Works about SILICON oxide films
1
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 15, p. 20659, doi. 10.1007/s10854-021-06579-x
- He, Majun;
- Yang, Deren;
- Li, Dongsheng
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 16010, doi. 10.1007/s10854-018-9688-6
- Amin, Peshawa O.;
- Kadhim, Asmaa J.;
- Ameen, Majida A.;
- Abdulwahid, Rebar T.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 8, p. 5746, doi. 10.1007/s10854-016-6246-y
- Das, Gourab;
- Mandal, Sourav;
- Dhar, Sukanta;
- Bose, Sukanta;
- Mukhopadhyay, Sumita;
- Barua, A.;
- Banerjee, Chandan
- Article
4
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 2733, doi. 10.1007/s10854-015-2750-8
- Karasiński, P.;
- Tyszkiewicz, C.;
- Maciaga, A.;
- Kityk, I.;
- Gondek, E.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 1, p. 160, doi. 10.1007/s10854-012-1004-2
- Meng, Xiangqin;
- Yang, Chengtao;
- Chen, Qingqing;
- Yang, Jiancang
- Article
6
- Plasma Physics Reports, 2011, v. 37, n. 13, p. 1242, doi. 10.1134/S1063780X11120014
- Burachevsky, Yu.;
- Burdovitsin, V.;
- Oks, E.
- Article
7
- Physica Status Solidi (B), 2017, v. 254, n. 2, p. n/a, doi. 10.1002/pssb.201600088
- Su, Yurong;
- Falgenhauer, Jane;
- Leichtweiß, Thomas;
- Geiß, Matthias;
- Lupó, Christian;
- Polity, Angelika;
- Zhou, Shengqiang;
- Obel, Jaroslava;
- Schlettwein, Derck;
- Janek, Jürgen;
- Meyer, Bruno K.
- Article
8
- Research on Chemical Intermediates, 2014, v. 40, n. 5, p. 1965, doi. 10.1007/s11164-013-1094-3
- Xu, Kejing;
- Sun, Qingwen;
- Guo, Yanqing;
- Zhang, Yingying;
- Dong, Shuhua
- Article
9
- NANO (1793-2920), 2021, v. 16, n. 10, p. 1, doi. 10.1142/S1793292021501150
- Jana, Tapati;
- Goswami, Romyani
- Article
10
- Philosophical Magazine, 2007, v. 87, n. 1, p. 11, doi. 10.1080/14786430600863047
- Wang, J.;
- Wang, X. F.;
- Li, Q.;
- Hryciw, A.;
- Meldrum, A.
- Article
11
- Advanced Engineering Materials, 2014, v. 16, n. 9, p. 1090, doi. 10.1002/adem.201400245
- Belgardt, Christian;
- Blaudeck, Thomas;
- von Borczyskowski, Christian;
- Graaf, Harald
- Article
12
- Journal of Applied Spectroscopy, 2011, v. 78, n. 1, p. 75, doi. 10.1007/s10812-011-9427-8
- Ostapenko, N.;
- Kozlova, N.;
- Frolova, E.;
- Ostapenko, Yu.;
- Peckus, D.;
- Gulbinas, V.;
- Eremenko, A.;
- Smirnova, N.;
- Surovtseva, N.;
- Suto, S.;
- Watanabe, A.
- Article
13
- Electronic Components & Materials, 2018, v. 37, n. 7, p. 83, doi. 10.14106/j.cnki.1001-2028.2018.07.016
- Article
14
- Piezoelectrics & Acoustooptics, 2023, v. 45, n. 3, p. 450, doi. 10.11977/j.issn.1004-2474.2023.03.024
- Article
15
- Journal of Adhesion, 2005, v. 81, n. 1, p. 41, doi. 10.1080/00218460590904444
- O'Brien, E. P.;
- Case, S. L.;
- Ward, T. C.
- Article
16
- JETP Letters, 2010, v. 92, n. 5, p. 310, doi. 10.1134/S0021364010170091
- Arapkina, L.;
- Yuryev, V.;
- Shevlyuga, V.;
- Chizh, K.
- Article
17
- Physica Status Solidi. A: Applications & Materials Science, 2022, v. 219, n. 3, p. 1, doi. 10.1002/pssa.202100208
- Knyazev, Maxim;
- Sedlovets, Daria;
- Soltanovich, Oleg;
- Khodos, Igor;
- Koveshnikov, Sergei
- Article
18
- Physica Status Solidi. A: Applications & Materials Science, 2020, v. 217, n. 15, p. 1, doi. 10.1002/pssa.202000093
- Gregory, Geoffrey;
- Feit, Corbin;
- Gao, Zhengning;
- Banerjee, Parag;
- Jurca, Titel;
- Davis, Kristopher O.
