Works matching DE "SILICON wafers testing"
Results: 7
Synthesis of Ag@Silica Nanoparticles by Assisted Laser Ablation.
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- Nanoscale Research Letters, 2015, v. 10, n. 1, p. 1, doi. 10.1186/s11671-015-1105-y
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- Article
Combined neutron reflectometry and rheology.
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- Journal of Applied Crystallography, 2013, v. 46, n. 6, p. 1729, doi. 10.1107/S0021889813024059
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- Article
Synthesis and characterization of vanadium oxide thin films on different substrates.
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- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 10909, doi. 10.1007/s10854-017-6870-1
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- Article
Challenges in Failure Analysis for Three-Dimensional Integration.
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- Electronic Device Failure Analysis, 2012, v. 14, n. 3, p. 2
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- Article
Influence of the Viscoelastic Properties of the Polyimide Dielectric Coating on the Wafer Warpage.
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- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3255, doi. 10.1007/s11664-014-3255-6
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- Article
Permanent annihilation of thermally activated defects which limit the lifetime of float-zone silicon.
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- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 11, p. 2844, doi. 10.1002/pssa.201600360
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- Article
Polystyrene-silicon bonding through π electrons: a combined XPS and DFT study.
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- Surface & Interface Analysis: SIA, 2016, v. 48, n. 7, p. 556, doi. 10.1002/sia.5879
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- Article