Works matching DE "SILICON oxide films"
Results: 181
Electron Beam Effects on Silicon Oxide Films – Structure and Electrical Properties.
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- 2019
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- Publication type:
- Abstract
Laser-Stimulated Phase Transformations in Thin Layers of SiO<sub>x</sub> and CN<sub>x</sub> -Ni.
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- Materials Science, 2018, v. 54, n. 2, p. 223, doi. 10.1007/s11003-018-0177-0
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- Article
Phase transition between (2 × 1) and c(8 × 8) reconstructions observed on the Si(001) surface around 600°C.
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- JETP Letters, 2010, v. 92, n. 5, p. 310, doi. 10.1134/S0021364010170091
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- Article
Preparation of Silicon Oxide Films by a Hot-Target Impulse Magnetron Deposition in a Reactive Mixture.
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- Journal of Communications Technology & Electronics, 2023, v. 68, n. 11, p. 1321, doi. 10.1134/S1064226923070070
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- Article
Subthreshold swing model using scale length for sub-10 nm junction-based double-gate MOSFETs.
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- International Journal of Electrical & Computer Engineering (2088-8708), 2020, v. 10, n. 3, p. 1747, doi. 10.11591/ijece.v10i2.pp1747-1754
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- Article
Subthreshold swing model using scale length for sub-10 nm junction-based double-gate MOSFETs.
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- International Journal of Electrical & Computer Engineering (2088-8708), 2020, v. 10, n. 2, p. 1747, doi. 10.11591/ijece.v10i2.pp1747-1754
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- Article
Flexible Fiber Conditioner for Fine Conditioning of Polishing Pad and its Evaluation in Chemical Mechanical Polishing: Verification of SUS-FFC on Soft Urethane Foam Pad and Proposal of PEEK-FFC.
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- International Journal of Automation Technology, 2021, v. 15, n. 6, p. 878, doi. 10.20965/ijat.2021.p0878
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- Article
Study of the Dehydroxylation–Rehydroxylation of Pyrophyllite.
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- Journal of the American Ceramic Society, 2010, v. 93, n. 8, p. 2392, doi. 10.1111/j.1551-2916.2010.03750.x
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- Article
Interface properties of SiO<sub>x</sub>N<sub>y</sub> layer on Si prepared by atmospheric-pressure plasma oxidation-nitridation.
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- Nanoscale Research Letters, 2013, n. 5, p. 1, doi. 10.1186/1556-276X-8-201
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- Article
Reasons of Crystallite Formation during the Self-Catalyzed GaAs Nanowire Growth.
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- Semiconductors, 2020, v. 54, n. 14, p. 1850, doi. 10.1134/S1063782620140213
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- Article
Structural Transformation of "Silica+Zn" Nanocomposite after Annealing in Oxidizing Atmosphere.
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- Semiconductors, 2018, v. 52, n. 16, p. 2111, doi. 10.1134/S1063782618160133
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- Article
Redistribution of Erbium and Oxygen Recoil Atoms and the Structure of Silicon Thin Surface Layers Formed by High-Dose Argon Implantation through Er and SiO<sub>2</sub> Surface Films.
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- Semiconductors, 2018, v. 52, n. 13, p. 1696, doi. 10.1134/S1063782618130055
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- Article
Nanoparticle Formation in Zn<sup>+</sup> and O<sup>+</sup> Ion Sequentially Implanted SiO<sub>2</sub> Film.
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- Semiconductors, 2018, v. 52, n. 5, p. 645, doi. 10.1134/S106378261805024X
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- Article
Diffusion-Controlled growth of Ge nanocrystals in SiO films under conditions of ion synthesis at high pressure.
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- Semiconductors, 2017, v. 51, n. 10, p. 1364, doi. 10.1134/S1063782617100189
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- Article
Superconductivity in one-atomic-layer metal films grown on Si(111).
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- Nature Physics, 2010, v. 6, n. 2, p. 104, doi. 10.1038/nphys1499
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- Article
Highly Miniaturized On-Chip 180° Hybrid Employing Periodic Ground Strip Structure for Application to Silicon RFIC.
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- ETRI Journal, 2011, v. 33, n. 1, p. 13, doi. 10.4218/etrij.11.0110.0146
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- Publication type:
- Article
MICROSTRUCTURAL PROPERTIES OF NC-Si/SiO<sub>2</sub> FILMS IN SITU GROWN BY REACTIVE MAGNETRON CO-SPUTTERING.