- Article
19
- Physica Status Solidi. A: Applications & Materials Science, 2020, v. 217, n. 15, p. 1, doi. 10.1002/pssa.202000093
- Gregory, Geoffrey;
- Feit, Corbin;
- Gao, Zhengning;
- Banerjee, Parag;
- Jurca, Titel;
- Davis, Kristopher O.
- Article
20
- Physica Status Solidi. A: Applications & Materials Science, 2020, v. 217, n. 4, p. 1, doi. 10.1002/pssa.201900513
- Article
21
- Journal of Adhesion Science & Technology, 2001, v. 15, n. 7, p. 841, doi. 10.1163/15685610152540885
- Leterrier, Y.;
- Månson, J.-A. E.;
- Wyser, Y.
- Article
22
- Semiconductors, 2020, v. 54, n. 14, p. 1850, doi. 10.1134/S1063782620140213
- Nastovjak, A. G.;
- Shwartz, N. L.;
- Emelyanov, E. A.;
- Petrushkov, M. O.;
- Vasev, A. V.;
- Putyato, M. A.;
- Preobrazhenskii, V. V.
- Article
23
- International Journal of Photoenergy, 2013, p. 1, doi. 10.1155/2013/513284
- Limmanee, Amornrat;
- Kittisontirak, Songkiate;
- Inthisang, Sorapong;
- Krajangsang, Taweewat;
- Sritharathikhun, Jaran;
- Sriprapha, Kobsak
- Article
24
- Advanced Functional Materials, 2025, v. 35, n. 5, p. 1, doi. 10.1002/adfm.202414374
- Jeon, Gi Wan;
- Kim, Yu‐Mi;
- Yeo, Sunmog;
- Jeong, Seock‐Jin;
- Lee, Sang‐Hyeon;
- Lee, Sang‐Geul;
- Kim, Jong Hwa;
- Ha, Jun Mok;
- Suk, Jaekwon;
- Yang, In Mok;
- Seo, Junhyeok;
- Chae, Weon‐Sik;
- Lee, Jong‐Soo;
- Park, Jun Kue
- Article
25
- Journal of Materials Science, 2000, v. 35, n. 14, p. 3655, doi. 10.1023/A:1004886118489
- Shi, F. X.;
- Cao, L. L.;
- Yao, W. Q.;
- Ye, X. Y.
- Article
26
- Journal of Materials Science, 2000, v. 35, n. 13, p. 3301, doi. 10.1023/A:1004883607913
- Shimoo, T.;
- Toyoda, F.;
- Okamura, K.
- Article
27
- Silicone Material, 2022, v. 36, n. 4, p. 547, doi. 10.14136/j.cnki.issn1673-2812.2022.04.001
- HU Jie;
- YUAN Meng;
- YANG Deren;
- LI Dongsheng
- Article
28
- Applied Physics B: Lasers & Optics, 2010, v. 99, n. 3, p. 553, doi. 10.1007/s00340-010-3930-0
- Hocini, A.;
- Boumaza, T.;
- Bouchemat, M.;
- Choueikani, F.;
- Royer, F.;
- Rousseau, J. J.
- Article
29
- Applied Physics B: Lasers & Optics, 2007, v. 88, n. 2, p. 241, doi. 10.1007/s00340-007-2700-0
- Prucnal, S.;
- Sun, J.M.;
- Nazarov, A.;
- Tjagulskii, I.P.;
- Osiyuk, I.N.;
- Fedaruk, R.;
- Skorupa, W.
