Works matching DE "SOFT errors"
Results: 274
Adaptive Optimization of Control Parameters for Feed-Forward Software Defined Equalization.
- Published in:
- Wireless Personal Communications, 2017, v. 95, n. 4, p. 4001, doi. 10.1007/s11277-017-4036-3
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- Publication type:
- Article
Precise Error Rate Analysis of Wireless Relay Networks.
- Published in:
- Wireless Personal Communications, 2017, v. 95, n. 4, p. 5081, doi. 10.1007/s11277-017-4146-y
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- Publication type:
- Article
Priority Filt: A Way to Increase Network Reliability on Chip against Soft Error by Considering Multiple Bit Upset.
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- Computational Intelligence in Electrical Engineering, 2021, v. 12, n. 3, p. 20
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- Publication type:
- Article
Predicting the Soft Error Vulnerability of Parallel Applications Using Machine Learning.
- Published in:
- International Journal of Parallel Programming, 2021, v. 49, n. 3, p. 410, doi. 10.1007/s10766-021-00707-0
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- Publication type:
- Article
Fault Recovery Methods for Asynchronous Linear Solvers.
- Published in:
- International Journal of Parallel Programming, 2021, v. 49, n. 1, p. 51, doi. 10.1007/s10766-020-00676-w
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- Publication type:
- Article
A Survey of Soft-Error Mitigation Techniques for Non-Volatile Memories.
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- Computers (2073-431X), 2017, v. 6, n. 1, p. 8, doi. 10.3390/computers6010008
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- Publication type:
- Article
一种 Xilinx FPGA 有效配置位保护方法.
- Published in:
- Telecommunication Engineering, 2022, v. 62, n. 3, p. 379, doi. 10.3969/j.issn.1001-893x.2022.03.017
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- Publication type:
- Article
A Scalable Formal Framework for the Verification and Vulnerability Analysis of Redundancy-Based Error-Resilient Null Convention Logic Asynchronous Circuits.
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- Journal of Low Power Electronics & Applications, 2024, v. 14, n. 1, p. 5, doi. 10.3390/jlpea14010005
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- Publication type:
- Article
In-Pipeline Processor Protection against Soft Errors.
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- Journal of Low Power Electronics & Applications, 2023, v. 13, n. 2, p. 33, doi. 10.3390/jlpea13020033
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- Publication type:
- Article
Design and Analysis of SEU Hardened Latch for Low Power and High Speed Applications.
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- Journal of Low Power Electronics & Applications, 2019, v. 9, n. 3, p. 21, doi. 10.3390/jlpea9030021
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- Publication type:
- Article
A Bi-Exponential Repair Algorithm for Radiation-Induced Double-Strand Breaks: Application to Simulation of Chromosome Aberrations.
- Published in:
- Genes, 2019, v. 10, n. 11, p. 936, doi. 10.3390/genes10110936
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- Publication type:
- Article
ENHANCED CLOCK GATING TECHNIQUE FOR POWER OPTIMIZATION IN SRAM AND SEQUENTIAL CIRCUIT.
- Published in:
- Journal of Automation, Mobile Robotics & Intelligent Systems, 2021, v. 15, n. 2, p. 32, doi. 10.14313/JAMRIS/2-2021/11
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- Publication type:
- Article
Soft error tolerance using HVDQ (Horizontal-Vertical-Diagonal-Queen parity method).
- Published in:
- Computer Systems Science & Engineering, 2017, v. 32, n. 1, p. 35
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- Publication type:
- Article
Fault Detection and Analysis in SRAM through SelfRefreshing Operation.
- Published in:
- EAI Endorsed Transactions on Scalable Information Systems, 2024, v. 11, n. 3, p. 1, doi. 10.4108/eetsis.4025
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- Publication type:
- Article
水泵水轮机甩负荷过程流动诱导噪声数值模拟.
- Published in:
- Transactions of the Chinese Society of Agricultural Engineering, 2019, v. 35, n. 18, p. 52, doi. 10.11975/j.issn.1002-6819.2018.20.007
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- Publication type:
- Article
A 1‐GHz GC‐eDRAM in 7‐nm FinFET with static retention time at 700 mV for ultra‐low power on‐chip memory applications.
- Published in:
- International Journal of Circuit Theory & Applications, 2022, v. 50, n. 2, p. 417, doi. 10.1002/cta.3171
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- Publication type:
- Article
An efficient combinational approach for PAPR reduction in MIMO-OFDM system.
- Published in:
- Wireless Networks (10220038), 2016, v. 22, n. 2, p. 417, doi. 10.1007/s11276-015-0974-4
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- Publication type:
- Article
Radiotherapy-related skin toxicity (RAREST-02): A randomized trial testing the effect of a mobile application reminding head-and-neck cancer patients to perform skin care (reminder app) on radiation dermatitis.
- Published in:
- 2020
- By:
- Publication type:
- journal article
High Reliability Soft Error Hardened Latch Designfor Nanoscale CMOS Technology using PVT Variation.
- Published in:
- Wireless Personal Communications, 2023, v. 128, n. 2, p. 1471, doi. 10.1007/s11277-022-10033-4
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- Publication type:
- Article
A Dynamic Hybrid Decoder Apprroach Using EG-LDPC Codes for Signal Processing Applications.
- Published in:
- Wireless Personal Communications, 2022, v. 122, n. 2, p. 1435, doi. 10.1007/s11277-021-08956-5
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- Publication type:
- Article
A Multi-bit Error Upset Immune 12T SRAM Cell for 5G Satellite Communications.
- Published in:
- Wireless Personal Communications, 2021, v. 120, n. 3, p. 2201, doi. 10.1007/s11277-021-08462-8
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- Publication type:
- Article
NRStitcher: non-rigid stitching of terapixel-scale volumetric images.
