Works about SINGLE event effects

Results: 218

Design and testing of a pulsed laser system for single event effects analysis on semiconductor devices.

Published in:

Canadian Journal of Chemistry, 2025, v. 103, n. 6, p. 270, doi. 10.1139/cjc-2024-0103

By:

Elash, Christopher J.;
Pour-Momen, Peiman;
Shi, Shuting;
Belev, George;
Sammynaiken, R.;
Chen, Li

Publication type:

Article

Foresail-2: Space Physics Mission in a Challenging Environment.

Published in:

Space Science Reviews, 2023, v. 219, n. 8, p. 1, doi. 10.1007/s11214-023-01012-7

By:

Anger, Marius;
Niemelä, Petri;
Cheremetiev, Kiril;
Clayhills, Bruce;
Fetzer, Anton;
Lundén, Ville;
Hiltunen, Markus;
Kärkkäinen, Tomi;
Mayank, M.;
Turc, Lucile;
Osmane, Adnane;
Palmroth, Minna;
Kilpua, Emilia;
Oleynik, Philipp;
Vainio, Rami;
Virtanen, Pasi;
Toivanen, Petri;
Janhunen, Pekka;
Fischer, David;
Le Bonhomme, Guillaume

Publication type:

Article

Multiple-Fault Tolerant Hardware Structure for Cellular Genetic Algorithm.

Published in:

Journal of Computing & Security, 2016, v. 3, n. 1, p. 27

By:

Ashoorian, Peyman;
Damavandi, Yasser Baleghi

Publication type:

Article

Single event transient of SOI FinFET with total ionizing dose irradiation.

Published in:

Vibroengineering Procedia, 2023, v. 51, p. 76, doi. 10.21595/vp.2023.23602

By:

Baojun Liu;
Ping Zhou;
Liang Qian

Publication type:

Article

Study on Single Event Upset and Mitigation Technique in JLTFET‐Based 6T SRAM Cell.

Published in:

Journal of Electrical & Computer Engineering, 2024, v. 2024, p. 1, doi. 10.1155/2024/9212078

By:

K, Aishwarya;
B, Lakshmi;
Lutzemberger, Giovanni

Publication type:

Article

CNTFET based radiation hardened latch.

Published in:

Australian Journal of Electrical & Electronic Engineering, 2021, v. 18, n. 3, p. 199, doi. 10.1080/1448837X.2021.1958978

By:

Shakeel, Shazia;
Alam, Naushad

Publication type:

Article

Single event transient effects on 3T and 4T CMOS active pixel sensors for different technologies.

Published in:

Australian Journal of Electrical & Electronic Engineering, 2019, v. 16, n. 3, p. 117, doi. 10.1080/1448837X.2019.1624245

By:

Sukor, M. A.;
Hedzir, A. S.;
Sabri, S. S.;
Hasbullah, N. F.

Publication type:

Article

Editorial.

Published in:

2019

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Modeling Soft Error Propagation in Near-Threshold Combinational Circuits Using Neural Networks.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 3, p. 401, doi. 10.1007/s10836-019-05796-x

By:

Hajian, Ali;
Safari, Saeed

Publication type:

Article

Editorial.

Published in:

2019

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits.

Published in:

Journal of Electronic Testing, 2019, v. 35, n. 2, p. 163, doi. 10.1007/s10836-019-05791-2

By:

Cai, Shuo;
Wang, Weizheng;
Yu, Fei;
He, Binyong

Publication type:

Article

Low-Power Resonant Clocking Using Soft Error Robust Energy Recovery Flip-Flops.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 4, p. 471, doi. 10.1007/s10836-018-5737-6

By:

Islam, Riadul

Publication type:

Article

Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 5, p. 607, doi. 10.1007/s10836-017-5682-9

By:

Hamad, Ghaith;
Ait Mohamed, Otmane;
Savaria, Yvon

Publication type:

Article

Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and Passivation.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 2, p. 255, doi. 10.1007/s10836-017-5647-z

By:

Mo, Jiongjiong;
Chen, Hua;
Wang, Liping;
Yu, Faxin

Publication type:

Article

A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 1, p. 25, doi. 10.1007/s10836-017-5640-6

By:

Wali, I.;
Deveautour, B.;
Virazel, Arnaud;
Bosio, A.;
Girard, P.;
Sonza Reorda, M.

Publication type:

Article

Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 6, p. 695, doi. 10.1007/s10836-016-5624-y

By:

Chen, Qingyu;
Chen, Li;
Wang, Haibin;
Wu, Longsheng;
Li, Yuanqing;
Zhao, Xing;
Chen, Mo

Publication type:

Article

Editorial.

