Works matching DE "STATIC random access memory"
1
- Canadian Journal of Chemistry, 2025, v. 103, n. 6, p. 270, doi. 10.1139/cjc-2024-0103
- Elash, Christopher J.;
- Pour-Momen, Peiman;
- Shi, Shuting;
- Belev, George;
- Sammynaiken, R.;
- Chen, Li
- Article
2
- Advanced Electronic Materials, 2025, v. 11, n. 8, p. 1, doi. 10.1002/aelm.202400786
- Ran, Yuqia;
- Song, Yiwen;
- Li, Long;
- Song, Xujin;
- Gu, Pingfan;
- Wang, Qi;
- Du, Haifeng;
- Kang, Jinfeng;
- Ye, Yu
- Article
3
- Applied Sciences (2076-3417), 2025, v. 15, n. 10, p. 5712, doi. 10.3390/app15105712
- Kim, Han-Gyeol;
- Jo, Sung-Hun
- Article
4
- Micro & Nano Letters (Wiley-Blackwell), 2020, v. 15, n. 2, p. 72, doi. 10.1049/mnl.2019.0375
- Panigrahi, Spandita;
- Sahu, Prasanna Kumar;
- Lenka, Annada Shankar
- Article
5
- Electronic Science & Technology, 2022, v. 35, n. 9, p. 44, doi. 10.16180/j.cnki.issn1007-7820.2022.09.007
- Article
6
- Advanced Electronic Materials, 2022, v. 8, n. 11, p. 1, doi. 10.1002/aelm.202200528
- Pradhan, Jyoti Ranjan;
- Singh, Manvendra;
- Dasgupta, Subho
- Article
7
- Advanced Electronic Materials, 2019, v. 5, n. 7, p. N.PAG, doi. 10.1002/aelm.201900313
- Zhu, Ma‐Guang;
- Zhang, Zhiyong;
- Peng, Lian‐Mao
- Article
8
- Computational Intelligence in Electrical Engineering, 2024, v. 15, n. 4, p. 1, doi. 10.22108/ISEE.2024.138212.1636
- سید حسن هادی نعمتی;
- نیما اسلامی;
- محمد حسین معیری
- Article
9
- Advances in Systems Science & Applications, 2022, v. 22, n. 1, p. 130
- Rani, Mucherla Usha;
- N., Siva Sankara Reddy;
- B., Rajendra Naik
- Article
10
- Telecommunication Engineering, 2020, v. 60, n. 12, p. 1491, doi. 10.3969/j.issn.1001-893x.2020.12.017
- Article
11
- International Journal of Electronics Letters, 2024, v. 12, n. 2, p. 144, doi. 10.1080/21681724.2023.2210295
- Ashrafi, Md. Shakib Ibne;
- Maruf, Md Hasan;
- Shihavuddin, ASM;
- Ali, Syed Iftekhar
- Article
12
- International Journal of Electronics Letters, 2023, v. 11, n. 3, p. 339, doi. 10.1080/21681724.2022.2087914
- Kumar, Prashant;
- Panchore, Meena;
- Raikwal, Pushpa;
- Cecil, Kanchan
- Article
13
- International Journal of Electronics Letters, 2021, v. 9, n. 4, p. 494, doi. 10.1080/21681724.2020.1794048
- Patel, Pramod Kumar;
- Malik, Manzar;
- Gupta, Tarun Kumar
- Article
14
- International Journal of Electronics Letters, 2019, v. 7, n. 1, p. 117, doi. 10.1080/21681724.2018.1461248
- Article
15
- Archives for Technical Sciences / Arhiv za Tehnicke Nauke, 2025, n. 32, p. 44, doi. 10.70102/afts.2025.1732.044
- Joy, Ancy;
- Kuruvilla, Jinsa
- Article
16
- IUP Journal of Telecommunications, 2019, v. 11, n. 2, p. 57
- Mamta;
- Grewal, Surender Kumar
- Article
17
- Journal of Electrical & Computer Engineering, 2024, v. 2024, p. 1, doi. 10.1155/2024/9212078
- K, Aishwarya;
- B, Lakshmi;
- Lutzemberger, Giovanni
- Article
18
- Journal of Nanotechnology, 2020, p. 1, doi. 10.1155/2020/7608279
- Natarajamoorthy, Mathan;
- Subbiah, Jayashri;
- Alias, Nurul Ezaila;
- Tan, Michael Loong Peng
- Article
19
- Journal of Nanotechnology, 2020, p. 1, doi. 10.1155/2020/7608279
- Natarajamoorthy, Mathan;
- Subbiah, Jayashri;
- Alias, Nurul Ezaila;
- Tan, Michael Loong Peng
- Article
20
- Advances in Condensed Matter Physics, 2018, p. 1, doi. 10.1155/2018/2683723
- Narendran, S.;
- Selvakumar, J.
