Works matching DE "SEMICONDUCTOR manufacturing"


Results: 1147
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    BASF leadership changes.

    Published in:
    Tribology & Lubrication Technology, 2025, v. 81, n. 9, p. 58
    Publication type:
    Article
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    Impurity detection in polymer parts for the semiconductor manufacturing industry.

    Published in:
    Technisches Messen, 2018, v. 85, n. 11, p. 700, doi. 10.1515/teme-2018-0056
    By:
    • Moldaschl, T.;
    • Arnold, T.;
    • Zauner, M.;
    • Meislitzer, S.;
    • Obersteiner, D.;
    • De Biasio, M.;
    • Steinbrener, J.;
    • Neumaier, L.;
    • Molzbichler, Albert;
    • Cramer, Heinz;
    • Ottersböck, B.;
    • Oreski, G.;
    • Voronko, Y.;
    • Kraft, M.;
    • Hirschl, Christina
    Publication type:
    Article
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    The Role of Interface Defect States in n‐ and p‐Type Ge Metal–Ferroelectric–Semiconductor Structures with Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Ferroelectric.

    Published in:
    Physica Status Solidi. A: Applications & Materials Science, 2021, v. 218, n. 4, p. 1, doi. 10.1002/pssa.202000500
    By:
    • Boni, Georgia Andra;
    • Istrate, Cosmin M.;
    • Zacharaki, Christina;
    • Tsipas, Polychronis;
    • Chaitoglou, Stefanos;
    • Evangelou, Evangelos K.;
    • Dimoulas, Athanasios;
    • Pintilie, Ioana;
    • Pintilie, Lucian
    Publication type:
    Article
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    Tunable quantum emitters on large-scale foundry silicon photonics.

    Published in:
    Nature Communications, 2024, v. 15, n. 1, p. 1, doi. 10.1038/s41467-024-50208-0
    By:
    • Larocque, Hugo;
    • Buyukkaya, Mustafa Atabey;
    • Errando-Herranz, Carlos;
    • Papon, Camille;
    • Harper, Samuel;
    • Tao, Max;
    • Carolan, Jacques;
    • Lee, Chang-Min;
    • Richardson, Christopher J. K.;
    • Leake, Gerald L.;
    • Coleman, Daniel J.;
    • Fanto, Michael L.;
    • Waks, Edo;
    • Englund, Dirk
    Publication type:
    Article
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    Lumped parameter modelling of the litho cell.

    Published in:
    Production Planning & Control, 2011, v. 22, n. 1, p. 41, doi. 10.1080/09537287.2010.490016
    By:
    • Kock, A. A. A.;
    • Veeger, C. P. L.;
    • Etman, L. F. P.;
    • Lemmen, B.;
    • Rooda, J. E.
    Publication type:
    Article
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