
- D'Angelo, S.;
- Gravina, A.;
- Liberali, V.;
- Mancini, M.;
- Musazzi, P.;
- Pastore, S.;
- Sassi, M.;
- Sorrenti, G.
- Article
14
- Computer Measurement & Control, 2018, v. 26, n. 2, p. 13, doi. 10.16526/j.cnki.11-4762/tp.2018.02.004
- Article
15
- International Journal of Reconfigurable Computing, 2017, p. 1, doi. 10.1155/2017/7021056
- Asghar, Ali;
- Iqbal, Muhammad Mazher;
- Ahmed, Waqar;
- Ali, Mujahid;
- Parvez, Husain;
- Rashid, Muhammad
- Article
16
- International Journal of Reconfigurable Computing, 2015, p. 1, doi. 10.1155/2015/314358
- Cardona, Luis Andres;
- Ferrer, Carles
- Article
17
- Journal of Engineering Science & Technology Review, 2016, v. 9, n. 5, p. 145
- Apostolidis, G.;
- Balobas, D.;
- Konofaos, N.
- Article
18
- Radioengineering, 2017, v. 26, n. 3, p. 772, doi. 10.13164/re.2017.0772
- KUMAR, Satyendra;
- SAHA, Kaushik;
- GUPTA, Hariom
- Article
19
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1172, doi. 10.1049/el.2016.0938
- Weiwei He;
- Jing Chen;
- Jiexin Luo;
- Zhan Chai;
- Xi Wang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 24, p. 1823, doi. 10.1049/el.2014.2540
- Article
21
- Journal of Low Power Electronics & Applications, 2018, v. 8, n. 4, p. 41, doi. 10.3390/jlpea8040041
- Tripathi, Tripti;
- Chauhan, Durg Singh;
- Singh, Sanjay Kumar
- Article
22
- Journal of Low Power Electronics & Applications, 2018, v. 8, n. 3, p. 28, doi. 10.3390/jlpea8030028
- Gu, Yunfei;
- Yan, Dengxue;
- Verma, Vaibhav;
- Wang, Pai;
- Stan, Mircea R.;
- Zhang, Xuan
- Article
23
- Journal of Low Power Electronics & Applications, 2017, v. 7, n. 3, p. 24, doi. 10.3390/jlpea7030024
- Singh, Pooran;
- Vishvakarma, Santosh Kumar
- Article
24
- Journal of Low Power Electronics & Applications, 2017, v. 7, n. 3, p. 23, doi. 10.3390/jlpea7030023
- Mittal, Sparsh;
- Rujia Wang;
- Vetter, Jeffrey
- Article
25
- Metallurgical & Mining Industry, 2015, n. 9, p. 1134
- Yuejie Zhang;
- Jianping Hu;
- Tianfang Ma;
- Beibei Qi
- Article
26
- IETE Journal of Research, 2013, v. 59, n. 5, p. 597, doi. 10.4103/0377-2063.123766
- Jahanirad, Hadi;
- Mohammadi, Karim
- Article
27
- Journal of Circuits, Systems & Computers, 2013, v. 22, n. 7, p. -1, doi. 10.1142/S021812661350062X
- SINGH, AJAY KUMAR;
- SEONG, MAH MENG;
- PRABHU, C. M. R.
- Article
28
- Journal of Ovonic Research, 2017, v. 13, n. 1, p. 1
- RUKKUMANI, V.;
- DEVARAJAN, N.;
- SARAVANAKUMAR, M.
- Article
29
- Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ), 2016, v. 41, n. 8, p. 2945, doi. 10.1007/s13369-016-2047-0
- Kavitha, M.;
- Govindaraj, T.
