Works about SILICON spectra
1
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 111, doi. 10.1007/s10854-007-9156-1
- Gharghi, M.;
- Sivoththaman, S.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 175, doi. 10.1007/s10854-007-9184-x
- Costea, S.;
- Kherani, N. P.;
- Zukotynski, S.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 443, doi. 10.1007/s10854-007-9252-2
- Toyama, Toshihiko;
- Suzuki, Tetsuya;
- Ogane, Akiyoshi;
- Ota, Jun;
- Okamoto, Hiroaki
- Article
4
- Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 905, doi. 10.1017/S1431927612001134
- Carvajal, Joan J.;
- Bilousov, Oleksandr V.;
- Drouin, Dominique;
- Aguiló, Magdalena;
- Díaz, Francesc;
- Rojo, J. Carlos
- Article
5
- Measurement Techniques, 2015, v. 58, n. 3, p. 256, doi. 10.1007/s11018-015-0695-1
- Gavrilenko, V.;
- Karabanov, D.;
- Kuzin, A.;
- Mityukhlyaev, V.;
- Mikhutkin, A.;
- Todua, P.;
- Filippov, M.;
- Baimukhametov, T.;
- Vasil'ev, A.
- Article
6
- Measurement Techniques, 2013, v. 56, n. 9, p. 1031, doi. 10.1007/s11018-013-0325-8
- Kovalev, A.;
- Liberman, A.;
- Mikryukov, A.;
- Moskalyuk, S.;
- Ulanovskii, M.
- Article
7
- Scientific Reports, 2015, p. 7910, doi. 10.1038/srep07910
- Meng, Lala;
- Zhang, Xiaofei;
- Tang, Yusheng;
- Su, Kehe;
- Kong, Jie
- Article
8
- Scientific Reports, 2015, p. 7659, doi. 10.1038/srep07659
- Li, Bing;
- Yao, Fei;
- Bae, Jung Jun;
- Chang, Jian;
- Zamfir, Mihai Robert;
- Le, Duc Toan;
- Pham, Duy Tho;
- Yue, Hongyan;
- Lee, Young Hee
- Article
9
- Modern Physics Letters B, 2017, v. 31, n. 33, p. -1, doi. 10.1142/S0217984917503158
- Article
10
- Semiconductors, 1997, v. 31, n. 2, p. 143, doi. 10.1134/1.1187096
- Article
11
- XRS: X-ray Spectrometry, 2017, v. 46, n. 2, p. 88, doi. 10.1002/xrs.2735
- Reis, M. A.;
- Chaves, P. C.
- Article
12
- Rapid Communications in Mass Spectrometry: RCM, 2014, v. 28, n. 10, p. 1153, doi. 10.1002/rcm.6880
- Lassalle, Yannick;
- Kinani, Aziz;
- Rifai, Ahmad;
- Souissi, Yasmine;
- Clavaguera, Carine;
- Bourcier, Sophie;
- Jaber, Farouk;
- Bouchonnet, Stéphane
- Article
13
- Journal of Materials Science, 2011, v. 46, n. 5, p. 1244, doi. 10.1007/s10853-010-4904-7
- Caicedo, J. C.;
- Yate, L.;
- Cabrera, G.;
- Aperador, W.;
- Zambrano, G.;
- Prieto, P.
- Article
14
- Journal of Materials Science, 2005, v. 40, n. 15, p. 3951, doi. 10.1007/s10853-005-1915-x
- Singh, Puyam S.;
- Bastow, Tim;
- Trigg, Mark
- Article
15
- Plant & Soil, 2011, v. 342, n. 1/2, p. 369, doi. 10.1007/s11104-010-0702-x
- Cornelis, Jean-Thomas;
- Titeux, Hugues;
- Ranger, Jacques;
- Delvaux, Bruno
- Article
16
- Turkish Journal of Physics, 2012, v. 36, n. 2, p. 197, doi. 10.3906/fiz-1107-7
- Abdulrida, Moafak Cadim;
- Abdul-Ameer, Nidhal Moosa;
- Abdul-Hakeem, Shatha Mohammad
- Article
17
- Russian Journal of Organic Chemistry, 2015, v. 51, n. 3, p. 295, doi. 10.1134/S107042801503001X
- Koval, V.;
- Minyaev, R.;
- Minkin, V.
