Works matching DE "SILICON carbide thin films"
1
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 2844, doi. 10.1007/s10854-015-2767-z
- Jha, Himanshu;
- Agarwal, Pratima
- Article
2
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 309, doi. 10.1007/s10854-007-9222-8
- Stradins, P.;
- Teplin, C. W.;
- Young, D. L.;
- Yan, Y.;
- Branz, H. M.;
- Wang, Q.
- Article
3
- Journal of Superconductivity & Novel Magnetism, 2012, v. 25, n. 2, p. 311, doi. 10.1007/s10948-011-1305-3
- Romano, G.;
- Vajpayee, A.;
- Vignolo, M.;
- Awana, V.;
- Ferdeghini, C.
- Article
4
- Nature Communications, 2022, v. 13, n. 1, p. 1, doi. 10.1038/s41467-022-29448-5
- Powell, Keith;
- Li, Liwei;
- Shams-Ansari, Amirhassan;
- Wang, Jianfu;
- Meng, Debin;
- Sinclair, Neil;
- Deng, Jiangdong;
- Lončar, Marko;
- Yi, Xiaoke
- Article
5
- Plasma Chemistry & Plasma Processing, 2017, v. 37, n. 2, p. 489, doi. 10.1007/s11090-016-9781-7
- Lee, Jongchan;
- Efremov, Alexander;
- Kim, Kwangsoo;
- Kwon, Kwang-Ho
- Article
6
- Semiconductors, 2017, v. 51, n. 3, p. 402, doi. 10.1134/S106378261703023X
- Pavlikov, A.;
- Latukhina, N.;
- Chepurnov, V.;
- Timoshenko, V.
- Article
7
- Semiconductors, 2015, v. 49, n. 9, p. 1226, doi. 10.1134/S1063782615090262
- Zuev, V.;
- Romanov, R.;
- Fominski, V.;
- Demin, M.;
- Grigoriev, V.;
- Nevolin, V.
- Article
8
- Semiconductors, 2011, v. 45, n. 2, p. 141, doi. 10.1134/S1063782611020096
- Ivanov, A.;
- Kozlovski, V.;
- Strokan, N.;
- Lebedev, A.
- Article
9
- Semiconductors, 2002, v. 36, n. 3, p. 354, doi. 10.1134/1.1461416
- Strokan, N. B.;
- Ivanov, A. M.;
- Savkina, N. S.;
- Davydov, D. V.;
- Bogdanova, E. V.;
- Lebedev, A. A.
- Article
10
- Semiconductors, 1999, v. 33, n. 11, p. 1206, doi. 10.1134/1.1187850
- Vasilevskiı, K. V.;
- Rendakova, S. V.;
- Nikitina, I. P.;
- Babanin, A. I.;
- Andreev, A. N.;
- Zekentes, K.
- Article
11
- Journal of Electronic Materials, 2015, v. 44, n. 3, p. 922, doi. 10.1007/s11664-014-3580-9
- Jha, Himanshu;
- Yadav, Asha;
- Singh, Mukesh;
- Kumar, Shailendra;
- Agarwal, Pratima
- Article
12
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1616, doi. 10.1007/s11664-010-1263-8
- Tai-Ming Chang;
- Chien-Chou Weng;
- Mei-Jiau Huang
- Article
13
- ARO: The Scientific Journal of Koya University, 2021, v. 9, n. 2, p. 46, doi. 10.14500/aro.10852
- Ahmed, Muhanad A.;
- Sabri, Mohammed M.;
- Abed, Wathiq R.
- Article
14
- Technical Physics, 2008, v. 53, n. 5, p. 641, doi. 10.1134/S1063784208050186
- Gorshunov, B. P.;
- Shupegin, M. L.;
- Ivanov, V. Yu.;
- Prokhorov, A. S.;
- Spektor, I. E.;
- Volkov, A. A.
- Article
15
- Physica Status Solidi. A: Applications & Materials Science, 2024, v. 221, n. 23, p. 1, doi. 10.1002/pssa.202400018
- Lee, Hyung‐Jin;
- Lee, Geon‐Hee;
- Lee, Hyun‐Woo;
- Lee, Tae‐Hee;
- Kim, Il Ryong;
- Kim, Min Kyu;
- Lim, Byeong Cheol;
- Koo, Sang‐Mo
- Article
16
- Applied Physics A: Materials Science & Processing, 2022, v. 128, n. 12, p. 1, doi. 10.1007/s00339-022-06166-9
- Choutapalli, Sree Harsha;
- Prashantha Kumar, H. G.;
- Paneerselvam, Emmanuel;
- Vasa, Nilesh J.;
- Jayaganthan, R.