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- International Journal of Nanoscience, 2012, v. 11, n. 6, p. 1240035-1, doi. 10.1142/S0219581X12400352
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- Article
PREPARATION OF HEAT INSULATING FILM WITH MPS (MERCAPTOPROPYL TRIMETHOXYSILANE) COATED-SiO<sub>2</sub> NANOPARTICLES.
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- International Journal of Nanoscience, 2006, v. 5, n. 2/3, p. 323, doi. 10.1142/S0219581X06004425
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- Article
FABRICATION OF NEARFIELD OPTICAL PROBE ARRAY USING VARIOUS NANOFABRICATION PROCEDURES.
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- International Journal of Nanoscience, 2003, v. 2, n. 4/5, p. 283, doi. 10.1142/S0219581X03001309
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- Article
Electroluminescence from metal–oxide–semiconductor devices based on erbium silicate nanocrystals and silicon nanocrystals co-embedded in silicon oxide thin films.
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- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 15, p. 20659, doi. 10.1007/s10854-021-06579-x
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- Article
Semiconductor–Metal Phase Transition and "Tristable" Electrical Switching in Nanocrystalline Vanadium Oxide Films on Silicon.
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- Technical Physics Letters, 2019, v. 45, n. 6, p. 584, doi. 10.1134/S1063785019060312
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- Article
Reducing the open porosity of pyroboroncarbon articles.
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- Technical Physics Letters, 2016, v. 42, n. 2, p. 191, doi. 10.1134/S1063785016020309
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- Publication type:
- Article
Breakdown Characteristics of Ga 2 O 3 -on-SiC Metal-Oxide-Semiconductor Field-Effect Transistors.
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- Crystals (2073-4352), 2023, v. 13, n. 6, p. 917, doi. 10.3390/cryst13060917
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- Article
Viscoelastic deformation of borosilicate glass substrates induced by a laser-patterned silicon suboxide film.
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- Applied Physics A: Materials Science & Processing, 2023, v. 129, n. 2, p. 1, doi. 10.1007/s00339-022-06357-4
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- Article
Impedance spectroscopy and transport mechanism of molybdenum oxide thin films for silicon heterojunction solar cell application.
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- Applied Physics A: Materials Science & Processing, 2022, v. 128, n. 2, p. 1, doi. 10.1007/s00339-021-05215-z
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- Article
Molecular dynamics simulation of amorphous SiO<sub>2</sub> thin films.
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- European Physical Journal - Applied Physics, 2015, v. 70, n. 1, p. 10302-p1, doi. 10.1051/epjap/2015140444
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- Article
Electronic properties of undoped microcrystalline silicon oxide films<sup>1</sup>.
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- Canadian Journal of Physics, 2014, v. 92, n. 7/8, p. 753, doi. 10.1139/cjp-2013-0618
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- Article
Optical properties of uniformly sized silicon nanocrystals within a single silicon oxide layer.
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- Journal of Nanoparticle Research, 2013, v. 15, n. 4, p. 1, doi. 10.1007/s11051-013-1538-0
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- Article
High‐Performance On‐Chip Electron Sources Based on Electroformed Silicon Oxide.
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- Advanced Electronic Materials, 2020, v. 6, n. 7, p. 1, doi. 10.1002/aelm.202000268
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- Article
DC-free Method to Evaluate Nanoscale Equivalent Oxide Thickness: Dark-Mode Scanning Capacitance Microscopy.
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- Nanomaterials (2079-4991), 2024, v. 14, n. 11, p. 934, doi. 10.3390/nano14110934
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- Article
Optical Properties in Mid-Infrared Range of Silicon Oxide Thin Films with Different Stoichiometries.
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- Nanomaterials (2079-4991), 2023, v. 13, n. 20, p. 2749, doi. 10.3390/nano13202749
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- Article
Thickness Optimization of Charge Transport Layers on Perovskite Solar Cells for Aerospace Applications.
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- Nanomaterials (2079-4991), 2023, v. 13, n. 12, p. 1848, doi. 10.3390/nano13121848
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- Article
Spectroscopic Properties of Si-nc in SiOx Films Using HFCVD.
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- Nanomaterials (2079-4991), 2020, v. 10, n. 7, p. 1415, doi. 10.3390/nano10071415
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- Article
Antibacterial Silicon Oxide Thin Films Doped with Zinc and Copper Grown by Atmospheric Pressure Plasma Chemical Vapor Deposition.
