Works matching DE "SILICON-on-insulator metal oxide semiconductor field-effect transistors"
Results: 12
Numerical Simulation and Mathematical Modeling of 3D DG SOI MOSFET with the Influence of Biasing with Back Gate.
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- Journal of Nano- & Electronic Physics, 2017, v. 9, n. 5, p. 1, doi. 10.21272/jnep.9(5).05002
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Comparison of Three Dimensional Partially and Fully Depleted SOI MOSFET Characteristics Using Mathcad.
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- Journal of Nano- & Electronic Physics, 2016, v. 8, n. 1, p. 1, doi. 10.21272/jnep.8(1).01041
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- Article
PERFORMANCE ANALYSIS OF MODIFIED SOURCE JUNCTIONLESS FULLY DEPLETED SILICON ON INSULATOR MOSFET.
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- i-Manager's Journal on Electronics Engineering, 2017, v. 8, n. 2, p. 44
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- Article
Development for Germanium Blocked Impurity Band Far-Infrared Image Sensors with Fully-Depleted Silicon-On-Insulator CMOS Readout Integrated Circuit.
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- Journal of Low Temperature Physics, 2016, v. 184, n. 1/2, p. 217, doi. 10.1007/s10909-016-1522-z
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A Demonstration of TIA Using FD-SOI CMOS OPAMP for Far-Infrared Astronomy.
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- Journal of Low Temperature Physics, 2016, v. 184, n. 1/2, p. 449, doi. 10.1007/s10909-016-1551-7
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Empirical and Theoretical Modeling of Low-Frequency Noise Behavior of Ultrathin Silicon-on-Insulator MOSFETs Aiming at Low-Voltage and Low-Energy Regime.
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- Micromachines, 2019, v. 10, n. 1, p. 5, doi. 10.3390/mi10010005
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The Search for the Integrable Qubit.
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- Clefs CEA (English), 2018, n. 66, p. 36
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A 1.9- GHz silicon-on-insulator CMOS stacked- FET power amplifier with uniformly distributed voltage stresses.
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- International Journal of Circuit Theory & Applications, 2017, v. 45, n. 11, p. 1660, doi. 10.1002/cta.2325
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- Article
Revision of interface coupling in ultra-thin body silicon-on-insulator MOSFETs.
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- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2013, v. 16, n. 3, p. 300
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Strain and Dimension Effects on the Threshold Voltage of Nanoscale Fully Depleted Strained-SOI TFETs.
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- Advances in Condensed Matter Physics, 2015, v. 2015, p. 1, doi. 10.1155/2015/850383
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- Article
Four-Port Network Parameters Extraction Method for Partially Depleted SOI with Body-Contact Structure.
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- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 763, doi. 10.1007/s10836-016-5625-x
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- Article
IGBT Dynamic Loss Reduction through Device Level Soft Switching.
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- Energies (19961073), 2018, v. 11, n. 5, p. 1182, doi. 10.3390/en11051182
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- Article