Synthesis and characterization of vanadium oxide thin films on different substrates.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 10909, doi. 10.1007/s10854-017-6870-1
- By:
- Publication type:
- Article
Works matching DE "SILICON wafers testing"
Results: 7
1
2
Combined neutron reflectometry and rheology.
- Published in:
- Journal of Applied Crystallography, 2013, v. 46, n. 6, p. 1729, doi. 10.1107/S0021889813024059
- By:
- Publication type:
- Article
3
Synthesis of Ag@Silica Nanoparticles by Assisted Laser Ablation.
- Published in:
- Nanoscale Research Letters, 2015, v. 10, n. 1, p. 1, doi. 10.1186/s11671-015-1105-y
- By:
- Publication type:
- Article
4
Polystyrene-silicon bonding through π electrons: a combined XPS and DFT study.
- Published in:
- Surface & Interface Analysis: SIA, 2016, v. 48, n. 7, p. 556, doi. 10.1002/sia.5879
- By:
- Publication type:
- Article
5
Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon.
- Published in:
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 11, p. 2844, doi. 10.1002/pssa.201600360
- By:
- Publication type:
- Article
6
Challenges in Failure Analysis for Three-Dimensional Integration.
- Published in:
- Electronic Device Failure Analysis, 2012, v. 14, n. 3, p. 2
- By:
- Publication type:
- Article
7
Influence of the Viscoelastic Properties of the Polyimide Dielectric Coating on the Wafer Warpage.
- Published in:
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3255, doi. 10.1007/s11664-014-3255-6
- By:
- Publication type:
- Article