Works matching DE "SEMICONDUCTOR wafer manufacturing"
Results: 29
The Symmetric-Partitioning and Incremental-Relearning Classification and Back-Propagation-Network Tree Approach for Cycle Time Estimation in Wafer Fabrication.
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- Symmetry (20738994), 2014, v. 6, n. 2, p. 409, doi. 10.3390/sym6020409
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- Article
BUILDING A FAB LAB.
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- Electronic Device Failure Analysis, 2015, v. 17, n. 2, p. 2
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- Article
Cleaving Breakthrough: A New Method Removes Old Limitations.
- Published in:
- 2014
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- Publication type:
- Case Study
A Nonlinear Programming and Artificial Neural Network Approach for Optimizing the Performance of a Job Dispatching Rule in a Wafer Fabrication Factory.
- Published in:
- Applied Computational Intelligence & Soft Computing, 2012, p. 1, doi. 10.1155/2012/471973
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- Publication type:
- Article
Multiple Testing in Regression Models With Applications to Fault Diagnosis in the Big Data Era.
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- Technometrics, 2017, v. 59, n. 3, p. 351, doi. 10.1080/00401706.2016.1236755
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- Article
Grouping genetic algorithms for solving single machine multiple orders per job scheduling problems.
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- Annals of Operations Research, 2015, v. 235, n. 1, p. 709, doi. 10.1007/s10479-015-1976-4
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- Publication type:
- Article
Minimising total completion time on single-machine scheduling with new integrated maintenance activities.
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- International Journal of Production Research, 2019, v. 57, n. 3, p. 918, doi. 10.1080/00207543.2018.1496294
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- Publication type:
- Article
A performance analytical model of automated material handling system for semiconductor wafer fabrication system.
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- International Journal of Production Research, 2016, v. 54, n. 6, p. 1650, doi. 10.1080/00207543.2015.1047980
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- Article
Simultaneous order-lot pegging and wafer release planning for semiconductor wafer fabrication facilities.
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- International Journal of Production Research, 2014, v. 52, n. 12, p. 3710, doi. 10.1080/00207543.2014.882025
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- Publication type:
- Article
A real-time scheduling method for the cluster tool with wafer transfer delay.
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- International Journal of Production Research, 2014, v. 52, n. 4, p. 934, doi. 10.1080/00207543.2013.808774
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- Publication type:
- Article
Dynamic scheduling of photolithography process based on Kohonen neural network.
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- Journal of Intelligent Manufacturing, 2015, v. 26, n. 1, p. 73, doi. 10.1007/s10845-013-0763-9
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- Article
Hierarchical indices to detect equipment condition changes with high dimensional data for semiconductor manufacturing.
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- Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 933, doi. 10.1007/s10845-013-0785-3
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- Article
An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing.
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- Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 961, doi. 10.1007/s10845-013-0791-5
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- Publication type:
- Article
Integrated data envelopment analysis and neural network model for forecasting performance of wafer fabrication operations.
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- Journal of Intelligent Manufacturing, 2014, v. 25, n. 5, p. 945, doi. 10.1007/s10845-013-0808-0
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- Publication type:
- Article
Collaborative decision making algorithm for selection of optimal wire saw in photovoltaic wafer manufacture.
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- Journal of Intelligent Manufacturing, 2012, v. 23, n. 3, p. 533, doi. 10.1007/s10845-010-0391-6
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- Publication type:
- Article
DISCRETE-EVENT SIMULATION FOR SEMICONDUCTOR WAFER FABRICATION FACILITIES: A TUTORIAL.
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- International Journal of Industrial Engineering, 2015, v. 22, n. 5, p. 661
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- Publication type:
- Article
The heuristic preemptive dispatching rule using stocker for conveyor-based material handling system of 450-mm wafer fabrication.
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- International Journal of Advanced Manufacturing Technology, 2017, v. 88, n. 5-8, p. 2179, doi. 10.1007/s00170-016-8908-6
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- Article
Depth of cut per abrasive in fixed diamond wire sawing.
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- International Journal of Advanced Manufacturing Technology, 2015, v. 80, n. 5-8, p. 1337, doi. 10.1007/s00170-015-7089-z
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- Publication type:
- Article
Dynamic dispatching for interbay material handling by using modified Hungarian algorithm and fuzzy-logic-based control.
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- International Journal of Advanced Manufacturing Technology, 2013, v. 67, n. 1-4, p. 295, doi. 10.1007/s00170-013-4775-6
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- Publication type:
- Article
Investigation of different inputs and a new release policy in the proposed simulation model for wafer fabrication system.
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- Sādhanā: Academy Proceedings in Engineering Sciences, 2019, v. 44, n. 2, p. 1, doi. 10.1007/s12046-018-1006-8
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- Publication type:
- Article
AMHS capacity determination model for wafer fabrication based on production performance optimization.
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- International Journal of Production Research, 2013, v. 51, n. 18, p. 5520, doi. 10.1080/00207543.2013.784416
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- Publication type:
- Article
MIP-based fix-and-optimise algorithms for the parallel machine capacitated lot-sizing and scheduling problem.
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- International Journal of Production Research, 2013, v. 51, n. 16, p. 5011, doi. 10.1080/00207543.2013.790570
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- Publication type:
- Article
Modelling and scheduling analysis of multi-cluster tools with residency constraints based on time constraint sets.
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- International Journal of Production Research, 2013, v. 51, n. 16, p. 4835, doi. 10.1080/00207543.2013.774490
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- Publication type:
- Article
Closed loop control-based real-time dispatching heuristic on parallel batch machines with incompatible job families and dynamic arrivals.
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- International Journal of Production Research, 2013, v. 51, n. 15, p. 4570, doi. 10.1080/00207543.2013.774505
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- Publication type:
- Article
Integer programming-based real-time dispatching ( i -RTD) heuristic for wet-etch station at wafer fabrication.
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- International Journal of Production Research, 2012, v. 50, n. 10, p. 2809, doi. 10.1080/00207543.2011.594816
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- Publication type:
- Article
Scheduling start-up and close-down periods of dual-armed cluster tools with wafer delay regulation.
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- International Journal of Production Research, 2012, v. 50, n. 10, p. 2785, doi. 10.1080/00207543.2011.590949
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- Publication type:
- Article
Scheduling identical wafer sorting parallel machines with sequence-dependent setup times using an iterated greedy heuristic.
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- International Journal of Production Research, 2012, v. 50, n. 10, p. 2710, doi. 10.1080/00207543.2011.588617
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- Publication type:
- Article
Optimal supply chain configurations in semiconductor manufacturing.
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- International Journal of Production Research, 2007, v. 45, n. 3, p. 631, doi. 10.1080/00207540600792499
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- Publication type:
- Article
Combining statistical analysis and artificial neural network for classifying jobs and estimating the cycle times in wafer fabrication.
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- Neural Computing & Applications, 2015, v. 26, n. 1, p. 223, doi. 10.1007/s00521-014-1739-1
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- Publication type:
- Article