Works matching DE "SINGLE event effects"

Results: 223

Comprehensive Study of Proton and Heavy Ion-Induced Damages for Cascode GaN-Based HEMTs.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 13, p. 2653, doi. 10.3390/electronics14132653

By:

Huang, Huixiang;
Wu, Zhipeng;
Peng, Chao;
Shen, Hanxin;
Wu, Xiaoqiang;
Yang, Jianqun;
Lei, Zhifeng;
Cui, Xiuhai;
Ma, Teng;
Zhang, Zhangang;
He, Yujuan;
Chen, Yiqiang;
Lu, Guoguang

Publication type:

Article

Analysis and Modeling of Single Event Transient Generation in Standard Combinational Cells.

Published in:

Journal of Electronic Testing, 2025, v. 41, n. 3, p. 287, doi. 10.1007/s10836-025-06175-5

By:

Andjelkovic, Marko;
Krstic, Milos

Publication type:

Article

Research on soft errors induced by alpha particles and atmospheric neutrons based on 28 nm field programmable gate array.

Published in:

Journal of Nuclear Science & Technology, 2025, v. 62, n. 7, p. 670, doi. 10.1080/00223131.2025.2462190

By:

Ma, Chao;
Du, Xuecheng;
Zhao, Xu;
Hu, Zhiliang;
Zhang, Panfeng;
Zhou, Chao;
Zheng, Bo;
Wang, Xiaodong;
Feng, Song

Publication type:

Article

Proteostasis in ice: the role of heat shock proteins and ubiquitin in the freeze tolerance of the intertidal mussel, Mytilus trossulus.

Published in:

Journal of Comparative Physiology B: Biochemical, Systemic & Environmental Physiology, 2023, v. 193, n. 2, p. 155, doi. 10.1007/s00360-022-01473-2

By:

Gill, Lauren T.;
Kennedy, Jessica R.;
Marshall, Katie E.

Publication type:

Article

Experimental Study of the Comparison of the Synergistic Effect of Total Ionizing Dose and Neutron Single Event on Si/SiC MOSFETs.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 4, p. 763, doi. 10.3390/electronics14040763

By:

Li, Wangtian;
Guo, Gang;
Chen, Qiming;
Zhang, Zheng;
Zhao, Shuyong;
Liu, Jiancheng;
Qin, Fengdi

Publication type:

Article

Study on the Single-Event Burnout Effect Mechanism of SiC MOSFETs Induced by Heavy Ions.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 17, p. 3402, doi. 10.3390/electronics13173402

By:

Liu, Cuicui;
Guo, Gang;
Shi, Huilin;
Zhang, Zheng;
Li, Futang;
Zhang, Yanwen;
Han, Jinhua

Publication type:

Article

Evaluation of Single Event Upset on a Relay Protection Device.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 1, p. 64, doi. 10.3390/electronics13010064

By:

Zhou, Hualiang;
Yu, Hao;
Zou, Zhiyang;
Su, Zhantao;
Zhao, Qianyun;
Yang, Weitao;
He, Chaohui

Publication type:

Article

Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 24, p. 4978, doi. 10.3390/electronics12244978

By:

Song, Ruiqiang;
Shao, Jinjin;
Chi, Yaqing;
Liang, Bin;
Chen, Jianjun;
Wu, Zhenyu

Publication type:

Article

Oxide Electric Field-Induced Degradation of SiC MOSFET for Heavy-Ion Irradiation.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 13, p. 2886, doi. 10.3390/electronics12132886

By:

Liang, Xiaowen;
Feng, Haonan;
Xiang, Yutang;
Sun, Jing;
Wei, Ying;
Zhang, Dan;
Li, Yudong;
Feng, Jie;
Yu, Xuefeng;
Guo, Qi

Publication type:

Article

Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 13, p. 2833, doi. 10.3390/electronics12132833

By:

Yang, Zhikang;
Wen, Lin;
Li, Yudong;
Feng, Jie;
Zhou, Dong;
Liu, Bingkai;
Zhao, Zitao;
Guo, Qi

Publication type:

Article

Investigation of Incident Angle Dependence of Single Event Transient Model in MOSFET.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 11, p. 2349, doi. 10.3390/electronics12112349

By:

Zhang, Fan;
Wang, Yibo;
Liu, Yi;
Wu, Minghu;
Zhou, Zilong

Publication type:

Article

Neutron Irradiation Testing and Monte Carlo Simulation of a Xilinx Zynq-7000 System on Chip.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 9, p. 2057, doi. 10.3390/electronics12092057

By:

Yang, Weitao;
Li, Yonghong;
Li, Yang;
Hu, Zhiliang;
Cai, Jiale;
He, Chaohui;
Wang, Bin;
Wu, Longsheng

