Works matching DE "SOLID immersion lenses"
1
- PIERS Proceedings, 2014, p. 1232
- Taikei Suyama;
- Xiaowei Ji;
- Akira Matsushima;
- Yaoju Zhang
- Article
2
- International Journal of Quantum Information, 2014, v. 12, n. 7/8, p. -1, doi. 10.1142/S0219749915600114
- Monticone, D. Gatto;
- Forneris, J.;
- Levi, M.;
- Battiato, A.;
- Picollo, F.;
- Olivero, P.;
- Traina, P.;
- Moreva, E.;
- Enrico, E.;
- Brida, G.;
- Degiovanni, I. P.;
- Genovese, M.;
- Amato, G.;
- Boarino, L.
- Article
3
- Optica Applicata, 2013, v. 43, n. 2, p. 247, doi. 10.5277/oa130205
- XIANGMEI DONG;
- TAO GENG;
- SONGLIN ZHUANG
- Article
4
- Electronic Device Failure Analysis, 2015, v. 17, n. 3, p. 12, doi. 10.31399/asm.edfa.2015-3.p012
- Stellari, Franco;
- Chung-Ching Lin;
- Peilin Song
- Article
5
- Electronic Device Failure Analysis, 2015, v. 17, n. 2, p. 4, doi. 10.31399/asm.edfa.2015-2.p004
- Lo, William;
- Marks, Howard
- Article
6
- Electronic Device Failure Analysis, 2015, v. 17, n. 1, p. 12, doi. 10.31399/asm.edfa.2015-1.p012
- Lo, William;
- Marks, Howard
- Article
7
- Electronic Device Failure Analysis, 2014, v. 16, n. 2, p. 26, doi. 10.31399/asm.edfa.2014-2.p026
- Vigil, Kyle;
- Yang Lu;
- Yurt, Abdulkadir;
- Cilingiroglu, Tenzile Berkin;
- Bifano, Thomas G.;
- Ünlü, M. Selim;
- Goldberg, Bennett B.
- Article
8
- 2014
- Pardy, Patrick;
- Niu, Baohua
- Proceeding