晶圆表面缺陷在线检测研究.
- Published in:
- Computer Measurement & Control, 2018, v. 26, n. 5, p. 14, doi. 10.16526/j.cnki.11-4762/tp.2018.05.004
- By:
- Publication type:
- Article
Works matching DE "SEMICONDUCTOR wafers testing"
Results: 4
1
2
Real-time adaptive test algorithm can safely reduce wafer testing time and cost.
- Published in:
- EE: Evaluation Engineering, 2016, v. 55, n. 6, p. 22
- By:
- Publication type:
- Article
3
Scheduling identical wafer sorting parallel machines with sequence-dependent setup times using an iterated greedy heuristic.
- Published in:
- International Journal of Production Research, 2012, v. 50, n. 10, p. 2710, doi. 10.1080/00207543.2011.588617
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- Publication type:
- Article
4
QQ Models: Joint Modeling for Quantitative and Qualitative Quality Responses in Manufacturing Systems.
- Published in:
- Technometrics, 2015, v. 57, n. 3, p. 320, doi. 10.1080/00401706.2015.1029079
- By:
- Publication type:
- Article