Publication type:

Article

A Novel DNU Self-Recoverable and SET Pulse Filterable Latch Design for Aerospace Applications.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 5, p. 1193, doi. 10.3390/electronics12051193

By:

Wang, Shixin;
Wang, Lixin;
Guo, Min;
Li, Yuanzhe;
Li, Bowang

Publication type:

Article

Effects of Different Factors on Single Event Effects Introduced by Heavy Ions in SiGe Heterojunction Bipolar Transistor: A TCAD Simulation.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 4, p. 1008, doi. 10.3390/electronics12041008

By:

Zhang, Zheng;
Guo, Gang;
Li, Futang;
Sun, Haohan;
Chen, Qiming;
Zhao, Shuyong;
Liu, Jiancheng;
Ouyang, Xiaoping

Publication type:

Article

A Checkpointing Recovery Approach for Soft Errors Based on Detector Locations.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 4, p. 805, doi. 10.3390/electronics12040805

By:

Yang, Na;
Wang, Yun

Publication type:

Article

The Inflection Point of Single Event Transient in SiGe HBT at a Cryogenic Temperature.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 3, p. 648, doi. 10.3390/electronics12030648

By:

Pan, Xiaoyu;
Guo, Hongxia;
Lu, Chao;
Zhang, Hong;
Liu, Yinong

Publication type:

Article

Study of Single Event Latch-Up Hardness for CMOS Devices with a Resistor in Front of DC-DC Converter.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 3, p. 550, doi. 10.3390/electronics12030550

By:

Xin, Jindou;
Zhu, Xiang;
Ma, Yingqi;
Han, Jianwei

Publication type:

Article

A Compact Model for Single-Event Transient in Fully Depleted Silicon on Insulator MOSFET Considering the Back-Gate Voltage Based on Time-Domain Components.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 23, p. 4022, doi. 10.3390/electronics11234022

By:

Wang, Kewei;
Zhang, Xinyi;
Li, Bo;
Li, Duoli;
Zhao, Fazhan;
Bu, Jianhui;
Han, Zhengsheng

Publication type:

Article

Soft Error Sensitivity Analysis Based on 40 nm SRAM-Based FPGA.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 23, p. 3844, doi. 10.3390/electronics11233844

By:

Xiong, Xu;
Du, Xuecheng;
Zheng, Bo;
Chen, Zhi;
Jiang, Wei;
He, Sanjun;
Zhu, Yixin

Publication type:

Article

Study on Single Event Upsets in a 28 nm Technology Static Random Access Memory Device Based on Micro-Beam Irradiation.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 20, p. 3413, doi. 10.3390/electronics11203413

By:

Sun, Haohan;
Guo, Gang;
Sun, Ruinan;
Zhao, Wen;
Zhang, Fengqi;
Liu, Jiancheng;
Zhang, Zheng;
Chen, Ya;
Zhao, Yongle

Publication type:

Article

Quantitative Research on Generalized Linear Modeling of SEU and Test Programs Based on Small Sample Data.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 14, p. N.PAG, doi. 10.3390/electronics11142242

By:

Chu, Fei;
Chen, Hongzhuan;
Yu, Chunqing;
You, Lihua;
Wang, Liang;
Liu, Yun

Publication type:

Article

Novel Radiation-Hardened High-Speed DFF Design Based on Redundant Filter and Typical Application Analysis.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 9, p. N.PAG, doi. 10.3390/electronics11091302

By:

Jiang, Shuang;
Liu, Shibin;
Zheng, Hongchao;
Wang, Liang;
Li, Tongde

Publication type:

Article

Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 3, p. 378, doi. 10.3390/electronics11030378

By:

Rajkowski, Tomasz;
Saigné, Frédéric;
Wang, Pierre-Xiao

Publication type:

Article

Analysis of Single Event Effects on Embedded Processor.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 24, p. 3160, doi. 10.3390/electronics10243160

By:

Azimi, Sarah;
De Sio, Corrado;
Rizzieri, Daniele;
Sterpone, Luca

Publication type:

Article

LIHL: Design of a Novel Loop Interlocked Hardened Latch.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 17, p. 2090, doi. 10.3390/electronics10172090

By:

Xu, Hui;
Liu, Xuan;
Yu, Guo;
Liang, Huaguo;
Huang, Zhengfeng

Publication type:

Article

Categorization and SEU Fault Simulations of Radiation-Hardened-by-Design Flip-Flops.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 13, p. 1572, doi. 10.3390/electronics10131572

By:

Hamed, Ehab A.;
Lee, Inhee

Publication type:

Article

Low-Cost Soft Error Robust Hardened D-Latch for CMOS Technology Circuit.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 11, p. 1256, doi. 10.3390/electronics10111256

By:

Hatefinasab, Seyedehsomayeh;
Rodriguez, Noel;
García, Antonio;
Castillo, Encarnacion

Publication type:

Article

Challenges and New Trends in Power Electronic Devices Reliability.