- Article
30
- European Physical Journal - Applied Physics, 2015, v. 70, n. 1, p. 10302-p1, doi. 10.1051/epjap/2015140444
- Nhu Tranh, Duong Thi;
- Van Hoang, Vo
- Article
31
- Electrical Engineering in Japan, 2005, v. 152, n. 1, p. 1, doi. 10.1002/eej.20099
- Nagahama, Tetsuya;
- Arikado, Tsunetoshi;
- Suematsu, Hisayuki;
- Weihua Jiang;
- Yatsui, Kiyoshi
- Article
32
- Polymers (20734360), 2019, v. 11, n. 2, p. 257, doi. 10.3390/polym11020257
- Scarfato, Paola;
- Schiavone, Nicola;
- Rossi, Gabriella;
- Incarnato, Loredana
- Article
33
- Journal of Applied Polymer Science, 2015, v. 132, n. 17, p. n/a, doi. 10.1002/app.41863
- Rodríguez‐Hernández, Juan;
- del Campo, Adolfo
- Article
34
- Nanoscale Research Letters, 2016, v. 11, n. 1, p. 1, doi. 10.1186/s11671-016-1744-7
- Lisovskyy, Igor;
- Voitovych, Mariia;
- Litovchenko, Volodymyr;
- Voitovych, Vasyl;
- Nasieka, Iurii;
- Bratus, Viktor
- Article
35
- Nanoscale Research Letters, 2016, v. 11, n. 1, p. 1, doi. 10.1186/s11671-016-1567-6
- van Sebille, Martijn;
- Allebrandi, Jort;
- Quik, Jim;
- van Swaaij, René;
- Tichelaar, Frans;
- Zeman, Miro
- Article
36
- Nanoscale Research Letters, 2015, v. 10, n. 1, p. 1, doi. 10.1186/s11671-014-0724-z
- Yang, Wen;
- Fronk, Michael;
- Geng, Yang;
- Chen, Lin;
- Sun, Qing-Qing;
- Gordan, Ovidiu;
- zhou, Peng;
- Zahn, Dietrich;
- Zhang, David
- Article
37
- Nanoscale Research Letters, 2013, n. 5, p. 1, doi. 10.1186/1556-276X-8-201
- Zeteng Zhuo;
- Yuta Sannomiya;
- Yuki Kanetani;
- Takahiro Yamada;
- Hiromasa Ohmi;
- Hiroaki Kakiuchi;
- Kiyoshi Yasutake
- Article
38
- Metallurgical & Materials Transactions. Part B, 2016, v. 47, n. 5, p. 2971, doi. 10.1007/s11663-016-0730-x
- Boisvert, Mathieu;
- Christopherson, Denis;
- L'Espérance, Gilles
- Article
39
- Chemistry Letters, 2005, v. 34, n. 3, p. 392, doi. 10.1246/cl.2005.392
- Noda, Bunpei;
- Katsuhara, Mao;
- Aoyagi, Isao;
- Mori, Takehiko;
- Taguchi, Tomohiro;
- Kambayashi, Takuya;
- Ishikawa, Ken;
- Takezoe, Hideo
- Article
40
- Analytical & Bioanalytical Chemistry, 2011, v. 400, n. 3, p. 649, doi. 10.1007/s00216-011-4686-z
- Krivec, Stefan;
- Buchmayr, Michael;
- Detzel, Thomas;
- Froemling, Till;
- Fleig, Juergen;
- Hutter, Herbert
- Article
41
- Journal of Nanoparticle Research, 2013, v. 15, n. 4, p. 1, doi. 10.1007/s11051-013-1538-0
- En Naciri, A.;
- Miska, P.;
- Keita, A.-S.;
- Battie, Y.;
- Rinnert, H.;
- Vergnat, M.
- Article
42
- Journal of Materials Science, 2024, v. 59, n. 30, p. 13873, doi. 10.1007/s10853-024-09506-7
- Park, Hyeong Gi;
- Hussain, Shahzada Qamar;
- Park, Jinjoo;
- Yi, Junsin
- Article
43
- Technical Physics, 2019, v. 64, n. 4, p. 575, doi. 10.1134/S1063784219040108
- Fadeev, A. V.;
- Devyatko, Yu. N.
- Article
44
- Technical Physics, 2016, v. 61, n. 2, p. 187, doi. 10.1134/S1063784216020286
- Zinchenko, V.;
- Lavrent'ev, K.;
- Emel'yanov, V.;
- Vatuev, A.
- Article
45
- Technical Physics, 2015, v. 60, n. 6, p. 928, doi. 10.1134/S106378421506002X
- Averin, I.;
- Igoshina, S.;
- Moshnikov, V.;
- Karmanov, A.;
- Pronin, I.;
- Terukov, E.
- Article
46
- Technical Physics, 2003, v. 48, n. 2, p. 261, doi. 10.1134/1.1553571
- Michailovskaya, E.V.;
- Indutnyy, I.Z.;
- Shepeliavyi, P.E.
- Article
47
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04523
- Revilla, Reynier I.;
- Xiao-Jun Li;
- Yan-Lian Yang;
- Chen Wang
- Article
48
- Nanomaterials (2079-4991), 2024, v. 14, n. 11, p. 934, doi. 10.3390/nano14110934
- Chang, Mao-Nan;
- Wu, Yi-Shan;
- Lin, Chiao-Jung;
- Hsueh, Yu-Hsun;
- Su, Chun-Jung;
- Lee, Yao-Jen
- Article
49
- Nanomaterials (2079-4991), 2023, v. 13, n. 20, p. 2749, doi. 10.3390/nano13202749
- Herguedas, Natalia;
- Carretero, Enrique
- Article
50
- Nanomaterials (2079-4991), 2023, v. 13, n. 12, p. 1848, doi. 10.3390/nano13121848
- Lee, Doowon;
- Kim, Kyeong Heon;
- Kim, Hee-Dong
- Article