Works matching DE "SKUTTERUDITE"
1
- Materials (1996-1944), 2025, v. 18, n. 13, p. 2923, doi. 10.3390/ma18132923
- Article
2
- Journal of Electronic Materials, 2025, v. 54, n. 8, p. 6275, doi. 10.1007/s11664-025-11941-4
- Zuo, Tong;
- Li, Xin;
- Tang, Xian
- Article
3
- Advanced Functional Materials, 2013, v. 23, n. 25, p. 3194, doi. 10.1002/adfm.201202571
- Qiu, Yuting;
- Xi, Lili;
- Shi, Xun;
- Qiu, Pengfei;
- Zhang, Wenqing;
- Chen, Lidong;
- Salvador, James R.;
- Cho, Jung Y.;
- Yang, Jihui;
- Chien, Yuan‐chun;
- Chen, Sinn‐wen;
- Tang, Yinglu;
- Snyder, G. Jeffrey
- Article
4
- 2010
- Eilertsen, J.;
- Rouvimov, S.;
- Plachinda, P.;
- Hendricks, T. J.;
- Subramanian, M.
- Abstract
5
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05889
- Raza, Zamaan;
- Errea, Ion;
- Oganov, Artem R.;
- Saitta, A. Marco
- Article
6
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05131
- Article
7
- European Physical Journal B: Condensed Matter, 2013, v. 86, n. 11, p. 1, doi. 10.1140/epjb/e2013-40335-5
- Kong, Shi;
- Zhang, Weiyi;
- Shi, Daning
- Article
8
- European Physical Journal B: Condensed Matter, 2011, v. 79, n. 3, p. 275, doi. 10.1140/epjb/e2010-10612-0
- Xu, B.;
- Liang, J.;
- Li, X.;
- Sun, J. F.;
- Yi, L.
- Article
9
- Advanced Energy Materials, 2017, v. 7, n. 13, p. n/a, doi. 10.1002/aenm.201602582
- Meng, Xianfu;
- Liu, Zihang;
- Cui, Bo;
- Qin, Dandan;
- Geng, Huiyuan;
- Cai, Wei;
- Fu, Liangwei;
- He, Jiaqing;
- Ren, Zhifeng;
- Sui, Jiehe
- Article
10
- Modern Physics Letters B, 2019, v. 33, n. 3, p. N.PAG, doi. 10.1142/S0217984919500271
- Chen, Jiaxiang;
- Jia, Xiaopeng;
- Zhang, Yuewen;
- Liu, Haiqiang;
- Liu, Baomin;
- Wang, Jian;
- Ding, Luyao;
- Ji, Guangyao;
- Ma, Hongan
- Article
11
- Modern Physics Letters B, 2017, v. 31, n. 28, p. -1, doi. 10.1142/S021798491750261X
- Jiang, Yiping;
- Jia, Xiaopeng;
- Ma, Hongan
- Article
12
- Modern Physics Letters B, 2016, v. 30, n. 5, p. -1, doi. 10.1142/S0217984916300015
- Article
14
- Journal of Electronic Materials, 2023, v. 52, n. 2, p. 971, doi. 10.1007/s11664-022-10083-1
- Bashir, Mohamed Bashir Ali;
- Salih, Ethar Yahya;
- Said, Suhana Mohd;
- Miyazaki, Yuzuru;
- Shnawah, Dhafer Abdul-Ameer;
- Bashir, M. Nasir;
- Sajid, Imran Haider;
- Elsheikh, Mohamed Hamid
- Article
15
- Journal of Electronic Materials, 2022, v. 51, n. 6, p. 3350, doi. 10.1007/s11664-022-09547-1
- Masarrat, Anha;
- Bhogra, Anuradha;
- Meena, Ramcharan;
- Urkude, Rajashri;
- Niazi, Asad;
- Kandasami, Asokan
- Article
16
- Journal of Materials Science, 2017, v. 52, n. 9, p. 5324, doi. 10.1007/s10853-017-0772-8
- Elsheikh, Mohamed;
- Sabri, Mohd;
- Said, Suhana;
- Miyazaki, Yuzuru;
- Masjuki, H.;
- Shnawah, Dhafer;
- Naito, Shuma;
- Bashir, Mohamed
- Article
17
- Journal of Materials Science, 2016, v. 51, n. 13, p. 6117, doi. 10.1007/s10853-016-9868-9
- Mackey, Jon;
- Dynys, Frederick;
- Hudak, Bethany;
- Guiton, Beth;
- Sehirlioglu, Alp
- Article
18
- Journal of Materials Science, 2015, v. 50, n. 3, p. 1500, doi. 10.1007/s10853-014-8711-4
- Park, Young-Sam;
- Thompson, Travis;
- Kim, Yunsung;
- Salvador, James;
- Sakamoto, Jeffrey
- Article
19
- Journal of Materials Science, 2015, v. 50, n. 1, p. 34, doi. 10.1007/s10853-014-8562-z
- Dong, Yongkwan;
- Puneet, Pooja;
- Tritt, Terry;
- Nolas, George
- Article
20
- Journal of Materials Science, 2014, v. 49, n. 20, p. 7192, doi. 10.1007/s10853-014-8427-5
- Schmidt, Robert;
- Case, Eldon;
- Lobo, Zayra;
- Thompson, Travis;
- Sakamoto, Jeffrey;
- Zhou, Xiao-Yuan;
- Uher, Ctirad
- Article
21
- Journal of Materials Science, 2014, v. 49, n. 13, p. 4445, doi. 10.1007/s10853-014-8141-3
- Duan, Bo;
- Zhai, Pengcheng;
- Xu, Chenglong;
- Ding, Shijie;
- Li, Peng;
- Zhang, Qingjie
- Article
22
- Journal of Materials Science, 2013, v. 48, n. 7, p. 2761, doi. 10.1007/s10853-012-6891-3
- Chubilleau, C.;
- Lenoir, B.;
- Masschelein, P.;
- Dauscher, A.;
- Candolfi, C.;
- Guilmeau, E.;
- Godart, C.
