Works about SEMICONDUCTOR manufacturing

Results: 1132

Removal of Metal Ions in Spin-on Hardmask Using Functionalized Porous Silica Adsorbents.

Published in:

Applied Sciences (2076-3417), 2025, v. 15, n. 13, p. 7185, doi. 10.3390/app15137185

By:

Kim, Won;
Lee, Kiseok;
Kim, Hyosik;
Choi, Mingi;
Hong, Suk-Koo;
Lee, Ji Eun

Publication type:

Article

Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production.

Published in:

Sensors (14248220), 2025, v. 25, n. 13, p. 4218, doi. 10.3390/s25134218

By:

Amato, Umberto;
Antoniadis, Anestis;
De Feis, Italia;
Doinychko, Anastasiia;
Gijbels, Irène;
La Magna, Antonino;
Pagano, Daniele;
Piccinini, Francesco;
Selvan Suviseshamuthu, Easter;
Severgnini, Carlo;
Torres, Andres;
Vasquez, Patrizia

Publication type:

Article

Optimization of Argon Gas Flow Rate for High‐Quality Germanium Crystal Growth in Czochralski Method.

Published in:

Heat Transfer, 2025, v. 54, n. 4, p. 2632, doi. 10.1002/htj.23301

By:

Hadidchi, Sanaz;
Tavakoli, Mohammad Hossein

Publication type:

Article

Investigation into the relationship between grinding force and total thickness variation using embedded force sensor.

Published in:

Journal of Mechanical Science & Technology, 2025, v. 39, n. 7, p. 3897, doi. 10.1007/s12206-025-0613-7

By:

Lin, FuChen;
Park, Kyoung-Su

Publication type:

Article

Development and Characterization of Functional Acrylic Adhesives for the Transfer Process in Semiconductor Microchip Processes.

Published in:

Journal of Applied Polymer Science, 2025, v. 142, n. 24, p. 1, doi. 10.1002/app.57039

By:

Hong, Suk‐Min;
Park, In‐Seon;
Lee, Chil Won;
Han, Kwan‐Young

Publication type:

Article

Es tut sich was im Lande Sachsen.

Published in:: Elektronik Industrie, 2025, p. 3
Publication type:: Article

Simple and Cost-Effective Design of a THz-Metamaterial-Based Hybrid Sensor on a Single Substrate.

Published in:

Sensors (14248220), 2025, v. 25, n. 12, p. 3660, doi. 10.3390/s25123660

By:

Nath, Uddipan;
Banerjee, Sagnik;
Santini, Carlo;
Citroni, Rocco;
Mangini, Fabio;
Frezza, Fabrizio

Publication type:

Article

Microfluidic Synthesis of Semiconductor Materials: Toward Accelerated Materials Development in Flow.

Published in:

Particle & Particle Systems Characterization, 2020, v. 37, n. 12, p. 1, doi. 10.1002/ppsc.202000256

By:

Campbell, Zachary S.;
Bateni, Fazel;
Volk, Amanda A.;
Abdel‐Latif, Kameel;
Abolhasani, Milad

Publication type:

Article

Temperature Compensation by Calibration Transfer for an AC Voltammetric Analyzer of Electroplating Baths.

Published in:

Electroanalysis, 2017, v. 29, n. 1, p. 67, doi. 10.1002/elan.201600488

By:

Jaworski, Aleksander;
Wikiel, Hanna;
Wikiel, Kazimierz

Publication type:

Article

Synthesis, properties and photocatalytic activity of a semiconductor/cellulose composite for dye degradation-a review.

Published in:

Cellulose, 2020, v. 27, n. 2, p. 595, doi. 10.1007/s10570-019-02851-w

By:

Jiang, Yifan;
Lawan, Ibrahim;
Zhou, Weiming;
Zhang, Mingxin;
Fernando, Gerard Franklyn;
Wang, Liwei;
Yuan, Zhanhui

Publication type:

Article

Unraveling the Connection between Deposition, Microstructure, and Performance of Superconducting Quantum Circuits using Multi-modal Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.766

By:

Oh, Jin-Su;
Kopas, Cameron J;
Marshall, Jayss;
Fang, Xiaotian;
Joshi, Kamal R;
Datta, Amlan;
Ghimire, Sunil;
Park, Joong-Mok;
Kim, Richard;
Setiawan, Daniel;
Lachman, Ella;
Mutus, Joshua Y;
Murthy, Akshay A;
Grassellino, Anna;
Romanenko, Alex;
Zasadzinski, John;
Wang, Jigang;
Prozorov, Ruslan;
Yadavalli, Kameshwar;
Kramer, Matt

Publication type:

Article

Expanding the Role of Atom Probe Tomography in Semiconductor Manufacturing and R&D – The Initiation of a Project Between CAMECA Instruments Inc. and imec.