- Article
18
- Applied Physics A: Materials Science & Processing, 1997, v. 64, n. 4, p. 357, doi. 10.1007/s003390050490
- Krotkus, A.;
- Pačebutas, V.;
- Kavaliauskas, J.;
- Subačius, I.;
- Grigoras, K.;
- Šimkienė, I.
- Article
19
- Molecular Physics, 2005, v. 103, n. 5, p. 611, doi. 10.1080/00268970512331316012
- Davy, Randall;
- Skoumbourdis, Evangelos;
- Dinsmore, David
- Article
20
- Photovoltaics International, 2010, n. 7, p. 138
- Article
21
- Journal of Microscopy, 1999, v. 194, n. 2/3, p. 445, doi. 10.1046/j.1365-2818.1999.00530.x
- Article
22
- Revista Cubana de Física, 2008, v. 25, n. 2A, p. 75
- Cheben, P.;
- Delâge, A.;
- Densmore, A.;
- Janz, S.;
- Lamontagne, B.;
- Lapointe, J.;
- Post, E.;
- Schmid, J.;
- Waldron, P.;
- Xu, D.-X.
- Article
23
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5148, doi. 10.1007/s11664-018-6337-z
- Lorenzi, Bruno;
- Dettori, Riccardo;
- Dunham, Marc T.;
- Melis, Claudio;
- Tonini, Rita;
- Colombo, Luciano;
- Sood, Aditya;
- Goodson, Kenneth E.;
- Narducci, Dario
- Article
24
- Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3204, doi. 10.1007/s11664-014-3286-z
- Lee, Seung-Yun;
- Bang, Ki;
- Lim, Jung
- Article
25
- Journal of Electronic Materials, 2010, v. 39, n. 6, p. 719, doi. 10.1007/s11664-010-1138-z
- Tokuda, Yutaka;
- Nagae, Youichi;
- Sakane, Hitoshi;
- Ito, Jyoji
- Article
26
- Journal of Electronic Materials, 2009, v. 38, n. 11, p. 2343, doi. 10.1007/s11664-009-0907-z
- Taylor, P. J.;
- Dhar, N. K.;
- Harris, E.;
- Swaminathan, V.;
- Chen, Y.;
- Jesser, W. A.
- Article
27
- Journal of Electronic Materials, 2008, v. 37, n. 2, p. 176, doi. 10.1007/s11664-007-0307-1
- Chen, Y. W.;
- Jiang, S. H.;
- Shao, B. X.;
- Wang, W.;
- Wang, R. C.
- Article
28
- Materialwissenschaft und Werkstoffechnik, 2016, v. 47, n. 2/3, p. 120, doi. 10.1002/mawe.201600479
- Buchenko, V. V.;
- Goloborodko, A. A.;
- Afanasieva, T. V.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3891, doi. 10.1007/s10854-016-6002-3
- Sharma, Prachi;
- Tripathi, Nishant;
- Gupta, Navneet
- Article
30
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 4, p. 1751, doi. 10.1007/s10854-014-1794-5
- Li, Jiayan;
- Jia, Pengjun;
- Li, Yaqiong;
- Cao, Panpan;
- Liu, Yao;
- Tan, Yi
- Article
31
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 9, p. 1610, doi. 10.1007/s10854-012-0637-5
- Shi, Qiwu;
- Huang, Wanxia;
- Zhang, Yaxin;
- Qiao, Shen;
- Wu, Jing;
- Zhao, Dong;
- Yan, Jiazhen
- Article
32
- Crystallography Reports, 2017, v. 62, n. 3, p. 370, doi. 10.1134/S1063774517030099
- Kaloyan, A.;
- Tikhomirov, S.;
- Podurets, K.;
- Maisheev, V.;
- Sandomirskiy, Yu.;
- Chesnokov, Yu.
- Article
33
- International Journal of Automotive & Mechanical Engineering, 2013, v. 8, p. 1339, doi. 10.15282/ijame.8.2013.21.0109
- Aznilinda, Z.;
- Herman, S. H.;
- Ramly, M. M.;
- Raudah, A. B.;
- Rusop, M.
