Works matching DE "SEMICONDUCTOR storage devices"
1
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 23, p. 27133, doi. 10.1007/s10854-021-07105-9
- Zou, Yong Sheng;
- Gan, Chong Leong;
- Chung, Min-Hua;
- Takiar, Hem
- Article
2
- Journal of Algebra & Applied Mathematics, 2022, v. 20, n. 1, p. 17
- Article
3
- Integrated Ferroelectrics, 2012, v. 132, n. 1, p. 70, doi. 10.1080/10584587.2012.660819
- Phillips, Thomas A.;
- MacLeod, Todd C.;
- Ho, Fat D.
- Article
4
- Integrated Ferroelectrics, 2011, v. 124, n. 1, p. 119, doi. 10.1080/10584587.2011.573734
- Roy, A.;
- Dhar, A.;
- Ray, S. K.
- Article
5
- Integrated Ferroelectrics, 2006, v. 81, n. 1, p. 89, doi. 10.1080/10584580600657955
- Shaislamov, U. A.;
- Seo, B. I.;
- Lee, S. J.;
- Park, B. H.;
- Kim, I. S.;
- Hong, S. K.;
- Yang, B.
- Article
6
- Nature Communications, 2023, v. 14, n. 1, p. 1, doi. 10.1038/s41467-023-42223-4
- Sadremomtaz, Afsaneh;
- Glass, Robert F.;
- Guerrero, Jorge Eduardo;
- LaJeunesse, Dennis R.;
- Josephs, Eric A.;
- Zadegan, Reza
- Article
7
- Nature Communications, 2023, v. 14, n. 1, p. 1, doi. 10.1038/s41467-023-41363-x
- Yu, Jun;
- Wang, Han;
- Zhuge, Fuwei;
- Chen, Zirui;
- Hu, Man;
- Xu, Xiang;
- He, Yuhui;
- Ma, Ying;
- Miao, Xiangshui;
- Zhai, Tianyou
- Article
8
- Microscopy Today, 2022, v. 30, p. 19, doi. 10.1017/S1551929522000153
- Article
9
- International Journal of High Speed Electronics & Systems, 2006, v. 16, n. 2, p. 479, doi. 10.1142/S0129156406003801
- White, Marvin H.;
- Yu Wang;
- Wrazien, Stephen J.;
- Yijie Zhao
- Article
10
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 1, p. 38, doi. 10.1049/ell2.12337
- Jin, Soo‐Min;
- Kang, Shin‐Young;
- Kim, Hea‐Jee;
- Lee, Ju‐Young;
- Nam, In‐Ho;
- Shim, Tae‐Hun;
- Song, Yun‐Heub;
- Park, Jea‐Gun
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 11, p. 739, doi. 10.1049/el.2017.0465
- Kim, Y.;
- Park, I. H.;
- Kwon, H. T.;
- Wee, D.;
- Park, B.-G.
- Article
12
- Journal of Analysis & Applications, 2025, v. 23, n. 1, p. 1
- Article
13
- Journal of Analysis & Applications, 2024, v. 22, n. 1, p. 31
- Article
14
- IUP Journal of Electrical & Electronics Engineering, 2014, v. 7, n. 3, p. 25
- Shetty, Pooja;
- Biswas, Aindrila;
- Threse, Annie
- Article
15
- Administrative Science Quarterly, 1994, v. 39, n. 1, p. 24, doi. 10.2307/2393493
- Article
16
- Journal of International Commerce & Economics, 2007, p. 1
- Article
17
- Studies in Applied Mathematics, 2003, v. 111, n. 2, p. 185, doi. 10.1111/1467-9590.t01-1-00232
- Article
18
- Advanced Functional Materials, 2025, v. 35, n. 12, p. 1, doi. 10.1002/adfm.202417606
- Zhou, Feng;
- Liang, Huizhen;
- Liu, Tingchang;
- Liu, Ting;
- Luo, Wancheng;
- He, Zhihao;
- Zhang, Qijian
- Article
19
- Advanced Functional Materials, 2023, v. 33, n. 31, p. 1, doi. 10.1002/adfm.202301746
- Hao, Puqi;
- Zheng, Shuaizhi;
- Zeng, Binjian;
- Yu, Tao;
- Yang, Zhibin;
- Liao, Luocheng;
- Peng, Qiangxiang;
- Yang, Qijun;
- Zhou, Yichun;
- Liao, Min
- Article
20
- Multimedia Systems, 2009, v. 15, n. 2, p. 101, doi. 10.1007/s00530-009-0152-6
- Article
21
- IETE Technical Review, 2009, v. 26, n. 4, p. 247, doi. 10.4103/0256-4602.52994
- Jang-Gn Yun;
- Jong Duk Lee;
- Byung-Gook Park
- Article
22
- Materials Transactions, 2023, v. 64, n. 6, p. 1107, doi. 10.2320/matertrans.MT-ME2022001
- Yuri Mitsuhashi;
- Shogen Matsumoto;
- Akihiko Ito
- Article
23
- Journal of Circuits, Systems & Computers, 2021, v. 13, n. 15, p. 1, doi. 10.1142/S0218126621502704
- Mishra, Jitendra Kumar;
- Mankali, Lakshmi Likhitha;
- Kandpal, Kavindra;
- Misra, Prasanna Kumar;
- Goswami, Manish
- Article
24
- Journal of Circuits, Systems & Computers, 2004, v. 13, n. 6, p. 1321, doi. 10.1142/S0218126604001994
- LIU, WANLI;
- ALBONESI, DAVID H.;
- GOSTOMSKI, JOHN;
- PALUM, LLOYD;
- HINTERBERGER, DAVE;
- WANZENRIED, RICK;
