Works matching DE "SILICON nitride"
1
- Laser & Photonics Reviews, 2025, v. 19, n. 14, p. 1, doi. 10.1002/lpor.202401746
- Moille, Grégory;
- Westly, Daron;
- Shrestha, Rahul;
- Hoang, Khoi Tuan;
- Srinivasan, Kartik
- Article
2
- Applied Physics A: Materials Science & Processing, 2025, v. 131, n. 7, p. 1, doi. 10.1007/s00339-025-08649-x
- Imokawa, Kaname;
- Tanaka, Yohei;
- Katayama, Keita;
- Yabuta, Hisato;
- Miura, Taisuke;
- Kakizaki, Kouji
- Article
3
- Refractories / Naihuo Cailiao, 2025, v. 59, n. 3, p. 224, doi. 10.3969/j.issn.1001-1935.2025.03.008
- 姜悦纳;
- 叶欣健;
- 陶天一;
- 杨梦瑶;
- 林凡凯;
- 郑晓洪;
- 孙振华;
- 吴小文;
- 黄朝晖
- Article
4
- Microsystems & Nanoengineering, 2025, v. 11, n. 1, p. 1, doi. 10.1038/s41378-025-00979-3
- Zhao, Lihuan;
- Wang, Jiajun;
- Wu, Lin-Sheng;
- Zhao, Xin
- Article
5
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-11404-0
- Liu, Fangxu;
- Lv, Huanlin;
- Zhang, Hongyu;
- Liu, Shuo;
- Liang, Yanfeng;
- Wang, Haoyu;
- Cong, Yang;
- Li, Xuanchen;
- Guo, Qingxiao
- Article
6
- Nanomaterials (2079-4991), 2025, v. 15, n. 13, p. 958, doi. 10.3390/nano15130958
- Chen, Wen-Jie;
- Liu, Yang-Chao;
- Wang, Zhen-Yu;
- Gu, Lin;
- Shen, Yi;
- Ma, Hong-Ping
- Article
7
- Advanced Materials in Engineering, 2025, v. 44, n. 2, p. 79, doi. 10.47176/jame.44.2.1102
- مهدی دارابی;
- احسان محمد شریفی;
- رضا وفایی;
- اکبر اسحاقی;
- محمد رضا لقمان اس
- Article
8
- Inorganic Materials, 2024, v. 60, n. 15, p. 1593, doi. 10.1134/S0020168525700323
- Zakorzhevskii, V. V.;
- Shibakov, I. A.;
- Kovalev, I. D.;
- Mukhina, N. I.
- Article
9
- Sensors (14248220), 2025, v. 25, n. 12, p. 3663, doi. 10.3390/s25123663
- Melchiorre, Luigi;
- Thottoli, Ajmal;
- Vorobev, Artem S.;
- Menduni, Giansergio;
- Sampaolo, Angelo;
- Magno, Giovanni;
- O'Faolain, Liam;
- Spagnolo, Vincenzo
- Article
10
- Materials (1996-1944), 2025, v. 18, n. 12, p. 2813, doi. 10.3390/ma18122813
- Žmak, Irena;
- Jozić, Sonja;
- Ćurković, Lidija;
- Filetin, Tomislav
- Article
11
- Journal of Microwave Power & Electromagnetic Energy, 2003, v. 38, n. 4, p. 243, doi. 10.1080/08327823.2003.11688503
- Hu Peng;
- Tinga, W. R.;
- Sundararaj, U.;
- Eadie, R. L.
- Article
12
- Journal of Research of the National Institute of Standards & Technology, 2019, v. 124, p. 1, doi. 10.6028/jres.124.021
- Feng Yi;
- Grapes, Michael D.;
- LaVan, David A.
- Article
13
- Journal of Research of the National Institute of Standards & Technology, 2011, v. 116, n. 4, p. 703, doi. 10.6028/jres.116.015
- Gates, Richard S.;
- Reitsma, Mark G.;
- Kramar, John A.;
- Pratt, Jon R.