Published in:

2016

By:

Agrawal, Vishwani

Publication type:

Editorial

A Fast Statistical Soft Error Rate Estimation Method for Nano-scale Combinational Circuits.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 3, p. 291, doi. 10.1007/s10836-016-5583-3

By:

Raji, Mohsen;
Ghavami, Behnam

Publication type:

Article

A Built-in Single Event Upsets Detector for Sequential Cells.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 1, p. 11, doi. 10.1007/s10836-015-5560-2

By:

Li, Yuanqing;
Wang, Haibin;
Li, Lixiang;
Chen, Li;
Liu, Rui;
Chen, Mo

Publication type:

Article

Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 1, p. 97, doi. 10.1007/s10836-015-5559-8

By:

Wang, Haibin;
Li, Mulong;
Dai, Xixi;
Shi, Shuting;
Chen, Li;
Guo, Gang

Publication type:

Article

Optimization of a Particles Detection Chain Based on a VCO Structure.

Published in:

Journal of Electronic Testing, 2016, v. 32, n. 1, p. 21, doi. 10.1007/s10836-016-5563-7

By:

Coulié-Castellani, K.;
Rahajandraibe, W.;
Micolau, G.;
Aziza, H.;
Portal, J.-M.

Publication type:

Article

A High Performance SEU Tolerant Latch.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 4, p. 349, doi. 10.1007/s10836-015-5533-5

By:

Huang, Zhengfeng;
Liang, Huaguo;
Hellebrand, Sybille

Publication type:

Article

Double Node Upsets Hardened Latch Circuits.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 5/6, p. 537, doi. 10.1007/s10836-015-5551-3

By:

Li, Yuanqing;
Wang, Haibin;
Yao, Suying;
Yan, Xi;
Gao, Zhiyuan;
Xu, Jiangtao

Publication type:

Article

Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 4, p. 411, doi. 10.1007/s10836-015-5537-1

By:

Simionovski, Alexandre;
Vaz, Rafael;
Gonçalez, Odair;
Wirth, Gilson

Publication type:

Article

A Novel Built-in Current Sensor for N-WELL SET Detection.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 4, p. 395, doi. 10.1007/s10836-015-5538-0

By:

Wang, H.-B.;
Liu, R.;
Chen, L.;
Bi, J.-S.;
Li, M.-L.;
Li, Y.-Q.

Publication type:

Article

Editorial.

Published in:

2015

By:

Agrawal, Vishwani

Publication type:

Editorial

Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch.

Published in:

Journal of Electronic Testing, 2015, v. 31, n. 3, p. 275, doi. 10.1007/s10836-015-5529-1

By:

Andjelković, Marko;
Petrović, Vladimir;
Stamenković, Zoran;
Ristić, Goran;
Jovanović, Goran

Publication type:

Article

Three-Level Management Algorithm to Increase the SEU Emulation Rate in DPR Based Emulators.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 6, p. 739, doi. 10.1007/s10836-014-5489-x

By:

Omidi Gosheblagh, Reza;
Mohammadi, Karim

Publication type:

Article

Single Event Resilient Dynamic Logic Designs.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 6, p. 751, doi. 10.1007/s10836-014-5492-2

By:

Wang, H.-B.;
Li, M.-L.;
Chen, L.;
Liu, R.;
Baeg, S.;
Wen, S.-J.;
Wong, R.;
Fung, R.;
Bi, J.-S.

Publication type:

Article

A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 5, p. 595, doi. 10.1007/s10836-014-5476-2

By:

Pahlevanzadeh, Hoda;
Yu, Qiaoyan

Publication type:

Article

Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAs.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 425, doi. 10.1007/s10836-014-5463-7

By:

Ullah, Anees;
Sterpone, Luca

Publication type:

Article

The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 3, p. 377, doi. 10.1007/s10836-014-5448-6

By:

Ren, Yi;
Chen, Li

Publication type:

Article

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 1, p. 149, doi. 10.1007/s10836-013-5431-7

By:

Ren, Y.;
He, A.-L.;
Shi, S.-T.;
Guo, G.;
Chen, L.;
Wen, S.-J.;
Wong, R.;
Vonno, N.;
Bhuva, B.

Publication type:

Article

Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path Delay.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 1, p. 125, doi. 10.1007/s10836-013-5425-5

By:

Kadiyala Rao, Sushmita;
Robucci, Ryan;
Patel, Chintan

Publication type:

Article

Selective SWIFT-R: A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded Systems.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 6, p. 825, doi. 10.1007/s10836-013-5416-6

By:

Restrepo-Calle, Felipe;
Martínez-Álvarez, Antonio;
Cuenca-Asensi, Sergio;
Jimeno-Morenilla, Antonio

Publication type:

Article

A Practical Approach to Single Event Transient Analysis for Highly Complex Design.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 3, p. 301, doi. 10.1007/s10836-013-5385-9

By:

Costenaro, Enrico;
Alexandrescu, Dan;
Belhaddad, Kader;
Nicolaidis, Michael

Publication type:

Article

Editorial.