Published in:

2021

By:

Chiodo, Elio;
De Falco, Pasquale;
Di Noia, Luigi Pio

Publication type:

Editorial

Comparative Study on the "Soft Errors" Induced by Single-Event Effect and Space Electrostatic Discharge.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 7, p. 802, doi. 10.3390/electronics10070802

By:

Chen, Rui;
Chen, Li;
Han, Jianwei;
Wang, Xuan;
Liang, Yanan;
Ma, Yingqi;
Shangguan, Shipeng;
Ratti, Lodovico

Publication type:

Article

A Virtual Device for Simulation-Based Fault Injection.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 12, p. 1989, doi. 10.3390/electronics9121989

By:

Muñoz-Quijada, Maria;
Sanz, Luis;
Guzman-Miranda, Hipolito

Publication type:

Article

Novel Full TMR Placement Techniques for High-Speed Radiation Tolerant Digital Integrated Circuits.

Published in:

Electronics (2079-9292), 2020, v. 9, n. 11, p. 1936, doi. 10.3390/electronics9111936

By:

Appels, Karel;
Prinzie, Jeffrey

Publication type:

Article

SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA.

Published in:

Electronics (2079-9292), 2019, v. 8, n. 12, p. 1531, doi. 10.3390/electronics8121531

By:

Cai, Chang;
Gao, Shuai;
Zhao, Peixiong;
Yu, Jian;
Zhao, Kai;
Xu, Liewei;
Li, Dongqing;
He, Ze;
Yang, Guangwen;
Liu, Tianqi;
Liu, Jie

Publication type:

Article

Coupled changes in pH, temperature, and dissolved oxygen impact the physiology and ecology of herbivorous kelp forest grazers.

Published in:

Global Change Biology, 2022, v. 28, n. 9, p. 3023, doi. 10.1111/gcb.16125

By:

Donham, Emily M.;
Strope, Lauren T.;
Hamilton, Scott L.;
Kroeker, Kristy J.

Publication type:

Article

Effects of Equatorial Plasma Bubbles on Multi-GNSS Signals: A Case Study over South China.

Published in:

Remote Sensing, 2024, v. 16, n. 8, p. 1358, doi. 10.3390/rs16081358

By:

Han, Hao;
Zhong, Jiahao;
Hao, Yongqiang;
Wang, Ningbo;
Wan, Xin;
Huang, Fuqing;
Li, Qiaoling;
Song, Xingyan;
Chen, Jiawen;
Wang, Kang;
Tang, Yanyan;
Ou, Zhuoliang;
Du, Wenyu

Publication type:

Article

Nuclear Reactions' Contribution to Spacecraft On-Board Electronics Failures.

Published in:

Physics of Atomic Nuclei, 2023, v. 86, n. 2, p. 188, doi. 10.1134/S1063778823020047

By:

Chechenin, N. G.;
Novikov, N. V.;
Shirokova, A. A.

Publication type:

Article

Analysis of Single Event Effects Created by Space Ionizing Radiation in the Microcircuits of the Interplanetary Spacecraft Radio Electronic Equipment.

Published in:

Solar System Research, 2022, v. 56, n. 7, p. 537, doi. 10.1134/S0038094622070115

By:

Khamidullina, N. M.;
Zefirov, I. V.;
Chernikov, P. S.

Publication type:

Article

Analysis of Single Event Effects Created by Space Ionizing Radiation in the Microcircuits of the Interplanetary Spacecraft Radio Electronic Equipment.

Published in:

Solar System Research, 2022, v. 56, n. 6, p. 537, doi. 10.1134/S0038094622070115

By:

Khamidullina, N. M.;
Zefirov, I. V.;
Chernikov, P. S.

Publication type:

Article

Detection of Transient Nanoparticle Collision Events Using Electrochemiluminescence on a Closed Bipolar Microelectrode.

Published in:

ChemElectroChem, 2020, v. 7, n. 1, p. 252, doi. 10.1002/celc.201901734

By:

Defnet, Peter A.;
Bo Zhang

Publication type:

Article

Multiple Upsets Induced by Protons in 90-nm SRAMs.

Published in:

Technical Physics Letters, 2018, v. 44, n. 12, p. 1205, doi. 10.1134/S1063785019010097

By:

Ivanov, N. A.;
Lobanov, O. V.;
Pashuk, V. V.;
Prygunov, M. O.;
Sizova, K. G.

