Works matching DE "SILICON oxidation"
1
- Surface Engineering, 2015, v. 31, n. 12, p. 930, doi. 10.1179/1743294414Y.0000000411
- Nouri, S.;
- Rastegari, S.;
- Mirdamadi, Sh.;
- Hadavi, M.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 15782, doi. 10.1007/s10854-017-7472-7
- Li, Suping;
- Huang, Ying;
- Ding, Xiao;
- Zhang, Na;
- Zong, Meng;
- Wang, Mingyue;
- Liu, Jun
- Article
3
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 6, p. 5058, doi. 10.1007/s10854-016-6163-0
- Sharma, Govind;
- Dutta, Shankar;
- Singh, Sushil;
- Chatterjee, Ratnamala
- Article
4
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4385, doi. 10.1007/s10854-016-4308-9
- Christopoulos, S.-R.;
- Parfitt, D.;
- Sgourou, E.;
- Londos, C.;
- Vovk, R.;
- Chroneos, A.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 3291, doi. 10.1007/s10854-015-2830-9
- Zhang, Qixiang;
- Liu, Jindong;
- Cui, Yunxian;
- Ding, Wanyu
- Article
6
- Physica Status Solidi (B), 2015, v. 252, n. 1, p. 87, doi. 10.1002/pssb.201350398
- Goletti, Claudio;
- Fazi, Laura;
- Hogan, Conor;
- Persichetti, Luca;
- Sgarlata, Anna;
- Palummo, Maurizia;
- Balzarotti, Adalberto
- Article
7
- Physica Status Solidi (B), 2014, v. 251, n. 11, p. 2169, doi. 10.1002/pssb.201400068
- Takahashi, Norihiko;
- Yamasaki, Takahiro;
- Kaneta, Chioko
- Article
8
- Advanced Engineering Materials, 2014, v. 16, n. 2, p. 176, doi. 10.1002/adem.201300261
- D'Amico, Giuseppe Claudio;
- Ortona, Alberto;
- Biamino, Sara;
- Fino, Paolo;
- Badini, Claudio;
- D'Angelo, Claudio
- Article
9
- Journal of Thermal Analysis & Calorimetry, 2016, v. 124, n. 2, p. 593, doi. 10.1007/s10973-015-5157-0
- Cao, Jianwei;
- Lu, Jinshan;
- Jiang, Longxiang;
- Wang, Zhi
- Article
10
- Heteroatom Chemistry, 2018, v. 29, n. 5/6, p. N.PAG, doi. 10.1002/hc.21481
- Ishida, Shintaro;
- Takiguchi, Minori;
- Iwamoto, Takeaki
- Article
11
- Heteroatom Chemistry, 2018, v. 29, n. 5/6, p. N.PAG, doi. 10.1002/hc.21480
- Nishiyama, Yutaka;
- Sumida, Mari;
- Sonoda, Noboru
- Article
12
- Heteroatom Chemistry, 2018, v. 29, n. 5/6, p. N.PAG, doi. 10.1002/hc.21478
- Kanno, Ken‐ichiro;
- Hirose, Satoshi;
- Kyushin, Soichiro
- Article
13
- Electronic Journal of Differential Equations, 2012, v. 2012, p. 1
- ZHENBANG LI;
- CHANGCHUN LIU
- Article
14
- Journal of Microelectronic & Electronic Packaging, 2012, v. 9, n. 1, p. 31, doi. 10.4071/imaps.308
- Chien-Ying Wu;
- Shang-Chun Chen;
- Pei-Jer Tzeng;
- Lau, John H.;
- Yi-Feng Hsu;
- Jui-Chin Chen;
- Yu-Chen Hsin;
- Chien-Chou Chen;
- Shang-Hung Shen;
- Cha-Hsin Lin;
- Tzu-Kun Ku;
- Ming-Jer Kao
- Article
15
- Bulletin of Materials Science, 2018, v. 41, n. 6, p. 1, doi. 10.1007/s12034-018-1652-9
- Razavi, Razieh;
- Abrishamifar, Seyyed Milad;
- Kahkha, Mohammad Reza Rezaei;
- Vojood, Arash;
- Najafi, Meysam
- Article
16
- Micro & Nano Letters (Wiley-Blackwell), 2018, v. 13, n. 5, p. 666, doi. 10.1049/mnl.2017.0519
- Hongguang Zhang;
- Guowei Wang;
- Ge Sun;
- Feng Xu;
- Hongmei Li;
- Shuang Li;
- Shuang Fu
- Article
17
- Materials at High Temperatures, 2018, v. 35, n. 6, p. 552, doi. 10.1080/09603409.2018.1439682
- He, Bei;
- Xu, Guang;
- Yuan, Qing;
- Zhou, Mingxing;
- Liang, Weicheng
- Article
18
- Colloid Journal, 2015, v. 77, n. 5, p. 635, doi. 10.1134/S1061933X1505018X
- Troyan, V.;
- Loginov, V.;
- Borisyuk, P.;
- Vasil'ev, O.