Published in:

2013

By:

Agrawal, Vishwani

Publication type:

Editorial

A Preliminary Study about SEU Effects on Programmable Interconnections of SRAM-based FPGAs.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 3, p. 341, doi. 10.1007/s10836-013-5387-7

By:

Alderighi, M.;
Casini, F.;
D'Angelo, S.;
Gravina, A.;
Liberali, V.;
Mancini, M.;
Musazzi, P.;
Pastore, S.;
Sassi, M.;
Sorrenti, G.

Publication type:

Article

A Probabilistic Approach to Diagnose SETs in Sequential Circuits.

Published in:

Journal of Electronic Testing, 2013, v. 29, n. 3, p. 317, doi. 10.1007/s10836-013-5361-4

By:

Gangadhar, Sreenivas;
Tragoudas, Spyros

Publication type:

Article

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 777, doi. 10.1007/s10836-012-5321-4

By:

Portela-Garcia, M.;
Lindoso, A.;
Entrena, L.;
Garcia-Valderas, M.;
Lopez-Ongil, C.;
Marroni, N.;
Pianta, B.;
Bolzani Poehls, L.;
Vargas, F.

Publication type:

Article

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 6, p. 877, doi. 10.1007/s10836-012-5338-8

By:

Ren, Y.;
Fan, L.;
Chen, L.;
Wen, S.-J.;
Wong, R.;
Vonno, N.;
Witulski, A.;
Bhuva, B.

Publication type:

Article

Study of Single Event Burnout Mechanism in GaN Power Devices Using Femtosecond Pulsed Laser.

Published in:

Photonics, 2022, v. 9, n. 4, p. N.PAG, doi. 10.3390/photonics9040270

By:

Cui, Yixin;
Ma, Yingqi;
Shangguan, Shipeng;
Han, Jianwei

Publication type:

Article

Actinobacillus pleuropneumoniae Eradication with Enrofloxacin May Lead to Dissemination and Long-Term Persistence of Quinolone Resistant Escherichia coli in Pig Herds.

Published in:

Antibiotics (2079-6382), 2020, v. 9, n. 12, p. 910, doi. 10.3390/antibiotics9120910

By:

Kaspersen, Håkon;
Urdahl, Anne Margrete;
Grøntvedt, Carl Andreas;
Gulliksen, Stine Margrethe;
Tesfamichael, Bereket;
Slettemeås, Jannice Schau;
Norström, Madelaine;
Sekse, Camilla

Publication type:

Article

Application of a Laser-Plasma Accelerator to Study Single Event Effects in a Microelectronic Device.

Published in:

Instruments & Experimental Techniques, 2024, v. 67, n. 5, p. 952, doi. 10.1134/S0020441224701641

By:

Safronov, K. V.;
Flegentov, V. A.;
Gorokhov, S. A.;
Shamaeva, N. N.;
Tishchenko, A. S.;
Zamuraev, D. O.;
Shamraev, A. L.;
Kovaleva, S. F.;
Fedorov, N. A.;
Dubrovskikh, S. M.;
Pilipenko, A. S.;
Kustov, A. S.;
Shibakov, E. A.;
Potapov, A. V.

Publication type:

Article

How Personal Transformation Occurs Following a Single Peak Experience in Nature: A Phenomenological Account.

Published in:

Journal of Humanistic Psychology, 2020, v. 60, n. 6, p. 865, doi. 10.1177/0022167817714692

By:

Naor, Lia;
Mayseless, Ofra

Publication type:

Article

A Review on SEU Mitigation Techniques for FPGA Configuration Memory.

Published in:

IETE Technical Review, 2018, v. 35, n. 2, p. 157, doi. 10.1080/02564602.2016.1265905

By:

Nidhin, T. S.;
Bhattacharyya, Anindya;
Behera, R. P.;
Jayanthi, T.

Publication type:

Article

Single event response of ferroelectric spacer engineered SOI FinFET at 14 nm technology node.

Published in:

Scientific Reports, 2023, v. 13, n. 1, p. 1, doi. 10.1038/s41598-023-36952-1

By:

Liu, Baojun;
Zhu, Jing

Publication type:

Article

Single Event Upset Detection and Hardening schemes for CNTFET SRAM - A Review.

Published in:

Journal of Engineering Science & Technology Review, 2015, v. 8, n. 5, p. 49

By:

Rajalakshmi, T. R.;
Sudhakar, R.

Publication type:

Article

High-performance, low-cost, and highly reliable radiation hardened latch design.

Published in:

Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 2, p. 139, doi. 10.1049/el.2015.3020

By:

Aibin Yan;
Huaguo Liang;
Zhengfeng Huang;
Cuiyun Jiang

Publication type:

Article

Simplified fault-tolerant FIR filter architecture based on redundant residue number system.

Published in:

Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 23, p. 1768, doi. 10.1049/el.2014.3508

By:

Zhibin Luan;
Xiang Chen;
Ning Ge;
Zhaocheng Wang

Publication type:

Article