Published in:

2023

By:

Ulfig, Robert M;
Reinhard, David A;
Larson, David J;
Clifton, Peter;
Dulac, Olivier;
Fleischmann, Claudia;
van der Heide, Paul

Publication type:

Abstract

Silicon Chip Teardown to the Atomic Scale – Challenges Facing the Reverse Engineering of Semiconductors.

Published in:

2010

By:

James, Dick

Publication type:

Abstract

Testing Semiconductor Products Using Low-Frequency Noise Parameters.

Published in:

Russian Journal of Nondestructive Testing, 2022, v. 58, n. 1, p. 10, doi. 10.1134/S1061830922010028

By:

Gorlov, M. I.;
Sergeev, V. A.

Publication type:

Article

Noise and Learning in Semiconductor Manufacturing.

Published in:

Management Science, 1995, v. 41, n. 1, p. 31, doi. 10.1287/mnsc.41.1.31

By:

Bohn, Roger E.

Publication type:

Article

Samsung Uses Data-Driven Approach to Manage Work-in-Process of Bottlenecks in Semiconductor Manufacturing Operations.

Published in:

INFORMS Journal on Applied Analytics, 2024, v. 54, n. 6, p. 487, doi. 10.1287/inte.2023.0051

By:

Yu, Gwangjae;
Ryu, Jaehyeon;
Choi, Sang-Seok

Publication type:

Article

Increasing Chip Availability Through a New After-Sales Service Supply Concept at ASML.

Published in:

INFORMS Journal on Applied Analytics, 2022, v. 52, n. 5, p. 460, doi. 10.1287/inte.2022.1133

By:

Lamghari-Idrissi, Douniel;
van Hugten, Roy;
van Houtum, Geert-Jan;
Basten, Rob

Publication type:

Article

General Electric Uses Simulation and Risk Analysis for Silicon Carbide Production System Design.

Published in:

INFORMS Journal on Applied Analytics, 2019, v. 49, n. 2, p. 117, doi. 10.1287/inte.2018.0979

By:

Biller, Bahar;
Hartig, Michael;
Olson, Ronald J.;
Sandvik, Peter;
Trant, Gerald;
Sui, Yang;
Minnick, Andrew

Publication type:

Article

The Development Trends and Prospects of India's Semiconductor Industry.

Published in:

China International Studies, 2024, n. 108, p. 116

By:

Lou Chunhao

Publication type:

Article

State‐of‐the‐Art Advances, Development, and Challenges of Metal Oxide Semiconductor Nanomaterials for Photothermal Solar Steam Generation.

Published in:

Advanced Sustainable Systems, 2022, v. 6, n. 4, p. 1, doi. 10.1002/adsu.202100416

By:

Tan, Kar Woon;
Yap, Chun Man;
Zheng, Ziyue;
Haw, Choon Yian;
Khiew, Poi Sim;
Chiu, Wee Siong

Publication type:

Article

Rapid single-shot parity spin readout in a silicon double quantum dot with fidelity exceeding 99%.

Published in:

NPJ Quantum Information, 2024, v. 10, n. 1, p. 1, doi. 10.1038/s41534-024-00813-0

By:

Takeda, Kenta;
Noiri, Akito;
Nakajima, Takashi;
Camenzind, Leon C.;
Kobayashi, Takashi;
Sammak, Amir;
Scappucci, Giordano;
Tarucha, Seigo

Publication type:

Article

Phase flip code with semiconductor spin qubits.

Published in:

NPJ Quantum Information, 2022, v. 8, n. 1, p. 1, doi. 10.1038/s41534-022-00639-8

By:

van Riggelen, F.;
Lawrie, W. I. L.;
Russ, M.;
Hendrickx, N. W.;
Sammak, A.;
Rispler, M.;
Terhal, B. M.;
Scappucci, G.;
Veldhorst, M.

Publication type:

Article

Ag-PMMA 复合薄膜抗冲击性能的分子动力学研究.

Published in:

Chinese Journal of High Pressure Physics, 2023, v. 37, n. 4, p. 1, doi. 10.11858/gywlxb.20230655

By:

林高建;
高文鹏;
陈鹏万;
孙伟福

Publication type:

Article

窒化アルミニウム粉末製造技術および用途展開.