- Article
23
- Technical Physics Letters, 2020, v. 46, n. 9, p. 931, doi. 10.1134/S1063785020090308
- Tukmakova, A. S.;
- Shcheglova, D. B.;
- Novitskii, A. P.;
- Voronin, A. I.;
- Khovailo, V. V.;
- Novotelnova, A. V.
- Article
24
- Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-76538-z
- Nayak, Poorva;
- Gupta, Dinesh C.
- Article
25
- Crystals (2073-4352), 2022, v. 12, n. 12, p. 1843, doi. 10.3390/cryst12121843
- Rogl, Gerda;
- Rogl, Peter Franz
- Article
26
- Crystals (2073-4352), 2017, v. 7, n. 12, p. 381, doi. 10.3390/cryst7120381
- Article
27
- Crystals (2073-4352), 2016, v. 6, n. 11, p. 137, doi. 10.3390/cryst6110137
- Pina, Carlos M.;
- López-Acevedo, Victoria
- Article
28
- Coatings (2079-6412), 2017, v. 7, n. 11, p. 205, doi. 10.3390/coatings7110205
- Zhuanghao Zheng;
- Meng Wei;
- Fu Li;
- Jingting Luo;
- Guangxing Liang;
- Hongli Ma;
- Xianghua Zhang;
- Ping Fan
- Article
29
- Journal of Electronic Materials, 2020, v. 49, n. 5, p. 2872, doi. 10.1007/s11664-019-07929-6
- Spotorno, Roberto;
- Ghiara, Giorgia;
- Latronico, Giovanna;
- Carlini, Riccardo;
- Mele, Paolo;
- Artini, Cristina
- Article
30
- Journal of Electronic Materials, 2019, v. 48, n. 11, p. 7526, doi. 10.1007/s11664-019-07590-z
- Holgate, Tim C.;
- Bennett, Russell;
- Renomeron, Lynda;
- Keyser, Steven;
- Chi, Ike;
- Ni, Jennifer;
- Yu, Kevin;
- Caillat, Thierry;
- Pinkowski, Stanley
- Article
31
- Journal of Electronic Materials, 2019, v. 48, n. 9, p. 5523, doi. 10.1007/s11664-019-06924-1
- Bao, Xin;
- Gu, Ming;
- Zhang, Qihao;
- Wu, Zihua;
- Bai, Shengqiang;
- Chen, Lidong;
- Xie, Huaqing
- Article
32
- Journal of Electronic Materials, 2019, v. 48, n. 8, p. 5257, doi. 10.1007/s11664-019-07321-4
- Katsuyama, Shigeru;
- Yamakawa, Wakana;
- Matsumura, Yoko;
- Funahashi, Ryoji
- Article
33
- Journal of Electronic Materials, 2019, v. 48, n. 4, p. 1833, doi. 10.1007/s11664-018-6777-5
- CHUNG-YUL YOO;
- HANA YOON;
- SANG HYUN PARK
- Article
34
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4544, doi. 10.1007/s11664-018-6323-5
- Bhat, Tahir Mohiuddin;
- Singh, Srishti;
- Gupta, Dinesh C.