- Article
14
- International Journal of Nanoscience, 2010, v. 9, n. 4, p. 321, doi. 10.1142/S0219581X10006892
- KAMYAB, LOBNA;
- RUSLI;
- YU, MINGBIN;
- HE, LINING;
- DUA, MANIK
- Article
15
- International Journal of Nanoscience, 2006, v. 5, n. 4/5, p. 413, doi. 10.1142/S0219581X06004565
- JU, BING-FENG;
- JU, YANG;
- SAKA, MASUMI
- Article
16
- International Journal of Nanoscience, 2005, v. 4, n. 4, p. 431, doi. 10.1142/S0219581X05003267
- TSAI, J. T. H.;
- CHEN, K. H.
- Article
17
- Particle & Particle Systems Characterization, 2021, v. 38, n. 4, p. 1, doi. 10.1002/ppsc.202100007
- Kilian, Stefan O.;
- Wiggers, Hartmut
- Article
18
- Annalen der Physik, 2022, v. 534, n. 11, p. 1, doi. 10.1002/andp.202200161
- Jia, Hao;
- Chen, Haoxiang;
- Wang, Tao;
- Yang, Jianhong
- Article
19
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 10, p. 1026, doi. 10.1007/s10854-008-9815-x
- Article
20
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 76, doi. 10.1007/s10854-007-9448-5
- Danieluk, Dominik;
- Bradley, Ann L.;
- Mitra, Anirban;
- O'Reilly, Lisa;
- Lucas, Olibanji F.;
- Cowley, Aidan;
- McNally, Patrick J.;
- Foy, Barry;
- McGlynn, Enda
- Article
21
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 285, doi. 10.1007/s10854-007-9513-0
- Claudio, Gianfranco;
- Calnan, Sonya;
- Bass, Kevin;
- Boreland, Matt
- Article
22
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 902, doi. 10.1007/s10854-008-9679-0
- Tyagi, Hitender Kumar;
- George, P. J.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 5, p. 471, doi. 10.1007/s10854-007-9365-7
- Article
24
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 323, doi. 10.1007/s10854-007-9321-6
- Hasanuzzaman, Mohammad;
- Haddara, Yaser M.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 29, doi. 10.1007/s10854-007-9181-0
- Kobayashi, S.;
- Ohrui, N.;
- Chao, Y. C.;
- Aoki, T.;
- Kobayashi, H.;
- Asakawa, T.
- Article
26
- Journal of Materials Science Letters, 2003, v. 22, n. 12, p. 895, doi. 10.1023/A:1024479107007
- Feng Ye;
- Sheng Chen;
- Iwasa, M.
- Article
27
- Journal of Materials Science Letters, 2003, v. 22, n. 5, p. 331, doi. 10.1023/A:1022678606160
- She, J. H.;
- Yang, J. F.;
- Ohji, T.
- Article
28
- Journal of Materials Science Letters, 2003, v. 22, n. 2, p. 91, doi. 10.1023/A:1021894232197
- Matovic, B.;
- Rixecker, G.;
- Aldinger, F.