- Article
21
- Optical & Quantum Electronics, 2022, v. 54, n. 9, p. 1, doi. 10.1007/s11082-022-03992-2
- Bagherian Khosroshahy, Milad;
- Moaiyeri, Mohammad Hossein;
- Abdoli, Alireza
- Article
22
- Journal of Electronic Testing, 2019, v. 35, n. 4, p. 473, doi. 10.1007/s10836-019-05819-7
- P, Princy;
- N.M., Sivamangai
- Article
23
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 191, doi. 10.1007/s10836-019-05784-1
- Medeiros, G. Cardoso;
- Brum, E.;
- Poehls, L. Bolzani;
- Copetti, T.;
- Balen, T.
- Article
24
- Journal of Electronic Testing, 2019, v. 35, n. 2, p. 201, doi. 10.1007/s10836-019-05783-2
- Ranjbar, Omid;
- Bayat-Sarmadi, Siavash;
- Pooyan, Fatemeh;
- Asadi, Hossein
- Article
25
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 137, doi. 10.1007/s10836-016-5573-5
- Li, Yuanqing;
- Li, Lixiang;
- Ma, Yuan;
- Chen, Li;
- Liu, Rui;
- Wang, Haibin;
- Wu, Qiong;
- Newton, Michael;
- Chen, Mo
- Article
26
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 425, doi. 10.1007/s10836-014-5463-7
- Ullah, Anees;
- Sterpone, Luca
- Article
27
- Journal of Electronic Testing, 2014, v. 30, n. 2, p. 159, doi. 10.1007/s10836-014-5444-x
- Ceratti, A.;
- Copetti, T.;
- Bolzani, L.;
- Vargas, F.;
- Fagundes, R.
- Article
28
- Journal of Electronic Testing, 2014, v. 30, n. 2, p. 171, doi. 10.1007/s10836-014-5439-7
- Somha, Worawit;
- Yamauchi, Hiroyuki
- Article
30
- Journal of Cybersecurity & Information Management, 2024, v. 14, n. 1, p. 207, doi. 10.54216/JCIM.140114
- Saranya, N. Naga;
- Shilpa, V. Jean;
- Jayakumar, K.;
- Senthil, P.;
- Arun, M.
- Article
31
- i-Manager's Journal on Digital Signal Processing, 2019, v. 7, n. 2, p. 25
- SRIMATHI;
- BALAMURUGAN, K.;
- MAHESWARI, M. SRIDEVI
- Article
32
- Intel Technology Journal, 2013, v. 17, n. 1, p. 18
- Wilkerson, Chris;
- Alameldeen, Alaa;
- Chishti, Zeshan
- Article
33
- Computers (2073-431X), 2025, v. 14, n. 1, p. 23, doi. 10.3390/computers14010023
- Junejo, Yahya S.;
- Shaikh, Faisal K.;
- Chowdhry, Bhawani S.;
- Ejaz, Waleed
- Article
34
- Carpathian Journal of Electrical Engineering, 2019, v. 12, n. 2, p. 15, doi. 10.2478/cjece-2019-0011
- Devnath, Bappy Chandra;
- Biswas, Satyendra N.