- Article
17
- Applied Physics A: Materials Science & Processing, 2022, v. 128, n. 5, p. 1, doi. 10.1007/s00339-022-05499-9
- Oujja, Mohamed;
- Tabakkouht, Karima;
- Sanz, Mikel;
- Rebollar, Esther;
- Sánchez-Arenillas, María;
- Marco, José F.;
- Castillejo, Marta;
- de Nalda, Rebeca
- Article
18
- Applied Physics A: Materials Science & Processing, 2010, v. 100, n. 4, p. 1163, doi. 10.1007/s00339-010-5729-6
- Coscia, U.;
- Ambrosone, G.;
- Basa, D. K.;
- Tresso, E.;
- Chiodoni, A.;
- Pinto, N.;
- Murri, R.
- Article
19
- Nature Communications, 2022, v. 13, n. 1, p. 1, doi. 10.1038/s41467-022-29448-5
- Powell, Keith;
- Li, Liwei;
- Shams-Ansari, Amirhassan;
- Wang, Jianfu;
- Meng, Debin;
- Sinclair, Neil;
- Deng, Jiangdong;
- Lončar, Marko;
- Yi, Xiaoke
- Article
20
- Nanomaterials (2079-4991), 2022, v. 12, n. 19, p. 3319, doi. 10.3390/nano12193319
- Lo Nigro, Raffaella;
- Fiorenza, Patrick;
- Pécz, Béla;
- Eriksson, Jens
- Article
21
- Crystals (2073-4352), 2023, v. 13, n. 6, p. 917, doi. 10.3390/cryst13060917
- Zhang, Maolin;
- Wang, Lei;
- Yang, Kemeng;
- Yao, Jiafei;
- Tang, Weihua;
- Guo, Yufeng
- Article
22
- Journal of Adhesion Science & Technology, 2002, v. 16, n. 1, p. 81, doi. 10.1163/15685610252771176
- Andrieux, M.;
- Ignat, M.;
- Ducarroir, M.;
- Feltz, B.;
- Farges, G.
- Article
23
- Digest Journal of Nanomaterials & Biostructures (DJNB), 2013, v. 8, n. 2, p. 573
- Article
25
- Bulletin of Materials Science, 2015, v. 38, n. 4, p. 1105, doi. 10.1007/s12034-015-0881-4
- PERI, BHAVANA;
- BORAH, BIKASH;
- DASH, RAJ
- Article
26
- Technical Physics Letters, 2017, v. 43, n. 7, p. 631, doi. 10.1134/S1063785017070094
- Article
27
- Journal of the American Ceramic Society, 2008, v. 91, n. 5, p. 1412, doi. 10.1111/j.1551-2916.2007.02217.x
- Guron, Marta M.;
- Myung Jong Kim;
- Sneddon, Larry G.
- Article
28
- 2021
- ELGAZZAR, HAYTHAM;
- ELBASHAR, Y. H.
- Literature Review
29
- Progress in Photovoltaics, 2020, v. 28, n. 2, p. 167, doi. 10.1002/pip.3238
- Article
30
- Materials (1996-1944), 2021, v. 14, n. 1, p. 78, doi. 10.3390/ma14010078
- Kukushkin, Sergey A.;
- Osipov, Andrey V.
- Article
32
- Materials (1996-1944), 2020, v. 13, n. 19, p. 4335, doi. 10.3390/ma13194335
- Kim, Dong-Hyeon;
- Min, Seong-Ji;
- Oh, Jong-Min;
- Koo, Sang-Mo
- Article
33
- Materials (1996-1944), 2020, v. 13, n. 11, p. 2643, doi. 10.3390/ma13112643
- Vivaldo, Israel;
- Ambrosio, Roberto C.;
- López, Roberto;
- Flores-Méndez, Javier;
- Sánchez-Gaspariano, Luis A.;
- Moreno, Mario;
- Candia, Filiberto
- Article
34
- Materials (1996-1944), 2018, v. 11, n. 7, p. 1120, doi. 10.3390/ma11071120
- Galvão, Nierlly;
- Vasconcelos, Getúlio;
- Pessoa, Rodrigo;
- Machado, João;
- Guerino, Marciel;
- Fraga, Mariana;
- Rodrigues, Bruno;
- Camus, Julien;
- Djouadi, Abdou;
- Maciel, Homero
- Article
35
- Advanced Engineering Materials, 2024, v. 26, n. 18, p. 1, doi. 10.1002/adem.202302161
- Jamshaid, Sumbal;
- Cicconi, Maria Rita;
- Heiss, Wolfgang;
- Webber, Kyle G.;
- Wellmann, Peter J.
