Works matching DE "SILICONMAP LLC"

Study of phase separation in Ti-Co-N thin films on silicon substrate.

Published in:

Applied Physics A: Materials Science & Processing, 1997, v. 64, n. 5, p. 517, doi. 10.1007/s003390050510

By:

• Gromov, D.G.;
• Mochalov, A.I.;
• Pugachevich, V.P.;
• Kirilenko, E.P.;
• Trifonov, A.Y.

Publication type:

Article