Works matching DE "SEMICONDUCTORS testing"
Results: 61
Exhaust gas monitoring: New window into semiconductor processing.
- Published in:
- Solid State Technology, 1999, v. 42, n. 5, p. 61
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- Publication type:
- Article
Wafer-level burn-in will cut time and cost.
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- Solid State Technology, 1998, v. 41, n. 11, p. 20
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- Publication type:
- Article
Properties of trivalent-ion doped tungsten bronzes.
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- Journal of Materials Science, 2013, v. 48, n. 7, p. 3003, doi. 10.1007/s10853-012-7079-6
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- Publication type:
- Article
Gas-mediated liquid metal printing toward large-scale 2D semiconductors and ultraviolet photodetector.
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- NPJ 2D Materials & Applications, 2021, v. 5, n. 1, p. 1, doi. 10.1038/s41699-021-00219-y
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- Publication type:
- Article
3D Local Manipulation of the Metal–Insulator Transition Behavior in VO<sub>2</sub> Thin Film by Defect‐Induced Lattice Engineering.
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- Advanced Materials Interfaces, 2018, v. 5, n. 8, p. 1, doi. 10.1002/admi.201701268
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- Publication type:
- Article
THE TRANSFORMATION OF FAILURE ANALYSIS—LESSONS FROM 10 YEARS IN THE SERVICE.
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- Electronic Device Failure Analysis, 2015, v. 17, n. 3, p. 2
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- Publication type:
- Article
Training Calendar.
- Published in:
- 2014
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- Publication type:
- Calendar
ACCOUNTING FOR DYNAMIC BEHAVIOR IN FET DEVICE MODELS.
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- Microwave Journal, 2011, v. 54, n. 7, p. 80
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- Publication type:
- Article
Infrared and EPR studies of the red potassium molybdenum bronze K0.33MoO3.
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- Journal of Materials Science, 2001, v. 36, n. 22, p. 5511, doi. 10.1023/A:1012466622001
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- Publication type:
- Article
Study of optimization of Al/a-SiC:H Schottky diodes by means of annealing process of a-SiC:H thin films sputtered at three different hydrogen flow rates.
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- Journal of Engineering Science & Technology Review, 2008, v. 1, n. 1, p. 4
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- Publication type:
- Article
Technology: Getting Moore from DNA sequencing.
- Published in:
- 2011
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- Publication type:
- journal article
Charge Transport Mechanism in Thin Cuticles Holding Nandi Flame Seeds.
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- International Journal of Biomaterials, 2009, v. 2009, p. 1, doi. 10.1155/2009/548406
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- Publication type:
- Article
The Importance of integrated alarms in automotive device test.
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- EE: Evaluation Engineering, 2018, v. 57, n. 12, p. 26
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- Publication type:
- Article
Cost of test still biggest hurdle as newer factors add to challenges.
- Published in:
- 2018
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- Publication type:
- Product Review
Instrumentation platforms facilitate testing.
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- 2018
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- Publication type:
- Product Review
ITC focuses on automotive, data analytics.
- Published in:
- 2018
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- Publication type:
- Proceeding
INDUSTRY UPDATE.
- Published in:
- EE: Evaluation Engineering, 2016, v. 55, n. 10, p. 6
- Publication type:
- Article
Presto, Peraso develop 60-GHz transceiver test.
- Published in:
- EE: Evaluation Engineering, 2016, v. 55, n. 6, p. 6
- Publication type:
- Article
Internet of Things dominates SEMICON West.
- Published in:
- 2015
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- Publication type:
- Proceeding
Semiconductor Vendors Mine Big Data for Quality.
- Published in:
- EE: Evaluation Engineering, 2014, v. 53, n. 4, p. 24
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- Publication type:
- Article
Modular Instruments Vie With Traditional IC ATE.
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- EE: Evaluation Engineering, 2013, v. 52, n. 7, p. 22
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- Publication type:
- Article
Exploring the Relationship Between AXIe and PXI.
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- EE: Evaluation Engineering, 2012, v. 51, n. 3, p. 36
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- Publication type:
- Article
Improving Semiconductor Yield With Scan Diagnosis.
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- EE: Evaluation Engineering, 2010, v. 49, n. 3, p. 36
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- Publication type:
- Article
What Is Concurrent Test?
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- EE: Evaluation Engineering, 2009, v. 48, n. 4, p. 40
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- Publication type:
- Article
System Architected Around IEEE 1450 STIL.
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- 2005
- Publication type:
- Product Review
Portable System Supports Multisite Final Testing.
- Published in:
- 2005
- Publication type:
- Product Review
Package Provides Pulse Measurement Capabilities.
- Published in:
- 2005
- Publication type:
- Product Review
Hydrocarbons‐Driven Crystallization of Polymer Semiconductors for Low‐Temperature Fabrication of High‐Performance Organic Field‐Effect Transistors.
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- Advanced Functional Materials, 2018, v. 28, n. 15, p. 1, doi. 10.1002/adfm.201706372
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- Publication type:
- Article
Radiative d-d transitions at tungsten centers in II-VI semiconductors.
