Works matching DE "SPECTROMETER industry"
1
- Atmospheric Measurement Techniques, 2011, v. 4, n. 9, p. 1735, doi. 10.5194/amt-4-1735-2011
- Krings, T.;
- Gerilowski, K.;
- Buchwitz, M.;
- Reuter, M.;
- Tretner, A.;
- Erzinger, J.;
- Heinze, D.;
- Pflüger, U.;
- Burrows, J. P.;
- Bovensmann, H.
- Article
2
- Instrumentation Science & Technology, 2008, v. 36, n. 4, p. 410, doi. 10.1080/10739140802151689
- Demir, Faruk;
- Şimşek, Önder;
- Budak, Gökhan;
- Karabulut, Abdulhalik
- Article
3
- Instrumentation Science & Technology, 2008, v. 36, n. 4, p. 432, doi. 10.1080/10739140802151796
- Article
4
- Hyperfine Interactions, 2004, v. 156/157, n. 1-4, p. 15, doi. 10.1023/B:HYPE.0000043202.86190.55
- Mashlan, Miroslav;
- Yevdokimov, Viktor;
- Pechousek, Jiri;
- Zboril, Radek;
- Kholmetskii, Alexander
- Article
5
- Hyperfine Interactions, 2004, v. 156/157, n. 1-4, p. 3, doi. 10.1023/B:HYPE.0000043200.50133.5c
- Kholmetskii, A. L.;
- Evdokimov, V. A.;
- Mashlan, M.;
- Misevich, O. V.;
- Lopatik, A. R.
- Article
6
- Nature Photonics, 2008, v. 2, n. 9, p. 544, doi. 10.1038/nphoton.2008.175
- Article