- Article
29
- Journal of Materials Science Letters, 2003, v. 22, n. 2, p. 163, doi. 10.1023/A:1021847811241
- Dianying Chen;
- Baolin Zhang;
- Jianguang Xu;
- Hanrui Zhuang
- Article
30
- Cellulose, 2020, v. 27, n. 11, p. 6691, doi. 10.1007/s10570-020-03235-1
- Zeng, Fanxin;
- Qin, Zongyi;
- Li, Tao;
- Chen, Yuanyu;
- Yang, Lifeng
- Article
31
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.898
- Papadimitriou, Vasileios A;
- Pechnikova, Evgeniya;
- Jakobi, Arjen;
- Pen, Merijn;
- Perez-Garza, Hector Hugo
- Article
32
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.895
- Balakrishnan, Deepan;
- Yeo, Joel;
- Dong, Zhaogang;
- Paniagua-Dominguez, Ramon;
- Bosman, Michel;
- Mirsaidov, Utkur;
- Loh, Duane
- Article
33
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.888
- Bhalla-Levine, Aviram;
- Park, Kunwoo;
- Park, Jungwon;
- Ercius, Peter;
- Miao, Jianwei
- Article
34
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.853
- Ahn, Martin Changman;
- Asa-Awuku, Akua;
- Woehl, Taylor
- Article
35
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.802
- Kim, Joodeok;
- Kang, Sungsu;
- Park, Jungwon
- Article
36
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.796
- Liu, Yukun;
- Koo, Kunmo;
- Hu, Xiaobing;
- Dravid, Vinayak
- Article
37
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.763
- Haverstick, James;
- McMorran, Benjamin J
- Article
38
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.270
- León, X;
- Chávez, K;
- Borjas-García, S E;
- Márquez-Beltrán, César;
- Quiroga-González, E
- Article
39
- 2023
- Parkin, Calvin;
- Kotula, Paul;
- Podlevsky, Jennie;
- Chacon, Carlos;
- Chiu, Edwin;
- Grutzik, Scott;
- Rezwan, Aashique;
- Janicki, Tesia;
- Lane, J Matthew D;
- Lim, Hojun;
- Bishop, Chris;
- Hattar, Khalid
- Abstract
40
- 2019
- Hodoroaba, Vasile-Dan;
- Terborg, Ralf;
- Procop, Mathias
- Abstract
41
- Microscopy & Microanalysis, 2019, p. 348, doi. 10.1017/S1431927618002234
- Gupta, Tanya;
- Kolmakov, Andrei
- Article
42
- Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 93, doi. 10.1017/S143192761201392X
- Ramachandra, Ranjan;
- Demers, Hendrix;
- de Jonge, Niels
- Article
43
- Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 656, doi. 10.1017/S1431927612001249
- Allard, Lawrence F.;
- Overbury, Steven H.;
- Bigelow, Wilbur C.;
- Katz, Michael B.;
- Nackashi, David P.;
- Damiano, John
- Article
44
- Microscopy & Microanalysis, 2012, v. 18, n. 1, p. 218, doi. 10.1017/S1431927611012347
- Ramachandra, Ranjan;
- de Jonge, Niels
- Article
45
- Food & Bioproducts Processing: Transactions of the Institution of Chemical Engineers Part C, 2014, v. 92, n. 2, p. 178, doi. 10.1016/j.fbp.2013.12.012
- Hassan, Ines Ben;
- Lafforgue, Christine;
- Ayadi, Abdelmonem;
- Schmitz, Philippe
- Article
46
- Adsorption Science & Technology, 2023, v. 2023, p. 1, doi. 10.1155/2023/8468644
- Anjalin, F. Mary;
- Krishnan, A. Mohana;
- Arunkumar, G.;
- Raju, K.;
- Vivekanandan, M.;
- Somasundaram, S.;
- Thirugnanasambandham, T.;
- Ramaraj, Elangomathavan
- Article
47
- Kinetics & Catalysis, 2024, v. 65, n. 2, p. 101, doi. 10.1134/S0023158423601195
- Skvortsova, L. N.;
- Artyukh, I. A.;
- Tatarinova, T. V.;
- Bolgaru, K. A.
- Article
48
- Gels (2310-2861), 2025, v. 11, n. 5, p. 324, doi. 10.3390/gels11050324
- Tong, Zongwei;
- Yan, Xiangjie;
- Liu, Yun;
- Zhao, Yali;
- Li, Kexun
- Article
49
- Journal of Shanghai University / Shanghai Daxue Xuebao, 2025, v. 31, n. 1, p. 122, doi. 10.12066/j.issn.1007-2861.2542
- Article
50
- NPJ Quantum Information, 2023, v. 9, n. 1, p. 1, doi. 10.1038/s41534-023-00751-3
- Dolphin, Joseph A.;
- Paraïso, Taofiq K.;
- Du, Han;
- Woodward, Robert I.;
- Marangon, Davide G.;
- Shields, Andrew J.
- Article