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- Semiconductors, 2017, v. 51, n. 3, p. 322, doi. 10.1134/S1063782617030253
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- Publication type:
- Article
Features of the band structure and conduction mechanisms of n-HfNiSn heavily doped with Y.
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- Semiconductors, 2017, v. 51, n. 2, p. 139, doi. 10.1134/S106378261702018X
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- Publication type:
- Article
Design and Analysis of Low Noise Optimization Amplifier Using Reconfigurable Slotted Patch Antenna.
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- Wireless Personal Communications, 2017, v. 97, n. 4, p. 5185, doi. 10.1007/s11277-017-4774-2
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- Publication type:
- Article
MBJ Solutions.
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- Photovoltaics International, 2011, n. 13, p. 159
- Publication type:
- Article
Keithley updates solar cell tester to support Drive-Level Capacitance Profiling.
- Published in:
- Photovoltaics International, 2009, n. 4, p. 59
- Publication type:
- Article
COMPRESSED SKEWED-LOAD DELAY TEST GENERATION BASED ON EVOLUTION AND DETERMINISTIC INITIALIZATION OF POPULATIONS.
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- Computing & Informatics, 2013, v. 32, n. 2, p. 251
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- Publication type:
- Article
Intelligent manufacturing: New advances and challenges.
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- 2015
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- Publication type:
- Editorial
The cooperative estimation of distribution algorithm: a novel approach for semiconductor final test scheduling problems.
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- Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 867, doi. 10.1007/s10845-013-0746-x
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- Publication type:
- Article
Determining the operator-machine assignment for machine interference problem and an empirical study in semiconductor test facility.
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- Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 899, doi. 10.1007/s10845-013-0777-3
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- Publication type:
- Article
Yield improvement planning for the recycle processes of test wafers.
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- International Journal of Advanced Manufacturing Technology, 2006, v. 27, n. 11/12, p. 1228, doi. 10.1007/s00170-004-2316-z
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- Publication type:
- Article
Controlled Low‐Frequency Electrical Noise of Monolayer MoS<sub>2</sub> with Ohmic Contact and Tunable Carrier Concentration.
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- Advanced Electronic Materials, 2018, v. 4, n. 1, p. 1, doi. 10.1002/aelm.201700340
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- Publication type:
- Article
Rating the extent of surface scratches on photostimulable storage phosphor plates in a dental school environment.
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- Dentomaxillofacial Radiology, 2010, v. 39, n. 3, p. 179, doi. 10.1259/dmfr/28972644
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- Publication type:
- Article
products & literature.
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- Advanced Materials & Processes, 2011, v. 169, n. 3, p. 44
- Publication type:
- Article
Design and Preliminary Evaluation of High‐Speed Line‐of‐Sight Calculation CMOS Image Sensor.
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- Electronics & Communications in Japan, 2018, v. 101, n. 5, p. 47, doi. 10.1002/ecj.12062
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- Publication type:
- Article
Basic research on a consecutive educational system including design, trial fabrication, and evaluation of integrated crcuits.
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- Electronics & Communications in Japan, 2010, v. 93, n. 10, p. 12, doi. 10.1002/ecj.10290
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- Publication type:
- Article
Optimal test capacity allocation in automated high-frequency testing environments.
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- International Journal of Advanced Manufacturing Technology, 2012, v. 62, n. 1-4, p. 213, doi. 10.1007/s00170-011-3768-6
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- Publication type:
- Article
Semiconductor sequencing: how many flows do you need?
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- Bioinformatics, 2015, v. 31, n. 7, p. 1199, doi. 10.1093/bioinformatics/btu805
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- Publication type:
- Article
Synthesis of Efficient and Effective <italic>γ</italic>-MnO<sub>2</sub>/<italic>α</italic>-Bi<sub>2</sub>O<sub>3</sub>/a-Si Solar Cell by Vacuum Thermal Evaporation Technique.
- Published in:
- Plasmonics, 2018, v. 13, n. 3, p. 891, doi. 10.1007/s11468-017-0585-2
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- Publication type:
- Article
Design, Characterization and Analysis of a 0.35 μm CMOS SPAD.
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- Sensors (14248220), 2014, v. 14, n. 12, p. 22773, doi. 10.3390/s141222773
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- Publication type:
- Article
Non-Equilibrium Dislocation Dynamics in Semiconductor Crystals and Superlattices.
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- Journal of Non-Equilibrium Thermodynamics, 2018, v. 43, n. 2, p. 163, doi. 10.1515/jnet-2018-0002
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- Publication type:
- Article
Towards Polyoxometalate-Cluster-Based Nano-Electronics.
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- Chemistry - A European Journal, 2013, v. 19, n. 49, p. 16502, doi. 10.1002/chem.201301631
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- Publication type:
- Article
A hybrid knowledge discovery model using decision tree and neural network for selecting dispatching rules of a semiconductor final testing factory.
- Published in:
- Production Planning & Control, 2005, v. 16, n. 7, p. 665, doi. 10.1080/09537280500213757
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- Publication type:
- Article