New FIB System Improves Processing Speed and Accuracy.
- Published in:
- 2012
- Publication type:
- Product Review
Works matching DE "SII NanoTechnology Inc."
Results: 2
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SEM is combined with focused ion beam for imaging/analysis.
- Published in:
- Advanced Materials & Processes, 2006, v. 164, n. 10, p. 9
- Publication type:
- Article