- Article
35
- Carpathian Journal of Electrical Engineering, 2019, v. 12, n. 1, p. 29, doi. 10.2478/cjece-2019-0006
- Sharif, Kazi Fatima;
- Biswas, Satyendra N.
- Article
36
- Journal of the Korea Institute of Information & Communication Engineering, 2020, v. 24, n. 8, p. 1037, doi. 10.6109/jkiice.2020.24.8.1037
- Article
37
- Journal of the Korea Institute of Information & Communication Engineering, 2019, v. 13, n. 11, p. 1377, doi. 10.6109/jkiice.2019.23.11.1377
- Article
38
- Indian Journal of Pure & Applied Physics, 2022, v. 60, n. 12, p. 1016, doi. 10.56042/ijpap.v60i12.67455
- Mustaqueem, Zeba;
- Ansari, Abdul Quaiyum;
- Akram, Md. Waseem
- Article
39
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-021-03994-2
- Han, Seong-Joo;
- Han, Joon-Kyu;
- Yun, Gyeong-Jun;
- Lee, Mun-Woo;
- Yu, Ji-Man;
- Choi, Yang-Kyu
- Article
40
- Expert Systems, 2022, v. 39, n. 10, p. 1, doi. 10.1111/exsy.13039
- Zhang, Fan;
- Guo, Chenguang;
- Zhang, Shifeng;
- Zeng, Qinqin;
- Nguyen, Tri Gia
- Article
41
- IUP Journal of Electrical & Electronics Engineering, 2021, v. 14, n. 1, p. 7
- Kumar, Gyanender;
- Yadav, Sachin Kumar
- Article
42
- International Journal of Performability Engineering, 2021, v. 17, n. 2, p. 167, doi. 10.23940/ijpe.21.02.p1.167177
- Janniekode, Uma Maheshwar;
- Somineni, Rajendra Prasad;
- Naidu, C. D.
- Article
43
- International Journal of Performability Engineering, 2019, n. 11, p. 3052, doi. 10.23940/ijpe.19.11.p25.30523060
- Yuanyuan Ma;
- Bai Na;
- Wei Tan;
- Gelan Yang
- Article
44
- BMC Genomics, 2019, v. 20, p. 1, doi. 10.1186/s12864-019-6341-6
- Yang, Andrian;
- Kishore, Abhinav;
- Phipps, Benjamin;
- Ho, Joshua W. K.
- Article
45
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3337, doi. 10.1007/s11664-013-2762-1
- Gogna, P.;
- Suarez, E.;
- Lingalugari, M.;
- Chandy, J.;
- Heller, E.;
- Hasaneen, E.-S.;
- Jain, F.-C.
- Article
46
- Multimedia Tools & Applications, 2025, v. 84, n. 8, p. 4809, doi. 10.1007/s11042-024-18950-1
- Al-Ghuraybi, Hind A.;
- AlZain, Mohammed A.;
- Soh, Ben
- Article
47
- Informacije MIDEM: Journal of Microelectronics, Electronic Components & Materials, 2018, v. 48, n. 4, p. 197, doi. 10.33180/InfMIDEM2018.401
- Article
48
- Maska, 2017, v. 32, n. 187/188, p. 6, doi. 10.1386/maska.32.187-188.6_7
- Article
49
- Journal of Measurement Science & Instrumentation, 2020, n. 3, p. 205, doi. 10.3969/j.issn.1674-8042.2020.03.001
- YU Zhi-guo;
- LI Qing-qing;
- FENG Yang;
- GU Xiao-feng
- Article
50
- Journal of Measurement Science & Instrumentation, 2015, v. 6, n. 1, p. 63, doi. 10.3969/j.issn.1674-8042.2015.01.012
- YAO Qin-qin;
- XIE Rui;
- BAI Ru;
- SHEN Yu-ling
- Article