Works matching DE "SEMICONDUCTOR materials -- Electric properties"
1
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19454, doi. 10.1007/s10854-018-0075-0
- Zhang, Min;
- Zhu, Guangping;
- Dai, Jianming;
- Zhu, Xuebin;
- Liu, Qiangchun;
- Li, Qiang
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19344, doi. 10.1007/s10854-018-0061-6
- Xie, Juan;
- Yang, Chen;
- He, Yawen;
- Wang, Hu
- Article
3
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19278, doi. 10.1007/s10854-018-0054-5
- Wang, Linmeng;
- Gu, Xiuquan;
- Zhao, Yulong;
- Wei, Meng;
- Qiang, Yinghuai;
- Zhao, Yun
- Article
4
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19137, doi. 10.1007/s10854-018-0040-y
- Xu, Xin;
- Wang, Shurong;
- Ma, Xun;
- Yang, Shuai;
- Li, Yaobin;
- Tang, Zhen
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19028, doi. 10.1007/s10854-018-0028-7
- Zhang, Hao;
- Deng, Jinxiang;
- He, Yafeng;
- Duan, Ping;
- Liang, Xiaoyang;
- Li, Ruidong;
- Qin, Changdong;
- Pan, Zhiwei;
- Bai, Zhiying;
- Wang, Jiyou
- Article
6
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 596, doi. 10.1007/s10854-013-1521-7
- Chen, Ming-Kun;
- Huang, Yu-Jung;
- Cheng, Chi-Chan;
- Lin, Yi-Lung;
- Fu, Shen-Li
- Article
7
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 778, doi. 10.1007/s10854-013-1645-9
- Bhaskar, Ankam;
- Lin, Z.-R.;
- Liu, Chia-Jyi
- Article
8
- Physica Status Solidi (B), 2013, v. 250, n. 10, p. 2114, doi. 10.1002/pssb.201200945
- Doutt, Daniel R.;
- Balaz, S.;
- Isabella, L.;
- Look, D. C.;
- Leedy, K. D.;
- Brillson, L. J.
- Article
9
- Journal of Solid State Electrochemistry, 2018, v. 22, n. 8, p. 2445, doi. 10.1007/s10008-018-3955-6
- Castelhano, Douglas Iafrate;
- De Almeida, Juliana;
- De Paiva Pinheiro, Carlos Henrique;
- Bertazzoli, Rodnei;
- De Arruda Rodrigues, Christiane
- Article
10
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05969
- Xi Chen;
- Bairen Zhu;
- Anmin Zhang;
- Hualing Zeng;
- Qingming Zhang;
- Xiaodong Cui
- Article
11
- Microwave Journal, 2017, v. 60, n. 5, p. 10
- Article
12
- Microwave Journal, 2014, v. 57, n. 4, p. 57
- Article
13
- Semiconductors, 2017, v. 51, n. 2, p. 139, doi. 10.1134/S106378261702018X
- Romaka, V.;
- Rogl, P.;
- Kaczorowski, D.;
- Krayovskyy, V.;
- Stadnyk, Yu.;
- Horyn, A.
- Article
14
- Journal of the Tennessee Academy of Science, 2014, v. 89, n. 1, p. 36
- Smith, Nathanael J.;
- Johnston, Jamin M.
- Article
15
- Instruments & Experimental Techniques, 2017, v. 60, n. 1, p. 114, doi. 10.1134/S0020441217010195
- Article