Works matching DE "SEMICONDUCTORS"
Results: 5000
Research of In0.48Ga0.52P/GaAs Heterojunction Interface Properties Improvement Deposited by MOCVD.
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- Crystal Research & Technology, 2025, v. 60, n. 3, p. 1, doi. 10.1002/crat.202400198
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- Article
Photocurrents in Homogeneous Semiconductors in the Absence of an External Electric Field.
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- Journal of Communications Technology & Electronics, 2024, v. 69, n. 4, p. 195, doi. 10.1134/S1064226924700475
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- Article
Modeling methodology for thermo-structural analysis of V-NAND flash memory structure.
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- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-89936-8
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- Article
A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing.
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- Applied Sciences (2076-3417), 2025, v. 15, n. 4, p. 2009, doi. 10.3390/app15042009
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- Article
SH surface waves in piezoelectric semiconductors loaded with a finite viscous liquid layer: SH surface waves in piezoelectric semiconductors: L. Zhang et al.
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- Acta Mechanica, 2025, v. 236, n. 2, p. 903, doi. 10.1007/s00707-024-04181-w
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- Article
Floating Reduced Duty Cycle Step-Down Converter.
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- Electronics (2079-9292), 2025, v. 14, n. 4, p. 644, doi. 10.3390/electronics14040644
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- Article
High-Peak-Power Sub-Nanosecond Laser Pulse Sources Based on Hetero-Integrated "Heterothyristor–Laser Diode" Vertical Stack.
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- Photonics, 2025, v. 12, n. 2, p. 130, doi. 10.3390/photonics12020130
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- Article
Bridgman Method for Growing Metal Halide Single Crystals: A Review.
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- Inorganics, 2025, v. 13, n. 2, p. 53, doi. 10.3390/inorganics13020053
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- Article
On the solvability of the Cauchy problem for a thermal–electrical model.
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- Theoretical & Mathematical Physics, 2025, v. 222, n. 2, p. 183, doi. 10.1134/S0040577925020011
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- Article
Comparative analysis and control design of two non-isolated DC–DC converters with high reduction ratio.
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- Electrical Engineering, 2025, v. 107, n. 2, p. 2329, doi. 10.1007/s00202-024-02642-y
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- Article
Photo-thermoelastic interaction of a semiconductor infinite medium due to an inclined linearly distributed load.
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- Journal of Thermal Stresses, 2025, v. 48, n. 2, p. 209, doi. 10.1080/01495739.2025.2456769
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- Article
The Effect of Area Density of Polysilicon Thermocouples on Thermoelectric Performance.
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- Sensors (14248220), 2025, v. 25, n. 4, p. 1098, doi. 10.3390/s25041098
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- Article
Degradation Testing of Thermoelectrics Due to Temperature.
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- Journal of the IEST, 2024, v. 67, n. 1, p. 1, doi. 10.17764/1557-2196-67.1.1
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- Article
INVESTIGATIONS OF SPECTRAL CHARACTERISTICS OF MODIFIED PHOTOELECTRODES MADE OF TiO<sub>2</sub> AND SrTiO<sub>3</sub>.
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- Electronic Journal of Natural Sciences, 2003, v. 1, n. 1, p. 26
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- Article
Developments in materials for 157nm photoresists.
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- Solid State Technology, 2001, v. 44, n. 10, p. 63
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- Article
The race is on: CVD and spin-on vie for the low-k dielectric market.
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- Solid State Technology, 2001, v. 44, n. 10, p. 40
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- Article
Chemistry and treatment of III-V semiconductor wastewater.
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- Solid State Technology, 2001, v. 44, n. 8, p. 79
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- Article
An alternative to solid polyurethane for CMP.
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- Solid State Technology, 2001, v. 44, n. 8, p. 30
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- Article
WORLDWIDE HIGHLIGHTS.
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- Solid State Technology, 2001, v. 44, n. 8, p. 18
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- Article
Characterizing resists and films with VUV spectroscopic ellipsometry.