Publication type:

Article

Radiation-resistant Silicon-on-insulator MOSFETs Realized by Neutron Irradiation.

Published in:

Sensors & Materials, 2023, v. 35, n. 10, Part 2, p. 4555, doi. 10.18494/SAM4317

By:

Huixiang Huang;
Qi Han;
Yu Li;
Tao He;
Chi-Cheng Chen

Publication type:

Article

Influence of Buried Oxide Layer and Bias State on Total Ionizing Dose of Fully Depleted Silicon-on-insulator Devices.

Published in:

Sensors & Materials, 2023, v. 35, n. 6, Part 3, p. 2051, doi. 10.18494/SAM4156

By:

Shougang Du;
Hongxia Liu;
Shulong Wang

Publication type:

Article

Diversity of Growth Responses of Soil Saprobic Fungi to Recurring Heat Events.

Published in:

Frontiers in Microbiology, 2020, v. 11, p. 1, doi. 10.3389/fmicb.2020.01326

By:

Szymczak, Aleksandra;
Ryo, Masahiro;
Roy, Julien;
Rillig, Matthias C.

Publication type:

Article

RAMSEES: A Model of the Atmospheric Radiative Environment Based on Geant4 Simulation of Extensive Air Shower.

Published in:

Aerospace (MDPI Publishing), 2023, v. 10, n. 3, p. 295, doi. 10.3390/aerospace10030295

By:

Cintas, Hugo;
Wrobel, Frédéric;
Ruffenach, Marine;
Herrera, Damien;
Saigné, Frédéric;
Varotsou, Athina;
Bezerra, Françoise;
Mekki, Julien

Publication type:

Article

Heavy Ion Induced Single Event Effects Characterization on an RF-Agile Transceiver for Flexible Multi-Band Radio Systems in NewSpace Avionics.

Published in:

Aerospace (MDPI Publishing), 2020, v. 7, n. 2, p. 14, doi. 10.3390/aerospace7020014

By:

Budroweit, Jan;
Jaksch, Mattis;
Alía, Rubén Garcia;
Coronetti, Andrea;
Kölpin, Alexander

Publication type:

Article

Impact of Energy Dependence on Ground Level and Avionic SEE Rate Prediction When Applying Standard Test Procedures.

Published in:

Aerospace (MDPI Publishing), 2019, v. 6, n. 11, p. 119, doi. 10.3390/aerospace6110119

By:

Cecchetto, Matteo;
García Alía, Rubén;
Wrobel, Frédéric

Publication type:

Article

In-Situ Testing of a Multi-Band Software-Defined Radio Platform in a Mixed-Field Irradiation Environment.

Published in:

Aerospace (MDPI Publishing), 2019, v. 6, n. 10, p. 106, doi. 10.3390/aerospace6100106

By:

Budroweit, Jan;
Mueller, Steffen;
Jaksch, Mattis;
Alía, Rubén Garcia;
Coronetti, Andrea;
Koelpin, Alexander

Publication type:

Article

AniMAIRE‐A New Openly Available Tool for Calculating Atmospheric Ionising Radiation Dose Rates and Single Event Effects During Anisotropic Conditions.

Published in:

Space Weather: The International Journal of Research & Applications, 2024, v. 22, n. 10, p. 1, doi. 10.1029/2024SW003985

By:

Davis, C. S. W.;
Baird, F.;
Lei, F.;
Ryden, K.;
Dyer, C.

Publication type:

Article

NAIRAS Model Run‐On‐Request Service at CCMC.

Published in:

Space Weather: The International Journal of Research & Applications, 2023, v. 21, n. 5, p. 1, doi. 10.1029/2023SW003473

By:

Mertens, C. J.;
Gronoff, G. P.;
Zheng, Y.;
Petrenko, M.;
Buhler, J.;
Phoenix, D.;
Willis, E.;
Jun, I.;
Minow, J.

Publication type:

Article

A New Model for Nowcasting the Aviation Radiation Environment With Comparisons to In Situ Measurements During GLEs.

Published in:

Space Weather: The International Journal of Research & Applications, 2022, v. 20, n. 8, p. 1, doi. 10.1029/2022SW003155

By:

Hands, A. D. P.;
Lei, F.;
Davis, C. S.;
Clewer, B. J.;
Dyer, C. S.;
Ryden, K. A.

Publication type:

Article

An Enhanced LPRAFF with Tri-State Inverter Embedded Non-Clock Gating via the CT-GWO Algorithm.

Published in:

IETE Journal of Research, 2025, v. 71, n. 1, p. 199, doi. 10.1080/03772063.2024.2403697

By:

Kamalakannan, R. S.;
Senthilkumar, R.;
Venkatachalam, K.;
Tamilarasi, K.

Publication type:

Article