Works matching DE "SEMICONDUCTOR wafer manufacturing"

Results: 31

A Nonlinear Programming and Artificial Neural Network Approach for Optimizing the Performance of a Job Dispatching Rule in a Wafer Fabrication Factory.

Published in:

Applied Computational Intelligence & Soft Computing, 2012, p. 1, doi. 10.1155/2012/471973

By:

Toly Chen

Publication type:

Article

Combining statistical analysis and artificial neural network for classifying jobs and estimating the cycle times in wafer fabrication.

Published in:

Neural Computing & Applications, 2015, v. 26, n. 1, p. 223, doi. 10.1007/s00521-014-1739-1

By:

Chen, Toly

Publication type:

Article

Efficient wafer sorting scheduling using a hybrid artificial immune system.

Published in:

Journal of the Operational Research Society, 2014, v. 65, n. 2, p. 169, doi. 10.1057/jors.2013.8

By:

Ying, K-C;
Lin, S-W

Publication type:

Article

Order-lot pegging for minimizing total tardiness in semiconductor wafer fabrication process.

Published in:

Journal of the Operational Research Society, 2012, v. 63, n. 9, p. 1258, doi. 10.1057/jors.2011.133

By:

Kim, J-G;
Lim, S-K

Publication type:

Article

The heuristic preemptive dispatching rule using stocker for conveyor-based material handling system of 450-mm wafer fabrication.

Published in:

International Journal of Advanced Manufacturing Technology, 2017, v. 88, n. 5-8, p. 2179, doi. 10.1007/s00170-016-8908-6

By:

Wang, Chia-Nan;
Lee, Yueh-Hsiu;
Hsu, Hsien-Pin;
Dang, Van-Hiep

Publication type:

Article

Depth of cut per abrasive in fixed diamond wire sawing.

Published in:

International Journal of Advanced Manufacturing Technology, 2015, v. 80, n. 5-8, p. 1337, doi. 10.1007/s00170-015-7089-z

By:

Chung, Chunhui;
Le, Van-Nhat

Publication type:

Article

Dynamic dispatching for interbay material handling by using modified Hungarian algorithm and fuzzy-logic-based control.

Published in:

International Journal of Advanced Manufacturing Technology, 2013, v. 67, n. 1-4, p. 295, doi. 10.1007/s00170-013-4775-6

By:

Qin, Wei;
Zhang, Jie;
Sun, Yinbin

Publication type:

Article

A performance analytical model of automated material handling system for semiconductor wafer fabrication system.

Published in:

International Journal of Production Research, 2016, v. 54, n. 6, p. 1650, doi. 10.1080/00207543.2015.1047980

By:

Zhang, J.;
Qin, W.;
Wu, L.H.

Publication type:

Article

Simultaneous order-lot pegging and wafer release planning for semiconductor wafer fabrication facilities.

Published in:

International Journal of Production Research, 2014, v. 52, n. 12, p. 3710, doi. 10.1080/00207543.2014.882025

By:

Lim, Seung-Kil;
Kim, Jae-Gon;
Kim, Hwa-Joong

Publication type:

Article

A real-time scheduling method for the cluster tool with wafer transfer delay.

Published in:

International Journal of Production Research, 2014, v. 52, n. 4, p. 934, doi. 10.1080/00207543.2013.808774

By:

Lim, Si-Yeong;
Park, You-Jin;
Lee, Hyun;
Hur, Sun

Publication type:

Article

AMHS capacity determination model for wafer fabrication based on production performance optimization.

Published in:

International Journal of Production Research, 2013, v. 51, n. 18, p. 5520, doi. 10.1080/00207543.2013.784416

By:

Tu, Ying-Mei;
Lu, Chun-Wei;
Lee, AmyH.I.

Publication type:

Article

MIP-based fix-and-optimise algorithms for the parallel machine capacitated lot-sizing and scheduling problem.

Published in:

International Journal of Production Research, 2013, v. 51, n. 16, p. 5011, doi. 10.1080/00207543.2013.790570

By:

Xiao, Jing;
Zhang, Canrong;
Zheng, Li;
Gupta, JatinderN. D.

Publication type:

Article

Closed loop control-based real-time dispatching heuristic on parallel batch machines with incompatible job families and dynamic arrivals.

Published in:

International Journal of Production Research, 2013, v. 51, n. 15, p. 4570, doi. 10.1080/00207543.2013.774505

By:

Jia, Wenyou;
Jiang, Zhibin;
Li, You

Publication type:

Article

Modelling and scheduling analysis of multi-cluster tools with residency constraints based on time constraint sets.

Published in:

International Journal of Production Research, 2013, v. 51, n. 16, p. 4835, doi. 10.1080/00207543.2013.774490

By:

Liu, Ming-Xiang;
Zhou, Bing-Hai

Publication type:

Article

Integer programming-based real-time dispatching ( i -RTD) heuristic for wet-etch station at wafer fabrication.

