Works matching DE "SOFT errors"

Results: 299

A Radiation-Hardened Low-Power SRAM with Enhanced Write Capability for Space Applications.

Published in:

Applied Sciences (2076-3417), 2025, v. 15, n. 13, p. 6988, doi. 10.3390/app15136988

By:

Kim, Sang-Jin;
Jo, Sung-Hun

Publication type:

Article

Applying Reinforcement Learning to Protect Deep Neural Networks from Soft Errors.

Published in:

Sensors (14248220), 2025, v. 25, n. 13, p. 4196, doi. 10.3390/s25134196

By:

Su, Peng;
Li, Yuhang;
Lu, Zhonghai;
Chen, Dejiu

Publication type:

Article

Research on soft errors induced by alpha particles and atmospheric neutrons based on 28 nm field programmable gate array.

Published in:

Journal of Nuclear Science & Technology, 2025, v. 62, n. 7, p. 670, doi. 10.1080/00223131.2025.2462190

By:

Ma, Chao;
Du, Xuecheng;
Zhao, Xu;
Hu, Zhiliang;
Zhang, Panfeng;
Zhou, Chao;
Zheng, Bo;
Wang, Xiaodong;
Feng, Song

Publication type:

Article

A posteriori error estimates of mixed finite element solutions for fourth order parabolic control problems.

Published in:

Journal of Inequalities & Applications, 2015, v. 2015, n. 1, p. 1, doi. 10.1186/s13660-015-0762-9

By:

Hou, Chunjuan;
Chen, Yanping;
Lu, Zuliang

Publication type:

Article

Fine-Grained Fault Sensitivity Analysis of Vision Transformers Under Soft Errors.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 12, p. 2418, doi. 10.3390/electronics14122418

By:

He, Jiajun;
Liu, Yi;
Xu, Changqing;
Liao, Xinfang;
Yang, Yintang

Publication type:

Article

DMR-SCL: A Design and Verification Framework for Redundancy-Based Resilient Asynchronous Sleep Convention Logic Circuits †.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 5, p. 884, doi. 10.3390/electronics14050884

By:

Datta, Mithun;
Mazumder, Dipayan;
Bodoh, Alexander C.;
Sakib, Ashiq A.

Publication type:

Article

Two-Dimensional Protection Code for Virtual Page Information in Translation Lookaside Buffers.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 7, p. 1320, doi. 10.3390/electronics13071320

By:

Gao, Xin;
Cui, Naiyuan;
Nian, Jiawei;
Liu, Hongjin;
Yang, Mengfei

Publication type:

Article

Radiation Effects of Advanced Electronic Devices and Circuits.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 6, p. 1073, doi. 10.3390/electronics13061073

By:

Chi, Yaqing;
Cai, Chang;
Cai, Li

Publication type:

Article

Fault Classification and Diagnosis Approach Using FFT-CNN for FPGA-Based CORDIC Processor.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 1, p. 72, doi. 10.3390/electronics13010072

By:

Xie, Yu;
Chen, He;
Zhuang, Yin;
Xie, Yizhuang

Publication type:

Article

Evaluation of Single Event Upset on a Relay Protection Device.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 1, p. 64, doi. 10.3390/electronics13010064

By:

Zhou, Hualiang;
Yu, Hao;
Zou, Zhiyang;
Su, Zhantao;
Zhao, Qianyun;
Yang, Weitao;
He, Chaohui

Publication type:

Article

Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 24, p. 4978, doi. 10.3390/electronics12244978

By:

Song, Ruiqiang;
Shao, Jinjin;
Chi, Yaqing;
Liang, Bin;
Chen, Jianjun;
Wu, Zhenyu

Publication type:

Article

On-Chip Bus Protection against Soft Errors.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 22, p. 4706, doi. 10.3390/electronics12224706

By:

Mach, Ján;
Kohútka, Lukáš;
Čičák, Pavel

Publication type:

Article

gemV-tool: A Comprehensive Soft Error Reliability Estimation Tool for Design Space Exploration.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 22, p. 4573, doi. 10.3390/electronics12224573

By:

So, Hwisoo;
Ko, Yohan;
Jung, Jinhyo;
Lee, Kyoungwoo;
Shrivastava, Aviral

Publication type:

Article

Soft Error Simulation of Near-Threshold SRAM Design for Nanosatellite Applications.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 18, p. 3968, doi. 10.3390/electronics12183968

By:

Artola, Laurent;
Ruard, Benjamin;
Forest, Julien;
Hubert, Guillaume

Publication type:

Article

Soft-Error-Aware Radiation-Hardened Ge-DLTFET-Based SRAM Cell Design.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 14, p. 3198, doi. 10.3390/electronics12143198

By:

Raikwal, Pushpa;
Kumar, Prashant;
Panchore, Meena;
Dwivedi, Pushpendra;
Cecil, Kanchan

Publication type:

Article

Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 12, p. 2557, doi. 10.3390/electronics12122557

By:

Santos, Douglas A.;
Mattos, André M. P.;
Melo, Douglas R.;
Dilillo, Luigi

Publication type:

Article

Research on Posture Sensing and Error Elimination for Soft Manipulator Using FBG Sensors.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 6, p. 1476, doi. 10.3390/electronics12061476

By:

Li, Wenyu;
He, Yanlin;
Geng, Peng;
Yang, Yi

Publication type:

Article

Single-Event Transient Study of 28 nm UTBB-FDSOI Technology Using Pulsed Laser Mapping †.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 5, p. 1214, doi. 10.3390/electronics12051214

By:

Chen, Rui;
Chen, Li;
Li, Sai;
Liu, Rui;
Li, Xuantian;
Shi, Shuting;
Gu, Cheng;
Han, Jianwei

Publication type:

Article

A Checkpointing Recovery Approach for Soft Errors Based on Detector Locations.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 4, p. 805, doi. 10.3390/electronics12040805

By:

Yang, Na;
Wang, Yun

Publication type:

Article

Soft Error Sensitivity Analysis Based on 40 nm SRAM-Based FPGA.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 23, p. 3844, doi. 10.3390/electronics11233844

By:

Xiong, Xu;
Du, Xuecheng;
Zheng, Bo;
Chen, Zhi;
Jiang, Wei;
He, Sanjun;
Zhu, Yixin

Publication type:

Article

A High Performance and Low Power Triple-Node-Upset Self-Recoverable Latch Design.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 21, p. 3606, doi. 10.3390/electronics11213606

By:

Dai, Yanyun;
Yang, Yanfei;
Jiang, Nan;
Qi, Pengjia;
Chen, Qi;
Tong, Jijun

Publication type:

Article

A Study on Selective Implementation Approaches for Soft Error Detection Using S-SWIFT-R.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 20, p. 3380, doi. 10.3390/electronics11203380

By:

Nikseresht, Mohaddaseh;
Vankeirsbilck, Jens;
Boydens, Jeroen

Publication type:

Article

A Fully Polarity-Aware Double-Node-Upset-Resilient Latch Design.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 15, p. 2465, doi. 10.3390/electronics11152465

By:

Park, Jung-Jin;
Kang, Young-Min;
Kim, Geon-Hak;
Chang, Ik-Joon;
Kim, Jinsang

Publication type:

Article

Quantitative Research on Generalized Linear Modeling of SEU and Test Programs Based on Small Sample Data.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 14, p. N.PAG, doi. 10.3390/electronics11142242

By:

Chu, Fei;
Chen, Hongzhuan;
Yu, Chunqing;
You, Lihua;
Wang, Liang;
Liu, Yun

Publication type:

Article

TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 13, p. N.PAG, doi. 10.3390/electronics11132043

By:

Shao, Jinjin;
Song, Ruiqiang;
Chi, Yaqing;
Liang, Bin;
Wu, Zhenyu

Publication type:

Article

TECED: A Two-Dimensional Error-Correction Codes Based Energy-Efficiency SRAM Design.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 10, p. N.PAG, doi. 10.3390/electronics11101638

By:

Chen, Zhenglin;
Zhao, Yunping;
Lu, Jianzhuang;
Liang, Bin;
Chen, Xiaowen;
Li, Chen

Publication type:

Article

Survey of Software-Implemented Soft Error Protection.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 3, p. 456, doi. 10.3390/electronics11030456

By:

Ko, Yohan

Publication type:

Article

DuckCore: A Fault-Tolerant Processor Core Architecture Based on the RISC-V ISA.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 1, p. 122, doi. 10.3390/electronics11010122

By:

Li, Jiemin;
Zhang, Shancong;
Bao, Chong

Publication type:

Article

Revisiting Symptom-Based Fault Tolerant Techniques against Soft Errors.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 23, p. 3028, doi. 10.3390/electronics10233028

By:

So, Hwisoo;
Didehban, Moslem;
Ko, Yohan;
Jeyapaul, Reiley;
Kim, Jongho;
Kim, Youngbin;
Lee, Kyoungwoo;
Shrivastava, Aviral

Publication type:

Article

High-Performance Double-Node-Upset-Tolerant and Triple-Node-Upset-Tolerant Latch Designs.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 20, p. 2515, doi. 10.3390/electronics10202515

By:

Xu, Hui;
Zhou, Le;
Liang, Huaguo;
Huang, Zhengfeng;
Sun, Cong;
Ning, Yafei

Publication type:

Article

HTNURL: Design of a High-Performance Low-Cost Triple-Node Upset Self-Recoverable Latch.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 20, p. 2457, doi. 10.3390/electronics10202457

By:

Xu, Hui;
Peng, Zehua;
Liang, Huaguo;
Huang, Zhengfeng;
Sun, Cong;
Zhou, Le

Publication type:

Article

Characterizing System-Level Masking Effects against Soft Errors.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 18, p. 2286, doi. 10.3390/electronics10182286

By:

Ko, Yohan

Publication type:

Article

An Ultra-Low-Cost Soft Error Protection Scheme Based on the Selection of Critical Variables.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 17, p. 2101, doi. 10.3390/electronics10172101

By:

Ko, Yohan

Publication type:

Article

LIHL: Design of a Novel Loop Interlocked Hardened Latch.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 17, p. 2090, doi. 10.3390/electronics10172090

By:

Xu, Hui;
Liu, Xuan;
Yu, Guo;
Liang, Huaguo;
Huang, Zhengfeng

Publication type:

Article

Selective Code Duplication for Soft Error Protection on VLIW Architectures.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 15, p. 1835, doi. 10.3390/electronics10151835

By:

Ko, Yohan;
Kim, Soohwan;
Kim, Hyunchoong;
Lee, Kyoungwoo

Publication type:

Article

Categorization and SEU Fault Simulations of Radiation-Hardened-by-Design Flip-Flops.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 13, p. 1572, doi. 10.3390/electronics10131572

By:

Hamed, Ehab A.;
Lee, Inhee

Publication type:

Article

Low-Cost Soft Error Robust Hardened D-Latch for CMOS Technology Circuit.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 11, p. 1256, doi. 10.3390/electronics10111256

By:

Hatefinasab, Seyedehsomayeh;
Rodriguez, Noel;
García, Antonio;
Castillo, Encarnacion

Publication type:

Article

Comparative Study on the "Soft Errors" Induced by Single-Event Effect and Space Electrostatic Discharge.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 7, p. 802, doi. 10.3390/electronics10070802

By:

Chen, Rui;
Chen, Li;
Han, Jianwei;
Wang, Xuan;
Liang, Yanan;
Ma, Yingqi;
Shangguan, Shipeng;
Ratti, Lodovico