- Article
35
- Journal of Electronic Materials, 2018, v. 47, n. 6, p. 3152, doi. 10.1007/s11664-017-5907-9
- Cha, Ye-Eun;
- Shin, Dong-Kil;
- Kim, Il-Ho
- Article
36
- Journal of Electronic Materials, 2018, v. 47, n. 6, p. 3061, doi. 10.1007/s11664-017-5891-0
- Wang, Hongtao;
- Duan, Bo;
- Bai, Guanghui;
- Li, Jialiang;
- Yu, Yue;
- Yang, Houjiang;
- Chen, Gang;
- Zhai, Pengcheng
- Article
37
- Journal of Electronic Materials, 2018, v. 47, n. 6, p. 3143, doi. 10.1007/s11664-017-5869-y
- Shin, Dong-Kil;
- Jang, Kyung-Wook;
- Choi, Soon-Mok;
- Lee, Soonil;
- Seo, Won-Seon;
- Kim, Il-Ho
- Article
38
- Journal of Electronic Materials, 2018, v. 47, n. 4, p. 2429, doi. 10.1007/s11664-018-6074-3
- BASHIR, MOHAMED BASHIR ALI;
- SAID, SUHANA MOHD;
- SABRI, MOHD FAIZUL MOHD;
- YUZURU MIYAZAKI;
- SHNAWAH, DHAFER ABDULAMEER;
- MASANORI SHIMADA;
- SALLEH, MOHD FAIZ MOHD;
- MAHMOOD, MOHAMAD SYAFIE;
- SALIH, ETHAR YAHYA;
- FITRIANI, FITRIANI;
- ELSHEIKH, MOHAMED HAMID
- Article
39
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2634, doi. 10.1007/s11664-016-4847-0
- Song, Kwon-Min;
- Shin, Dong-Kil;
- Jang, Kyung-Wook;
- Choi, Soon-Mok;
- Lee, Soonil;
- Seo, Won-Seon;
- Kim, Il-Ho
- Article
40
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2640, doi. 10.1007/s11664-016-4849-y
- Nie, G.;
- Suzuki, S.;
- Tomida, T.;
- Sumiyoshi, A.;
- Ochi, T.;
- Mukaiyama, K.;
- Kikuchi, M.;
- Guo, J.;
- Yamamoto, A.;
- Obara, H.
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2832, doi. 10.1007/s11664-016-4990-7
- Sun, Yajing;
- Chen, Gang;
- Bai, Guanghui;
- Yang, Xuqiu;
- Li, Peng;
- Zhai, Pengcheng
- Article
42
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2839, doi. 10.1007/s11664-016-4991-6
- Son, Geonsik;
- Lee, Kyu;
- Choi, Soon-Mok
- Article
43
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2944, doi. 10.1007/s11664-016-5073-5
- Tomida, T.;
- Sumiyoshi, A.;
- Nie, G.;
- Ochi, T.;
- Suzuki, S.;
- Kikuchi, M.;
- Mukaiyama, K.;
- Guo, J.
- Article
44
- Journal of Electronic Materials, 2017, v. 46, n. 5, p. 2958, doi. 10.1007/s11664-016-5079-z
- Shaheen, Nusrat;
- Shen, Xingchen;
- Javed, Muhammad;
- Zhan, Heng;
- Guo, Lijie;
- Alsharafi, Rashed;
- Huang, Tianyu;
- Lu, Xu;
- Wang, Guoyu;
- Zhou, Xiaoyuan
- Article
45
- Journal of Electronic Materials, 2017, v. 46, n. 4, p. 2419, doi. 10.1007/s11664-017-5306-2
- Rao, Ashwin;
- Bosak, Gregg;
- Joshi, Binay;
- Keane, Jennifer;
- Nally, Luke;
- Peng, Adam;
- Perera, Susanthri;
- Waring, Alfred;
- Poudel, Bed
- Article
46
- Journal of Electronic Materials, 2017, v. 46, n. 4, p. 2438, doi. 10.1007/s11664-017-5309-z
- Skomedal, Gunstein;
- Kristiansen, Nils;
- Sottong, Reinhard;
- Middleton, Hugh
- Article
47
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2904, doi. 10.1007/s11664-015-4325-0
- Navrátil, J.;
- Plecháček, T.;
- Drašar, Č.;
- Kucek, V.;
- Laufek, F.;
- Černošková, E.;
- Beneš, L.;
- Vlček, M.
- Article
48
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2886, doi. 10.1007/s11664-016-4355-2
- Elsheikh, Mohamed;
- Sabri, Mohd;
- Said, Suhana;
- Miyazaki, Yuzuru;
- Masjuki, H.;
- Shnawah, Dhafer;
- Long, Bui;
- Naito, Shuma;
- Bashir, Mohamed
- Article
49
- Journal of Electronic Materials, 2016, v. 45, n. 3, p. 1227, doi. 10.1007/s11664-015-3952-9
- Song, Kwon-Min;
- Shin, Dong-Kil;
- Kim, Il-Ho
- Article
50
- Journal of Electronic Materials, 2016, v. 45, n. 3, p. 1234, doi. 10.1007/s11664-015-3967-2
- Shin, Dong-Kil;
- Kim, Il-Ho
- Article