- Article
30
- Journal of Supercomputing, 2018, v. 74, n. 7, p. 3388, doi. 10.1007/s11227-018-2389-3
- Gao, Lan;
- Wang, Rui;
- Xu, Yunlong;
- Yang, Hailong;
- Luan, Zhongzhi;
- Qian, Depei;
- Zhang, Han;
- Cai, Jihong
- Article
31
- Journal of Supercomputing, 2015, v. 71, n. 8, p. 2847, doi. 10.1007/s11227-014-1332-5
- Valls, Joan;
- Ros, Alberto;
- Sahuquillo, Julio;
- Gómez, María
- Article
32
- Wireless Personal Communications, 2017, v. 96, n. 1, p. 1099, doi. 10.1007/s11277-017-4226-z
- Singh, Shalini;
- Akashe, Shyam
- Article
33
- Electronics (2079-9292), 2020, v. 9, n. 9, p. 1498, doi. 10.3390/electronics9091498
- Zhang, Xu;
- Jiang, Chunsheng;
- Gu, Ke;
- Zhong, Le;
- Fang, Wen;
- Dai, Gang
- Article
34
- Advances in Mechanical Engineering (Sage Publications Inc.), 2013, v. 5, p. 1, doi. 10.1155/2013/783673
- Jie Zhang;
- Yong Guan;
- Chunjing Mao
- Article
35
- Journal of Active & Passive Electronic Devices, 2017, v. 12, n. 1/2, p. 23
- BORKAR, NEHA;
- AKASHE, SHYAM
- Article
36
- Journal of Active & Passive Electronic Devices, 2016, v. 11, n. 4, p. 291
- SINGH, SHALINI;
- AKASHE, SHYAM
- Article
37
- Journal of Active & Passive Electronic Devices, 2016, v. 11, n. 4, p. 283
- SHARMA, JOSHIKA;
- KHANDELWAL, SAURABH;
- AKASHE, SHYAM
- Article
38
- Journal of Active & Passive Electronic Devices, 2015, v. 10, n. 1, p. 41
- SHARMA, JOSHIKA;
- AKASHE, SHYAM
- Article
39
- Journal of Active & Passive Electronic Devices, 2014, v. 9, n. 2/3, p. 101
- SIKARWAR, VANDNA;
- KHANDELWAL, SAURABH;
- AKASHE, SHYAM
- Article
40
- Sensors (14248220), 2020, v. 20, n. 21, p. 6132, doi. 10.3390/s20216132
- Zhang, Xu;
- Jiang, Chunsheng;
- Dai, Gang;
- Zhong, Le;
- Fang, Wen;
- Gu, Ke;
- Xiao, Guoping;
- Ren, Shangqing;
- Liu, Xin;
- Zou, Sanyong
- Article
41
- Electronic Device Failure Analysis, 2018, v. 20, n. 2, p. 18, doi. 10.31399/asm.edfa.2018-2.p018
- Zhigang Song;
- Safran, Laura
- Article
42
- Telkomnika, 2016, v. 14, n. 4, p. 1299, doi. 10.12928/TELKOMNIKA.v14i4.3458
- Chitra, P.;
- Ravi, S.;
- Ramakrishnan, V. N.
- Article
43
- Majlesi Journal of Electrical Engineering, 2012, v. 6, n. 4, p. 30
- Ebrahimi, Amir;
- Kargaran, Ehsan;
- Golmakani, Abbas
- Article
44
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 22, p. 1, doi. 10.1049/ell2.13036
- Bai, Su;
- Guo, Jiaqi;
- Liu, Yunlong;
- Xu, Yaohua;
- Peng, Chunyu;
- Wu, Xiulong
- Article
45
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12885
- Mai, Yangzhan;
- Wang, Mingyu;
- Zhong, Baiqing;
- Zhang, Chuanghao;
- Zhang, Yicong;
- Yu, Zhiyi
- Article
46
- Journal of VLSI Circuits & Systems (JVCS), 2020, v. 2, n. 1, p. 18, doi. 10.31838/jvcs/02.01.05
- Article
47
- i-Manager's Journal on Circuits & Systems, 2018, v. 6, n. 2, p. 19
- LOKESH, P.;
- MUNIREDDY, T.;
- PESHA, J. V.
- Article
48
- i-Manager's Journal on Circuits & Systems, 2018, v. 6, n. 2, p. 8, doi. 10.26634/jcir.6.2.14760
- SHIVAPRAKASH, G.;
- SURESH, D. S.
- Article
49
- i-Manager's Journal on Circuits & Systems, 2017, v. 6, n. 1, p. 25
- TIWARI, NIDHI;
- NEEMA, VAIBHAV;
- RANGRA, KAMAL J.;
- SHARMA, YOGESH CHANDRA
- Article
50
- i-Manager's Journal on Circuits & Systems, 2016, v. 4, n. 4, p. 1, doi. 10.26634/jcir.4.4.12392
- REDDY, A. PULLA;
- SREENIVASULU, G.;
- CHARY, R. VEERABADRA
- Article