- Article
34
- Physica Status Solidi. A: Applications & Materials Science, 2017, v. 214, n. 8, p. n/a, doi. 10.1002/pssa.201600859
- Vetter, Michael;
- Jia, Guobin;
- Sanei, Azade;
- Gawlik, Annett;
- Plentz, Jonathan;
- Andrä, Gudrun
- Article
35
- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 9, p. 2031, doi. 10.1002/pssa.201431908
- Grafe, Hans‐Joachim;
- Löser, Wolfgang;
- Schmitz, Steffen;
- Sakaliyska, Miroslava;
- Wurmehl, Sabine;
- Eisert, Stefan;
- Reichenbach, Birk;
- Acker, Jörg;
- Rietig, Anja;
- Ducke, Jana;
- Müller, Tim
- Article
36
- Physica Status Solidi - Rapid Research Letters, 2013, v. 7, n. 7, p. 481, doi. 10.1002/pssr.201307151
- Li, Galina V.;
- Astrova, Ekaterina V.;
- Dyakov, Sergey A.;
- Baldycheva, Anna;
- Perova, Tatiana S.;
- Tikhodeev, Sergey G.;
- Gippius, Nikolay A.
- Article
37
- Packaging Technology & Science, 2014, v. 27, n. 8, p. 625, doi. 10.1002/pts.2055
- Dhawan, Sumeet;
- Sablani, Shyam S.;
- Tang, Juming;
- Barbosa‐Cànovas, Gustavo V.;
- Ullman, Jeffrey L.;
- Bhunia, Kanishka
- Article
38
- Computer Methods in Biomechanics & Biomedical Engineering, 2016, v. 19, n. 11, p. 1210, doi. 10.1080/10255842.2015.1124268
- Li, Eric;
- Chang, C.C.;
- Zhang, Zhongpu;
- Li, Qing
- Article
39
- JETP Letters, 2016, v. 104, n. 4, p. 231, doi. 10.1134/S0021364016160086
- Krivobok, V.;
- Nikolaev, S.;
- Novikov, A.;
- Shaleev, M.;
- Bagaev, V.;
- Onishchenko, E.;
- Lebedev, V.;
- Skorikov, M.;
- Utsina, E.;
- Kochiev, M.
- Article
40
- Physica Status Solidi (B), 2014, v. 251, n. 11, p. 2205, doi. 10.1002/pssb.201400038
- Inoue, Naohisa;
- Goto, Yasunori;
- Sugiyama, Takahide;
- Watanabe, Kaori;
- Seki, Hirofumi;
- Kawamura, Yuichi
- Article
41
- Applied Physics A: Materials Science & Processing, 2015, v. 120, n. 1, p. 161, doi. 10.1007/s00339-015-9064-9
- Zaporozhchenko, A.;
- Chernov, S.;
- Odnodvorets, L.;
- Stetsenko, B.;
- Nepijko, S.;
- Elmers, H.;
- Schönhense, G.
- Article
42
- Applied Physics A: Materials Science & Processing, 2011, v. 105, n. 4, p. 795, doi. 10.1007/s00339-011-6651-2
- Smith, Matthew;
- Winkler, Mark;
- Sher, Meng-Ju;
- Lin, Yu-Ting;
- Mazur, Eric;
- Gradečak, Silvija
- Article
43
- Applied Physics A: Materials Science & Processing, 2011, v. 104, n. 3, p. 987, doi. 10.1007/s00339-011-6483-0
- Salingue, Nils;
- Hess, Peter
- Article
44
- European Journal of Organic Chemistry, 2013, v. 2013, n. 26, p. 5814, doi. 10.1002/ejoc.201300932
- Lu, Xing;
- Li, Li;
- Yang, Wei;
- Jiang, Kezhi;
- Yang, Ke‐Fang;
- Zheng, Zhan‐Jiang;
- Xu, Li‐Wen
- Article
45
- Nature Photonics, 2009, v. 3, n. 4, p. 190, doi. 10.1038/nphoton.2009.39
- Article
46
- Semiconductors, 2017, v. 51, n. 2, p. 178, doi. 10.1134/S1063782617020154
- Privezentsev, V.;
- Kirilenko, E.;
- Goryachev, A.;
- Batrakov, A.
- Article
47
- Semiconductors, 2008, v. 42, n. 6, p. 655, doi. 10.1134/S1063782608060055
- Article
48
- Semiconductors, 2003, v. 37, n. 1, p. 57, doi. 10.1134/1.1538540
- Astrova, E.V.;
- Korovin, L.I.;
- Lang, I.G.;
- Remenyuk, A.D.;
- Shuman, V.B.
- Article
49
- Chemistry & Industry, 2010, n. 12, p. 23
- Article
50
- Advanced Engineering Materials, 2015, v. 17, n. 1, p. 68, doi. 10.1002/adem.201400060
- Monachon, Christian;
- Weber, Ludger
- Article