- INDOVINA, MARK
- Article
25
- Journal of Active & Passive Electronic Devices, 2020, v. 15, n. 1/2, p. 117
- THOMAS, SABU;
- AKASHE, SHYAM
- Article
26
- Chemistry & Industry, 2023, v. 87, n. 11, p. 46, doi. 10.1002/cind.10195
- Article
27
- Journal of Electronic Testing, 2016, v. 32, n. 2, p. 111, doi. 10.1007/s10836-016-5570-8
- Luo, Kun-Lun;
- Wu, Ming-Hsueh;
- Hsu, Chun-Lung;
- Chen, Chen-An
- Article
28
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 643, doi. 10.1007/s10836-014-5487-z
- Hou, Chih-Sheng;
- Li, Jin-Fu
- Article
29
- International Journal of Parallel Programming, 2018, v. 46, n. 4, p. 736, doi. 10.1007/s10766-017-0527-9
- Shi, Yang;
- Zhu, Yanmin;
- Huang, Linpeng
- Article
30
- Electronics (2079-9292), 2021, v. 10, n. 16, p. 1954, doi. 10.3390/electronics10161954
- Wang, Chen;
- Zhao, Xiuli;
- Liu, Hao;
- Chao, Xin;
- Zhu, Hao;
- Sun, Qingqing
- Article
31
- Electronics (2079-9292), 2021, v. 10, n. 15, p. 1759, doi. 10.3390/electronics10151759
- Article
32
- Nanomaterials (2079-4991), 2025, v. 15, n. 5, p. 362, doi. 10.3390/nano15050362
- Tian, Qian;
- Liang, Xinchao;
- Xu, Maoping;
- Liu, Yi;
- Wu, Qilong;
- Tai, Guoan
- Article
33
- Nanomaterials (2079-4991), 2024, v. 14, n. 23, p. 1920, doi. 10.3390/nano14231920
- Qiu, Xinxia;
- Xu, Mingsheng;
- Cong, Chunxiao;
- Qiu, Zhi-Jun;
- Hu, Laigui;
- Liu, Ran
- Article
34
- Nanomaterials (2079-4991), 2022, v. 12, n. 3, p. 548, doi. 10.3390/nano12030548
- Kim, Hak-Gyeong;
- Hong, Da-Hee;
- Yoo, Jae-Hoon;
- Lee, Hee-Chul
- Article
35
- Nanomaterials (2079-4991), 2021, v. 11, n. 1, p. 101, doi. 10.3390/nano11010101
- Takahashi, Mitsue;
- Sakai, Shigeki
- Article
36
- Chemistry - An Asian Journal, 2018, v. 13, n. 14, p. 1784, doi. 10.1002/asia.201800331
- Wang, Ming;
- Zhang, Qi‐jian;
- Li, Zhuang;
- Li, Hua;
- Lu, Jian‐Mei
- Article
37
- Wireless Personal Communications, 2023, v. 130, n. 1, p. 103, doi. 10.1007/s11277-023-10277-8
- Santosh Kumar, T.;
- Tripathi, Suman Lata
- Article
38
- Wireless Personal Communications, 2023, v. 128, n. 1, p. 471, doi. 10.1007/s11277-022-09963-w
- Addala, Durgesh;
- Sinha, Sanjeet Kumar;
- Gadiparthi, Mohan Chandu;
- Chander, Sweta
- Article
39
- Chips, 2024, v. 3, n. 4, p. 271, doi. 10.3390/chips3040014
- Pan, Jiong;
- Wang, Zeda;
- Zhao, Bingchen;
- Yin, Jiaju;
- Guo, Pengwen;
- Yang, Yi;
- Ren, Tian-Ling
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1172, doi. 10.1049/el.2016.0938
- Weiwei He;
- Jing Chen;
- Jiexin Luo;
- Zhan Chai;
- Xi Wang
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1155, doi. 10.1049/el.2015.4001
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 477, doi. 10.1049/el.2015.2874
- Hunt, M. R.;
- Mitchell, C.;
- McCartney, C. L.;
- Ho, F. D.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 8, p. 615, doi. 10.1049/el.2014.4375
- Article
44
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 2, p. 55, doi. 10.1049/el.2013.4247
- Article
45
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 25, p. 1607, doi. 10.1049/el.2013.1418
- Article
46
- International Journal of the Economics of Business, 1995, v. 2, n. 1, p. 87, doi. 10.1080/758521098
- Article
47
- Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 5, p. 1, doi. 10.1007/s00339-017-0973-7
- Song, Bing;
- Xu, Hui;
- Liu, Haijun;
- Li, Qingjiang
- Article
48
- Monthly Weather Review, 2002, v. 130, n. 5, p. 1384, doi. 10.1175/1520-0493(2002)130<1384:AESDCF>2.0.CO;2
- Rivier, L.;
- Loft, R.;
- Polvani, L. M.
- Article
49
- PLoS ONE, 2017, v. 12, n. 3, p. 1, doi. 10.1371/journal.pone.0174375
- Baek, Seungjae;
- Cho, Sangyeun;
- Choi, Jongmoo
- Article
50
- Nature Nanotechnology, 2007, v. 2, n. 12, p. 790, doi. 10.1038/nnano.2007.380
- Jang-Sik Lee;
- Jinhan Cho;
- Chiyoung Lee;
- Inpyo Kim;
- Jeongju Park;
- Yong-Mu Kim;
- Hyunjung Shin;
- Jaegab Lee;
- Caruso, Frank
- Article