Connecting you to content on EBSCOhost

Works matching DE "SEMICONDUCTOR wafers testing"

Results: 4

1

Scheduling identical wafer sorting parallel machines with sequence-dependent setup times using an iterated greedy heuristic.

Published in:

International Journal of Production Research, 2012, v. 50, n. 10, p. 2710, doi. 10.1080/00207543.2011.588617

By:

Ying, Kuo-Ching

Publication type:

Article

2

晶圆表面缺陷在线检测研究.

Published in:

Computer Measurement & Control, 2018, v. 26, n. 5, p. 14, doi. 10.16526/j.cnki.11-4762/tp.2018.05.004

By:

林佳;
王海明;
于乃功;
孙彬;
郝靖

Publication type:

Article

3

Real-time adaptive test algorithm can safely reduce wafer testing time and cost.

Published in:

EE: Evaluation Engineering, 2016, v. 55, n. 6, p. 22

By:

Streitwieser, Christian

Publication type:

Article

4

QQ Models: Joint Modeling for Quantitative and Qualitative Quality Responses in Manufacturing Systems.

Published in:

Technometrics, 2015, v. 57, n. 3, p. 320, doi. 10.1080/00401706.2015.1029079

By:

Deng, Xinwei;
Jin, Ran

Publication type:

Article