Published in:

International Journal of Production Research, 2012, v. 50, n. 10, p. 2809, doi. 10.1080/00207543.2011.594816

By:

Ham, M.

Publication type:

Article

Scheduling start-up and close-down periods of dual-armed cluster tools with wafer delay regulation.

Published in:

International Journal of Production Research, 2012, v. 50, n. 10, p. 2785, doi. 10.1080/00207543.2011.590949

By:

Kim, Tae-Kyu;
Jung, Chihyun;
Lee, Tae-Eog

Publication type:

Article

Scheduling identical wafer sorting parallel machines with sequence-dependent setup times using an iterated greedy heuristic.

Published in:

International Journal of Production Research, 2012, v. 50, n. 10, p. 2710, doi. 10.1080/00207543.2011.588617

By:

Ying, Kuo-Ching

Publication type:

Article

Optimal supply chain configurations in semiconductor manufacturing.

Published in:

International Journal of Production Research, 2007, v. 45, n. 3, p. 631, doi. 10.1080/00207540600792499

By:

Chiang, David;
Guo, Ruey-Shan;
Chen, Argon;
Cheng, Meng-Tse;
Chen, Cheng-Bang

Publication type:

Article

Grouping genetic algorithms for solving single machine multiple orders per job scheduling problems.

Published in:

Annals of Operations Research, 2015, v. 235, n. 1, p. 709, doi. 10.1007/s10479-015-1976-4

By:

Sobeyko, Oleh;
Mönch, Lars

Publication type:

Article

Multiple Testing in Regression Models With Applications to Fault Diagnosis in the Big Data Era.

Published in:

Technometrics, 2017, v. 59, n. 3, p. 351, doi. 10.1080/00401706.2016.1236755

By:

Ing, Ching-Kang;
Lai, Tze Leung;
Shen, Milan;
Tsang, KaWai;
Yu, Shu-Hui

Publication type:

Article

The Symmetric-Partitioning and Incremental-Relearning Classification and Back-Propagation-Network Tree Approach for Cycle Time Estimation in Wafer Fabrication.

Published in:

Symmetry (20738994), 2014, v. 6, n. 2, p. 409, doi. 10.3390/sym6020409

By:

Chen, Toly

Publication type:

Article

BUILDING A FAB LAB.

Published in:

Electronic Device Failure Analysis, 2015, v. 17, n. 2, p. 2

By:

Russell, Jeremy D.

Publication type:

Article

Cleaving Breakthrough: A New Method Removes Old Limitations.

Published in:

2014

By:

Moyal, Efrat;
Brandstädt, Ekkehart

Publication type:

Case Study

Dynamic scheduling of photolithography process based on Kohonen neural network.

Published in:

Journal of Intelligent Manufacturing, 2015, v. 26, n. 1, p. 73, doi. 10.1007/s10845-013-0763-9

By:

Zhou, Bing-hai;
Li, Xin;
Fung, Richard

Publication type:

Article

Integrated data envelopment analysis and neural network model for forecasting performance of wafer fabrication operations.

Published in:

Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 945, doi. 10.1007/s10845-013-0808-0

By:

Hsu, Chia-Yu

Publication type:

Article

Hierarchical indices to detect equipment condition changes with high dimensional data for semiconductor manufacturing.

Published in:

Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 933, doi. 10.1007/s10845-013-0785-3

By:

Yu, Hui-Chun;
Lin, Kuo-Yi;
Chien, Chen-Fu

Publication type:

Article

An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing.

Published in:

Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 961, doi. 10.1007/s10845-013-0791-5

By:

Chien, Chen-Fu;
Chang, Kuo-Hao;
Wang, Wen-Chih

Publication type:

Article

Collaborative decision making algorithm for selection of optimal wire saw in photovoltaic wafer manufacture.

Published in:

Journal of Intelligent Manufacturing, 2012, v. 23, n. 3, p. 533, doi. 10.1007/s10845-010-0391-6

By:

Chang, Che-Wei

Publication type:

Article

DISCRETE-EVENT SIMULATION FOR SEMICONDUCTOR WAFER FABRICATION FACILITIES: A TUTORIAL.

Published in:

International Journal of Industrial Engineering, 2015, v. 22, n. 5, p. 661

By:

Fowler, John W.;
Mönch, Lars;
Ponsignon, Thomas

Publication type:

Article

Minimising total completion time on single-machine scheduling with new integrated maintenance activities.

Published in:

International Journal of Production Research, 2019, v. 57, n. 3, p. 918, doi. 10.1080/00207543.2018.1496294

By:

Chung, Tsui-Ping;
Xue, Zhen;
Wu, Tong;
Shih, Stephen C.

Publication type:

Article

Investigation of different inputs and a new release policy in the proposed simulation model for wafer fabrication system.

Published in:

Sādhanā: Academy Proceedings in Engineering Sciences, 2019, v. 44, n. 2, p. 1, doi. 10.1007/s12046-018-1006-8

By:

Singh, Rashmi;
Mathirajan, M

Publication type:

Article