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- Nanomaterials (2079-4991), 2019, v. 9, n. 2, p. 255, doi. 10.3390/nano9020255
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- Article
Less Energetic Routes for the Production of SiOx Films from Tris(dimethylamino)silane by Plasma Enhanced Atomic Layer Deposition.
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- Coatings (2079-6412), 2023, v. 13, n. 10, p. 1730, doi. 10.3390/coatings13101730
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- Article
A Study on the Characteristics of Inductively Coupled Plasma Nitridation Process.
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- Coatings (2079-6412), 2022, v. 12, n. 10, p. 1372, doi. 10.3390/coatings12101372
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- Article
Optical and Laser-Induced Damage Characterization of Porous Structural Silicon Oxide Film with Hexagonal Period by Nanoimprint Lithography.
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- Coatings (2079-6412), 2022, v. 12, n. 3, p. 351, doi. 10.3390/coatings12030351
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- Publication type:
- Article
Two-Step Deposition of Silicon Oxide Films Using the Gas Phase Generation of Nanoparticles in the Chemical Vapor Deposition Process.
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- Coatings (2079-6412), 2021, v. 11, n. 3, p. 365, doi. 10.3390/coatings11030365
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- Article
Gas Permeation, Mechanical Behavior and Cytocompatibility of Ultrathin Pure and Doped Diamond-Like Carbon and Silicon Oxide Films.
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- Coatings (2079-6412), 2013, v. 3, n. 4, p. 268, doi. 10.3390/coatings3040268
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- Article
Internal stresses and adhesion of thin silicon oxide coatings on poly(ethylene terephthalate).
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- Journal of Adhesion Science & Technology, 2001, v. 15, n. 7, p. 841, doi. 10.1163/15685610152540885
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- Publication type:
- Article
Preparation of Hf-Si-O films by simultaneous deposition and reaction process using pulsed ion-beam evaporation.
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- Electrical Engineering in Japan, 2005, v. 152, n. 1, p. 1, doi. 10.1002/eej.20099
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- Article
Degradation of direct-tunneling gate oxide under hot hole injection.
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- Electrical Engineering in Japan, 2002, v. 140, n. 4, p. 54, doi. 10.1002/eej.2008
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- Publication type:
- Article
Structural and Insulating Behaviour of High-Permittivity Binary Oxide Thin Films for Silicon Carbide and Gallium Nitride Electronic Devices.
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- Materials (1996-1944), 2022, v. 15, n. 3, p. 830, doi. 10.3390/ma15030830
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- Article
Cathodoluminescence Spectroscopic Stress Analysis for Silicon Oxide Film and Its Damage Evaluation.
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- Materials (1996-1944), 2020, v. 13, n. 20, p. 4490, doi. 10.3390/ma13204490
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- Article
Silicon Oxide Barrier Films Deposited on Polycarbonate Substrates in Pulsed Plasmas.
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- Plasma Chemistry & Plasma Processing, 2020, v. 40, n. 2, p. 607, doi. 10.1007/s11090-019-10049-y
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- Article
Fabrication of hierarchical wrinkled morphologies through sequential UVO treatments.
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- Journal of Applied Polymer Science, 2015, v. 132, n. 17, p. n/a, doi. 10.1002/app.41863
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- Article
Amorphous Silicon Nanowires Grown on Silicon Oxide Film by Annealing.
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- Nanoscale Research Letters, 2017, v. 12, n. 1, p. 1, doi. 10.1186/s11671-017-2251-1
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- Publication type:
- Article
Optoelectronic and Structural Properties of Plasma Deposited Nanocrystalline Hydrogenated Silicon Oxide Thin Films.
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- NANO, 2021, v. 16, n. 10, p. 1, doi. 10.1142/S1793292021501150
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- Publication type:
- Article
Chemically ordered face-centred tetragonal Fe-Pt nanoparticles embedded SiO films.
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- Bulletin of Materials Science, 2012, v. 35, n. 7, p. 1079, doi. 10.1007/s12034-012-0406-3
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- Article
Forming Lipid Bilayer Membrane Arrays on Micropatterned Polyelectrolyte Film Surfaces.
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- Chemistry - A European Journal, 2013, v. 19, n. 27, p. 9059, doi. 10.1002/chem.201204419
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- Article