Published in:

Journal of the Japan Society of Powder & Powder Metallurgy / Funtai Oyobi Fummatsu Yakin, 2021, v. 68, n. 12, p. 511, doi. 10.2497/jjspm.68.511

By:

金近幸博

Publication type:

Article

Development of fiber-reinforced polylactic acid filaments using untreated/silane-treated trichosanthes cucumerina fibers for additive manufacturing.

Published in:

Journal of Elastomers & Plastics, 2024, v. 56, n. 3, p. 277, doi. 10.1177/00952443241229186

By:

Raghunathan, Vijay;
Ayyappan, Vinod;
Rangappa, Sanjay Mavinkere;
Siengchin, Suchart

Publication type:

Article

A Credibility Theory-Based Robust Optimization Model to Hedge Price Uncertainty of DSO with Multiple Transactions.

Published in:

Mathematics (2227-7390), 2022, v. 10, n. 23, p. 4420, doi. 10.3390/math10234420

By:

Shao, Li-Peng;
Chen, Jia-Jia;
Pan, Lu-Wen;
Yang, Zi-Juan

Publication type:

Article

Hierarchical Transfer Learning for Cycle Time Forecasting for Semiconductor Wafer Lot under Different Work in Process Levels.

Published in:

Mathematics (2227-7390), 2021, v. 9, n. 17, p. 2039, doi. 10.3390/math9172039

By:

Wang, Junliang;
Gao, Pengjie;
Li, Zhe;
Bai, Wei

Publication type:

Article

Short-Term Scheduling Model of Cluster Tool in Wafer Fabrication.

Published in:

Mathematics (2227-7390), 2021, v. 9, n. 9, p. 1029, doi. 10.3390/math9091029

By:

Tu, Ying-Mei;
Versaci, Mario

Publication type:

Article

Outliers Detection Models in Shewhart Control Charts; an Application in Photolithography: A Semiconductor Manufacturing Industry.

Published in:

Mathematics (2227-7390), 2020, v. 8, n. 5, p. 857, doi. 10.3390/math8050857

By:

Raji, Ishaq Adeyanju;
Lee, Muhammad Hisyam;
Riaz, Muhammad;
Abujiya, Mu'azu Ramat;
Abbas, Nasir

Publication type:

Article

Synthesis and Morphological Characterization of Electroless-Deposited Ni-P Coatings on Diamond Abrasives.

Published in:

Lubricants (2075-4442), 2021, v. 9, n. 2, p. 20, doi. 10.3390/lubricants9020020

By:

Ma, Lian;
Chen, Yan;
Renner, Peter;
Parkinson, Dilworth;
Fang, Alex;
Liang, Hong

Publication type:

Article

Review of Evolution and Rising Significance of Wafer-Level Electroplating Equipment in Semiconductor Manufacturing.

Published in:

Electronics (2079-9292), 2025, v. 14, n. 5, p. 894, doi. 10.3390/electronics14050894

By:

Jiang, Tao;
Hu, Huiyong

Publication type:

Article

Synergistic Effects of Total Ionizing Dose and Single-Event Upset in 130 nm 7T Silicon-on-Insulator Static Random Access Memory.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 15, p. 2997, doi. 10.3390/electronics13152997

By:

Zhang, Zheng;
Guo, Gang;
Wang, Linfei;
Xiao, Shuyan;
Chen, Qiming;
Gao, Linchun;
Wang, Chunlin;
Li, Futang;
Zhang, Fuqiang;
Zhao, Shuyong;
Liu, Jiancheng

Publication type:

Article

Feature Selection for Data Classification in the Semiconductor Industry by a Hybrid of Simplified Swarm Optimization.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 12, p. 2242, doi. 10.3390/electronics13122242

By:

Yeh, Wei-Chang;
Chu, Chia-Li

Publication type:

Article

Digital Twin-Enabled Modelling of a Multivariable Temperature Uniformity Control System.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 8, p. 1419, doi. 10.3390/electronics13081419

By:

Araque, Juan Gabriel;
Angel, Luis;
Viola, Jairo;
Chen, Yangquan

Publication type:

Article

A Central Array Method to Locate Chips in AOI Systems in Semiconductor Manufacturing.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 6, p. 1070, doi. 10.3390/electronics13061070

By:

Fu, Huichu;
Lai, Yiming;
Pan, Chunrong;
Zhang, Siwei;
Bai, Liping;
Li, Jie

Publication type:

Article

A New Framework of the EAP System in Semiconductor Manufacturing Internet of Things.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 18, p. 3910, doi. 10.3390/electronics12183910

By:

Song, Tairan;
Qiao, Yan;
He, Yunfang;
Li, Jie;
Wu, Naiqi;
Liu, Bin

Publication type:

Article

Investigating the Effect of Cross-Conjugation Patterns on the Optoelectronic Properties of 7,7′Isoindigo-Based Materials.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 15, p. 3313, doi. 10.3390/electronics12153313

By:

Ren, Shiwei;
Habibi, Amirhossein;
Wang, Yujie;
Yassar, Abderrahim

Publication type:

Article

Survey of Reliability Research on 3D Packaged Memory.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 12, p. 2709, doi. 10.3390/electronics12122709

By:

Zhou, Shuai;
Ma, Kaixue;
Wu, Yugong;
Liu, Peng;
Hu, Xianghong;
Nie, Guojian;
Ren, Yan;
Qiu, Baojun;
Cai, Nian;
Xu, Shaoqiu;
Wang, Han

Publication type:

Article

Dual-Arm Cluster Tool Scheduling for Reentrant Wafer Flows.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 11, p. 2411, doi. 10.3390/electronics12112411

By:

Song, Tairan;
Qiao, Yan;
He, Yunfang;
Wu, Naiqi;
Li, Zhiwu;
Liu, Bin

Publication type:

Article

Review of Wafer Surface Defect Detection Methods.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 8, p. 1787, doi. 10.3390/electronics12081787

By:

Ma, Jianhong;
Zhang, Tao;
Yang, Cong;
Cao, Yangjie;
Xie, Lipeng;
Tian, Hui;
Li, Xuexiang

Publication type:

Article

Alleviating Class-Imbalance Data of Semiconductor Equipment Anomaly Detection Study.

Published in:

Electronics (2079-9292), 2023, v. 12, n. 3, p. 585, doi. 10.3390/electronics12030585

By:

Seol, Da Hoon;
Choi, Jeong Eun;
Kim, Chan Young;
Hong, Sang Jeen

Publication type:

Article

Timing Analysis and Optimization Method with Interdependent Flip-Flop Timing Model for Near-Threshold Design.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 22, p. 3670, doi. 10.3390/electronics11223670

By:

Cao, Peng;
Qin, Yuan;
Jiang, Haiyang

Publication type:

Article

Predictive Maintenance System for Wafer Transport Robot Using K-Means Algorithm and Neural Network Model.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 9, p. N.PAG, doi. 10.3390/electronics11091324

By:

Yoo, Ji-Hyun;
Park, Young-Kook;
Han, Seung-Soo

Publication type:

Article

Using Enhanced Test Systems Based on Digital IC Test Model for the Improvement of Test Yield.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 7, p. 1115, doi. 10.3390/electronics11071115

By:

Yeh, Chung-Huang;
Chen, Jwu-E;
Chang, Chia-Jui;
Huang, Tse-Chia

Publication type:

Article

On-Wafer Temperature Monitoring Sensor for Condition Monitoring of Repaired Electrostatic Chuck.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 6, p. 880, doi. 10.3390/electronics11060880

By:

Kim, Jae-Hwan;
Koo, Yoonsung;
Song, Wansoo;
Hong, Sang Jeen

Publication type:

Article

Use of Optical Emission Spectroscopy Data for Fault Detection of Mass Flow Controller in Plasma Etch Equipment.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 2, p. 253, doi. 10.3390/electronics11020253

By:

Kwon, Hyukjoon;
Hong, Sang Jeen

Publication type:

Article

Unbalanced-Tests to the Improvement of Yield and Quality.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 23, p. 3032, doi. 10.3390/electronics10233032

By:

Yeh, Chung-Huang;
Chen, Jwu-E

Publication type:

Article

Fabrication of Planar Heating Chuck Using Nichrome Thin Film as Heating Element for PECVD Equipment.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 20, p. 2535, doi. 10.3390/electronics10202535

By:

Im, Dong-Hyeok;
Yoon, Tae-Woong;
Min, Woo-Sig;
Hong, Sang-Jeen

Publication type:

Article

Step Coverage and Dry Etching Process Improvement of Amorphous Carbon Hard Mask.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 20, p. 2512, doi. 10.3390/electronics10202512

By:

Jiang, Zheng;
Zhu, Hao;
Sun, Qingqing;
Zhang, Davidwei

Publication type:

Article

A Novel Self-Biased Phase-Locked Loop Scheme for WLAN Applications.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 17, p. 2077, doi. 10.3390/electronics10172077

By:

Li, Peng;
Tian, Tian;
Wu, Bin;
Ye, Tianchun

Publication type:

Article