- Article
19
- Archives of Metallurgy & Materials, 2018, v. 63, n. 1, p. 445, doi. 10.24425/118959
- YUAN, Q.;
- XU, G.;
- ZHOU, M.;
- HE, B.;
- HU, H.
- Article
20
- Plasma Chemistry & Plasma Processing, 2017, v. 37, n. 3, p. 857, doi. 10.1007/s11090-017-9803-0
- Tial, Mai;
- Tanaka, Yasunori;
- Maruyama, Yuji;
- Tsuchiya, Takumi;
- Uesugi, Yoshihiko;
- Ishijima, Tatsuo
- Article
21
- Journal of Materials Science, 2012, v. 47, n. 24, p. 8247, doi. 10.1007/s10853-012-6663-0
- Drevet, Béatrice;
- Eustathopoulos, Nicolas
- Article
22
- Metals (2075-4701), 2016, v. 6, n. 6, p. 137, doi. 10.3390/met6060137
- Bei He;
- Guang Xu;
- Mingxing Zhou;
- Qing Yuan
- Article
23
- Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 4, p. 1, doi. 10.1007/s00339-017-0897-2
- Article
24
- Applied Physics A: Materials Science & Processing, 2013, v. 112, n. 3, p. 561, doi. 10.1007/s00339-013-7783-3
- Kalem, Seref;
- Werner, Peter;
- Talalaev, Vadim
- Article
25
- IMA Journal of Applied Mathematics, 1997, v. 58, n. 2, p. 121, doi. 10.1093/imamat/58.2.121
- EVANS, J. D.;
- TAYLER, A. B.;
- KING, J. R.
- Article
26
- International Journal of Molecular Sciences, 2017, v. 18, n. 7, p. 1567, doi. 10.3390/ijms18071567
- Pinna, Elisa;
- Melis, Claudio;
- Antidormi, Aleandro;
- Cardia, Roberto;
- Sechi, Elisa;
- Cappellini, Giancarlo;
- d'Ischia, Marco;
- Colombo, Luciano;
- Mula, Guido
- Article
27
- Journal of Materials Science, 2017, v. 52, n. 17, p. 10387, doi. 10.1007/s10853-017-1196-1
- Martin, Thomas;
- Jones, K.;
- Camillo-Castillo, Renata;
- Hatem, Christopher;
- Xin, Yan;
- Elliman, Robert
- Article
28
- Chemistry - A European Journal, 2015, v. 21, n. 35, p. 12509, doi. 10.1002/chem.201502199
- Arz, Marius I.;
- Straßmann, Martin;
- Meyer, Andreas;
- Schnakenburg, Gregor;
- Schiemann, Olav;
- Filippou, Alexander C.
- Article
29
- Materials Research Innovations, 2014, v. 18, n. S2, p. 424, doi. 10.1179/1432891714Z.000000000451
- Wang, J.;
- Li, P.;
- Lv, X.;
- Lv, C.;
- Jia, Z.
- Article
30
- JETP Letters, 2012, v. 96, n. 2, p. 102, doi. 10.1134/S002136401214007X
- Koplak, O.;
- Morgunov, R.;
- Buchachenko, A.
- Article
31
- Surface Review & Letters, 2018, v. 25, n. 2, p. -1, doi. 10.1142/S0218625X18500555
- AMIT, KUMAR;
- SHARMA, RISHI
- Article
32
- Surface Review & Letters, 2011, v. 18, n. 6, p. 315, doi. 10.1142/S0218625X11014692
- YANG, CHUN;
- YANG, CHONG;
- HUANG, PING;
- LIANG, XIAO QIN
- Article
33
- Semiconductors, 2017, v. 51, n. 1, p. 104, doi. 10.1134/S106378261701016X
- Nikitin, S.;
- Verbitskiy, V.;
- Nashchekin, A.;
- Trapeznikova, I.;
- Bobyl, A.;
- Terukova, E.
- Article
34
- Applied Organometallic Chemistry, 2016, v. 30, n. 7, p. 510, doi. 10.1002/aoc.3462
- Arias ‐ Ugarte, Renzo N;
- Sharma, Hemant K;
- Pannell, Keith H
- Article
35
- Physica Status Solidi (B), 2019, v. 256, n. 2, p. N.PAG, doi. 10.1002/pssb.201800432
- Solonenko, Dmytro;
- Selyshchev, Oleksandr;
- Zahn, Dietrich R. T.;
- Vogt, Patrick
- Article
36
- International Journal of Electrochemistry, 2015, v. 2015, p. 1, doi. 10.1155/2015/439015
- Ramesh, Srivatsan;
- Ratnam, K. Venkata;
- Krishnamurthy, Balaji
- Article