- Published in:
- Bioinformatics, 2019, v. 35, n. 24, p. 5290, doi. 10.1093/bioinformatics/btz423
- By:
- Publication type:
- Article
Compact model for fast analytical evaluation of soft error rate in highly scaled memory circuits in space environment.
- Published in:
- Przegląd Elektrotechniczny, 2016, v. 92, n. 8, p. 48, doi. 10.15199/48.2016.08.13
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- Publication type:
- Article
Assessment of absolute added correlative coding in optical intensity modulation and direct detection channels.
- Published in:
- Optical Engineering, 2016, v. 55, n. 6, p. 1, doi. 10.1117/1.OE.55.6.066115
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- Publication type:
- Article
Soft Error-Tolerant and Highly Stable Low-Power SRAM for Satellite Applications.
- Published in:
- Applied Sciences (2076-3417), 2025, v. 15, n. 1, p. 375, doi. 10.3390/app15010375
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- Publication type:
- Article
Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications.
- Published in:
- Applied Sciences (2076-3417), 2024, v. 14, n. 24, p. 11940, doi. 10.3390/app142411940
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- Publication type:
- Article
Enhanced Soft Error Rate Estimation Technique for Aerospace Electronics Safety Design via Emulation Fault Injection.
- Published in:
- Applied Sciences (2076-3417), 2024, v. 14, n. 4, p. 1470, doi. 10.3390/app14041470
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- Publication type:
- Article
Special Issue on Design of Fault-Tolerant Digital Circuits and Systems.
- Published in:
- Applied Sciences (2076-3417), 2022, v. 12, n. 18, p. 8935, doi. 10.3390/app12188935
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- Publication type:
- Article
Experimental Study on the Space Electrostatic Discharge Effect and the Single Event Effect of SRAM Devices for Satellites.
- Published in:
- Applied Sciences (2076-3417), 2022, v. 12, n. 14, p. 7129, doi. 10.3390/app12147129
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- Publication type:
- Article
A Secure Architecture for Modular Division over a Prime Field against Fault Injection Attacks.
- Published in:
- Applied Sciences (2076-3417), 2020, v. 10, n. 5, p. 1700, doi. 10.3390/app10051700
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- Publication type:
- Article
A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits.
- Published in:
- Micromachines, 2024, v. 15, n. 4, p. 541, doi. 10.3390/mi15040541
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- Publication type:
- Article
An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor.
- Published in:
- Micromachines, 2023, v. 14, n. 11, p. 2085, doi. 10.3390/mi14112085
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- Publication type:
- Article
A High-Reliability 12T SRAM Radiation-Hardened Cell for Aerospace Applications.
- Published in:
- Micromachines, 2023, v. 14, n. 7, p. 1305, doi. 10.3390/mi14071305
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- Publication type:
- Article
Soft Sensor of Heating Extraction Steam Flow Rate Based on Frequency Complementary Information Fusion for CHP Plant.
- Published in:
- Energies (19961073), 2021, v. 14, n. 12, p. 3474, doi. 10.3390/en14123474
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- Publication type:
- Article
Study of Soft Errors in Spiking Neural Network Hardware.
- Published in:
- International Journal of High Speed Electronics & Systems, 2024, v. 33, n. 2/3, p. 1, doi. 10.1142/S0129156424401128
- By:
- Publication type:
- Article
Performance Analysis of Space-time Coded MIMO System with Discrete-rate Adaptive Modulation in Ricean Fading Channels.
- Published in:
- KSII Transactions on Internet & Information Systems, 2012, v. 6, n. 10, p. 2493, doi. 10.3837/tiis.2012.10.003
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- Publication type:
- Article
Uniform patterns based area-efficient and accurate stochastic computing finite impulse response filter.
- Published in:
- PLoS ONE, 2021, v. 16, n. 1, p. 1, doi. 10.1371/journal.pone.0245943
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- Publication type:
- Article
Changes in accommodative function following small-incision lenticule extraction for high myopia.
- Published in:
- PLoS ONE, 2020, v. 15, n. 12, p. 1, doi. 10.1371/journal.pone.0244602
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- 2020
- Publication type:
- Announcement
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 2, p. 255, doi. 10.1007/s10836-020-05864-7
- By:
- Publication type:
- Article
Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems.
- Published in:
- Journal of Electronic Testing, 2020, v. 36, n. 1, p. 47, doi. 10.1007/s10836-019-05846-4
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- Publication type:
- Article
Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 3, p. 367, doi. 10.1007/s10836-019-05806-y
- By:
- Publication type:
- Article
Modeling Soft Error Propagation in Near-Threshold Combinational Circuits Using Neural Networks.
- Published in:
- Journal of Electronic Testing, 2019, v. 35, n. 3, p. 401, doi. 10.1007/s10836-019-05796-x
- By:
- Publication type:
- Article
Generation Methodology for Good-Enough Approximate Modules of ATMR.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 651, doi. 10.1007/s10836-018-5764-3
- By:
- Publication type:
- Article
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 717, doi. 10.1007/s10836-018-5757-2
- By:
- Publication type:
- Article
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 1, p. 15, doi. 10.1007/s10836-017-5702-9
- By:
- Publication type:
- Article
A High-Level Approach to Analyze the Effects of Soft Errors on Lossless Compression Algorithms.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 53, doi. 10.1007/s10836-016-5637-6
- By:
- Publication type:
- Article
A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 25, doi. 10.1007/s10836-017-5640-6
- By:
- Publication type:
- Article
Editorial.
- Published in:
- 2017
- By:
- Publication type:
- Editorial
Editorial.
- Published in:
- 2016
- By:
- Publication type:
- Editorial