- Article
36
- Journal of Applied Mechanics & Technical Physics, 2007, v. 48, n. 1, p. 1, doi. 10.1007/s10808-007-0001-3
- Konstantinov, V.;
- Khmel, S.
- Article
37
- Ferroelectrics, 2008, v. 362, n. 1, p. 95, doi. 10.1080/00150190802006319
- Guiller, A.;
- Moussavou, A.-G.;
- Guilloux-Viry, M.;
- Perrin, A.;
- Fompeyrine, J.;
- Sauleau, R.;
- Mahdjoubi, K.
- Article
38
- International Reviews in Physical Chemistry, 2001, v. 20, n. 3, p. 387, doi. 10.1080/01442350110054910
- Edler, Karen J.;
- Roser, Steve J.
- Article
39
- Materials (1996-1944), 2023, v. 16, n. 8, p. 3115, doi. 10.3390/ma16083115
- Galashev, Alexander;
- Abramova, Ksenia
- Article
40
- Materials (1996-1944), 2022, v. 15, n. 3, p. 830, doi. 10.3390/ma15030830
- Lo Nigro, Raffaella;
- Fiorenza, Patrick;
- Greco, Giuseppe;
- Schilirò, Emanuela;
- Roccaforte, Fabrizio
- Article
41
- Insight: Non-Destructive Testing & Condition Monitoring, 2006, v. 48, n. 12, p. 743, doi. 10.1784/insi.2006.48.12.743
- Article
42
- AIMS Biophysics, 2024, v. 11, n. 1, p. 1, doi. 10.3934/biophy.2024004
- Article
43
- Molecular Crystals & Liquid Crystals, 2007, v. 470, n. 1, p. 129, doi. 10.1080/15421400701493596
- Il Yong Jung;
- Sang Mock Lee;
- Jung Hyun Lee;
- Sang Ho Sohn
- Article
44
- Biophysical Reviews & Letters, 2006, v. 1, n. 3, p. 301, doi. 10.1142/S1793048006000239
- Wong, Elicia L. S.;
- Chilcott, Terry C.;
- James, Michael;
- Coster, Hans G. L.
- Article
45
- Journal of Materials Science, 2018, v. 53, n. 9, p. 6681, doi. 10.1007/s10853-018-1986-0
- Keita, A. -S.;
- Wang, Z.;
- Sigle, W.;
- Mittemeijer, E. J.
- Article
46
- Journal of Materials Science, 2017, v. 52, n. 16, p. 9787, doi. 10.1007/s10853-017-1164-9
- Negri, Marco;
- Bosi, Matteo;
- Orsi, Davide;
- Rimoldi, Tiziano;
- Attolini, Giovanni;
- Buffagni, Elisa;
- Ferrari, Claudio;
- Cristofolini, Luigi;
- Salviati, Giancarlo
- Article
47
- Journal of Materials Science, 2014, v. 49, n. 11, p. 4108, doi. 10.1007/s10853-014-8104-8
- Orgiani, Pasquale;
- Ciancio, Regina;
- Wolak, Matthäus;
- Xi, Xiao
- Article
48
- Journal of Nano- & Electronic Physics, 2020, v. 12, n. 5, p. 05016-1, doi. 10.21272/jnep.12(5).05016
- Semenov, A. V.;
- Lubov, D. V.;
- Makhonin, M. V.
- Article
49
- Electrical Engineering in Japan, 1989, v. 109, n. 2, p. 102, doi. 10.1002/eej.4391090212
- Fukuda, Nobuhiro;
- Miyachi, Kenji;
- Tanaka, Hirofumi;
- Ashida, Yoshinori;
- Ohashi, Yutaka
- Article
50
- Plasmonics, 2015, v. 10, n. 5, p. 1211, doi. 10.1007/s11468-015-9915-4
- Kamakshi, Koppole;
- Sekhar, K.;
- Almeida, A.;
- Moreira, J.;
- Gomes, M.
- Article