Publication type:

Article

F_Radish: Enhancing Silent Data Corruption Detection for Aerospace-Based Computing.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 1, p. 61, doi. 10.3390/electronics10010061

By:

Yang, Na;
Wang, Yun

Publication type:

Article

FPGA-Based Reliable Fault Secure Design for Protection against Single and Multiple Soft Errors.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 12, p. 2064, doi. 10.3390/electronics9122064

By:

Shaker, Manar N.;
Hussien, Ahmed;
Alkady, Gehad I.;
Amer, Hassanein H.;
Adly, Ihab

Publication type:

Article

A Methodology to Analyze the Fault Tolerance of Demosaicking Methods against Memory Single Event Functional Interrupts (SEFIs).

Published in:

Electronics (2079-9292), 2020, v. 9, n. 10, p. 1619, doi. 10.3390/electronics9101619

By:

Aranda, Luis Alberto;
Sánchez-Macián, Alfonso;
Maestro, Juan Antonio

Publication type:

Article

A Review on Evaluation and Configuration of Fault Injection Attack Instruments to Design Attack Resistant MCU-Based IoT Applications.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 7, p. 1153, doi. 10.3390/electronics9071153

By:

Kazemi, Zahra;
Hely, David;
Fazeli, Mahdi;
Beroulle, Vincent

Publication type:

Article

Characterization of Single Event Cell Upsets in a Radiation Hardened SRAM in a 40 nm Bulk CMOS Technology.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 6, p. 927, doi. 10.3390/electronics9060927

By:

Yang, Guoqing;
Yu, Junting;
Zhang, Jincheng;
Liu, Xiangyuan;
Chen, Qiang

Publication type:

Article

ASFIT: AUTOSAR-Based Software Fault Injection Test for Vehicles.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 5, p. 850, doi. 10.3390/electronics9050850

By:

Park, Jihyun;
Choi, Byoungju

Publication type:

Article

A Reactive and On-Chip Sensor Circuit for NBTI and PBTI Resilient SRAM Design.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 2, p. 326, doi. 10.3390/electronics9020326

By:

Yadav, Nandakishor;
Kim, Youngbae;
Alashi, Mahmoud;
Choi, Kyuwon Ken

Publication type:

Article

Bias Temperature Instability Aware and Soft Error Tolerant Radiation Hardened 10T SRAM Cell.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 2, p. 256, doi. 10.3390/electronics9020256

By:

Shah, Ambika Prasad;
Waltl, Michael

Publication type:

Article

Using Approximate Computing and Selective Hardening for the Reduction of Overheads in the Design of Radiation-Induced Fault-Tolerant Systems.

Published in:

Electronics (2079-9292), 2019, v. 8, n. 12, p. 1539, doi. 10.3390/electronics8121539

By:

Aponte-Moreno, Alexander;
Restrepo-Calle, Felipe;
Pedraza, Cesar

Publication type:

Article

SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA.

Published in:

Electronics (2079-9292), 2019, v. 8, n. 12, p. 1531, doi. 10.3390/electronics8121531

By:

Cai, Chang;
Gao, Shuai;
Zhao, Peixiong;
Yu, Jian;
Zhao, Kai;
Xu, Liewei;
Li, Dongqing;
He, Ze;
Yang, Guangwen;
Liu, Tianqi;
Liu, Jie

Publication type:

Article

Step-by-step magic state encoding for efficient fault-tolerant quantum computation.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep07501

By:

Hayato Goto

Publication type:

Article

Fingerprint verification using computational geometry.

Published in:

Dyna (0012-7353), 2016, v. 83, n. 195, p. 128, doi. 10.15446/dyna.v83n195.46323

By:

Ramírez-Flores, Manuel;
Aguilar-Torres, Gualberto;
Gallegos-García, Gina

Publication type:

Article