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- Solid State Technology, 2001, v. 44, n. 7, p. 165
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- Article
Safety solutions for high-pressure gas cylinders.
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- Solid State Technology, 2001, v. 44, n. 7, p. 153
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- Article
Spin-on stacked films for low-k[sub eff] dielectrics.
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- Solid State Technology, 2001, v. 44, n. 7, p. 105
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- Article
Floating 3-D display seemingly out of sci-fi.
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- Solid State Technology, 2001, v. 44, n. 6, p. 28
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- Article
Adapting to the economics of SOC.
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- Solid State Technology, 2001, v. 44, n. 6, p. 14
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- Article
WORLDWIDE HIGHLIGHTS.
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- Solid State Technology, 2001, v. 44, n. 5, p. 18
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- Article
Navigating yield through the maze of copper CMP defects.
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- Solid State Technology, 2001, v. 44, n. 4, p. 63
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- Article
Process and environmental benefits with solvent-free stripping.
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- Solid State Technology, 2001, v. 44, n. 4, p. 52
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- Article
Eliminating the effects of gas-system pressure transients.
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- Solid State Technology, 2001, v. 44, n. 2, p. 115
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- Article
Part Two of Two--Operation: How to make a sensor smarter.
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- Solid State Technology, 2001, v. 44, n. 2, p. 105
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- Article
Ultrasonic technologies enable ultra-fine-pitch low-temperature bonding.
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- Solid State Technology, 2001, v. 44, n. 2, p. 97
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- Article
At long last, SOI wafer market on the move.
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- Solid State Technology, 2001, v. 44, n. 2, p. 62
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- Article
Advanced lithography needs rigorously tested fused silica glass.
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- Solid State Technology, 2001, v. 44, n. 1, p. 111
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- Article
Strong phase shift mask designs with lower cost.
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- Solid State Technology, 2001, v. 44, n. 1, p. 104
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- Article
Low-k integration issues.
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- Solid State Technology, 2001, v. 44, n. 1, p. 78
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- Article
Equipment and process considerations for ALD.
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- Solid State Technology, 2001, v. 44, n. 1, p. 70
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- Article
Nodal predictions.
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- Solid State Technology, 2001, v. 44, n. 1, p. 62
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- Article
The lithography equipment marketplace.
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- Solid State Technology, 2001, v. 44, n. 1, p. 58
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- Article
Welcome to the REAL New Millennium.
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- 2001
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- Editorial
M is for Manufacturing.
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- Solid State Technology, 2000, v. 43, n. 12, p. 44
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- Article
The challenges of macro integration for fully automated 300mm fabs.
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- Solid State Technology, 2000, v. 43, n. 10, p. 52
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- Article
Design and chip fabrication need to be linked.
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- Solid State Technology, 2000, v. 43, n. 8, p. 12
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- Article
WORLD NEWS.
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- Solid State Technology, 2000, v. 43, n. 7, p. 16
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- Article
Cu contamination control for advanced interconnect manufacturing.
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- Solid State Technology, 2000, v. 43, n. 5, p. 137
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- Article
1999 Roadmap: Solutions and caveats.
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- Solid State Technology, 2000, v. 43, n. 5, p. 76
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- Article
Nitrogen put in GaAs for solar cells.
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- Solid State Technology, 2000, v. 43, n. 5, p. 34
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- Article
SC300 consortium experiments wih single monitor wafer.
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- Solid State Technology, 2000, v. 43, n. 4, p. 30
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- Article
Tech Briefs.
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- Solid State Technology, 2000, v. 43, n. 4, p. 26
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- Article
Keeping ahead of the curve.
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- Solid State Technology, 2000, v. 43, n. 4, p. 12
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- Article
Powerful simulation yields perovskite transistors.
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- Solid State Technology, 2000, v. 43, n. 3, p. 22
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- Article
Photomask market prospect brighter; industry consolidation continues.
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- Solid State Technology, 2000, v. 43, n. 2, p. 47
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- Article